The application of metamorphic testing(MT)on automatic program repair(APR-MT)is used to generate a patch without test oracles by examining whether the input metamorphic relation(MR)is satisfied or not.However,the deli...The application of metamorphic testing(MT)on automatic program repair(APR-MT)is used to generate a patch without test oracles by examining whether the input metamorphic relation(MR)is satisfied or not.However,the delivered patch is plausible since it may satisfy the input MR but violate other MRs.This inspires us to propose an improved approach to enhance the effectiveness of APR-MT with metamorphic relation group.Ourapproach involves three major steps.First,we formally define the repair process of APR-MT by building the model of automatic program repair and metamorphic testing separately.Then,we propose the advanced model of automatic program repair based on metamorphic relation group,named METARO^(3),which takes several MRs as input while only one MR is used in APR-MT.We additionally present two kinds of selection strategies to rank MRs in descending order of the fault detection capability,which helps shorten the repair time of finding a patch.To demonstrate the feasibility and procedure of our approach,an illustration example was conducted.The results show that METARO^(3) can improve the effectiveness of APR-MT significantly.展开更多
Advancements in semiconductor technology are making gate-level test generation more challenging. This is because a large amount of detailed structural information must be processed in the search process of automatic t...Advancements in semiconductor technology are making gate-level test generation more challenging. This is because a large amount of detailed structural information must be processed in the search process of automatic test pattern generation (ATPG). In addition, ATPG needs to deal with new defects caused by process variation when IC is shrinking. To reduce the computation effort of ATPG, test generation could be started earlier at higher abstraction level, which is in line with top-down design methodology that has become more popular nowadays. In this research, we employ Chen’s high-level fault model in the high-level ATPG. Besides shorter ATPG time as shown in many previous works, our study showed that high-level ATPG also contributes to test compaction. This is because most of the high-level faults correlate with the gate-level collapsed faults especially at input/output of the modules in a circuit. The high-level ATPG prototype used in our work is mainly composed by constraint-driven test generation engine and fault simulation engine. Experimental result showed that more reduced/compact test set can be generated from the high-level ATPG.展开更多
Purpose Hundreds of digital beam position monitor processors(DBPM)are required to be produced during the construction of projects such as High Energy Photon Source(HEPS)and the upgrade project of the Beijing Electron ...Purpose Hundreds of digital beam position monitor processors(DBPM)are required to be produced during the construction of projects such as High Energy Photon Source(HEPS)and the upgrade project of the Beijing Electron Positron Collider(BEPCII),which brings great challenges to the test work.In order to achieve accurate,fast,and complete mass production tests of DBPMs,an automatic test system(ATS)has been developed in this article.Methods According to the test items of DBPM,the standardized testing softwareflow is designed based on virtual instru-ment program control technology and experimental physics and industrial control system(EPICS),which realize automatic adjustment of test parameters and automatic acquisition of test result data.Results and conclusions The ATS can realize one-button testing of channel coefficients,channel linearity,attenuator linearity,beam current dependence(BCD)and sampling signal-to-noise ratio(SNR),and generate test reports.The total test time is less than 3 minutes,which is significantly more efficient compared to manual testing.More than 90 BEPCII DBPMs has been tested by this ATS in the lab.The test results proved that such a system could automatically recognize defective products and satisfy the requirements of mass testing.展开更多
针对当前自动测试系统(ATS,Automatic Test System)开发技术存在的不足,构建了一个ATS通用开发平台.该平台对ATS软硬件进行联合设计,用户只需通过接口输入被测设备信息及测试策略流程,平台即可自动完成大部分软硬件设计工作,包括仪器选...针对当前自动测试系统(ATS,Automatic Test System)开发技术存在的不足,构建了一个ATS通用开发平台.该平台对ATS软硬件进行联合设计,用户只需通过接口输入被测设备信息及测试策略流程,平台即可自动完成大部分软硬件设计工作,包括仪器选型、适配器设计、测试程序生成等.设计结果会传递到平台提供的ATS运行环境,供用户进行被测设备的测试、故障诊断.经实例验证,ATS软硬件联合自动设计技术可缩短开发周期,降低开发成本,提高设计的标准化、通用化程度.展开更多
基金The work was supported by a grant from National Natural Science Foundation of China(No.61772423).
文摘The application of metamorphic testing(MT)on automatic program repair(APR-MT)is used to generate a patch without test oracles by examining whether the input metamorphic relation(MR)is satisfied or not.However,the delivered patch is plausible since it may satisfy the input MR but violate other MRs.This inspires us to propose an improved approach to enhance the effectiveness of APR-MT with metamorphic relation group.Ourapproach involves three major steps.First,we formally define the repair process of APR-MT by building the model of automatic program repair and metamorphic testing separately.Then,we propose the advanced model of automatic program repair based on metamorphic relation group,named METARO^(3),which takes several MRs as input while only one MR is used in APR-MT.We additionally present two kinds of selection strategies to rank MRs in descending order of the fault detection capability,which helps shorten the repair time of finding a patch.To demonstrate the feasibility and procedure of our approach,an illustration example was conducted.The results show that METARO^(3) can improve the effectiveness of APR-MT significantly.
文摘Advancements in semiconductor technology are making gate-level test generation more challenging. This is because a large amount of detailed structural information must be processed in the search process of automatic test pattern generation (ATPG). In addition, ATPG needs to deal with new defects caused by process variation when IC is shrinking. To reduce the computation effort of ATPG, test generation could be started earlier at higher abstraction level, which is in line with top-down design methodology that has become more popular nowadays. In this research, we employ Chen’s high-level fault model in the high-level ATPG. Besides shorter ATPG time as shown in many previous works, our study showed that high-level ATPG also contributes to test compaction. This is because most of the high-level faults correlate with the gate-level collapsed faults especially at input/output of the modules in a circuit. The high-level ATPG prototype used in our work is mainly composed by constraint-driven test generation engine and fault simulation engine. Experimental result showed that more reduced/compact test set can be generated from the high-level ATPG.
基金funded by the Foundation ofYouth Innovation Promotion Association,CAS(No.Y202005)the Major achievements cultivation project of major scientific and technological infrastructure,CAS(No.NE01G74Y2)the National Natural Science Foundation of China(No.11805221).
文摘Purpose Hundreds of digital beam position monitor processors(DBPM)are required to be produced during the construction of projects such as High Energy Photon Source(HEPS)and the upgrade project of the Beijing Electron Positron Collider(BEPCII),which brings great challenges to the test work.In order to achieve accurate,fast,and complete mass production tests of DBPMs,an automatic test system(ATS)has been developed in this article.Methods According to the test items of DBPM,the standardized testing softwareflow is designed based on virtual instru-ment program control technology and experimental physics and industrial control system(EPICS),which realize automatic adjustment of test parameters and automatic acquisition of test result data.Results and conclusions The ATS can realize one-button testing of channel coefficients,channel linearity,attenuator linearity,beam current dependence(BCD)and sampling signal-to-noise ratio(SNR),and generate test reports.The total test time is less than 3 minutes,which is significantly more efficient compared to manual testing.More than 90 BEPCII DBPMs has been tested by this ATS in the lab.The test results proved that such a system could automatically recognize defective products and satisfy the requirements of mass testing.
文摘针对当前自动测试系统(ATS,Automatic Test System)开发技术存在的不足,构建了一个ATS通用开发平台.该平台对ATS软硬件进行联合设计,用户只需通过接口输入被测设备信息及测试策略流程,平台即可自动完成大部分软硬件设计工作,包括仪器选型、适配器设计、测试程序生成等.设计结果会传递到平台提供的ATS运行环境,供用户进行被测设备的测试、故障诊断.经实例验证,ATS软硬件联合自动设计技术可缩短开发周期,降低开发成本,提高设计的标准化、通用化程度.
