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Comparison of time-related electrical properties of PN junctions and Schottky diodes for Zn O-based betavoltaic batteries 被引量:2
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作者 Xiao-Yi Li Jing-Bin Lu +4 位作者 Ren-Zhou Zheng Yu Wang Xu Xu Yu-Min Liu Rui He 《Nuclear Science and Techniques》 SCIE CAS CSCD 2020年第2期55-66,共12页
Schottky diodes and PN junctions were utilized as energy converting structures in ZnO-based betavoltaic batteries,in which 0.101121 Ci 63Ni was selected as the beta source.The time-related electrical properties were o... Schottky diodes and PN junctions were utilized as energy converting structures in ZnO-based betavoltaic batteries,in which 0.101121 Ci 63Ni was selected as the beta source.The time-related electrical properties were obtained using Monte Carlo simulations.For the n-type ZnO,the Pt/ZnO Schottky diode had the highest energy conversion efficiency,and the Ni/ZnO Schottky diode had the largest Isc.The overall electrical performance of PN junctions is better than that of Schottky diodes.The lifetimes of Pt/ZnO and Ni/ZnO are longer than for other Schottky devices,coming close to those of PN junctions.Considering that Schottky diodes are easier to fabricate and independent of p-type semiconductors,Pt/ZnO and Ni/ZnO diodes offer alternatives to PN-junction-based betavoltaic batteries. 展开更多
关键词 Beta voltaic effect Zinc oxide Time-related properties pn junction Schottky diode Monte Carlo simulation
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Influence of a cylindrical PN junction on the propagation characteristics of shear cylindrical waves in a layered piezoelectric semiconductor concentric cylinder structure
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作者 Ruiyang LIU Xiao GUO +2 位作者 Chunyu XU Zibo WEI Chenxi DING 《Applied Mathematics and Mechanics(English Edition)》 2025年第8期1551-1570,I0024-I0026,共23页
This paper theoretically investigates the influence of a cylindrical PN junction on the propagation characteristics of shear cylindrical waves(SCWs)in an infinitely long piezoelectric semiconductor(PS)concentric cylin... This paper theoretically investigates the influence of a cylindrical PN junction on the propagation characteristics of shear cylindrical waves(SCWs)in an infinitely long piezoelectric semiconductor(PS)concentric cylinder structure.This PS concentric cylinder structure is composed of three regions:an inner PS cylinder,an outer PS cylindrical shell,and a cylindrical PN junction at the interface between the two aforementioned regions.First,the basic equations of the PS concentric cylinder structure are derived,taking into account the coupling of the mechanical displacement,electric potential,and charge carrier perturbation in the cylindrical coordinate system.Next,a mathematical model for the SCWs in this PS concentric cylinder structure is established,utilizing the spectral method and considering the physical characteristics of the cylindrical PN junction.Finally,the dispersion and attenuation curves of the SCWs are numerically calculated to discuss the influence of the interface effect resulting from the cylindrical PN junction.It is found that the existence of a cylindrical PN junction can either reduce or enhance the mechanical-to-electrical energy conversion,which is closely related to the doping mode,doping concentration,and curvature radius of the cylindrical interface.A reasonable design of the aforementioned parameters can optimize the wave motion in acoustic equipment formed by PS media with different frequencies or wavelengths.The construction and resolution of the mathematical model as well as the analysis of physical mechanisms can offer theoretical guidance for improving the efficiency of energy conversion from mechanical energy to electrical energy and optimizing the acoustic performance of energy harvesting devices. 展开更多
关键词 piezoelectric semiconductor(PS) cylindrical pn junction layered cylinder structure dispersion relation spectral method
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Analysis of the electromechanical coupling characteristics of piezoelectric semiconductor PN junction shell structures
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作者 Tiqing WANG Feng ZHU +4 位作者 Peng LI Zelin XU Tingfeng MA I.KUZNETSOVA Zhenghua QIAN 《Applied Mathematics and Mechanics(English Edition)》 2025年第6期1167-1186,共20页
Based on the nonlinear drift-diffusion(NLDD)model,the coupled behavior between the mechanical and electrical fields in piezoelectric semiconductor(PS)PN junctions under two typical loading conditions is investigated.T... Based on the nonlinear drift-diffusion(NLDD)model,the coupled behavior between the mechanical and electrical fields in piezoelectric semiconductor(PS)PN junctions under two typical loading conditions is investigated.The governing equations for the general shell structure of the PS PN junction are derived within the framework of virtual work principles and charge continuity conditions.The distributions of the electromechanical coupling field are obtained by the Fourier series expansion and the differential quadrature method(DQM),and the nonlinearity is addressed with the iterative method.Several numerical examples are presented to investigate the effects of mechanical loading on the charge carrier transport characteristics.It is found that the barrier height of the heterojunction can be effectively modulated by mechanical loading.Furthermore,a nonlinearity index is introduced to quantify the influence of nonlinearity in the model.It is noted that,when the concentration difference between the two sides is considerable,the nonlinear results differ significantly from the linear results,thereby necessitating the adoption of the NLDD model. 展开更多
关键词 piezoelectric semiconductor(PS) pn junction shell structures nonlinear drift-diffusion(NLDD)model potential barrier(well)
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Dispersion,attenuation,and bandgap of in-plane coupled Bloch waves in piezoelectric semiconductor phononic crystal with PN junction
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作者 Zibo WEI Peijun WEI +1 位作者 Chunyu XU Xiao GUO 《Applied Mathematics and Mechanics(English Edition)》 2025年第5期813-830,共18页
In this paper,the dispersion,attenuation,and bandgap characteristics of in-plane coupled Bloch waves in one-dimensional piezoelectric semiconductor(PSC)phononic crystals are investigated,emphasizing the influence of p... In this paper,the dispersion,attenuation,and bandgap characteristics of in-plane coupled Bloch waves in one-dimensional piezoelectric semiconductor(PSC)phononic crystals are investigated,emphasizing the influence of positive-negative(PN)junctions.Unlike piezoelectric phononic crystals,the coupled Bloch waves in PSC phononic crystals are attenuated due to their semiconductor properties,and thus the solution of Bloch waves becomes more complicated.The transfer matrix of the phononic crystal unit cell is obtained using the state transfer equation.By applying the Bloch theorem for periodic structures,the dispersion relation of the coupled Bloch waves is derived,and the dispersion,attenuation,and bandgap are obtained in the complex wave number domain.It is found that the influence of the PN junction cannot be neglected.Moreover,the effects of the PN junction under different apparent wave numbers and steady-state carrier concentrations are provided.This indicates the feasibility of adjusting the propagation characteristics of Bloch waves through the regulation of the PN heterojunction. 展开更多
关键词 piezoelectric semiconductor(PSC) phononic crystal positive-negative(pn)junction dispersion and attenuation carrier field transfer matrix
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Electrical nonlinearity in silicon modulators based on reversed PN junctions
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作者 SHENG YU TAO CHU 《Photonics Research》 SCIE EI 2017年第2期124-128,共5页
The electrical nonlinearity of silicon modulators based on reversed PN junctions was found to severely limit the linearity of the modulators.This effect,however,was inadvertently neglected in previous studies.Consider... The electrical nonlinearity of silicon modulators based on reversed PN junctions was found to severely limit the linearity of the modulators.This effect,however,was inadvertently neglected in previous studies.Considering the electrical nonlinearity in simulation,a 32.2 dB degradation in the CDR3(i.e.,the suppression ratio between the fundamental signal and intermodulation distortion)of the modulator was observed at a modulation speed of 12 GHz,and the spurious free dynamic range was simultaneously degraded by 17.4 dB.It was also found that the linearity of the silicon modulator could be improved by reducing the series resistance of the PN junction.The frequency dependence of the linearity due to the electrical nonlinearity was also investigated. 展开更多
关键词 pn Electrical nonlinearity in silicon modulators based on reversed pn junctions SFDR CDR MZM IMD EN
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Two-dimensional complementary gate-programmable PN junctions for reconfigurable rectifier circuit 被引量:3
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作者 Zhe Sheng Yue Wang +6 位作者 Wennan Hu Haoran Sun Jianguo Dong Rui Yu David Wei Zhang Peng Zhou Zengxing Zhang 《Nano Research》 SCIE EI CSCD 2023年第1期1252-1258,共7页
The unique features of ambipolar two-dimensional materials open up a great opportunity to build gate-programmable devices for reconfigurable circuit applications,e.g.,PN junctions for rectifier circuits.However,curren... The unique features of ambipolar two-dimensional materials open up a great opportunity to build gate-programmable devices for reconfigurable circuit applications,e.g.,PN junctions for rectifier circuits.However,current-reported rectifier circuits usually consist of one gate-programmable PN junction as the rectifier and one resistor as the load,which are not conductive to voltage output and large-scale integration.Here we propose an approach of complementary gate-programmable PN junctions to assemble reconfigurable rectifier circuit,which include two symmetric back-to-back black phosphorus(BP)/hexagonal boron nitride(h-BN)/graphene heterostructured semi-gate field-effect transistors(FETs)and perform complementary NP and PN junction like complementary metal-oxide-semiconductor(CMOS)circuit.The investigation exhibits that the circuit can effectively reconfigure the circuit with/without rectifying ability,and can process alternating current(AC)signals with the frequency prior 1 KHz and reconfiguration speed up to 25μs.We also achieve the reconfigurable rectifier circuit memory via complementary semi-floating gate FETs configuration.The complementary configuration here should be of low output impedance and low static power consumption,being beneficial for effective voltage output and large-scale integration. 展开更多
关键词 two-dimensional(2D)material pn junction rectifier circuit complementary configuration
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Formation of single crystalline tellurium supersaturated silicon pn junctions by ion implantation followed by pulsed laser melting
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作者 王熙元 黄永光 +3 位作者 刘德伟 朱小宁 崔晓 朱洪亮 《Journal of Semiconductors》 EI CAS CSCD 2013年第6期16-20,共5页
Pn junctions based on single crystalline tellurium supersaturated silicon were formed by ion implantation followed by pulsed laser melting(PLM).P type silicon wafers were implanted with 245 keV ^126Te^+ to a dose o... Pn junctions based on single crystalline tellurium supersaturated silicon were formed by ion implantation followed by pulsed laser melting(PLM).P type silicon wafers were implanted with 245 keV ^126Te^+ to a dose of 2×10^15 ions/cm^2,after a PLM process(248 nm,laser fluence of 0.30 and 0.35 J/cm^2,1-5 pulses,duration 30 ns),an n^+ type single crystalline tellurium supersaturated silicon layer with high carrier density(highest concentration 4.10×10^19 cm^3,three orders of magnitude larger than the solid solution limit) was formed,it shows high broadband optical absorption from 400 to 2500 nm.Current-voltage measurements were performed on these diodes under dark and one standard sun(AM 1.5),and good rectification characteristics were observed.For present results,the samples with 4-5 pulses PLM are best. 展开更多
关键词 tellurium supersaturated silicon pn junction strong sub-band-gap optical absorption ion implantation pulsed laser melting
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Novel Substrate pn Junction Isolation for RF Integrated Inductors on Silicon 被引量:5
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作者 刘畅 陈学良 严金龙 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2001年第12期1486-1489,共4页
A new method for reducing the substrate rated losses of integrated spiral inductors is presented.The method is to block the eddy currents induced by spiral inductors by directly forming pn junction isolation in the S... A new method for reducing the substrate rated losses of integrated spiral inductors is presented.The method is to block the eddy currents induced by spiral inductors by directly forming pn junction isolation in the Si substrate. The substrate pn junction can be realized by using the standard silicon technologies without any additional processing steps.Integrated inductors on silicon are designed and fabricated. S parameters of the inductor based equivalent circuit are investigated and the inductor parameters are calculated.The impacts of the substrate pn junction isolation on the inductor quality factor are studied.The experimental results show that substrate pn junction isolation in certain depth has achieved a significant improvement.At 3GHz,the substrate pn junction isolation increases the inductor quality factor by 40%. 展开更多
关键词 Si integrated inductor quality factor eddy current pn junction isolation
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Effect of the Transient Response in Si/Ge Parallelizing PN Junction 被引量:10
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作者 Weiqi HUANGt and Chaogang CHEN(Department of Physics, Guizhou Educational College, Guiyan 550003, China)Ergang CHEN(Department of Physics, Yunnan University, Kunming 650091, China)To whom correspondence should be addressed 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 1999年第4期383-383,共1页
There are some new results about photovoltaic transient response in the new effect. We suggest a theoretical model to explain the effect reasonably. The theoretical calculation results agree with that in experiments.
关键词 pn SI Ge Effect of the Transient Response in Si/Ge Parallelizing pn Junction
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Electromechanical Fields Near a Circular PN Junction Between Two Piezoelectric Semiconductors 被引量:8
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作者 Yixun Luo Ruoran Cheng +2 位作者 Chunli Zhang Weiqiu Chen Jiashi Yang 《Acta Mechanica Solida Sinica》 SCIE EI CSCD 2018年第2期127-140,共14页
We study electromechanical fields near the interface between a circular piezoelectric semiconductor cylinder and another piezoelectric semiconductor in which it is embedded. The cylinder is p-doped. The surrounding ma... We study electromechanical fields near the interface between a circular piezoelectric semiconductor cylinder and another piezoelectric semiconductor in which it is embedded. The cylinder is p-doped. The surrounding material is n-doped. The phenomenological theory of piezoelectric semiconductors consisting of the equations of piezoelectricity and the conservation of charge for holes and electrons is used. The theory is linearized for small carrier concentration perturbations. An analytical solution is obtained, showing the formation of a PN junction near the interface. Various electromechanical fields associated with the junction are calculated. The effects of a few physical parameters are examined. 展开更多
关键词 Piezoelectric semiconductors CYLINDER Carriers pn junction Electromechanical coupling
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Fabrication and electrical properties of axial and radial GaAs nanowire pn junction diode arrays
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作者 李军帅 张霞 +5 位作者 颜鑫 陈雄 李亮 崔建功 黄永清 任晓敏 《Chinese Physics B》 SCIE EI CAS CSCD 2014年第12期555-558,共4页
We report on the fabrications and characterizations of axial and radial Ga As nanowire pn junction diode arrays.The nanowires are grown on n-doped Ga As(111)B substrates using the Au-catalyzed vapor–liquid–solid m... We report on the fabrications and characterizations of axial and radial Ga As nanowire pn junction diode arrays.The nanowires are grown on n-doped Ga As(111)B substrates using the Au-catalyzed vapor–liquid–solid mechanism by metal–organic chemical vapor deposition(MOCVD). Diethyl–zinc and silane are used as p- and n-type dopant precursors,respectively. Both the axial and radial diodes exhibit diode-like J–V characteristics and have similar performances under forward bias. Under backward bias, the axial diode has a large leakage current, which is attributed to the bending of the pn junction interface induced by two doping mechanisms in Au-catalyzed nanowires. The low leakage current and high rectification ratio make the radial diode more promising in electrical and optoelectronic devices. 展开更多
关键词 pn junction diode Ga As nanowire MOCVD
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Origin of anomalous enhancement of the absorption coefficient in a PN junction
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作者 Xiansheng Tang Baoan Sun +9 位作者 Chen Yue Xinxin Li Junyang Zhang Zhen Deng Chunhua Du Wenxin Wang Haiqiang Jia Yang Jiang Weihua Wang Hong Chen 《Chinese Physics B》 SCIE EI CAS CSCD 2021年第9期547-551,共5页
The absorption coefficient is usually considered as a constant for certain materials at the given wavelength.However,recent experiments demonstrated that the absorption coefficient could be enhanced a lot by the PN ju... The absorption coefficient is usually considered as a constant for certain materials at the given wavelength.However,recent experiments demonstrated that the absorption coefficient could be enhanced a lot by the PN junction.The absorption coefficient varies with the thickness of the intrinsic layer in a PIN structure.Here,we interpret the anomalous absorption coefficient from the competition between recombination and drift for non-equilibrium carriers.Based on the Fokker-Planck theory,a non-equilibrium statistical model that describes the relationship between absorption coefficient and material thickness has been proposed.It could predict the experimental data well.Our results can give new ideas to design photoelectric devices. 展开更多
关键词 pn junction absorption coefficient non-equilibrium statistical model
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Study on Photocapacitance in PN Junction of High Resistivity P-type Silicon
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作者 CHEN Jie (Hangzhou Institute of Appl. Eng. Tech.,Hangzhou 310012,CHN) 《Semiconductor Photonics and Technology》 CAS 1998年第3期193-195,共3页
The PN junction photodiode is fabricated with high resistivity P-type silicon ( ρ =12 000 Ω·cm).The experimental C-V curves with and without laser radiation were measured.The relative change of capacitanc... The PN junction photodiode is fabricated with high resistivity P-type silicon ( ρ =12 000 Ω·cm).The experimental C-V curves with and without laser radiation were measured.The relative change of capacitance can be greater than 100%,which is much greater than the relative change for low resistivity P-type silicon.The relative change of capacitance with and without laser radiation at zero bias is 121.7%. 展开更多
关键词 PHOTOCAPACITANCE Photodiodes pn Junction Semiconductor Photoelectric Devices
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Diamond-based electron emission:Structure,properties and mechanisms
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作者 Liang-Xue Gu Kai Yang +10 位作者 Yan Teng Wei-Kang Zhao Geng-You Zhao Kang-Kang Fan Bo Feng Rong Zhang You-Dou Zheng Jian-Dong Ye Shun-Ming Zhu Kun Tang Shu-Lin Gu 《Chinese Physics B》 SCIE EI CAS CSCD 2024年第9期165-177,共13页
Diamond has an ultrawide bandgap with excellent physical properties,such as high critical electric field,excellent thermal conductivity,high carrier mobility,etc.Diamond with a hydrogen-terminated(H-terminated)surface... Diamond has an ultrawide bandgap with excellent physical properties,such as high critical electric field,excellent thermal conductivity,high carrier mobility,etc.Diamond with a hydrogen-terminated(H-terminated)surface has a negative electron affinity(NEA)and can easily produce surface electrons from valence or trapped electrons via optical absorption,thermal heating energy or carrier transport in a PN junction.The NEA of the H-terminated surface enables surface electrons to emit with high efficiency into the vacuum without encountering additional barriers and promotes further development and application of diamond-based emitting devices.This article reviews the electron emission properties of H-terminated diamond surfaces exhibiting NEA characteristics.The electron emission is induced by different physical mechanisms.Recent advancements in electron-emitting devices based on diamond are also summarized.Finally,the current challenges and future development opportunities are discussed to further develop the relevant applications of diamond-based electronemitting devices. 展开更多
关键词 DIAMOND negative electron affinity(NEA) pn junction electron emission
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Design,preparation,and characterization of a novel ZnO/CuO/Al energetic diode with dual functionality:Logic and destruction
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作者 Jialu Yang Jiaheng Hu +3 位作者 Yinghua Ye Jianbing Xu Yan Hu Ruiqi Shen 《Defence Technology(防务技术)》 SCIE EI CAS CSCD 2024年第4期57-68,共12页
Self-destructing chips have promising applications for securing data.This paper proposes a new concept of energetic diodes for the first time,which can be used for self-destructive chips.A simple two-step electrochemi... Self-destructing chips have promising applications for securing data.This paper proposes a new concept of energetic diodes for the first time,which can be used for self-destructive chips.A simple two-step electrochemical deposition method is used to prepare ZnO/CuO/Al energetic diode,in which N-type ZnO and P-type CuO are constricted to a PN junction.This paper comprehensively discusses the material properties,morphology,semiconductor characteristics,and exploding performances of the energetic diode.Experimental results show that the energetic diode has typical rectification with a turn-on voltage of about 1.78 V and a reverse leakage current of about 3×10^(-4)A.When a constant voltage of 70 V loads to the energetic diode in the forward direction for about 0.14 s or 55 V loads in the reverse direction for about 0.17 s,the loaded power can excite the energetic diode exploding and the current rises to about100 A.Due to the unique performance of the energetic diode,it has a double function of rectification and explosion.The energetic diode can be used as a logic element in the normal chip to complete the regular operation,and it can release energy to destroy the chip accurately. 展开更多
关键词 Energetic diode ZnO—CuO—Al thermite ZnO/CuO pn junction Electrical explosion performance Self-destructing chips
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Non-contact and nanometer-scale measurement of PN junction depth buried in Si wafers using terahertz emission spectroscopy
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作者 Fumikazu Murakami Shinji Ueyama +8 位作者 Kenji Suzuki Ingi Kim Inkeun Baek Sangwoo Bae Dougyong Sung Myungjun Lee Sungyoon Ryu Yusin Yang Masayoshi Tonouchi 《Light(Science & Applications)》 2025年第8期2279-2288,共10页
Buried channel array transistors enable fast and high-density integrated devices.The depth of the PN junction and carrier dynamics at the depletion layer in silicon wafers have a crucial influence on their performance... Buried channel array transistors enable fast and high-density integrated devices.The depth of the PN junction and carrier dynamics at the depletion layer in silicon wafers have a crucial influence on their performance and reliability.Therefore,rapid and non-contact/non-destructive inspection tools are necessary to accelerate the semiconductor industry.Despite the great efforts in this field,realizing a technique to probe the junction depth and carrier dynamics at the PN junction inside wafers remains challenging.Herein,we propose a new approach to access PN junctions embedded in wafers using terahertz(THz)emission spectroscopy.THz emission measurements and simulations demonstrate that the amplitude and polarity of THz emissions reflect the junction depth and carrier dynamics at the PN junctions.It allows us to evaluate the junction depth non-destructively with nanometer-scale accuracy,surpassing the limits of traditional techniques.Laser-induced THz emission spectroscopy is a promising method for the sensitive and non-contact/non-destructive evaluation of Si wafers and will benefit the modern semiconductor industry. 展开更多
关键词 terahertz emission spectroscopy integrated devicesthe buried channel array transistors depletion layer pn junction silicon wafers depth measurement probe junction depth carrier dynamics
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A Novel Capacitive Pressure Sensor 被引量:7
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作者 黄晓东 黄见秋 +1 位作者 秦明 黄庆安 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2008年第3期428-432,共5页
A novel capacitive pressure sensor is presented, whose sensing structure is a solid-state capacitor consisting of three square membranes with Al/SiO2/n-type silicon. It was fabricated using pn junction self-stop etchi... A novel capacitive pressure sensor is presented, whose sensing structure is a solid-state capacitor consisting of three square membranes with Al/SiO2/n-type silicon. It was fabricated using pn junction self-stop etching combined with adhesive bonding,and only three masks were used during the process. Sensors with side lengths of 1000,1200,and 1400μm were fabricated,showing sensitivity of 1.8,2.3, and 3.6fF/hPa over the range of 410~ 1010hPa, respectively. The sensi- tivity of the sensor with a side length of 1500μm is 4. 6fF/hPa,the nonlinearity is 6. 4% ,and the max hysteresis is 3.6%. The results show that permittivity change plays an important part in the capacitance change. 展开更多
关键词 capacitive pressure senor ELECTROSTRICTION pn junction self-stop etching adhesive bonding LINEARITY
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Ultra-low specific on-resistance high-voltage vertical double diffusion metal–oxide–semiconductor field-effect transistor with continuous electron accumulation layer 被引量:1
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作者 马达 罗小蓉 +3 位作者 魏杰 谭桥 周坤 吴俊峰 《Chinese Physics B》 SCIE EI CAS CSCD 2016年第4期450-455,共6页
A new ultra-low specific on-resistance (Ron,sp) vertical double diffusion metal-oxide-semiconductor field-effect tran- sistor (VDMOS) with continuous electron accumulation (CEA) layer, denoted as CEA-VDMOS, is p... A new ultra-low specific on-resistance (Ron,sp) vertical double diffusion metal-oxide-semiconductor field-effect tran- sistor (VDMOS) with continuous electron accumulation (CEA) layer, denoted as CEA-VDMOS, is proposed and its new current transport mechanism is investigated. It features a trench gate directly extended to the drain, which includes two PN junctions. In on-state, the electron accumulation layers are formed along the sides of the extended gate and introduce two continuous low-resistance current paths from the source to the drain in a cell pitch. This mechanism not only dramatically reduces the Ron,sp but also makes the Ron,sp almost independent of the n-pillar doping concentration (Am). In off-state, the depletion between the n-pillar and p-pillar within the extended trench gate increases the Nn, and further reduces the Ron,sp. Especially, the two PNjunctions within the trench gate support a high gate--drain voltage in the off-state and on-state, re- spectively. However, the extended gate increases the gate capacitance and thus weakens the dynamic performance to some extent. Therefore, the CEA-VDMOS is more suitable for low and medium frequencies application. Simulation indicates that the CEA-VDMOS reduces the Ron,sp by 80% compared with the conventional super-junction VDMOS (CSJ-VDMOS) at the same high breakdown voltage (BV). 展开更多
关键词 electron accumulation layer pn junctions low specific on-resistance high breakdown voltage
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Effects of an attached functionally graded layer on the electromechanical behaviors of piezoelectric semiconductor fibers 被引量:1
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作者 Kai FANG Nian LI +3 位作者 Peng LI Zhenghua QIAN V.KOLESOV I.KUZNETSOVA 《Applied Mathematics and Mechanics(English Edition)》 SCIE EI CSCD 2022年第9期1367-1380,共14页
In this paper,we propose a specific two-layer model consisting of a functionally graded(FG)layer and a piezoelectric semiconductor(PS)layer.Based on the macroscopic theory of PS materials,the effects brought about by ... In this paper,we propose a specific two-layer model consisting of a functionally graded(FG)layer and a piezoelectric semiconductor(PS)layer.Based on the macroscopic theory of PS materials,the effects brought about by the attached FG layer on the piezotronic behaviors of homogeneous n-type PS fibers and PN junctions are investigated.The semi-analytical solutions of the electromechanical fields are obtained by expanding the displacement and carrier concentration variation into power series.Results show that the antisymmetry of the potential and electron concentration distributions in homogeneous n-type PS fibers is destroyed due to the material inhomogeneity of the attached FG layer.In addition,by creating jump discontinuities in the material properties of the FG layer,potential barriers/wells can be produced in the middle of the fiber.Similarly,the potential barrier configuration near the interface of a homogeneous PS PN junction can also be manipulated in this way,which offers a new choice for the design of PN junction based devices. 展开更多
关键词 piezoelectric semiconductor(PS) functionally graded(FG)material composite structure pn junction
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Silicon Photodiode with Very Small Sensitive Area
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作者 ① YIN Changsong,LI Xiaojun (Wuhan University,Wuhan 430072,CHN) 《Semiconductor Photonics and Technology》 CAS 1996年第4期289-292,共4页
The silicon PN junction photodiode with very small sensitive area has been investigated.The device gets superhigh light current density J LS counted by the sensitive area in the planar PN junction.The superhi... The silicon PN junction photodiode with very small sensitive area has been investigated.The device gets superhigh light current density J LS counted by the sensitive area in the planar PN junction.The superhigh light current density is due to the light current transferred by the photogenerated minority carriers in the area around edges of the dopant diffused region.Then,we can determine the diffusion length of the photogenerated minority carriers in the substance by measuring the light current of the PN junction photodiode with very small sensitive area. 展开更多
关键词 PHOTODIODE Photoelectric Conversion pn Junction
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