Parameter extraction is an important step for circuit simulation methods that are based on physical models of semiconductor devices. A novel physical parameter extraction approach for Schottky diodes is proposed in th...Parameter extraction is an important step for circuit simulation methods that are based on physical models of semiconductor devices. A novel physical parameter extraction approach for Schottky diodes is proposed in this paper. By employing a set of analytical formulas, this approach extracts all of the necessary physical parameters of the diode chip in a unique way. It then extracts the package parasitic parameters with a curve-fitting method. To validate the proposed approach, a model HSMS-282 c commercial Schottky diode is taken as an example. Its physical parameters are extracted and used to simulate the diode＇s electrical characteristics. The simulated results based on the extracted parameters are compared with the measurements and a good agreement is obtained, which verifies the feasibility and accuracy of the proposed approach.展开更多
Current transport mechanism in Ni-germanide/n-type Ge Schottky diodes is investigated using current-voltage characterisation technique with annealing temperatures from 300 ℃ to 500℃. Based on the current transport m...Current transport mechanism in Ni-germanide/n-type Ge Schottky diodes is investigated using current-voltage characterisation technique with annealing temperatures from 300 ℃ to 500℃. Based on the current transport model, a simple method to extract parameters of the NiGe/Ge diode is presented by using the I-V characteristics. Parameters of NiGe/n-type Ge Schottky diodes fabricated for testing in this paper are as follows： the ideality factor n, the series resistance Rs, the zero-field barrier height Фb0, the interface state density Dit, and the interracial layer capacitance Ci. It is found that the ideality factor n of the diode increases with the increase of annealing temperature. As the temperature increases, the interface defects from the sputtering damage and the penetration of metallic states into the Ge energy gap are passivated, thus improving the junction quality. However, the undesirable crystallisations of Ni-germanide are observed together with NiGe at a temperature higher than 400℃. Depositing a very thin （-1 nm） heavily Ge-doped n＋ Ge intermediate layer can improve the NiGe film morphology significantly.展开更多
In this work,forward current voltage characteristics for multi-quantum wells Al_(0.33)Ga_(0.67)As Schottky diode were measured at temperature ranges from 100 to 300 K.The main parameters of this Schottky diode,such as...In this work,forward current voltage characteristics for multi-quantum wells Al_(0.33)Ga_(0.67)As Schottky diode were measured at temperature ranges from 100 to 300 K.The main parameters of this Schottky diode,such as the ideality factor,barrier height,series resistance and saturation current,have been extracted using both analytical and heuristics methods.Differential evolution(DE),particle swarm optimization(PSO)and artificial bee colony(ABC)have been chosen as candidate heuristics algorithms,while Cheung technic was selected as analytical extraction method.The obtained results show clearly the high performance of DE algorithms in terms of parameters accuracy,convergence speed and robustness.展开更多
A novel equivalent circuit model for a GaAs PIN diode is presented based on physical analysis. The diode is divided into three parts： the p^＋ n^- junction, the i-layer, and the n^- n^＋ junction, which are modeled s...A novel equivalent circuit model for a GaAs PIN diode is presented based on physical analysis. The diode is divided into three parts： the p^＋ n^- junction, the i-layer, and the n^- n^＋ junction, which are modeled separately. The entire model is then formed by combining the three sub-models. In this way, the model＇s accuracy is greatly enhanced. Furthermore, the corresponding parameter extraction method is easy, requiring no rigorous experiment or measurement. To validate this newly proposed model,fifteen groups of diodes are fabricated. Measurement shows that the model exactly represents behavior of GaAs PIN diodes under both forward and reversely biased conditions.展开更多
A 10-bit 500 kHz low-power successive approximation register(SAR)analog-to-digital converter(ADC)for cryogenic infrared readout circuit is proposed.To improve the simulation accuracy of metal-oxidesemiconductor field-...A 10-bit 500 kHz low-power successive approximation register(SAR)analog-to-digital converter(ADC)for cryogenic infrared readout circuit is proposed.To improve the simulation accuracy of metal-oxidesemiconductor field-efect transistors(MOSFETs),corresponding modification in device model is presented on the basis of BSIM3v3 with parameter extraction at 77 K.Corresponding timing is adopted in comparator to eliminate the influence caused by abnormal performance of MOSFETs at 77 K.The SAR ADC is fabricated and verified by standard 0.35μm complementary metal oxide semiconductor(CMOS)process.At 77 K,measurement results show that signal to noise and distortion ratio(SNDR)is 54.74 dB and efective number of bits(ENOB)is 8.8 at the sampling rate of 500 kHz.The total circuit consumes 0.6 mW at 3.3 V power supply.展开更多
The mathematical modeling of solar cells is essential for any optimization operation of the efficiency or the diagnosis of photovoltaic generator. The photovoltaic module is generally represented by an equivalent circ...The mathematical modeling of solar cells is essential for any optimization operation of the efficiency or the diagnosis of photovoltaic generator. The photovoltaic module is generally represented by an equivalent circuit whose parameters are experimentally calculated by using the characteristic current-tension, I-V. The precise determination of these parameters stays a challenge for the researchers, making to a big difference in the models and the digital methods dedicated to their characterizations. In the present paper, We are interested to characterize the parameters of single diode and two diodes models, in order to plan the behavior of the photovoltaic generator under real functioning conditions. We developed an identification method of the parameters using Newton Raphson method by using the software Matlab/Simulink. This method is the faster technique which allows the identification of several parameters and can be used in real time applications. The results of the proposed method show an accordance with the experimental and simulated characteristics of photovoltaic generator.展开更多
This study focused on the determination and analysis of an accurate analytical model for PIN diode under different bias conditions. This approach employs analytically derived expressions including the variation of the...This study focused on the determination and analysis of an accurate analytical model for PIN diode under different bias conditions. This approach employs analytically derived expressions including the variation of the depletion regions in the device to make the used model available over a wide range of testing conditions without remake the parameters extraction procedure. The validity of the proposed extraction procedure has been verified by the very good agreement between simulated and measured current and voltage waveforms reverse recovery at different range of the operation conditions. The model is developed and simulated with the VHDL-AMS language under Ansoft Simplorer®Environment.展开更多
基金Project supported by the Joint Fund of the National Natural Science Foundation of China and the China Academy of Engineering Physics(Grant No.U1230112)
文摘Parameter extraction is an important step for circuit simulation methods that are based on physical models of semiconductor devices. A novel physical parameter extraction approach for Schottky diodes is proposed in this paper. By employing a set of analytical formulas, this approach extracts all of the necessary physical parameters of the diode chip in a unique way. It then extracts the package parasitic parameters with a curve-fitting method. To validate the proposed approach, a model HSMS-282 c commercial Schottky diode is taken as an example. Its physical parameters are extracted and used to simulate the diode＇s electrical characteristics. The simulated results based on the extracted parameters are compared with the measurements and a good agreement is obtained, which verifies the feasibility and accuracy of the proposed approach.
基金Project supported by the National Natural Science Foundation of China (Grant Nos. 60936005 and 60976068)the New Century Excellent Talents of Ministry of Education of China (Grant No. NCET-05-0851)+1 种基金the Cultivation Fund of Key Scientific and Technical Innovation Project,Ministry of Education of China (Grant No. 708083)the Applied Materials Innovation Fund(Grant No. XA-AM-200701)
文摘Current transport mechanism in Ni-germanide/n-type Ge Schottky diodes is investigated using current-voltage characterisation technique with annealing temperatures from 300 ℃ to 500℃. Based on the current transport model, a simple method to extract parameters of the NiGe/Ge diode is presented by using the I-V characteristics. Parameters of NiGe/n-type Ge Schottky diodes fabricated for testing in this paper are as follows： the ideality factor n, the series resistance Rs, the zero-field barrier height Фb0, the interface state density Dit, and the interracial layer capacitance Ci. It is found that the ideality factor n of the diode increases with the increase of annealing temperature. As the temperature increases, the interface defects from the sputtering damage and the penetration of metallic states into the Ge energy gap are passivated, thus improving the junction quality. However, the undesirable crystallisations of Ni-germanide are observed together with NiGe at a temperature higher than 400℃. Depositing a very thin （-1 nm） heavily Ge-doped n＋ Ge intermediate layer can improve the NiGe film morphology significantly.
文摘In this work,forward current voltage characteristics for multi-quantum wells Al_(0.33)Ga_(0.67)As Schottky diode were measured at temperature ranges from 100 to 300 K.The main parameters of this Schottky diode,such as the ideality factor,barrier height,series resistance and saturation current,have been extracted using both analytical and heuristics methods.Differential evolution(DE),particle swarm optimization(PSO)and artificial bee colony(ABC)have been chosen as candidate heuristics algorithms,while Cheung technic was selected as analytical extraction method.The obtained results show clearly the high performance of DE algorithms in terms of parameters accuracy,convergence speed and robustness.
文摘A novel equivalent circuit model for a GaAs PIN diode is presented based on physical analysis. The diode is divided into three parts： the p^＋ n^- junction, the i-layer, and the n^- n^＋ junction, which are modeled separately. The entire model is then formed by combining the three sub-models. In this way, the model＇s accuracy is greatly enhanced. Furthermore, the corresponding parameter extraction method is easy, requiring no rigorous experiment or measurement. To validate this newly proposed model,fifteen groups of diodes are fabricated. Measurement shows that the model exactly represents behavior of GaAs PIN diodes under both forward and reversely biased conditions.
基金the National Major Scientific and Technological Special Project of China(No.2012ZX03004008)the Science and Technology Pillar Program of Tianjin(No.11ZCKFGX01400)
文摘A 10-bit 500 kHz low-power successive approximation register(SAR)analog-to-digital converter(ADC)for cryogenic infrared readout circuit is proposed.To improve the simulation accuracy of metal-oxidesemiconductor field-efect transistors(MOSFETs),corresponding modification in device model is presented on the basis of BSIM3v3 with parameter extraction at 77 K.Corresponding timing is adopted in comparator to eliminate the influence caused by abnormal performance of MOSFETs at 77 K.The SAR ADC is fabricated and verified by standard 0.35μm complementary metal oxide semiconductor(CMOS)process.At 77 K,measurement results show that signal to noise and distortion ratio(SNDR)is 54.74 dB and efective number of bits(ENOB)is 8.8 at the sampling rate of 500 kHz.The total circuit consumes 0.6 mW at 3.3 V power supply.
文摘The mathematical modeling of solar cells is essential for any optimization operation of the efficiency or the diagnosis of photovoltaic generator. The photovoltaic module is generally represented by an equivalent circuit whose parameters are experimentally calculated by using the characteristic current-tension, I-V. The precise determination of these parameters stays a challenge for the researchers, making to a big difference in the models and the digital methods dedicated to their characterizations. In the present paper, We are interested to characterize the parameters of single diode and two diodes models, in order to plan the behavior of the photovoltaic generator under real functioning conditions. We developed an identification method of the parameters using Newton Raphson method by using the software Matlab/Simulink. This method is the faster technique which allows the identification of several parameters and can be used in real time applications. The results of the proposed method show an accordance with the experimental and simulated characteristics of photovoltaic generator.
文摘This study focused on the determination and analysis of an accurate analytical model for PIN diode under different bias conditions. This approach employs analytically derived expressions including the variation of the depletion regions in the device to make the used model available over a wide range of testing conditions without remake the parameters extraction procedure. The validity of the proposed extraction procedure has been verified by the very good agreement between simulated and measured current and voltage waveforms reverse recovery at different range of the operation conditions. The model is developed and simulated with the VHDL-AMS language under Ansoft Simplorer®Environment.
文摘碳化硅(SiC)MOSFET器件的短路耐受能力差是阻碍其广泛应用的关键难题,对于国产高压SiC MOSFET器件,其短路保护研发缺乏有力的技术、经验支撑。同时,缺乏快速、准确的仿真模型也是国产高压SiC MOSFET器件应用研发面临的核心问题之一。为此,该文提出一种适用于高压SiC MOSFET器件的、考虑器件实际物理特性的、可准确描述器件短路故障中电流、电压等外特性的行为模型。该行为模型针对高压SiC MOSFET的特点修正沟道电流模型中的电压,并基于元胞层面的电流路径对JFET区及漂移区电阻进行建模。该模型考虑了国产高压SiC MOSFET的实际器件设计、工艺等因素的影响,依据半导体、器件物理计算模型的关键参数,提升模型在短路故障仿真中的精度。并且,该文明确了模型所用参数的提取方法,其中关键参数获取自器件设计环节,建立起器件设计者与应用者之间的桥梁。最后,对国网智能电网研究院有限公司研制的6.5 kV/400 A SiC MOSFET器件开展短路测试实验,仿真结果与实验结果表现出较好的一致性,短路电流关键特征的相对误差小于2.5%,验证了该行为模型的准确性。
