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A Novel High Output Resistance Current Source Based on Negative Resistance 被引量:2
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作者 罗萍 李肇基 +1 位作者 余磊 张波 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2006年第3期443-447,共5页
This paper presents a novel scheme for enhancing resistance that utilizes an equivalent negative resistance. Adopting this novel scheme in the proposed current source could remarkably boost its output resistance witho... This paper presents a novel scheme for enhancing resistance that utilizes an equivalent negative resistance. Adopting this novel scheme in the proposed current source could remarkably boost its output resistance without requiring increased power supply. Simulation with 0.6μm CMOS process models shows that the output resistance of the novel current source can reach the order of 10^9Ω with a 1.04GHz bandwidth and only 10.6ppm/℃ in the range of -40~145℃. 展开更多
关键词 current source negative resistance paralleled resistance
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A 1V,156.7μW,65.9dB Rail-to-Rail Operational Amplifier by Means of Negative Resistance Load and Replica-Amplifier Gain Enhancement 被引量:2
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作者 刘爱荣 杨华中 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2006年第12期2101-2105,共5页
A low-voltage, low-power, and high-gain rail-to-rail operational amplifier (OpAmp) is presented. The replica-amplifier gain enhancement technique is applied to improve the DC gain of the amplifier, which does not de... A low-voltage, low-power, and high-gain rail-to-rail operational amplifier (OpAmp) is presented. The replica-amplifier gain enhancement technique is applied to improve the DC gain of the amplifier, which does not degrade the output swing and is very suitable for low-voltage applications. In a 0. 18/μm standard CMOS process,a 1V OpAmp with rail-to-rail output is designed. For a load capacitance of 5 pF,simulation by HSPICE shows that this OpAmp achieves an effective open-loop DC gain of 65. 9dB,gain bandwidth of 70.28 MHz,and phase margin of 50 with a quiescent power dissipation of 156.7μW. 展开更多
关键词 low-voltage low-power high DC gain replica-amplifier gain enhancement negative resistance load
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Simulation on Dynamic Characteristic of Negative Resistance Arc in Pulsed TIG Welding 被引量:1
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作者 杨立军 韩蓬勃 +2 位作者 董天顺 张健 徐立城 《Transactions of Tianjin University》 EI CAS 2007年第1期62-66,共5页
A mathematical model is established on the basis of the physical characteristic of the negative resistance arc when a low current of 0—50 A is applied in pulsed TIG welding. The simulation model converted from the ma... A mathematical model is established on the basis of the physical characteristic of the negative resistance arc when a low current of 0—50 A is applied in pulsed TIG welding. The simulation model converted from the mathematical model is run in MATLAB environment, and the discussion is focused on the way the peak current ranging from 29 A to 50 A and the time constant of arc in the span of 0.003—0.006 s influence the simulating results and the dynamic characteristic. The simulating data are close to that of welding experiments and correspond to the theoretical conclusion. 展开更多
关键词 pulsed TIG welding negative resistance arc mathematical model dynamic characteristic computer simulation
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Negative Resistance and Its Impact on a RC-DC Driven Electric Circuit 被引量:1
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作者 Haiduke Sarafian 《Journal of Electromagnetic Analysis and Applications》 2021年第7期103-110,共8页
It is a common misconception that electric “resistance” always is a positive defined electric element. <em>i.e.</em>, the plot of the voltage across the resistor, V vs. its current, i is a slanted straig... It is a common misconception that electric “resistance” always is a positive defined electric element. <em>i.e.</em>, the plot of the voltage across the resistor, V vs. its current, i is a slanted straight line with a positive slope. Esaki diode also known as tunnel diode is an exception to this character. For a certain voltage range, the current recedes resulting in a line with a negative slope;it is interpreted as negative resistance. In this research flavored report, we investigate the impact of the negative resistance in a typical classic electric circuit. E.g., a tunnel diode, D is inserted in a classic electric circuit that is composed of an ohmic resistor, R and a capacitor, C which are all in series with a DC power supply. The circuit equation for the RCD circuit is a nonlinear ordinary differential equation (NLODE). In line with the ever-growing popular Computer Algebra System (CAS), this is solved numerically utilizing two distinctly different CASs. The consistency of the solutions confidently leads to the understanding of the impact of the negative resistance. The circuit characteristics are compared to the classic analogous RC circuit. The report embodies an atlas of characteristics of the circuits making the analysis visually comprehensible. 展开更多
关键词 Tunnel Diode negative Electric resistance Computer Algebra System Mathematica Maple
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Impact of the Negative Resistance on the Characteristics of a Tunnel Diode-Inductive Circuit
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作者 Haiduke Sarafian 《Journal of Electromagnetic Analysis and Applications》 CAS 2022年第7期81-88,共8页
The I-V diagram of a tunnel diode inherits a voltage range corresponding to a specific current domain with a negative slope. Within this range, the electric resistance is negatively impacting the characteristics of th... The I-V diagram of a tunnel diode inherits a voltage range corresponding to a specific current domain with a negative slope. Within this range, the electric resistance is negatively impacting the characteristics of the electric circuits. One such circuit containing a tunnel diode in series with an inductor driven by a DC source is considered. The negative resistance significantly alters the characteristics of the circuit. In this research-oriented project, we unveil these characteristics comparing them to the classic inductive circuit with an ohmic resistor. This project stems from our previous work [1] and may be considered an application of the tunnel diode embodying unseen surprises. The circuit analysis is entirely based on utilizing a Computer Algebra System (CAS) specifically Mathematica. Without a CAS, the completion of the project wouldn’t have been possible otherwise. 展开更多
关键词 Tunnel Diode negative Electric resistance Computer Algebra System MATHEMATICA MAPLE
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Reliable sensors based on graphene textile with negative resistance variation in three dimensions 被引量:6
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作者 Wenpeng Han Yijun Wu +5 位作者 He Gong Linxin Liu Junxiang Yan Mengfei Li Yunze Long Guozhen Shen 《Nano Research》 SCIE EI CSCD 2021年第8期2810-2818,共9页
The weft-knitted reduced graphene oxide(r-GO)textile that is made up of many conductive r-GO coated fibers was successfully prepared dependent on the electrospray deposition technique.Interestingly,the r-GO textile pr... The weft-knitted reduced graphene oxide(r-GO)textile that is made up of many conductive r-GO coated fibers was successfully prepared dependent on the electrospray deposition technique.Interestingly,the r-GO textile presents negative resistance variation not only in axial direction as the pressure increases but also in transverse direction as the lateral stretch increases which makes it has the advantage to fabricate the reliable sensors based on strain-resistance effect.The transverse-strain and pressure sensors based on the r-GO textiles all show the excellent sensing characteristics such as high sensitivity,reliability,and good durability,etc.The maximum gauge factors(GF)of the transverse-sensor are 27.1 and 153.5 in the x-and/-direction,respectively.And the practical detection range can up to 40%in the x-direction and 35%in the y-direction,respectively.The r-GO textile pressure sensor also shows high sensitivity for a broad pressure range that with a GF up to 716.8 kPa-1 for less than 4.5 kPa region and still has more sensitive pressure sensing characteristics even the pressure goes up to 14 kPa.Based on those good performances of r-GO textile sensors,its potential applications in human body states monitoring have been studied. 展开更多
关键词 reduced graphene oxide textile transverse-strain sensor pressure sensor negative resistance variation human body states
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Differential negative resistance effect of output characteristics in deep sub-micrometer wurtzite AlGaN/GaN MODFETs 被引量:2
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作者 郭宝增 Umberto Ravaioli 《Science in China(Series F)》 2003年第3期187-198,共12页
We obtained the output characteristics in wurtzite Al0.15Ga0.85N/GaN MODFETs with the full band Monte Carlo method. The gate length Lg and the channel length Los in the device are 0.2 μm and 0.4 urn, respectively. In... We obtained the output characteristics in wurtzite Al0.15Ga0.85N/GaN MODFETs with the full band Monte Carlo method. The gate length Lg and the channel length Los in the device are 0.2 μm and 0.4 urn, respectively. In the output characteristics we found a differential negative resistance effect. That is, as VDS is a constant, initially, VDS increases with increasing VDS. When VDS exceeds a certain critical value, IDS decreases with increasing VDS. The analysis for velocity-field characteristics in wurtzite CaN, the distributions of the electric field and the electron velocity in the two dimensional electron gas channel indicates that the differential negative resistance effect of the electron average velocity results in the differential negative resistance effect of the output characteristics. The transient transport also is related to the differential negative resistance effect of the output characteristics. This effect only can be observed in the devices with very short channel. 展开更多
关键词 gallium nitride MODFETS Monte Carlo negative resistance effect.
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Negative Differential Resistance of Au-MgB2-Au Nanoscale Junctions
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作者 柳福提 程艳 陈向荣 《Chinese Journal of Chemical Physics》 SCIE CAS CSCD 2014年第4期407-411,J0001,共6页
The electron transport of linear atomic chain trodes was investigated by using the density Green's function method. We have calculated of MgB2 sandwiched between Au(100) elecfunctional theory with the non-equilibri... The electron transport of linear atomic chain trodes was investigated by using the density Green's function method. We have calculated of MgB2 sandwiched between Au(100) elecfunctional theory with the non-equilibrium the corresponding cohesion energy and conductance of junctions in different distance. It is found that, at the equilibrium position, the Au-B bond-length is 1.90 A, the B-Mg bond-length is 2.22 A, and the equilibrium conductance is 0.51G0 (Go=2e^2/h). The transport channel is almost formed by the π antibonding orbitals, which was made up of the Px and Py orbital electrons of B and Mg atoms. In the voltage range of -1.5 to 1.5 V, the junctions show the metallic behaviors. When the voltage is larger than 1.5 V, the current decreases gradually and then negative differential resistance appears almost symmetrically on both positive and negative bias. 展开更多
关键词 Electronic transport MgB2 atomic chain negative differential resistance
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Negative Differential Resistance and Spin-Filtering Effects in Zigzag Graphene Nanoribbons with Nitrogen-Vacancy Defects
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作者 徐婷 黄静 李群祥 《Chinese Journal of Chemical Physics》 SCIE CAS CSCD 2014年第6期653-658,I0003,共7页
We explore the electronic and transport properties of zigzag graphene nanoribbons (GNRs) with nitrogen-vacancy defects by performing fully self-consistent spin-polarized density functional theory calculations combin... We explore the electronic and transport properties of zigzag graphene nanoribbons (GNRs) with nitrogen-vacancy defects by performing fully self-consistent spin-polarized density functional theory calculations combined with non-equilibrium Green's function technique. We observe robust negative di erential resistance (NDR) effect in all examined molecular junctions. Through analyzing the calculated electronic structures and the bias-dependent transmission coefficients, we find that the narrow density of states of electrodes and the bias-dependent effective coupling between the central molecular orbitals and the electrode subbands are responsible for the observed NDR phenomenon. In addition, the obvious di erence of the transmission spectra of two spin channels is observed in some bias ranges, which leads to the near perfect spin-filtering effect. These theoretical findings imply that GNRs with nitrogenvacancy defects hold great potential for building molecular devices. 展开更多
关键词 Defective graphene nanoribbon Electronic structure Spin-polarized transport property negative differential resistance Spin-filtering
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Negative differential resistance behaviour in N-doped crossed graphene nanoribbons 被引量:1
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作者 陈灵娜 马松山 +3 位作者 欧阳方平 伍小赞 肖金 徐慧 《Chinese Physics B》 SCIE EI CAS CSCD 2010年第9期531-535,共5页
By using first-principles calculations and nonequilibrium Green's function technique, we study elastic transport properties of crossed graphene nanoribbons. The results show that the electronic transport properties o... By using first-principles calculations and nonequilibrium Green's function technique, we study elastic transport properties of crossed graphene nanoribbons. The results show that the electronic transport properties of molecular junctions can be modulated by doped atoms. Negative differential resistance (NDR) behaviour can be observed in a certain bias region, when crossed graphene nanoribbons are doped with nitrogen atoms at the shoulder, but it cannot be observed for pristine crossed graphene nanoribbons at low biases. A mechanism for the negative differential resistance behaviour is suggested. 展开更多
关键词 transport properties negative differential resistance FIRST-PRINCIPLES crossed graphene nanoribbons
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Spin logic devices based on negative differential resistance -enhanced anomalous Hall effect
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作者 Hongming Mou Ziyao Lu +2 位作者 Yuchen Pu Zhaochu Luo Xiaozhong Zhang 《International Journal of Minerals,Metallurgy and Materials》 SCIE EI CAS CSCD 2024年第6期1437-1448,共12页
Owing to rapid developments in spintronics,spin-based logic devices have emerged as promising tools for next-generation computing technologies.This paper provides a comprehensive review of recent advancements in spin ... Owing to rapid developments in spintronics,spin-based logic devices have emerged as promising tools for next-generation computing technologies.This paper provides a comprehensive review of recent advancements in spin logic devices,particularly focusing on fundamental device concepts rooted in nanomagnets,magnetoresistive random access memory,spin–orbit torques,electric-field modu-lation,and magnetic domain walls.The operation principles of these devices are comprehensively analyzed,and recent progress in spin logic devices based on negative differential resistance-enhanced anomalous Hall effect is summarized.These devices exhibit reconfigur-able logic capabilities and integrate nonvolatile data storage and computing functionalities.For current-driven spin logic devices,negative differential resistance elements are employed to nonlinearly enhance anomalous Hall effect signals from magnetic bits,enabling reconfig-urable Boolean logic operations.Besides,voltage-driven spin logic devices employ another type of negative differential resistance ele-ment to achieve logic functionalities with excellent cascading ability.By cascading several elementary logic gates,the logic circuit of a full adder can be obtained,and the potential of voltage-driven spin logic devices for implementing complex logic functions can be veri-fied.This review contributes to the understanding of the evolving landscape of spin logic devices and underscores the promising pro-spects they offer for the future of emerging computing schemes. 展开更多
关键词 spin logic spin–orbit torque negative differential resistance full-adder
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Negative differential resistance behavior in doped C_(82) molecular devices
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作者 徐慧 贾姝婷 陈灵娜 《Journal of Central South University》 SCIE EI CAS 2012年第2期299-303,共5页
By using the first-principle calculations and nonequilibrium Green functions method, the electronic transport properties of molecular devices constructed by C82, C80BN and C80N2 were studied. The results show that the... By using the first-principle calculations and nonequilibrium Green functions method, the electronic transport properties of molecular devices constructed by C82, C80BN and C80N2 were studied. The results show that the electronic transport properties of molecular devices are affected by doped atoms. Negative differential resistance (NDR) behavior can be observed in certain bias regions for C82 and C80BN molecular devices but cannot be observed for C80N2 molecular device. A mechanism for the negative differential resistance behavior was suggested. 展开更多
关键词 electronic transport properties negative differential resistance FIRST-PRINCIPLE molecular device
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Room-Temperature Organic Negative Differential Resistance Device Using CdSe Quantum Dots as the ITO Modification Layer
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作者 焦博 姚丽娟 +3 位作者 吴春芳 董化 侯洵 吴朝新 《Chinese Physics Letters》 SCIE CAS CSCD 2015年第11期122-126,共5页
Room-temperature negative differential resistance (NDR) has been observed in different types of organic materials. However, detailed study on the influence of the organic material on NDR performance is still scarce.... Room-temperature negative differential resistance (NDR) has been observed in different types of organic materials. However, detailed study on the influence of the organic material on NDR performance is still scarce. In this work, room-temperature NDR & observed when CdSe quantum dot (QD) modified ITO is used as the electrode. Furthermore, material dependence of the NDR performance is observed by selecting materials with different charge transporting properties as the active layer, respectively. A peak-to-valley current ratio up to 9 is observed. It is demonstrated that the injection barrier between ITO and the organic active layer plays a decisive role for the device NDR performance. The influence of the aggregation state of CdSe QDs on the NDR performance is also studied, which indicates that the NDR is caused by the resonant tunneling process in the ITO/CdSe QD/organic active layer structure. 展开更多
关键词 Room-Temperature Organic negative Differential resistance Device Using CdSe Quantum Dots as the ITO Modification Layer QDs NDR ITO
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Negative Differential Resistance in Atomic Carbon Chain-Graphene Junctions
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作者 安丽萍 刘春梅 刘念华 《Communications in Theoretical Physics》 SCIE CAS CSCD 2012年第6期1087-1090,共4页
We investigate the electronic transport properties of atomic carbon chain-graphene junctions by using the density-functionla theory combining with the non-equilibrium Green's functions. The results show that the tran... We investigate the electronic transport properties of atomic carbon chain-graphene junctions by using the density-functionla theory combining with the non-equilibrium Green's functions. The results show that the transport properties are sensitively dependent on the contact geometry of carbon chain. From the calculated I-V curve we find negative differential resistance (NDR) in the two types of junctions. The NDR can be considered as a result of molecular orbitals moving related to the bias window. 展开更多
关键词 atomic carbon chain-graphene junctions electronic transport negative differential resistance molecular orbitals
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Negative differential resistance effects induced by protonation in naphthalocyanine molecular junctions
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作者 CHEN Yiming ZHAO Wanzhu +3 位作者 ZHANG Baiyang WU Kangle BIAN Jiangyu CHANG Yingfei 《分子科学学报》 CAS 2024年第4期358-362,共5页
The electronic and transport characteristics of protonated derivatives of naphthalocyanine(Nc)were investigated using density functional theory and non-equilibrium Green's functions.The results indicate that the p... The electronic and transport characteristics of protonated derivatives of naphthalocyanine(Nc)were investigated using density functional theory and non-equilibrium Green's functions.The results indicate that the protonation of external meso-N atoms of Nc preserves its planar structure and is energetically more favorable than the protonation of internal isoindole-N atoms.The protonation shifts the energy levels of system's frontier molecular orbitals closer to the Fermi level,thus creating channels for electron transport.In contrast with the semiconductor transport properties of H2Nc,its protonation products respond more sensitively to bias and exhibit negative differential resistance phenomena at specific bias. 展开更多
关键词 protonation reaction electronic structure transport property NAPHTHALOCYANINE negative differential resistance effect
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Remarkable Resistance Change in Plasma Oxidized TiOx/TiNx Film for Memory Application 被引量:2
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作者 吴良才 宋志棠 +4 位作者 饶峰 徐成 张挺 殷伟君 封松林 《Chinese Physics Letters》 SCIE CAS CSCD 2007年第4期1103-1105,共3页
We report the experimental phenomenon of large resistance change in plasma oxidized TiOx/TiNx film fabricated on W bottom-electrode-contact (W-BEC) array. The W-BEC in diameter 26Ohm is fabricated by a 0.18μm CMOS ... We report the experimental phenomenon of large resistance change in plasma oxidized TiOx/TiNx film fabricated on W bottom-electrode-contact (W-BEC) array. The W-BEC in diameter 26Ohm is fabricated by a 0.18μm CMOS technology, and the TiOx/TiNx cell array is formed by rf magnetron sputtering and reactive ion etching. In current-voltage (I- V) measurement for current-sweeping mode, large snap-back of voltage is observed, which indicates that the sample changes from high-resistance state (HRS) to low-resistance state (LRS). In the I-V measurement for voltage-sweeping mode, large current collapse is observed, which indicates that the sample changes from LRS to HRS. The current difference between HRS and LRS is about two orders. The threshold current and voltage for the resistance change is about 5.0- 10^-5 A and 2.5 V, respectively. The pulse voltage can also change the resistance and the pulse time is as shorter as 30 ns for the resistance change. These properties of TiOx/TiNx film are comparable to that of conventional phase-change material, which makes it possible for RRAM application. 展开更多
关键词 RANDOM-ACCESS MEMORY THIN OXIDE-FILMS GE2SB2TE5 FILMS ELECTRICAL-PROPERTIES negative resistance NIO FILMS
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Negative Temperature Coefficient of Resistivity in Bulk Nanostructured Ag 被引量:1
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作者 Yushuang LIU, Chimei MO+ and Weili CAI (Department of Materials Science and Engineering, University of Science and Technology of China, Hefei 230026, China) 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2000年第5期521-524,共4页
The change of the temperature coefficient of resistivity (a) with the particle size, dp, and the grain size, dc, in the nanostructured Ag bulk samples was investigated. dp and dc were controlled by heating the nano-Ag... The change of the temperature coefficient of resistivity (a) with the particle size, dp, and the grain size, dc, in the nanostructured Ag bulk samples was investigated. dp and dc were controlled by heating the nano-Ag powders over the temperature range from 393 to 453 K. The electrical resistance measurements of the nanostructured Ag bulk samples obtained by compacting the Ag powders after heat treatments showed a change in the sign of a with dP and dc. When dp and dc are smaller or equal to 18 and 11 nm below room temperature or 20 and 12 nm above room temperature, respectively, the sign of the temperature coefficient of resistivity changes from positive to negative. The negative a arises mainly from the high resistivity induced by the particle interfaces with very lowly ordered or even disordered structure, a large volume fraction of interfaces and impurities existing in the interfaces, and the quantum size effect appearing in the nano-Ag grains. 展开更多
关键词 negative Temperature Coefficient of Resistivity in Bulk Nanostructured Ag
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Modeling and Simulation of Photoelectronic Lambda Bipolar Transistor 被引量:1
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作者 张世林 张波 郭维廉 《Transactions of Tianjin University》 EI CAS 2005年第5期348-352,共5页
Based on the region model of lambda bipolar transistor ( LBT), a dividing region theory model of PLBT is set up,simulated and verified. Firstly, the principal operations of different kinds of photoelectronic lambda bi... Based on the region model of lambda bipolar transistor ( LBT), a dividing region theory model of PLBT is set up,simulated and verified. Firstly, the principal operations of different kinds of photoelectronic lambda bipolar transistor ( PLBT) are characterized by a simple circuit model. Through mathematical analysis of the equivalent circuit, the typical characteristics curve is divided into positive resistance, peak, negative resistance and cutoff regions. Secondly, by analyzing and simulating this model, the ratio of MOSFET width to channel length, threshold voltage and common emitter gain are discovered as the main structure parameters that determine the characteristic curves of PLBT. And peak region width, peak current value, negative resistance value and valley voltage value of PLBT can be changed conveniently according to the actual demands by modifying these parameters. Finally comparisons of the characteristics of the fabricated devices and the simu- lation results are made, which show that the analytical results are in agreement with the observed devices characteristics. 展开更多
关键词 silicon photoelectronic negative resistance device bipolar transistor device modeling
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Preparation and Characteristics of Cu/Al_2O_3/MgF_2/Au Tunnel Junction
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作者 王茂祥 《Journal of Wuhan University of Technology(Materials Science)》 SCIE EI CAS 2009年第5期721-724,共4页
The fabrication process of Cu/Al2O3/MgF2/Au double-barrier metal/insulator/metal junction (DMIMJ) was introduced, and more stable light emission from this junction was successfully observed. The light emission physi... The fabrication process of Cu/Al2O3/MgF2/Au double-barrier metal/insulator/metal junction (DMIMJ) was introduced, and more stable light emission from this junction was successfully observed. The light emission physical mechanism of the junction was discussed. Results show that light emission spectrum of this structure locates at wavelength of 250-700 nm with two peaks at around 460 nm and 640 nm, which moves towards shorter wavelength region in comparison with that of the Al/Al2O3/Au junction. The light emission efficiency of this junction ranges from 0.7×10^-5-2.0×10^-5, which is 1 to 2 orders higher than that of the single-barrier Al/Al2O3/Au junction. The improved properties of this structure should be due to the electrons resonant tunneling effect in the double-barrier. 展开更多
关键词 double-barrier junction light emission negative resistance phenomenon electron resonant tunneling
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Simulating Experiment and Circuit Simulation of RTD/HPT Photo-Controlled MOBILE
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作者 齐海涛 张之圣 +3 位作者 郭维廉 钟明 梁惠来 张世林 《Transactions of Tianjin University》 EI CAS 2004年第3期217-220,共4页
The MOBILE is a logic element realizing the monostable-bistable transition of a circuit that consists of two resonant tunneling transistors—the resonant tunneling diodes (RTDs) connected in series. It has several adv... The MOBILE is a logic element realizing the monostable-bistable transition of a circuit that consists of two resonant tunneling transistors—the resonant tunneling diodes (RTDs) connected in series. It has several advantages including multiple inputs and multiple functions. In this paper, by connecting a heterojunction phototransistor (HPT) with the MOBILE, a novel optoelectronic functional device can be got, which presents the function of both photocurrent switching and photocurrent latching. These behaviors have been demonstrated for the first time by simulating experiments and circuit simulations, with RTDs firstly manufactured in China. Research indicates that the novel photo-controlled MOBILE has the same logic functions as conventional electrical MOBILE except for with light as an input signal. 展开更多
关键词 photo-controlled MOBILE negative resistance device high-speed optoelectronic logic element RTD/HPT optoelectronic integration
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