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Effects of Electropulsing Induced Microstructural Changes on THz-Reflection and Electrical Conductivity of Al-Doped ZnO Thin-Films
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作者 Yaohua Zhu Weien Lai 《Journal of Surface Engineered Materials and Advanced Technology》 2016年第3期106-117,共13页
Electropulsing induced phase transformation and crystal orientation change and their effects on electrical conductivity, THz reflection and surface roughness of thin-films of Al<sub>2</sub>O<sub>3<... Electropulsing induced phase transformation and crystal orientation change and their effects on electrical conductivity, THz reflection and surface roughness of thin-films of Al<sub>2</sub>O<sub>3</sub> (2 wt%) doped ZnO were studied using XRD, SEM, AFM and Thz spectroscopy techniques. AZO-2 thin-films showed an effective response in THz spectroscopy under electropulsing. Electropulsing induced circular preferred crystal orientation changes and phase transformations were observed. The preferred crystal orientation changes accompanying decrease in stress and the secondary phase precipitation favored enhancing conductivity and THz reflection of the AZO-2 thin-films. After adequate electropulsing, both THz reflection and electrical conductivity of the thin-films were enhanced by 22.8% and 6.8%, respectively;meanwhile surface roughness reduced. The property responses of electropulsing are discussed from point view of microstructural change and dislocation dynamics. 展开更多
关键词 ELECTROPULSING PRECIPITATION Preferred Crystal Orientation thz reflection Electrical Conductivity AZO Thin-Films
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Calibration method to improve the accuracy of THz imaging and spectroscopy in reflection geometry 被引量:5
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作者 Shuting Fan Edward P.J.Parrott +1 位作者 Benjamin S.Y.Ung Emma Pickwell-MacPherson 《Photonics Research》 SCIE EI 2016年第3期29-35,共7页
We introduce a novel method to accurately extract the optical parameters in terahertz reflection imaging. Our method builds on standard self-referencing methods using the reflected signal from the bottom of the imagin... We introduce a novel method to accurately extract the optical parameters in terahertz reflection imaging. Our method builds on standard self-referencing methods using the reflected signal from the bottom of the imaging window material to further compensate for time-dependent system fluctuations and position-dependent variation in the window thickness. Our proposed method not only improves the accuracy, but also simplifies the imaging procedure and reduces measurement times. 展开更多
关键词 Calibration method to improve the accuracy of thz imaging and spectroscopy in reflection geometry thz
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