As a method for testing a sequential circuit efficiently, a scan design is usually used. But, since this design has some drawbacks, a non-scan testable design should be discussed. The testable design can be implemente...As a method for testing a sequential circuit efficiently, a scan design is usually used. But, since this design has some drawbacks, a non-scan testable design should be discussed. The testable design can be implemented by enhancing controllability and observability. This paper discusses a non-scan testable design for a sequential circuit by only focusing the improvement of controllability. The proposed design modifies a circuit so that all the FFs can be directly controlled by primary input lines in a test mode. Experimental results show that we can get a good testability using this method.展开更多
This paper proposes a non-scan design-for-testability method for register-transfer level circuits where a circuit consists of a controller and a data path. It achieves complete fault efficiency with low hardware overh...This paper proposes a non-scan design-for-testability method for register-transfer level circuits where a circuit consists of a controller and a data path. It achieves complete fault efficiency with low hardware overhead and at-speed testing.展开更多
探索毫米波雷达在非均匀扫描成像应用中的优化方法,特别是通过在传统成像算法上引入距离补偿来提高成像质量,以解决徒手扫描、无人机探测成像等曲线成像情景问题;分析非均匀扫描下的数据分布特点,通过数学模型对扫描数据计算收发天线阵...探索毫米波雷达在非均匀扫描成像应用中的优化方法,特别是通过在传统成像算法上引入距离补偿来提高成像质量,以解决徒手扫描、无人机探测成像等曲线成像情景问题;分析非均匀扫描下的数据分布特点,通过数学模型对扫描数据计算收发天线阵列与其对应的虚拟阵列到参考点的距离差,以实现对非均匀扫描数据的有效校正。为验证所提方法,使用快速后向投影算法(Fast Back-Projection Algorithm,FBPA)和结合非均匀快速傅里叶变换的距离徙动算法(Non-Uniform Fast Fourier Transform-based Range Migration Algorithm,NUFFT-RMA)进行仿真和实验。研究结果表明,提出的距离补偿方法可以有效降低成像时受到的伪影影响并提高成像精度,为毫米波雷达非均匀扫描成像提供了一种有效的优化途径。展开更多
文摘As a method for testing a sequential circuit efficiently, a scan design is usually used. But, since this design has some drawbacks, a non-scan testable design should be discussed. The testable design can be implemented by enhancing controllability and observability. This paper discusses a non-scan testable design for a sequential circuit by only focusing the improvement of controllability. The proposed design modifies a circuit so that all the FFs can be directly controlled by primary input lines in a test mode. Experimental results show that we can get a good testability using this method.
文摘This paper proposes a non-scan design-for-testability method for register-transfer level circuits where a circuit consists of a controller and a data path. It achieves complete fault efficiency with low hardware overhead and at-speed testing.
文摘探索毫米波雷达在非均匀扫描成像应用中的优化方法,特别是通过在传统成像算法上引入距离补偿来提高成像质量,以解决徒手扫描、无人机探测成像等曲线成像情景问题;分析非均匀扫描下的数据分布特点,通过数学模型对扫描数据计算收发天线阵列与其对应的虚拟阵列到参考点的距离差,以实现对非均匀扫描数据的有效校正。为验证所提方法,使用快速后向投影算法(Fast Back-Projection Algorithm,FBPA)和结合非均匀快速傅里叶变换的距离徙动算法(Non-Uniform Fast Fourier Transform-based Range Migration Algorithm,NUFFT-RMA)进行仿真和实验。研究结果表明,提出的距离补偿方法可以有效降低成像时受到的伪影影响并提高成像精度,为毫米波雷达非均匀扫描成像提供了一种有效的优化途径。
