期刊文献+
共找到2篇文章
< 1 >
每页显示 20 50 100
Preparation of Sn-Ag-In ternary solder bumps by electroplating in sequence and reliability
1
作者 王栋良 袁媛 罗乐 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2011年第8期27-32,共6页
This paper describes a technique that can obtain ternary Sn-Ag-In solder bumps with fine pitch and homogenous composition distribution.The main feature of this process is that tin-silver and indium are electroplated o... This paper describes a technique that can obtain ternary Sn-Ag-In solder bumps with fine pitch and homogenous composition distribution.The main feature of this process is that tin-silver and indium are electroplated on copper under bump metallization(UBM) in sequence.After an accurate reflow process,Sn_(1.8)Ag_(9.4)In solder bumps are obtained.It is found that the intermetallic compounds(IMCs) between Sn-Ag-In solder and Cu grow with the reflow time,which results in an increase in Ag concentration in the solder area.So during solidification, more Ag_2In nucleates and strengthens the solder. 展开更多
关键词 sn-ag-in solder bumps ELECTROPLATING MICROSTRUCTURE shear strength
原文传递
Sn-Ag-In微凸点高温时效可靠性研究
2
作者 张建春 吴海建 +2 位作者 王栋良 丁小军 王松原 《航空维修与工程》 2015年第9期107-110,共4页
采用分步电镀法制备了三种不同组分的Sn-Ag-In微凸点,研究了微凸点在150℃时效至1000h过程中凸点下金属层Cu与焊料基体之间的界面反应,揭示了In的加入对Cu/Sn-Ag-In扩散偶中原子相互扩散以及Kirkendall孔洞分布状态的影响规律,同时研究... 采用分步电镀法制备了三种不同组分的Sn-Ag-In微凸点,研究了微凸点在150℃时效至1000h过程中凸点下金属层Cu与焊料基体之间的界面反应,揭示了In的加入对Cu/Sn-Ag-In扩散偶中原子相互扩散以及Kirkendall孔洞分布状态的影响规律,同时研究了高温时效条件下界面反应对微凸点剪切强度的影响规律,分析了微凸点的断裂模式。 展开更多
关键词 sn-ag-in 微凸点 高温时效 界面反应 可靠性
原文传递
上一页 1 下一页 到第
使用帮助 返回顶部