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Effect of Mechanical Treatment Temperature on Electrical Properties and Crystallite Size of PVDF Film 被引量:1
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作者 Ambran Hartono Suparno Satira +3 位作者 Mitra Djamal Ramli Ramli Herman Bahar Edi Sanjaya 《Advances in Materials Physics and Chemistry》 2013年第1期71-76,共6页
Fabrication of PVDF films has been making using Hot Roll Press. Preparation of samples carried out for nine different temperatures. This condition is carried out to see the effect of temperature fabrication on electri... Fabrication of PVDF films has been making using Hot Roll Press. Preparation of samples carried out for nine different temperatures. This condition is carried out to see the effect of temperature fabrication on electrical properties and crystallite size of PVDF films. The electrical properties like as surface resistivity are discussion focus in this paper. Surface resistivity properties of PVDF can be improved by mechanical treatment on the varying film thickness and the temperature. To obtain the diffraction pattern of sample characterization is performed using X-Ray Diffraction. Crystallite size of PVDF films calculate from broadening pattern of X-Ray Diffraction. Furthermore, from the diffraction pattern calculated β fraction and crystallite size, for calculation to determine the crystallite size of the sample by using the Scherrer equation. Has been obtained an increase piezoelectric properties of PVDF films that characterized by increasing β fraction. Have been obtained β fraction increased from 25.4% up to 44% for temperatures of 130°C up to 170°C, respectively. Resistivity value has been obtained at temperature 130°C up to 170°C, decreased from 1.23 × 104 Wm up to 0.21 × 104 Wm respectively. From the experimental results and the calculation of crystallite sizes obtained for the samples with temperature 130°C up to 170°C respectively are increased from 7.2 nm up to 20.54 nm. These results indicate that mechanical treatment caused increase β fraction and decrease surface resistivity. Increasing temperatures will also increase the size of the crystallite of the sample. This happens because with the increasing temperature causes the higher the degree of crystallization of PVDF film sample is formed, so that the crystallite size also increases. 展开更多
关键词 CRYSTALLITE size PVDF ROLL Hot PRESS scherrer Equation Surface RESISTIVITY TEMPERATURE Different XRD
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X射线衍射测定聚烯烃催化剂载体硅胶平均晶粒尺寸
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作者 郑鑫 孟智超 +1 位作者 李晓璐 杜亚明 《炼油与化工》 CAS 2024年第6期54-56,共3页
聚烯烃催化剂载体硅胶平均晶粒尺寸是1项极其重要的质量指标。采用桌面式X-射线衍射仪分别对2种进口和2种国产聚烯烃催化剂载体硅胶原始样品及1种进口和1种国产硅胶研磨试样的平均晶粒尺寸进行了分析,测定范围4.86~5.07 nm,标准偏差(SD... 聚烯烃催化剂载体硅胶平均晶粒尺寸是1项极其重要的质量指标。采用桌面式X-射线衍射仪分别对2种进口和2种国产聚烯烃催化剂载体硅胶原始样品及1种进口和1种国产硅胶研磨试样的平均晶粒尺寸进行了分析,测定范围4.86~5.07 nm,标准偏差(SD或σ)0.13~0.26 nm,相对标准偏差(RSD)2.49%~5.32%,极差0.35~0.89 nm,n=8,能够满足聚烯烃催化剂载体硅胶平均晶粒尺寸分析的所有工艺技术要求。基于该方法,研发了用于聚烯烃催化剂载体硅胶平均晶粒尺寸分析的桌面式专用X-射线衍射仪,可在石化生产行业推广应用。 展开更多
关键词 硅胶 纳米晶粒 平均晶粒尺寸测试 载体 催化剂 聚烯烃 谢勒公式 X-射线衍射 桌面式专用X-射线衍射仪
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镍纳米粉的粒度研究 被引量:3
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作者 王明旭 魏志强 +2 位作者 李年春 赵学福 闫鹏勋 《材料导报》 EI CAS CSCD 北大核心 2006年第F05期166-168,共3页
采用阳极弧放电等离子体方法制备了高纯镍纳米粉末并对其粒度进行了表征。利用X射线衍射法(XRD)测试样品的晶型和粒度,用谢乐Scherrer公式计算颗粒粒度;采用透射电子显微镜(TEM)分析样品的形貌和粒度分布;采用表面吸附仪测定样品的N2吸... 采用阳极弧放电等离子体方法制备了高纯镍纳米粉末并对其粒度进行了表征。利用X射线衍射法(XRD)测试样品的晶型和粒度,用谢乐Scherrer公式计算颗粒粒度;采用透射电子显微镜(TEM)分析样品的形貌和粒度分布;采用表面吸附仪测定样品的N2吸附-脱附等温线,并由BET理论模型计算出样品的比表面积和颗粒粒度。实验结果表明三者测得的值基本一致。 展开更多
关键词 Ni纳米粉 粒度 scherrer公式 TEM法 BET比表面积法
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应用Topas和Eva软件计算纳米材料晶粒尺寸的数值观察 被引量:5
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作者 黎爽 邓平晔 《人工晶体学报》 EI CAS CSCD 北大核心 2018年第4期879-884,共6页
随着纳米材料科学的发展,材料的晶粒尺寸是科研工作者在研发过程中十分重要的数据。Topas和Eva是两种常用的X-射线衍射数据分析软件,都可以进行晶粒尺寸的计算。选取6种具有代表性的高级晶族和中级晶族纳米材料,通过X-射线衍射仪测试获... 随着纳米材料科学的发展,材料的晶粒尺寸是科研工作者在研发过程中十分重要的数据。Topas和Eva是两种常用的X-射线衍射数据分析软件,都可以进行晶粒尺寸的计算。选取6种具有代表性的高级晶族和中级晶族纳米材料,通过X-射线衍射仪测试获得衍射谱,分别应用两种软件对6种材料晶粒尺寸进行计算,发现其结果存在一定差异。为了说明计算结果存在差异的原因,本文详细介绍了两种软件计算晶粒尺寸的方法和步骤,并通过比较说明由于两种软件计算方法不同是产生计算结果差异的直接原因,这对于材料科学工作者在进行相关计算时提供了较好的借鉴以及理论依据。 展开更多
关键词 晶粒尺寸 Topas EVA Rietveld拟合 洛仑兹函数 谢乐公式
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基于微波分光计的谢乐公式验证实验 被引量:9
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作者 庄世豪 顾旻瑜 +2 位作者 杜艾 张志华 方恺 《大学物理》 北大核心 2016年第7期37-41,共5页
利用微波分光计和模型来验证谢乐公式.首先对谢乐公式进行无近似修正,以满足本实验的要求;再使用微波分光计,模仿XRD测量方法,对模型进行测量,对所得结果进行分析后,发现其定性地符合谢乐公式所描述规律;随后利用数据处理软件进行数据处... 利用微波分光计和模型来验证谢乐公式.首先对谢乐公式进行无近似修正,以满足本实验的要求;再使用微波分光计,模仿XRD测量方法,对模型进行测量,对所得结果进行分析后,发现其定性地符合谢乐公式所描述规律;随后利用数据处理软件进行数据处理,计算出所需参数的具体值,代入且定量地验证了谢乐公式的数学表达式,最后对实验中的误差进行分析,得出结论,深入对谢乐公式的理解.本文利用微波和自行构建的模型验证了谢乐公式的正确性以及其模拟Ⅹ射线衍射的可行性,同时丰富了大学物理实验微波分光计项目的教学内容,提高学生构建物理模型的创造性. 展开更多
关键词 微波分光计 谢乐公式 晶粒尺寸 衍射峰宽
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Synthesis and Characterization of Cr Doped ZnO Nanocrystals 被引量:1
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作者 Vishwanath Dattu Mote Vishnu Ramrao Huse Babasaheb Nivrutti Dole 《World Journal of Condensed Matter Physics》 2012年第4期208-211,共4页
Samples of chromium doped ZnO were synthesized using co-precipitation technique at room temperature. Structural and optical properties of Cr doped ZnO samples were investigated by X-ray diffraction technique (XRD and ... Samples of chromium doped ZnO were synthesized using co-precipitation technique at room temperature. Structural and optical properties of Cr doped ZnO samples were investigated by X-ray diffraction technique (XRD and UV-Visible spectroscopy (UV-Vis) respectively. X-ray diffraction (XRD) patterns confirm that the samples have hexagonal (wurtzite) structure with no additional peak which suggests that Cr ions go to the regular Zn sites in the ZnO crystal structure. The lattice constants were calculated using X-ray diffraction data and it is found that lattice parameters decrease with increasing Cr content. The average grain size was calculated using Scherrer’s formula for pure and Cr doped ZnO samples and it is observed that grain size is in the range 11 to17 nm. Band gap of Zn1–xCrxO samples has been evaluated using UV-Vis spectrometer. It is found that the band gap decreases as Cr increases;it is attributed to the s-d and p interactions and the smaller average grain size. It indicates that incorporation of Cr ions into the ZnO matrix. The chemical species of the grown crystals were identified by Fourier transform infrared spectroscopy (FTIR). From FTIR spectra it is observed that IR peaks corresponding to the Zn-O bands. Such results are presented in this paper quantitatively and qualitatively. 展开更多
关键词 WURTZITE Structure AVERAGE GRAIN size scherrer’s FORMULA FTIR Spectra
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Effect of TiO2 Crystallite Diameter on Photocatalytic Water Splitting Rate
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作者 Haruna Banno Ben Kariya +8 位作者 Norifumi Isu Muneaki Ogawa Saeko Miwa Keisuke Sawada Junki Tsuge Shoichiro Imaizumi Hidenori Kato Kyota Tokutake Seiichi Deguchi 《Green and Sustainable Chemistry》 2014年第2期87-94,共8页
The effect of (Pt-loaded)TiO2 crystallite diameter (i.e. Scherrer size) on the photocatalytic water splitting rate was investigated. (Pt-loaded)TiO2 powders with a wide range of crystallite diameters from about 16 to ... The effect of (Pt-loaded)TiO2 crystallite diameter (i.e. Scherrer size) on the photocatalytic water splitting rate was investigated. (Pt-loaded)TiO2 powders with a wide range of crystallite diameters from about 16 to 45 nm with a blank region between about 23 and 41 nm were prepared by various annealing processes from an identical TiO2 powder. Water splitting experiments with these powders were carried out with methanol as an oxidizing sacrificial agent. It was found that the photocatalytic water splitting rate was sensitively affected by the crystallite diameter of the (Pt-loaded)TiO2 powder. More concretely, similar steep improvements of photocatalytic water splitting rates from around 15 and a little over 2 to about 30 μmol·m-2hr-1?were obtained in the two (Pt-loaded)TiO2 crystallite diameters ranging from 16 to 23 and from 41 to 45 nm, respectively. 展开更多
关键词 Photocatalytic WATER SPLITTING TIO2 CRYSTALLITE DIAMETER scherrer size X-Ray Diffraction Critical WATER ANNEAL
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