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Research on YOLO algorithm for lightweight PCB defect detection based on MobileViT
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作者 LIU Yuchen LIU Fuzheng JIANG Mingshun 《Optoelectronics Letters》 2025年第8期483-490,共8页
Current you only look once(YOLO)-based algorithm model is facing the challenge of overwhelming parameters and calculation complexity under the printed circuit board(PCB)defect detection application scenario.In order t... Current you only look once(YOLO)-based algorithm model is facing the challenge of overwhelming parameters and calculation complexity under the printed circuit board(PCB)defect detection application scenario.In order to solve this problem,we propose a new method,which combined the lightweight network mobile vision transformer(Mobile Vi T)with the convolutional block attention module(CBAM)mechanism and the new regression loss function.This method needed less computation resources,making it more suitable for embedded edge detection devices.Meanwhile,the new loss function improved the positioning accuracy of the bounding box and enhanced the robustness of the model.In addition,experiments on public datasets demonstrate that the improved model achieves an average accuracy of 87.9%across six typical defect detection tasks,while reducing computational costs by nearly 90%.It significantly reduces the model's computational requirements while maintaining accuracy,ensuring reliable performance for edge deployment. 展开更多
关键词 YOLO lightweight network mobile vision transformer mobile Lightweight Network convolutional block attention module cbam mechanism MobileViT CBAM pcb defect detection Regression Loss Function
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Printed Circuit Board (PCB) Surface Micro Defect Detection Model Based on Residual Network with Novel Attention Mechanism 被引量:1
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作者 Xinyu Hu Defeng Kong +2 位作者 Xiyang Liu Junwei Zhang Daode Zhang 《Computers, Materials & Continua》 SCIE EI 2024年第1期915-933,共19页
Printed Circuit Board(PCB)surface tiny defect detection is a difficult task in the integrated circuit industry,especially since the detection of tiny defects on PCB boards with large-size complex circuits has become o... Printed Circuit Board(PCB)surface tiny defect detection is a difficult task in the integrated circuit industry,especially since the detection of tiny defects on PCB boards with large-size complex circuits has become one of the bottlenecks.To improve the performance of PCB surface tiny defects detection,a PCB tiny defects detection model based on an improved attention residual network(YOLOX-AttResNet)is proposed.First,the unsupervised clustering performance of the K-means algorithm is exploited to optimize the channel weights for subsequent operations by feeding the feature mapping into the SENet(Squeeze and Excitation Network)attention network;then the improved K-means-SENet network is fused with the directly mapped edges of the traditional ResNet network to form an augmented residual network(AttResNet);and finally,the AttResNet module is substituted for the traditional ResNet structure in the backbone feature extraction network of mainstream excellent detection models,thus improving the ability to extract small features from the backbone of the target detection network.The results of ablation experiments on a PCB surface defect dataset show that AttResNet is a reliable and efficient module.In Torify the performance of AttResNet for detecting small defects in large-size complex circuit images,a series of comparison experiments are further performed.The results show that the AttResNet module combines well with the five best existing target detection frameworks(YOLOv3,YOLOX,Faster R-CNN,TDD-Net,Cascade R-CNN),and all the combined new models have improved detection accuracy compared to the original model,which suggests that the AttResNet module proposed in this paper can help the detection model to extract target features.Among them,the YOLOX-AttResNet model proposed in this paper performs the best,with the highest accuracy of 98.45% and the detection speed of 36 FPS(Frames Per Second),which meets the accuracy and real-time requirements for the detection of tiny defects on PCB surfaces.This study can provide some new ideas for other real-time online detection tasks of tiny targets with high-resolution images. 展开更多
关键词 Neural networks deep learning ResNet small object feature extraction pcb surface defect detection
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Lightweight Small Defect Detection with YOLOv8 Using Cascaded Multi-Receptive Fields and Enhanced Detection Heads
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作者 Shengran Zhao Zhensong Li +2 位作者 Xiaotan Wei Yutong Wang Kai Zhao 《Computers, Materials & Continua》 2026年第1期1278-1291,共14页
In printed circuit board(PCB)manufacturing,surface defects can significantly affect product quality.To address the performance degradation,high false detection rates,and missed detections caused by complex backgrounds... In printed circuit board(PCB)manufacturing,surface defects can significantly affect product quality.To address the performance degradation,high false detection rates,and missed detections caused by complex backgrounds in current intelligent inspection algorithms,this paper proposes CG-YOLOv8,a lightweight and improved model based on YOLOv8n for PCB surface defect detection.The proposed method optimizes the network architecture and compresses parameters to reduce model complexity while maintaining high detection accuracy,thereby enhancing the capability of identifying diverse defects under complex conditions.Specifically,a cascaded multi-receptive field(CMRF)module is adopted to replace the SPPF module in the backbone to improve feature perception,and an inverted residual mobile block(IRMB)is integrated into the C2f module to further enhance performance.Additionally,conventional convolution layers are replaced with GSConv to reduce computational cost,and a lightweight Convolutional Block Attention Module based Convolution(CBAMConv)module is introduced after Grouped Spatial Convolution(GSConv)to preserve accuracy through attention mechanisms.The detection head is also optimized by removing medium and large-scale detection layers,thereby enhancing the model’s ability to detect small-scale defects and further reducing complexity.Experimental results show that,compared to the original YOLOv8n,the proposed CG-YOLOv8 reduces parameter count by 53.9%,improves mAP@0.5 by 2.2%,and increases precision and recall by 2.0%and 1.8%,respectively.These improvements demonstrate that CG-YOLOv8 offers an efficient and lightweight solution for PCB surface defect detection. 展开更多
关键词 YOLOv8n pcb surface defect detection lightweight model small object detection
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