We are concerned, in a static regime, with a three-dimensional bounded domain of certain an imaging approach of the locations in electromagnetic imperfections. This approach is related to Electrical Impedance Tomograp...We are concerned, in a static regime, with a three-dimensional bounded domain of certain an imaging approach of the locations in electromagnetic imperfections. This approach is related to Electrical Impedance Tomography and makes use of a new perturbation formula in the electric fields. We present two localization procedures, from a Current Pro- jection method that deals with the single imperfection context and an inverse Fourier process that is devoted to multiple imperfections configurations. These procedures extend those that were described in our previous work, since operating for a broader class of settings. Namely, the localization is additionally performed for certain purely electric imperfections, as established from numerical simulations.展开更多
文摘We are concerned, in a static regime, with a three-dimensional bounded domain of certain an imaging approach of the locations in electromagnetic imperfections. This approach is related to Electrical Impedance Tomography and makes use of a new perturbation formula in the electric fields. We present two localization procedures, from a Current Pro- jection method that deals with the single imperfection context and an inverse Fourier process that is devoted to multiple imperfections configurations. These procedures extend those that were described in our previous work, since operating for a broader class of settings. Namely, the localization is additionally performed for certain purely electric imperfections, as established from numerical simulations.
