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Research on Efficient Storage Consistency Verification Technology for On-Chain and Off-Chain Data
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作者 Wei Lin Yi Sun 《Computers, Materials & Continua》 2025年第12期5117-5134,共18页
To enable efficient sharing of unbounded streaming data,this paper introduces blockchain technology into traditional cloud data,proposing a hybrid on-chain/off-chain storage model.We design a real-time verifiable data... To enable efficient sharing of unbounded streaming data,this paper introduces blockchain technology into traditional cloud data,proposing a hybrid on-chain/off-chain storage model.We design a real-time verifiable data structure that is more suitable for streaming data to achieve efficient real-time verifiability for streaming data.Based on the notch gate hash function and vector commitment,an adaptive notch gate hash tree structure is constructed,and an efficient real-time verifiable data structure for on-chain and off-chain stream data is proposed.The structure binds dynamic root nodes sequentially to ordered leaf nodes in its child nodes.Only the vector commitment of the dynamic root node is stored on the chain,and the complete data structure is stored off-chain.This structure ensures tamperproofing against malicious off-chain cloud servers of off-chain cloud servers.Preserves storage scalability space,realizes the immediate verification of stream data upon arrival,and the computational overhead of on-chain and off-chain hybrid storage verification is only related to the current data volume,which is more practical when dealing with stream data with unpredictable data volume.We formalize this as an efficient real-time verification scheme for stream data in on-chain and off-chain hybrid storage.Finally,the technology’s security and performance were empirically validated through rigorous analysis. 展开更多
关键词 On-chain and off-chain hybrid storage verifiable technology slot gate hash function vector commitment
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Performance of Double-Pole Four-Throw Double-Gate RF CMOS Switch in 45-nm Technology
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作者 Viranjay M. Srivastava 《Wireless Engineering and Technology》 2010年第2期47-54,共8页
In this paper, we have investigated the design parameters of RF CMOS switch, which will be used for the wireless tele-communication systems. A double-pole four-throw double-gate radio-frequency complementary-metal-oxi... In this paper, we have investigated the design parameters of RF CMOS switch, which will be used for the wireless tele-communication systems. A double-pole four-throw double-gate radio-frequency complementary-metal-oxide-semicon- ductor (DP4T DG RF CMOS) switch for operating at the 1 GHz is implemented with 45-nm CMOS process technology. This proposed RF switch is capable to select the data streams from the two antennas for both the transmitting and receiving processes. For the development of this DP4T DG RF CMOS switch we have explored the basic concept of the proposed switch circuit elements required for the radio frequency systems such as drain current, threshold voltage, resonant frequency, return loss, transmission loss, VSWR, resistances, capacitances, and switching speed. 展开更多
关键词 45-nm technology Capacitance of DOUBLE-gate MOSFET DG MOSFET DP4T SWITCH Radio Frequency RF SWITCH Resistance of DOUBLE-gate MOSFET VLSI
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Challenges of Process Technology in 32nm Technology Node 被引量:1
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作者 吴汉明 王国华 +1 位作者 黄如 王阳元 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2008年第9期1637-1653,共17页
According to the international technology roadmap for semiconductors (ITRS),32nm technology node will be introduced around 2009. Scaling of CMOS logic devices from 45 to 32nm node has come across significant barrier... According to the international technology roadmap for semiconductors (ITRS),32nm technology node will be introduced around 2009. Scaling of CMOS logic devices from 45 to 32nm node has come across significant barriers. Overcoming these pitch-scaling induced barriers requires integrating the most advanced process technologies into product manufacturing. This paper reviews and discusses new technology applications that could be potentially integrated into 32nm node in the following areas:extension of immersion lithography,mobility enhancement substrate technology,metal/ high-k (MHK) gate stack, ultra-shallow junction (USJ) and other strain enhancement engineering methods, including stress proximity effect (SPT), dual stress liner (DSL), stress memorization technique (SMT), high aspect ratio process (HARP) for STI and PMD,embedded SiGe (for pFET) and SiC (for nFET) source/drain (S/D) using selective epitaxial growth (SEG) method,metallization for middle of line (MOL) and back-end of line (BEOL) ,and ultra low-k (ULK) integration. 展开更多
关键词 CMOS technology 32nm technology node mobility enhancement metal gate/high k dielectrics ultra low k dielectrics
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Effect of X-ray irradiation on threshold voltage of AlGaN/GaN HEMTs with p-GaN and MIS Gates 被引量:3
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作者 Yongle Qi Denggui Wang +4 位作者 Jianjun Zhou Kai Zhang Yuechan Kong Suzhen Wu Tangsheng Chen 《Nanotechnology and Precision Engineering》 CAS CSCD 2020年第4期241-243,共3页
Commercially available AlGaN/GaN high-electron-mobility transistors(HEMTs)are beginning to enter the public scene froma range of suppliers.Based on previous studies,commercial GaN-based electronics are expected to be ... Commercially available AlGaN/GaN high-electron-mobility transistors(HEMTs)are beginning to enter the public scene froma range of suppliers.Based on previous studies,commercial GaN-based electronics are expected to be tolerant to different types of irradiation in space.To test this assumption,we compared the characteristic electrical curves obtained at different X-ray irradiation doses for GaN HEMT devices manufactured by Infineon and Transphorm.The p-GaN-based device was found to be more robust with a stable threshold voltage,whereas the threshold voltage of the device with ametal-insulator-semiconductor gatewas found to shift first in the negative and then the positive direction.This dynamic phenomenon is caused by the releasing and trapping effects of radiation-induced charges in the dielectric layer and at the interface of irradiated devices.As such,the p-GaNgate-based GaN HEMT provides a promising solution for use as an electric source in space. 展开更多
关键词 p-gan gate GaN HEMTs X-ray irradiation Threshold voltage
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Research and test of the adaptive quadrature demodulation technology for silicon micro-machined gyroscope 被引量:3
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作者 王玉良 《Journal of Harbin Institute of Technology(New Series)》 EI CAS 2012年第5期118-122,共5页
A program of adaptive quadrature demodulation is proposed to supply the gaps in the traditional analog detection technology of a silicon micro-machined gyroscope (SMG). This program is suitable for digital phase locke... A program of adaptive quadrature demodulation is proposed to supply the gaps in the traditional analog detection technology of a silicon micro-machined gyroscope (SMG). This program is suitable for digital phase locked loop (DPLL) drive technology that proposed in other papers. In addition the program adopts an adaptive filtering algorithm, which selects the in-phase and quadrature components that are outputs of the DPLL of the SMG's drive mode as reference signals to update the amplitude of the in-phase and quadrature components of the input signal by iteratively. An objective of the program is to minimize the mean square error of the accurate amplitudes and the estimated amplitudes of SMG's detection mode. The simulation and test results prove the feasibility of the program that lays the foundation for the further improvement of the SMG's system performance and the implementation of the SMG system's self-calibration and self-demarcation in future. 展开更多
关键词 Silicon Micro-machined Gyroscope (SMG) adaptive filtering technology quadrature demodulation Field Programmable gate Array(FPGA)
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An Improved SOI CMOS Technology Based Circuit Technique for Effective Reduction of Standby Subthreshold Leakage 被引量:1
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作者 Manish Kumar Md. Anwar Hussain Sajal K. Paul 《Circuits and Systems》 2013年第6期431-437,共7页
Silicon-on-insulator (SOI) CMOS technology is a very attractive option for implementing digital integrated circuits for low power applications. This paper presents migration of standby subthreshold leakage control tec... Silicon-on-insulator (SOI) CMOS technology is a very attractive option for implementing digital integrated circuits for low power applications. This paper presents migration of standby subthreshold leakage control technique from a bulk CMOS to SOI CMOS technology. An improved SOI CMOS technology based circuit technique for effective reduction of standby subthreshold leakage power dissipation is proposed in this paper. The proposed technique is validated through design and simulation of a one-bit full adder circuit at a temperature of 27℃, supply voltage, VDD of 0.90 V in 120 nm SOI CMOS technology. Existing standby subthreshold leakage control techniques in CMOS bulk technology are compared with the proposed technique in SOI CMOS technology. Both the proposed and existing techniques are also implemented in SOI CMOS technology and compared. Reduction in standby subthreshold leakage power dissipation by reduction factors of 54x and 45x foraone-bit full adder circuit was achieved using our proposed SOI CMOS technology based circuit technique in comparison with existing techniques such as MTCMOS technique and SCCMOS technique respectively in CMOS bulk technology. Dynamic power dissipation was also reduced significantly by using this proposed SOI CMOS technology based circuit technique. Standby subthreshold leakage power dissipation and dynamic power dissipation were also reduced significantly using the proposed circuit technique in comparison with other existing techniques, when all circuit techniques were implemented in SOI CMOS technology. All simulations were performed using Microwindver 3.1 EDA tool. 展开更多
关键词 STANDBY SUBTHRESHOLD LEAKAGE SOI technology Low Power MULTI-THRESHOLD VOLTAGE STACK Effect Reverse gate VOLTAGE
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Fin Field Effect Transistor with Active 4-Bit Arithmetic Operations in 22 nm Technology
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作者 S.Senthilmurugan K.Gunaseelan 《Intelligent Automation & Soft Computing》 SCIE 2023年第2期1323-1336,共14页
A design of a high-speed multi-core processor with compact size is a trending approach in the Integrated Circuits(ICs)fabrication industries.Because whenever device size comes down into narrow,designers facing many po... A design of a high-speed multi-core processor with compact size is a trending approach in the Integrated Circuits(ICs)fabrication industries.Because whenever device size comes down into narrow,designers facing many power den-sity issues should be reduced by scaling threshold voltage and supply voltage.Initially,Complementary Metal Oxide Semiconductor(CMOS)technology sup-ports power saving up to 32 nm gate length,but further scaling causes short severe channel effects such as threshold voltage swing,mobility degradation,and more leakage power(less than 32)at gate length.Hence,it directly affects the arithmetic logic unit(ALU),which suffers a significant power density of the scaled multi-core architecture.Therefore,it losses reliability features to get overheating and increased temperature.This paper presents a novel power mini-mization technique for active 4-bit ALU operations using Fin Field Effect Tran-sistor(FinFET)at 22 nm technology.Based on this,a diode is directly connected to the load transistor,and it is active only at the saturation region as a function.Thereby,the access transistor can cutoff of the leakage current,and sleep transis-tors control theflow of leakage current corresponding to each instant ALU opera-tion.The combination of transistors(access and sleep)reduces the leakage current from micro to nano-ampere.Further,the power minimization is achieved by con-necting the number of transistors(6T and 10T)of the FinFET structure to ALU with 22 nm technology.For simulation concerns,a Tanner(T-Spice)with 22 nm technology implements the proposed design,which reduces threshold vol-tage swing,supply power,leakage current,gate length delay,etc.As a result,it is quite suitable for the ALU architecture of a high-speed multi-core processor. 展开更多
关键词 FinFET(22 nm)technology diode connection arithmetic logic unit reduce threshold voltage swing gate length delay leakage power
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Comparative Analysis of Golden Gate and ClassicalCloning Techniques in E.coli:A Study in Molecular Cloning Efficiency
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作者 Ziyao Liu 《Asia Pacific Journal of Clinical Medical Research》 2025年第2期29-38,共10页
Molecular cloning remains a cornerstone technique in genetic engineering and synthetic biology.In this study,we conducted a systematic comparative analysis between the classical cloning method and the Golden Gate asse... Molecular cloning remains a cornerstone technique in genetic engineering and synthetic biology.In this study,we conducted a systematic comparative analysis between the classical cloning method and the Golden Gate assembly technique,utilizing Escherichia coli as the model organism.Through polymerase chain reaction(PCR)amplification,restriction enzyme digestion,ligation,transformation,and Sanger sequencing,we assessed the operational efficiency and cloning fidelity of both strategies.Our results demonstrated that Golden Gate assembly,leveraging type IIS restriction enzymes and simultaneous ligation,significantly enhanced cloning efficiency and precision,particularly for seamless multi-fragment assembly.In contrast,the classical cloning approach maintained certain advantages in simplicity and robustness for specific experimental conditions.Challenges encountered during transformation and sequencing highlighted the critical impact of technical accuracy on experimental outcomes.This study underscores the importance of selecting appropriate cloning methodologies tailored to experimental objectives and laboratory capabilities,providing a foundation for optimized molecular cloning workflows in future synthetic biology and biotechnology applications. 展开更多
关键词 Golden gate Assembly Classical Cloning Escherichia Coli Molecular Cloning DNA Assembly Recombinant DNA technology Transformation Effi ciency Synthetic Biology
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P-GaN栅结构GaN基HEMT器件研究进展 被引量:3
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作者 朱彦旭 宋潇萌 +3 位作者 李建伟 谭张杨 李锜轩 李晋恒 《北京工业大学学报》 CAS CSCD 北大核心 2023年第8期926-936,共11页
增强型氮化镓(GaN)基高电子迁移率晶体管(high electron mobility transistor,HEMT)是高频高功率器件与开关器件领域的研究热点,P-GaN栅技术因具备制备工艺简单、可控且工艺重复性好等优势而成为目前最常用且唯一实现商用的GaN基增强型... 增强型氮化镓(GaN)基高电子迁移率晶体管(high electron mobility transistor,HEMT)是高频高功率器件与开关器件领域的研究热点,P-GaN栅技术因具备制备工艺简单、可控且工艺重复性好等优势而成为目前最常用且唯一实现商用的GaN基增强型器件制备方法。首先,概述了当前制约P-GaN栅结构GaN基HEMT器件发展的首要问题,从器件结构与器件制备工艺这2个角度,综述了其性能优化举措方面的最新研究进展。然后,通过对研究进展的分析,总结了当前研究工作面临的挑战以及解决方法。最后,对未来的发展前景、发展方向进行了展望。 展开更多
关键词 氮化镓(GaN) p-gan栅技术 高电子迁移率晶体管(high electron mobility transistor HEMT) 增强型器件 结构优化 制备工艺优化
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基于水利工程的闸门防腐施工安装验收要点探讨
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作者 孙伟 《粘接》 2026年第1期254-257,共4页
以某地独立供水水库水利工程为例,系统分析闸门制造、运输、吊装、防腐和安装等各个环节的验收要点,实现施工工艺优化和验收标准一体化,然后进行实际应用实践。结果表明,与设计标准值相比,该验收要点体系让安装阶段的平面偏差实测平均... 以某地独立供水水库水利工程为例,系统分析闸门制造、运输、吊装、防腐和安装等各个环节的验收要点,实现施工工艺优化和验收标准一体化,然后进行实际应用实践。结果表明,与设计标准值相比,该验收要点体系让安装阶段的平面偏差实测平均值提高了38.3%,高度偏差测试平均值提升了44%,焊接质量一次合格率达到98.7%,超标缺陷率降低至0.8%,返修合格率达到100%,密封性能渗漏量控制在0.12 L/min,压力保持率达到93.5%,防腐涂层厚度偏差控制在±9.5,附着力等级达到0.8级,预期使用寿命提高了21.3%。 展开更多
关键词 施工工艺 闸门安装 工程验收 安装精度 验收标准
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3S技术在黄河口拦门沙测验及数据分析中的应用研究
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作者 边聪聪 金冠 《科技创新与应用》 2026年第3期193-196,共4页
随着信息技术的发展,3S技术(遥感RS、地理信息系统GIS和全球定位系统GPS)在水利工程、河口地貌演变监测等领域应用日益广泛。该文以黄河口拦门沙区域为研究对象,结合遥感影像、实时定位与三维建模等技术,研究3S技术在黄河口拦门沙测验... 随着信息技术的发展,3S技术(遥感RS、地理信息系统GIS和全球定位系统GPS)在水利工程、河口地貌演变监测等领域应用日益广泛。该文以黄河口拦门沙区域为研究对象,结合遥感影像、实时定位与三维建模等技术,研究3S技术在黄河口拦门沙测验及数据分析中的应用路径。研究发现,采用3S技术可显著提升黄河口拦门沙测验精度和数据分析效率,大幅减少外业作业量,提升黄河口拦门沙测验的安全性。 展开更多
关键词 黄河口 拦门沙 3S技术 遥感 GPS GIS
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Research on Night Vision System Based on Range-Gated Imaging 被引量:1
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作者 刘宇 范燕平 +3 位作者 茹志兵 郭城 周新妮 张保民 《Defence Technology(防务技术)》 SCIE EI CAS 2009年第4期287-291,共5页
A design of low-light-level night vision system is described,which can image objects selectively in the specific space. The system can selectively image some objects in specific distances,meanwhile ignore those shelte... A design of low-light-level night vision system is described,which can image objects selectively in the specific space. The system can selectively image some objects in specific distances,meanwhile ignore those shelters on the way of observation by combining an intensifying charge coupled device(ICCD) with a near infrared laser assisted in vision,whose operation wavelength matches with the photocathode of the image tube,and adopting the gated mode and adjustable time-delay. A semiconductor laser diode of 100 W in peak power is chosen for illumination. The laser and the image tube operate in 150 ns pulse width and 2 kHz repeat frequency. Some images of different objects at the different distances within 100 m can be obtained clearly,and even behind a grove by using a sampling circuit and a delay control device at 100 W in peak power of semiconductor laser diode,150 ns in pulse width of laser and image tube,2 kHz in repeat frequency. 展开更多
关键词 electron technology low-light-level night vision ICCD spatial gated range gated
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Innovative Development and Commercialization of Technologies: Experience of Technopark "Novosibirsk"
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作者 Yury I. Shokin Boris Y. Grishnyakov Leonid K. Bobrov 《Chinese Business Review》 2012年第10期855-863,共9页
This article is concerned with analyzes of experience of Technopark "Novosibirsk" as an important part of the innovation infrastructure of the Novosibirsk region. In this article the authors are formulated prioritie... This article is concerned with analyzes of experience of Technopark "Novosibirsk" as an important part of the innovation infrastructure of the Novosibirsk region. In this article the authors are formulated priorities for the development of an innovative economy: The promotion of investment growth in production infrastructure and innovation, increasing the orientation of research institutions to the needs of the real economy, the development of entrepreneurship in all sectors of the economy and the creation of necessary conditions. The article considers the key elements of innovation infrastructure. Also program "Development of high-tech industry and which Technopark "Novosibirsk" implements the this article is given a brief description of the complex target innovation in the industry to the city of Novosibirsk in 2020", in concept of technopark of distributed type, when the Technopark is built in the form of structural and autonomous innovation and technology centers established by the territorial-branch principle in conjunction with partner organizations. The analysis of the stories of success (and failure) of residents of Technopark is described in this article. Based on this analysis, which highlights the main factors contributing to the achievement of commercially meaningful results. These include training as an essential component of the innovation infrastructure. Describes the international educational programs implemented by the Innovative Technology Center "Education" at the Novosibirsk State University of Economics and Management. It is noted that the most important result of the operation of Technopark "Novosibirsk" was working out a model of public-private partnership that has allowed Technopark flourish, creating a network of specialized centers of innovation and technology. Finally the authors conclude that at the present time in Russia on almost all the basic elements of support for innovative entrepreneurship are created. At the same time a significant part of the difficulties cause problems originating from the external environment of business innovation 展开更多
关键词 innovation infrastructure start-up projects technology transfer experience of technopark public-private partnership technology commercialization gate2RuBIN project
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新一代冠状动脉运动追踪冻结技术用于改善不同心率患者冠状动脉CT血管成像质量 被引量:4
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作者 安备 张卓璐 +4 位作者 刘卓 付玲 商旭 刘磊 程瑾 《中国介入影像与治疗学》 北大核心 2025年第2期131-135,共5页
目的观察新一代冠状动脉追踪冻结(NG SSF)技术用于改善不同心率(HR)患者冠状动脉CT血管成像(CCTA)质量的效果。方法回顾性分析利用256排CT机于1个心动周期内采集的164例CCTA数据,管电压分别为80、100及120 kV,以智能心电门控技术判断HR... 目的观察新一代冠状动脉追踪冻结(NG SSF)技术用于改善不同心率(HR)患者冠状动脉CT血管成像(CCTA)质量的效果。方法回顾性分析利用256排CT机于1个心动周期内采集的164例CCTA数据,管电压分别为80、100及120 kV,以智能心电门控技术判断HR并自动选择曝光期相:对HR≤65次/分者(低HR组)将曝光时间窗设在70%~80%R-R间期,65次/分<HR≤85次/分者(中等HR组)设在40%~80%R-R间期,HR>85次/分(高HR组)者设在40%~60%R-R间期;对3组图像分别以标准重建算法(STD)、第一代追踪冻结(SSF1)技术及NG SSF进行重建。以Likert量表对3种图像所示右冠状动脉(RCA)、左前降支(LAD)及左回旋支(LCX)各节段进行主观评分。结果低HR组NG SSF重建图像中的LAD中远段、RCA及LCX全段得分均高于STD,而NG SSF重建图像中的RCA中段及LAD远段得分高于SSF1重建图像(P均<0.05);中等HR组NG SSF重图像显示冠状动脉各节段的主观评分均高于STD及SSF1重建图像(P均<0.05);高HR组NG SSF重建图像显示冠状动脉各节段的主观评分均高于STD,显示RCA近远段、LAD中远段及LCX全段的主观评分均高于SSF1重建图像(P均<0.05)。结论利用NG SSF技术能有效提升不同HR患者前瞻性心电门控CCTA成像质量。 展开更多
关键词 冠状动脉疾病 CT血管成像 前瞻性心电门控扫描 追踪冻结技术
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黄墩湖滞洪闸底板裂缝综合治理技术及其效果评估
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作者 潘卫锋 余洋 +2 位作者 丁睿 王子垚 唐淼 《科技创新与应用》 2025年第10期185-188,共4页
为解决黄墩湖滞洪闸底板裂缝问题,研究采用控制灌浆技术及改性环氧结构胶等材料进行裂缝治理。通过对裂缝进行清理、注浆管安装、控制灌浆以及材料固化等一系列工艺流程,确保裂缝得到妥善处理。检测结果显示,治理后裂缝宽度显著减小,裂... 为解决黄墩湖滞洪闸底板裂缝问题,研究采用控制灌浆技术及改性环氧结构胶等材料进行裂缝治理。通过对裂缝进行清理、注浆管安装、控制灌浆以及材料固化等一系列工艺流程,确保裂缝得到妥善处理。检测结果显示,治理后裂缝宽度显著减小,裂缝深度明显改善,裂缝形态趋于稳定且未见新扩展,表明裂缝治理措施有效提升结构的安全性和稳定性。长期观察发现,非固化橡胶密封材料的应用保持结构良好的耐久性和防水性能,延长使用寿命,增强工程的安全性和可靠性。研究表明,采用控制灌浆技术及高性能材料对裂缝进行综合治理是可行且有效的,为类似工程提供有益的参考。 展开更多
关键词 黄墩湖滞洪闸 裂缝治理 控制灌浆技术 改性环氧结构胶 裂缝检测 结构稳定性
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新能源汽车车门内板二次顶出注塑模设计 被引量:2
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作者 李清安 张维合 《中国塑料》 北大核心 2025年第6期105-109,共5页
根据汽车车门内板的尺寸大小、结构特点和工艺要求,设计了一副超大型薄壁顺序阀控制的热流道注塑模具。模具脱模系统采用二次顶出机构,成功解决了喇叭孔对成型零件包紧力大、塑件脱模困难的难题。在塑件倒扣附近设计定位柱,成功消除了... 根据汽车车门内板的尺寸大小、结构特点和工艺要求,设计了一副超大型薄壁顺序阀控制的热流道注塑模具。模具脱模系统采用二次顶出机构,成功解决了喇叭孔对成型零件包紧力大、塑件脱模困难的难题。在塑件倒扣附近设计定位柱,成功消除了脱模过程中塑件被斜顶拉变形的故障。模具采用顺序阀控制热流道浇口进胶顺序和进胶口时间的智能浇注系统,有效解决了大型、狭窄型腔注塑模具熔体填充困难问题。模具采用24组由直通式水管、倾斜式水管和隔片式水井组成的冷却水路,纵横交错,冷却快速且均衡。模具成功投产,成型塑件精度达到了MT3(GB/T 14486—2008),注射周期降低了10%。 展开更多
关键词 新能源汽车 车门内板 超大型注塑模具 二次顶出 顺序阀热流道 定位柱 侧向抽芯机构
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平面闸门动水闭门的数值模拟研究 被引量:1
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作者 赵伟 蔡伟 易伟 《水资源与水工程学报》 北大核心 2025年第2期125-133,共9页
为了深入研究潜孔式平面闸门在流固耦合作用下的动水闭门过程,选取了某水电站进水口平面闸门作为研究对象,建立了详细的流体区域和闸门模型。通过使用ANSYS Fluent中的RNG k-ε湍流模型、VOF(流体体积)模型及动网格技术,进行了数值模拟... 为了深入研究潜孔式平面闸门在流固耦合作用下的动水闭门过程,选取了某水电站进水口平面闸门作为研究对象,建立了详细的流体区域和闸门模型。通过使用ANSYS Fluent中的RNG k-ε湍流模型、VOF(流体体积)模型及动网格技术,进行了数值模拟分析,并将模拟结果与物理试验数据进行了对比,以分析平面闸门的受力及变形情况。结果表明:通过与物理模型试验中的测点压强和流场分布对比,验证了数值模拟技术的准确性和可靠性;在闸门关闭过程中,面板上的最大等效应力逐渐增大,尤其是在主横梁上翼缘靠近闸门中部的位置应力集中显著,而下翼缘由于几乎不受水压力影响,应力相对较小;平面闸门的整体最大位移集中在底缘处,并随着闸门关闭过程逐渐增大。 展开更多
关键词 平面闸门 面板测点压力 梁格应力 动水压力 动网格技术 物理试验 数值模拟
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BCD工艺栅极驱动器总剂量效应
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作者 许世萍 崔江维 +7 位作者 郑齐文 刘刚 邢康伟 李小龙 施炜雷 王信 李豫东 郭旗 《强激光与粒子束》 北大核心 2025年第5期86-93,共8页
针对一款BCD工艺栅极驱动器,采用环栅结构进行总剂量效应加固。通过^(60)Co γ辐照试验,对比了加固和非加固器件电学参数随剂量变化情况。结果表明,总剂量辐射会导致器件的输出电压与电流特性发生退化,出现转换电压下降与输出电流上升... 针对一款BCD工艺栅极驱动器,采用环栅结构进行总剂量效应加固。通过^(60)Co γ辐照试验,对比了加固和非加固器件电学参数随剂量变化情况。结果表明,总剂量辐射会导致器件的输出电压与电流特性发生退化,出现转换电压下降与输出电流上升的现象,同时发现总剂量辐射对输出电阻几乎无影响。对比两种栅极驱动器辐照前后的测试结果,证明环栅加固方法对抑制总剂量辐射引起的边缘漏电有一定的效果,但辐照总剂量达到500 krad(Si)时,加固器件发生功能失效。通过仿真模拟各级晶体管辐射损伤对器件最终输出结果的影响,确定初级施密特反相器内阈值电压漂移影响转换电压,而末级晶体管阈值电压漂移导致输出高电平下降。 展开更多
关键词 BCD工艺 栅极驱动器 总剂量效应 环栅加固器件
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基于HLS的高精度位移测量算法的硬件加速设计
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作者 陈昊然 王天昊 +5 位作者 路美娜 宋茂新 罗环 吴晓宇 骆冬根 裘桢炜 《系统工程与电子技术》 北大核心 2025年第2期341-351,共11页
针对高精度位移传感器对高速位移测量算法的运行速度、可移植性及降低研发成本的需求,提出一种基于高层次综合(high-level synthesis, HLS)技术的高精度测量算法的硬件加速设计方法。使用HLS技术实现C++语言到Verilog语言的综合,针对高... 针对高精度位移传感器对高速位移测量算法的运行速度、可移植性及降低研发成本的需求,提出一种基于高层次综合(high-level synthesis, HLS)技术的高精度测量算法的硬件加速设计方法。使用HLS技术实现C++语言到Verilog语言的综合,针对高精度位移测量算法设计策略,利用HLS技术中的流水化和数组重构等优化技术进行硬件加速,并将其封装为知识产权(intellectual property, IP)核,提高算法的可移植性。以Xilinx公司的Kintex-7系列现场可编程门阵列(field-programmable gate array, FPGA)芯片XC7K325TFFG676为载体的测量系统实验结果表明,整个算法耗时91.8μs,相比数字信号处理(digital signal processor, DSP)单元将运行时间缩短了308.2μs,测量精度达到44.44 nm,稳定性为49.20 nm,线性度为0.503‰。 展开更多
关键词 高层次综合技术 位移检测 现场可编程门阵列 硬件加速
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焊接和压接型IGBT的劣化机理与状态检测综述
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作者 何赟泽 李祺颖 +8 位作者 张超峰 常珊 康文 耿学锋 唐龙海 平阳 张杰 何洪英 李佐胜 《中国电机工程学报》 北大核心 2025年第19期7721-7742,I0046,共23页
绝缘栅双极晶体管(insulated gate bipolar transistor,IGBT)是柔性直流输电技术的核心电能变换部件,其可靠性对于柔性直流输电系统安全稳定运行至关重要。基于传感器技术的IGBT器件状态检测方法,可以提高IGBT的运行可靠性,降低器件失... 绝缘栅双极晶体管(insulated gate bipolar transistor,IGBT)是柔性直流输电技术的核心电能变换部件,其可靠性对于柔性直流输电系统安全稳定运行至关重要。基于传感器技术的IGBT器件状态检测方法,可以提高IGBT的运行可靠性,降低器件失效故障带来的经济损失。首先,探讨焊接型IGBT和压接型IGBT的劣化机理和主要故障模式异同点;然后,根据IGBT的不同封装形式,分别从嵌入式检测和非接触式检测两个方面详细综述基于温度、电流、应力波和应力应变等物理量的IGBT状态检测方法研究现状;基于研究现状,对现有研究的难点与不足进行总结,并展望IGBT器件状态检测技术的未来研究方向。 展开更多
关键词 绝缘栅双极晶体管 状态检测 检测技术 劣化机理 应力
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