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Impact of surface passivation on the electrical stability of strained germanium devices
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作者 Zong-Hu Li Mao-Lin Wang +10 位作者 Zhen-Zhen Kong Gui-Lei Wang Yuan Kang Yong-Qiang Xu Rui Wu Tian-Yue Hao Ze-Cheng Wei Bao-Chuan Wang Hai-Ou Li Gang Cao Guo-Ping Guo 《Chinese Physics B》 2025年第9期66-71,共6页
Strained germanium hole spin qubits are promising for quantum computing,but the devices hosting these qubits face challenges from high interface trap density,which originates from the naturally oxidized surface of the... Strained germanium hole spin qubits are promising for quantum computing,but the devices hosting these qubits face challenges from high interface trap density,which originates from the naturally oxidized surface of the wafer.These traps can degrade the device stability and cause an excessively high threshold voltage.Surface passivation is regarded as an effective method to mitigate these impacts.In this study,we perform low-thermal-budget chemical passivation using the nitric acid oxidation of silicon method on the surface of strained germanium devices and investigate the impact of passivation on the device stability.The results demonstrate that surface passivation effectively reduces the interface defect density.This not only improves the stability of the device's threshold voltage but also enhances its long-term static stability.Furthermore,we construct a band diagram of hole surface tunneling at the static operating point to gain a deeper understanding of the physical mechanism through which passivation affects the device stability.This study provides valuable insights for future optimization of strained Ge-based quantum devices and advances our understanding of how interface states affect device stability. 展开更多
关键词 HOLE strained germanium interface trap STABILITY surface passivation
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Tension-strained mesoporous Pt nanosheets for Li-CO_(2) battery with low overpotential
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作者 Jing Zhang Yuchun Liu +2 位作者 Xinpei Lin Zhihao Liu and Min Zhou 《中国科学技术大学学报》 北大核心 2025年第6期49-55,48,I0002,共9页
The slow kinetics of the cathode CO_(2) reduction reaction and the decomposition reaction of Li2CO3,a widebandwidth insulating product,lead to difficult CO_(2) capture and high charging potential in Li-CO_(2) batterie... The slow kinetics of the cathode CO_(2) reduction reaction and the decomposition reaction of Li2CO3,a widebandwidth insulating product,lead to difficult CO_(2) capture and high charging potential in Li-CO_(2) batteries.To improve the reaction kinetics and decrease the reaction overpotential,we synthesized mesoporous Pt nanosheets with high tensile strain.The presence of many unsaturated coordinated Pt atoms around the pores gives rise to tensile strain in the mesoporous Pt nanosheets.This tensile strain plays a key role in regulating the interactions between the catalytic surface of Pt and the adsorbed intermediates.The two-dimensional structure provides more active sites on the surface for the catalytic reactions.These superiorities enable a low overpotential of 0.36 V at a cutoff capacity of 100μAh·cm^(−2) at a current density of 10μA·cm^(−2) over more than 2000 h.This study opens new possibilities for the rational design of metal-based materials with strain engineering for electrochemical energy storage. 展开更多
关键词 Li-CO_(2)battery Pt nanosheets MESOPOROUS tension strain
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Fabrication and Characterization of Strained Si Material Using SiGe Virtual Substrate for High Mobility Devices 被引量:2
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作者 梁仁荣 张侃 +3 位作者 杨宗仁 徐阳 王敬 许军 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2007年第10期1518-1522,共5页
The fabrication and characterization of strained-Si material grown on a relaxed Si0.79 Ge0.21/graded Si1-x- Gex/Si virtual substrate, using reduced pressure chemical vapor deposition, are presented. The Ge concentrati... The fabrication and characterization of strained-Si material grown on a relaxed Si0.79 Ge0.21/graded Si1-x- Gex/Si virtual substrate, using reduced pressure chemical vapor deposition, are presented. The Ge concentration of the constant composition SiGe layer and the grading rate of the graded SiGe layer are estimated with double-crystal X-ray diffraction and further confirmed by SIMS measurements. The surface root mean square roughness of the strained Si cap layer is 2.36nm,and the strain is about 0.83% as determined by atomic force microscopy and Raman spectra, respectively. The threading dislocation density is on the order of 4 × 10^4cm^-2. Furthermore, it is found that the stress in the strained Si cap layer is maintained even after the high thermal budget process, nMOSFET devices are fabricated and measured in strained-Si and unstrained bulk-Si channels. Compared to the co-processed bulk-Si MOSFETs at room temperature,a significant low vertical field mobility enhancement of about 85% is observed in the strained-Si devices. 展开更多
关键词 strained Si RPCVD SiGe virtual substrate mobility enhancement
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Binding Energies of Screened Excitons in a Strained(111)-Oriented Zinc-Blende GaN/AlGaN Quantum Well Under Hydrostatic Pressure 被引量:6
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作者 哈斯花 班士良 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2008年第2期234-239,共6页
We investigate the binding energies of excitons in a strained (111)-oriented zinc-blende GaN/Al0.3 Ga0.7 N quantum well screened by the electron-hole (e-h) gas under hydrostatic pressure by combining a variational... We investigate the binding energies of excitons in a strained (111)-oriented zinc-blende GaN/Al0.3 Ga0.7 N quantum well screened by the electron-hole (e-h) gas under hydrostatic pressure by combining a variational method and a selfconsistent procedure. A built-in electric field produced by the strain-induced piezoelectric polarization is considered in our calculations. The result indicates that the binding energies of excitons increase nearly linearly with pressure,even though the modification of strain with hydrostatic pressure is considered, and the influence of pressure is more apparent under higher e-h densities. It is also found that as the density of an e-h gas increases,the binding energies first increase slowly to a maximum and then decrease rapidly when the e-h density is larger than about 1 ×10^11 cm^-2. The excitonic binding energies increase obviously as the barrier thickness decreases due to the decrease of the built-in electric field. 展开更多
关键词 EXCITON strained zinc-blende quantum well pressure screened effect
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The KP Dispersion Relation Near the Δ~i Valley in Strained Si_(1-x)Ge_x/Si 被引量:1
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作者 宋建军 张鹤鸣 +2 位作者 舒斌 胡辉勇 戴显英 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2008年第3期442-446,共5页
Based on an analysis of symmetry, the dispersion relations near the Ai valley in strained Si1-x Gex (0≤x〈0.45)/ (001), (111), (101)Si are derived using the KP method with perturbation theory. These relations... Based on an analysis of symmetry, the dispersion relations near the Ai valley in strained Si1-x Gex (0≤x〈0.45)/ (001), (111), (101)Si are derived using the KP method with perturbation theory. These relations demonstrate that △^i levels in strained Si1-x Gex are different from the △1 level in relaxed Si1-x Gex, while the longitudinal and transverse masses (m1^* and mt^* ) are unchanged under strain. The energy shift between the △^i levels and the △1 level follows the linear deformation potential theory. Finally,a description of the conduction band (CB) edge in biaxially strained layers is given. 展开更多
关键词 KP method conduction band strained SiGe
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Band Edge Model of (101)-Biaxial Strained Si 被引量:1
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作者 宋建军 张鹤鸣 +2 位作者 戴显英 胡辉勇 宣荣喜 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2008年第9期1670-1673,共4页
A band edge model in (101)-biaxial strained Si on relaxed Si1-x Gex alloy,or monoclinic Si (m-Si),is presented using the k · p perturbation method coupled with deformation potential theory. Results show that ... A band edge model in (101)-biaxial strained Si on relaxed Si1-x Gex alloy,or monoclinic Si (m-Si),is presented using the k · p perturbation method coupled with deformation potential theory. Results show that the [001], [001], [100], [100] valleys constitute the conduction band (CB) edge,which moves up in electron energy as the Ge fraction (x) increases. Furthermore,the CB splitting energy is in direct proportion to x and all the valence band (VB) edges move up in electron energy as x increases. In addition, the decrease in the indirect bandgap and the increase in the VB edge splitting energy as x increases are found. The quantitative data from the models supply valuable references for the design of the devices. 展开更多
关键词 strained Si band edge k · p method
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GSMBE-Grown InGaAs/InGaAsP Strained Quantum Well Lasers at 1.84 Micron Wavelength 被引量:1
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作者 柏劲松 方祖捷 +3 位作者 张云妹 陈高庭 李爱珍 陈建新 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2001年第2期126-129,共4页
GSMBE grown 1 84 micron wavelength InGaAs/InGaAsP/InP strained quantum well lasers are reported. Lasers with 800 micron long cavity and 40 micron wide planar electrical stripe have been operated under the pulsed r... GSMBE grown 1 84 micron wavelength InGaAs/InGaAsP/InP strained quantum well lasers are reported. Lasers with 800 micron long cavity and 40 micron wide planar electrical stripe have been operated under the pulsed regime at room temperature. At 20℃, the threshold current density is 3 8kA/cm 2 and the external different quantum efficiency is 9 3%. 展开更多
关键词 GSMBE midinfrared band strained quantum well laser
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An analytical threshold voltage model for dual-strained channel PMOSFET 被引量:1
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作者 秦珊珊 张鹤鸣 +3 位作者 胡辉勇 戴显英 宣荣喜 舒斌 《Chinese Physics B》 SCIE EI CAS CSCD 2010年第11期608-614,共7页
Based on the analysis of vertical electric potential distribution across the dual-channel strained p-type Si/strained Si1-xGex/relaxd Si1-yGey(s-Si/s-SiGe/Si1-yGey) metal-oxide-semiconductor field-effect transistor ... Based on the analysis of vertical electric potential distribution across the dual-channel strained p-type Si/strained Si1-xGex/relaxd Si1-yGey(s-Si/s-SiGe/Si1-yGey) metal-oxide-semiconductor field-effect transistor (PMOSFET), analytical expressions of the threshold voltages for buried channel and surface channel are presented. And the maximum allowed thickness of s-Si is given, which can ensure that the strong inversion appears earlier in the buried channel (compressive strained SiGe) than in the surface channel (tensile strained Si), because the hole mobility in the buried channel is higher than that in the surface channel. Thus they offer a good accuracy as compared with the results of device simulator ISE. With this model, the variations of threshold voltage and maximum allowed thickness of s-Si with design parameters can be predicted, such as Ge fraction, layer thickness, and doping concentration. This model can serve as a useful tool for p-channel s-Si/s-SiGe/Si1-yGey metal-oxide-semiconductor field-effect transistor (MOSFET) designs. 展开更多
关键词 strained Si strained SiGe dual-channel metal-oxide-semiconductor field-effect transistor (MOSFET) threshold voltage
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Calculation of Valence Subband Structures for Strained Quantum-Wells by Plane Wave Expansion Method Within 6×6 Luttinger-Kohn Model
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作者 国伟华 黄永箴 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2002年第6期577-581,共5页
The valence subband energies and wave functions of a tensile strained quantum well are calculated by the plane wave expansion method within the 6×6 Luttinger Kohn model.The effect of the number and period of pla... The valence subband energies and wave functions of a tensile strained quantum well are calculated by the plane wave expansion method within the 6×6 Luttinger Kohn model.The effect of the number and period of plane waves used for expansion on the stability of energy eigenvalues is examined.For practical calculation,it should choose the period large sufficiently to ensure the envelope functions vanish at the boundary and the number of plane waves large enough to ensure the energy eigenvalues keep unchanged within a prescribed range. 展开更多
关键词 semiconductor optical amplifier strained quantum well plane wave expansion method POLARIZATION
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An Analytical Model of Electron Mobility for Strained-Si Channel nMOSFETs 被引量:1
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作者 李小健 谭耀华 田立林 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2008年第5期863-868,共6页
An analytical model of electron mobility for strained-silicon channel nMOSFETs is proposed in this paper. The model deals directly with the strain tensor,and thus is independent of the manufacturing process. It is sui... An analytical model of electron mobility for strained-silicon channel nMOSFETs is proposed in this paper. The model deals directly with the strain tensor,and thus is independent of the manufacturing process. It is suitable for (100〉/ 〈110) channel nMOSFETs under biaxial or (100〉/〈 110 ) uniaxial stress and can be implemented in conventional device simulation tools . 展开更多
关键词 strained-SI electron mobility analytical model NMOSFET uniaxial stress/strain
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Wide-Band Polarization-Independent Semiconductor Optical Amplifier Gate with Tensile-Strained Quasi-Bulk InGaAs
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作者 王书荣 刘志宏 +6 位作者 王圩 朱洪亮 张瑞英 丁颖 赵玲娟 周帆 王鲁峰 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2004年第8期898-902,共5页
A semiconductor optical amplifier gate based on tensile strained quasi bulk InGaAs is developed.At injection current of 80mA,a 3dB optical bandwidth of more than 85nm is achieved due to dominant band filling effect... A semiconductor optical amplifier gate based on tensile strained quasi bulk InGaAs is developed.At injection current of 80mA,a 3dB optical bandwidth of more than 85nm is achieved due to dominant band filling effect.Moreover,the most important is that very low polarization dependence of gain (<0 7dB),fiber to fiber lossless operation current (70~90mA) and a high extinction ratio (>50dB) are simultaneously obtained over this wide 3dB optical bandwidth (1520~1609nm) which nearly covers the spectral region of the whole C band (1525~1565nm) and the whole L band (1570~1610nm).The gating time is also improved by decreasing carrier lifetime.The wide band polarization insensitive SOA gate is promising for use in future dense wavelength division multiplexing (DWDM) communication systems. 展开更多
关键词 semiconductor optical amplifier gate wide bandwidth polarization insensitive tensile strained quasi bulk InGaAs fiber to fiber lossless operation current extinction ratio
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Compressively Strained InGaAs/InGaAsP Quantum Well Distributed Feedback Laser at 1.74μm 被引量:1
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作者 潘教青 王圩 +4 位作者 朱洪亮 赵谦 王宝军 周帆 王鲁峰 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2005年第9期1688-1691,共4页
The compressively strained InGaAs/InGaAsP quantum well distributed feedback laser with ridge-wave- guide is fabricated at 1.74μm. It is grown by low-pressure metal organic chemical vapor deposition(MOCVD). A strain... The compressively strained InGaAs/InGaAsP quantum well distributed feedback laser with ridge-wave- guide is fabricated at 1.74μm. It is grown by low-pressure metal organic chemical vapor deposition(MOCVD). A strain buffer layer is used to avoid indium segregation. The threshold current of the device uncoated with length of 300μm is 11.5mA. The maximum output power is 14mW at 100mA. A side mode suppression ratio of 35.5dB is obtained. 展开更多
关键词 DFB laser compressive strain quantum well
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Determination of conduction band edge characteristics of strained Si/Si1-xGex 被引量:15
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作者 宋建军 张鹤鸣 +2 位作者 胡辉勇 戴显英 宣荣喜 《Chinese Physics B》 SCIE EI CAS CSCD 2007年第12期3827-3831,共5页
The feature of conduction band (CB) of Tensile-Strained Si(TS-Si) on a relaxed Si1-xGex substrate is systematically investigated, including the number of equivalent CB edge energy extrema, CB energy minima, the po... The feature of conduction band (CB) of Tensile-Strained Si(TS-Si) on a relaxed Si1-xGex substrate is systematically investigated, including the number of equivalent CB edge energy extrema, CB energy minima, the position of the extremal point, and effective mass. Based on an analysis of symmetry under strain, the number of equivalent CB edge energy extrema is presented; Using the K.P method with the help of perturbation theory, dispersion relation near minima of CB bottom energy, derived from the linear deformation potential theory, is determined, from which the parameters, namely, the position of the extremal point, and the longitudinal and transverse masses (m1^* and mt^*)are obtained. 展开更多
关键词 strained Si/Si1-xGex CONDUCTION-BAND K.P method
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Novel vertical stack HCMOSFET with strained SiGe/Si quantum channel 被引量:4
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作者 姜涛 张鹤鸣 +2 位作者 王伟 胡辉勇 戴显英 《Chinese Physics B》 SCIE EI CAS CSCD 2006年第6期1339-1345,共7页
A novel vertical stack heterostructure CMOSFET is investigated, which is structured by strained SiGe/Si with a hole quantum well channel in the compressively strained Sil-xGex layer for p-MOSFET and an electron quantu... A novel vertical stack heterostructure CMOSFET is investigated, which is structured by strained SiGe/Si with a hole quantum well channel in the compressively strained Sil-xGex layer for p-MOSFET and an electron quantum well channel in the tensile strained Si layer for n-MOSFET. The device possesses several advantages including: 1) the integration of electron quantum well channel with hole quantum well channel into the same vertical layer structure; 2) the gate work function modifiability due to the introduction of poly-SiGe as a gate material; 3) better transistor matching; and 4) flexibility of layout design of CMOSFET by adopting exactly the same material lays for both n-channel and p-channel. The MEDICI simulation result shows that p-MOSFET and n-MOSFET have approximately the same matching threshold voltages. Nice performances are displayed in transfer characteristic, transconductance and cut-off frequency. In addition, its operation as an inverter confirms the CMOSFET structured device to be normal and effective in function. 展开更多
关键词 strained SiGe/Si quantum well channel heterostructure CMOSFET poly-SiGe gate
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The study on two-dimensional analytical model for gate stack fully depleted strained Si on silicon-germanium-on-insulator MOSFETs 被引量:3
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作者 李劲 刘红侠 +2 位作者 李斌 曹磊 袁博 《Chinese Physics B》 SCIE EI CAS CSCD 2010年第10期485-491,共7页
Based on the exact resultant solution of two-dimensional Poisson's equation in strained Si and Si1-xCex layer, a simple and accurate two-dimensional.analytical model including surface channel potential, surface chann... Based on the exact resultant solution of two-dimensional Poisson's equation in strained Si and Si1-xCex layer, a simple and accurate two-dimensional.analytical model including surface channel potential, surface channel electric field, threshold voltage and subthreshold swing for fully depleted gate stack strained Si on silicon-germanium-on-insulator (SGOI) MOSFETs has been developed. The results show that this novel structure can suppress the short channel effects (SCE), the drain-induced barrier-lowering (DIBL) and improve the subthreshold performance in nanoelectronics application. The model is verified by numerical simulation. The model provides the basic designing guidance of gate stack strained Si on SGOI MOSFETs. 展开更多
关键词 silicon-germanium-on-insulator MOSFETs strained Si short channel effects the draininduced barrier-lowering
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Deformation efficiency, homogeneity, and electrical resistivity of pure copper processed by constrained groove pressing 被引量:4
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作者 Zong-Shen Wang Yan-Jin Guan Ping Liang 《Rare Metals》 SCIE EI CAS CSCD 2014年第3期287-292,共6页
Constrained groove pressing(CGP) is a new severe plastic deformation method suitable for producing ultra-fine grained sheet metals. In this work, the processing efficiency for a muti-pass CGP of pure copper was inve... Constrained groove pressing(CGP) is a new severe plastic deformation method suitable for producing ultra-fine grained sheet metals. In this work, the processing efficiency for a muti-pass CGP of pure copper was investigated. With a relatively small groove width of 2 mm and tight constraint, a sharp variation of mechanical properties with pass number is observed. Subgrains with the size of*0.5 lm have distinct boundaries, which is the predominant feature in the microstructure after three passes. The evolution of deformation homogeneity characterized by micro-hardness distribution was examined in detail.Observations of optical micrographs and fracture surface morphology confirm the evolution rule. The relation between electrical resistivity and accumulative plastic strain was discussed. Crystalline defects, micro-cracks, and microstructure uniformity together determine the change of electrical resistivity of CGP copper. 展开更多
关键词 Constrained groove pressing Processingefficiency Strain homogeneity Electrical resistivity
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ELECTRONIC STRUCTURES OF (CdSe)_n/(ZnSe)_m STRAINED-LAYER SUPERLATTICES 被引量:2
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作者 HL. Huang J.H Xing G.L. Liu and G.Y Zhang(Department of Electrouic Science and Engineering, Liaoning University Shenyang 110036, China)(Department of Physics, Liaoning University Shenyang 110036, China)(Shenyang Polytechnic University Shenyan 110023, Chin 《Acta Metallurgica Sinica(English Letters)》 SCIE EI CAS CSCD 1997年第1期10-16,共7页
The electronic structures of (CdSe)n/(ZnSe)m strained-lager soperfattice (SLS) were investigated by the recursion method in the tight-bindiop opproximation. The total,local, and partial density of states were calculat... The electronic structures of (CdSe)n/(ZnSe)m strained-lager soperfattice (SLS) were investigated by the recursion method in the tight-bindiop opproximation. The total,local, and partial density of states were calculated for n=1, m=5.The total density of states (TDOS) for bulk CdSe, ZnSe and n=1, 3, m=1, 3, 5, for SLS were investigated.Fermi energy, the band gap, the valence of an atom, and the ionization potential and the electron affinity were discassed. 展开更多
关键词 density of state strained layer superlattice CdSe/ZnSe Fermi energy band gap
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Conversion efficiency of strained wurtzite In_(x)Ga_(1-x)N/ZnSnN_(2)core/shell quantum dot solar cells under external electric field 被引量:2
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作者 ZHANG Jun SHI Lei YAN Zuwei 《Optoelectronics Letters》 EI 2023年第3期144-150,共7页
In this study,the conversion efficiency(CE),open-circuit voltage(V_(OC))and short-circuit current density(J_(SC))of wurtzite In_(x)Ga_(1-x)N/ZnSnN_(2)core/shell quantum dot(QD)solar cells are studied by using the deta... In this study,the conversion efficiency(CE),open-circuit voltage(V_(OC))and short-circuit current density(J_(SC))of wurtzite In_(x)Ga_(1-x)N/ZnSnN_(2)core/shell quantum dot(QD)solar cells are studied by using the detailed balance model.The effects of strain and external electric field have been considered.The results show that with the increase of the core size,the V_(OC)increases,while the J_(SC)and CE decrease.With the increase of shell size or In content,the V_(OC)decreases,while the J_(SC)and CE increase.In addition,our calculations show that the band gap of QD increases due to strain,which leads to an increase of the V_(OC),but decreases of the CE and J_(SC).By contrast,the situation is opposite under the effect of external electric field. 展开更多
关键词 QUANTUM strained field
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Screening influence on the Stark effect of impurity states in strained wurtzite GaN/Al_xGa_(1-x)N heterojunctions under pressure 被引量:1
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作者 张敏 班士良 《Chinese Physics B》 SCIE EI CAS CSCD 2009年第12期5437-5442,共6页
The screening effect of the random-phase-approximation on the states of shallow donor impurities in free strained wurtzite GaN/AlxGa1-xN heterojunctions under hydrostatic pressure and an external electric field is inv... The screening effect of the random-phase-approximation on the states of shallow donor impurities in free strained wurtzite GaN/AlxGa1-xN heterojunctions under hydrostatic pressure and an external electric field is investigated by using a variational method and a simplified coherent potential approximation. The variations of Stark energy shift with electric field, impurity position, A1 component and areal electron density are discussed. Our results show that the screening dramatically reduces both the blue and red shifts as well as the binding energies of impurity states. For a given impurity position, the change in binding energy is more sensitive to the increase in hydrostatic pressure in the presence of the screening effect than that in the absence of the screening effect. The weakening of the blue and red shifts, induced by the screening effect, strengthens gradually with the increase of electric field. Furthermore, the screening effect weakens the mixture crystal effect, thereby influencing the Stark effect. The screening effect strengthens the influence of energy band bending on binding energy due to the areal electron density. 展开更多
关键词 strained wurtzite heterojunction Stark effect SCREENING pressure
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Optical properties of InGaAsBi/GaAs strained quantum wells studied by temperature-dependent photoluminescence 被引量:1
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作者 顾溢 张永刚 +4 位作者 宋禹忻 叶虹 曹远迎 李爱珍 王庶民 《Chinese Physics B》 SCIE EI CAS CSCD 2013年第3期508-511,共4页
The effect of bismuth on the optical properties of InGaAsBi/GaAs quantum well structures is investigated using the temperature-dependent photoluminescence from 12 K to 450 K.The incorporation of bismuth in the InGaAsB... The effect of bismuth on the optical properties of InGaAsBi/GaAs quantum well structures is investigated using the temperature-dependent photoluminescence from 12 K to 450 K.The incorporation of bismuth in the InGaAsBi quantum well is confirmed and found to result in a red shift of photoluminescence wavelength of 27.3 meV at 300 K.The photoluminescence intensity is significantly enhanced by about 50 times at 12 K with respect to that of the InGaAs quantum well due to the surfactant effect of bismuth.The temperature-dependent integrated photoluminescence intensities of the two samples reveal different behaviors related to various non-radiative recombination processes.The incorporation of bismuth also induces alloy non-uniformity in the quantum well,leading to an increased photoluminescence linewidth. 展开更多
关键词 InGaAsBi strained quantum wells PHOTOLUMINESCENCE
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