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Influence of growth conditions on the V-defects in InGaN/GaN MQWs 被引量:1
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作者 纪攀峰 刘乃鑫 +4 位作者 魏学成 刘喆 路红喜 王军喜 李晋闽 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2011年第10期17-21,共5页
The influence of the growth temperature,TMIn/TEGa andⅤ/Ⅲratio on the V-defects of InGaN/GaN multi-quantum wells(MQWs) has been investigated and discussed.When the TMIn flow increases from 180 to 200 sccm,the densi... The influence of the growth temperature,TMIn/TEGa andⅤ/Ⅲratio on the V-defects of InGaN/GaN multi-quantum wells(MQWs) has been investigated and discussed.When the TMIn flow increases from 180 to 200 sccm,the density of V-defects increases from 2.72×10^(18) to 5.24×10^(18) cm^(-2),and the V-defect width and depth increase too.The density also increases with the growth temperature.The densities are 2.05×10~8,2.72×10^(18) and 4.23×10~8 cm^(-2),corresponding to a growth temperature of 748,753 and 758℃respectively.When the NH_3 flows are 5000,6600 and 8000 sccm,the densities of the V-defects of these samples are 6.34×10^(18),2.72×10^(18) and 4.13×10^(18) cm^(-2),respectively.A properⅤ/Ⅲratio is needed to achieve step flow growth mode.We get the best quality of InGaN/GaN MQWs at a growth temperature of 753℃TMIn flow at 180 sccm,NH_3 flow at 6600 sccm,a flatter surface and less V-defects density.The depths of these V-defects are from 10 to 30 nm,and the widths are from 100 to 200 nm.In order to suppress the influence of V-defects on reverse current and electro-static discharge of LEDs,it is essential to grow thicker p-GaN to fill the V-defects. 展开更多
关键词 V-defect density WIDTH DEPTH tmin/tega NH_3 temperature
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