The in-plane optical anisotropy(IPOA) of c-plane In Ga N/Ga N quantum disks(Qdisks) in nanowires grown on MoS_(2)/Mo and Ti/Mo substrates is investigated using reflectance difference spectroscopy(RDS) at room temperat...The in-plane optical anisotropy(IPOA) of c-plane In Ga N/Ga N quantum disks(Qdisks) in nanowires grown on MoS_(2)/Mo and Ti/Mo substrates is investigated using reflectance difference spectroscopy(RDS) at room temperature. A large IPOA related to defect or impurity states is observed. The IPOA of samples grown on MoS_(2)/Mo is approximately one order of magnitude larger than that of samples grown on Ti/Mo substrates. Numerical calculations based on the envelope function approximation have been performed to analyze the origin of the IPOA. It is found that the IPOA primarily results from the segregation of indium atoms in the In Ga N/Ga N Qdisks. This work highlights the significant influence of substrate materials on the IPOA of semiconductor heterostructures.展开更多
We employed the microscopic reflectance difference spectroscopy （micro-RDS） to determine the layer- number and microscopically image the surface topography of graphene and MoS2 samples. The contrast image shows the ...We employed the microscopic reflectance difference spectroscopy （micro-RDS） to determine the layer- number and microscopically image the surface topography of graphene and MoS2 samples. The contrast image shows the efficiency and reliability of this new clipping technique. As a low-cost, quantifiable, no-contact and non-destructive method, it is not concerned with the characteristic signal of certain materials and can be applied to arbitrary substrates. Therefore it is a perfect candidate for characterizing the thickness of graphene-like two- dimensional materials.展开更多
We have measured the in-plane optical anisotropy （IPOA） of （1120） ZnO （a-plane） on （10]-2） sapphire （r-plane） by reflectance difference spectroscopy （RDS） at room temperature. Giant IPOA has been observed ...We have measured the in-plane optical anisotropy （IPOA） of （1120） ZnO （a-plane） on （10]-2） sapphire （r-plane） by reflectance difference spectroscopy （RDS） at room temperature. Giant IPOA has been observed be- tween the light polarized direction parallel and perpendicular to the c axis of ZnO, since the symmetry of a-plane is C2v. A sharp resonance has been observed near the fundamental band gap, which is induced by the polarization- depend band gap shift. The sharp line shape is attributed to the exciton transition. The spectra fitting and differential spectra indicate the polarization-depend band energies. The giant IPOA is possible enhanced by anisotropy strain along and perpendicular to the c axis in the a-plane.展开更多
基金Project supported by the National Natural Science Foundation of China (Grant Nos. 62074036, 61674038, and 11574302)Foreign Cooperation Project of Fujian Province (Grant No. 2023I0005)+2 种基金Open Research Fund Program of the State Key Laboratory of Low-Dimensional Quantum Physics (Grant No. KF202108)the National Key Research and Development Program (Grant No. 2016YFB0402303)the Foundation of Fujian Provincial Department of Industry and Information Technology of China (Grant No. 82318075)。
文摘The in-plane optical anisotropy(IPOA) of c-plane In Ga N/Ga N quantum disks(Qdisks) in nanowires grown on MoS_(2)/Mo and Ti/Mo substrates is investigated using reflectance difference spectroscopy(RDS) at room temperature. A large IPOA related to defect or impurity states is observed. The IPOA of samples grown on MoS_(2)/Mo is approximately one order of magnitude larger than that of samples grown on Ti/Mo substrates. Numerical calculations based on the envelope function approximation have been performed to analyze the origin of the IPOA. It is found that the IPOA primarily results from the segregation of indium atoms in the In Ga N/Ga N Qdisks. This work highlights the significant influence of substrate materials on the IPOA of semiconductor heterostructures.
基金supported by the State Key Development Program for Basic Research of China(Nos.2012CB921304,2013CB632805,2012CB619306)the National Natural Science Foundation of China(No.61474114)
文摘We employed the microscopic reflectance difference spectroscopy （micro-RDS） to determine the layer- number and microscopically image the surface topography of graphene and MoS2 samples. The contrast image shows the efficiency and reliability of this new clipping technique. As a low-cost, quantifiable, no-contact and non-destructive method, it is not concerned with the characteristic signal of certain materials and can be applied to arbitrary substrates. Therefore it is a perfect candidate for characterizing the thickness of graphene-like two- dimensional materials.
基金Project supported by the State Key Development Program for Basic Research of China(Nos.2013CB619306,2012CB921304)the National Natural Science Foundation of China(No.60990313)the National High Technology Research and Development Program of China(No.2011AA03A101)
文摘We have measured the in-plane optical anisotropy （IPOA） of （1120） ZnO （a-plane） on （10]-2） sapphire （r-plane） by reflectance difference spectroscopy （RDS） at room temperature. Giant IPOA has been observed be- tween the light polarized direction parallel and perpendicular to the c axis of ZnO, since the symmetry of a-plane is C2v. A sharp resonance has been observed near the fundamental band gap, which is induced by the polarization- depend band gap shift. The sharp line shape is attributed to the exciton transition. The spectra fitting and differential spectra indicate the polarization-depend band energies. The giant IPOA is possible enhanced by anisotropy strain along and perpendicular to the c axis in the a-plane.
