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A Comprehensive Review for Micro/Nanoscale Thermal Mapping Technology Based on Scanning Thermal Microscopy
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作者 LI Yifan ZHANG Yuan +2 位作者 LIU Yicheng XIE Huaqing YU Wei 《Journal of Thermal Science》 SCIE EI CAS CSCD 2022年第4期976-1007,共32页
Thermal characterization becomes challenging as the material size is reduced to micro/nanoscales.Based on scanning probe microscopy(SPM),scanning thermal microscopy(STh M)is able to collect thermophysical characterist... Thermal characterization becomes challenging as the material size is reduced to micro/nanoscales.Based on scanning probe microscopy(SPM),scanning thermal microscopy(STh M)is able to collect thermophysical characteristics of the microscopic domain with high spatial resolution.Starting from its development history,this review introduces the operation mechanism of the instrument in detail,including working principles,thermal probes,quantitative study,and applications.As the core principle of STh M,the heat transfer mechanism section is discussed emphatically.Additionally,the emerging technologies based on the STh M platform are clearly reviewed and corresponding examples are presented in detail.Finally,the current challenges and future opportunities of STh M are discussed. 展开更多
关键词 micro/nanoscale thermal mapping scanning thermal microscopy interfacial heat transfer THERMOELECTRICS
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