An on-chip power-on reset circuit with a brown-out detection capability is implemented in a 0. 18 μm CMOS. A pF-order capacitor is charged with a proportional-to-absolute-temperature （PTAT） current from a bandgap r...An on-chip power-on reset circuit with a brown-out detection capability is implemented in a 0. 18 μm CMOS. A pF-order capacitor is charged with a proportional-to-absolute-temperature （PTAT） current from a bandgap reference with limited loop bandwidth and slow start-up feature, to generate a reset signal with high robustness and wide-range supply rise time. An embedded brown- out detector based on complementary voltage-to-current （V-to-I） conversion and current comparison can accurately respond to the brown-out event with high robustness over process and temperature when the supply is lower than 1.5 V and the brown-out duration is longer than 0. 1 ms. The presented design with embedded offset voltage cancellation consumes a quiescent current of 8. 5 μA from a 1. 8 V supply and works over ambient temperature of -40° to 120°.展开更多
Single event latch-up (SEL) is a significant issue for electronics design in space application, which would cause large currents in electronic devices, and may lead to burning out of devices. A new monitoring circuit ...Single event latch-up (SEL) is a significant issue for electronics design in space application, which would cause large currents in electronic devices, and may lead to burning out of devices. A new monitoring circuit based on current-comparing method is designed to protect the electronics away from SEL’s damage in radiation environment. The response time of protection circuit has been analyzed. The signal simulation results indicated that the operating time of the SEL protection circuit is dependent on the action time of current comparator and system application recovery time. The function of the monitoring circuit protection device away from SEL’s damage has validated through experiment at last.展开更多
According to the parameters and applications of laser diode （LD）, three protection circuits were designed： the time-delay soft-start protection circuit, the power-on impulse protection circuit and the limit-current...According to the parameters and applications of laser diode （LD）, three protection circuits were designed： the time-delay soft-start protection circuit, the power-on impulse protection circuit and the limit-current protection circuit. In this article, the structure and the principle of every protection circuit have been detailed. From several tests and feedbacks from customers, the expected goals have been completed.展开更多
基金Supported by the National Natural Science Foundation of China(6130603761201182)
文摘An on-chip power-on reset circuit with a brown-out detection capability is implemented in a 0. 18 μm CMOS. A pF-order capacitor is charged with a proportional-to-absolute-temperature （PTAT） current from a bandgap reference with limited loop bandwidth and slow start-up feature, to generate a reset signal with high robustness and wide-range supply rise time. An embedded brown- out detector based on complementary voltage-to-current （V-to-I） conversion and current comparison can accurately respond to the brown-out event with high robustness over process and temperature when the supply is lower than 1.5 V and the brown-out duration is longer than 0. 1 ms. The presented design with embedded offset voltage cancellation consumes a quiescent current of 8. 5 μA from a 1. 8 V supply and works over ambient temperature of -40° to 120°.
文摘Single event latch-up (SEL) is a significant issue for electronics design in space application, which would cause large currents in electronic devices, and may lead to burning out of devices. A new monitoring circuit based on current-comparing method is designed to protect the electronics away from SEL’s damage in radiation environment. The response time of protection circuit has been analyzed. The signal simulation results indicated that the operating time of the SEL protection circuit is dependent on the action time of current comparator and system application recovery time. The function of the monitoring circuit protection device away from SEL’s damage has validated through experiment at last.
基金the National Natural Science Foundation of China （60372061）.
文摘According to the parameters and applications of laser diode （LD）, three protection circuits were designed： the time-delay soft-start protection circuit, the power-on impulse protection circuit and the limit-current protection circuit. In this article, the structure and the principle of every protection circuit have been detailed. From several tests and feedbacks from customers, the expected goals have been completed.
