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Emergence of metal-semiconductor phase transition in MX_(2)(M=Ni,Pd,Pt;X=S,Se,Te)moirésuperlattices
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作者 Jie Li Rui-Zi Zhang +2 位作者 Jinbo Pan Ping Chen Shixuan Du 《Chinese Physics B》 2025年第3期12-18,共7页
Two-dimensional(2D)moirésuperlattices with a small twist in orientation exhibit a broad range of physical properties due to the complicated intralayer and interlayer interactions modulated by the twist angle.Here... Two-dimensional(2D)moirésuperlattices with a small twist in orientation exhibit a broad range of physical properties due to the complicated intralayer and interlayer interactions modulated by the twist angle.Here,we report a metal-semiconductor phase transition in homojunction moirésuperlattices of NiS_(2) and PtTe_(2) with large twist angles based on high-throughput screening of 2D materials MX_(2)(M=Ni,Pd,Pt;X=S,Se,Te)via density functional theory(DFT)calculations.Firstly,the calculations for different stacking configurations(AA,AB and AC)reveal that AA stacking ones are stable for all the bilayer MX_(2).The metallic or semiconducting properties of these 2D materials remain invariable for different stacking without twisting except for NiS_(2) and PtTe_(2).For the twisted configurations,NiS_(2) transfers from metal to semiconductor when the twist angles are 21.79°,27.79°,32.20°and 60°.PtTe_(2) exhibits a similar transition at 60°.The phase transition is due to the weakened d-p orbital hybridization around the Fermi level as the interlayer distance increases in the twisted configurations.Further calculations of untwisted bilayers with increasing interlayer distance demonstrate that all the materials undergo metal-semiconductor phase transition with the increased interlayer distance because of the weakened d-p orbital hybridization.These findings provide fundamental insights into tuning the electronic properties of moirésuperlattices with large twist angles. 展开更多
关键词 moirésuperlattices first-principles calculations metal-semiconductor phase transition
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Improved performance of 4H-SiC metal-semiconductor field-effect transistors with step p-buffer layer
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作者 邓小川 张波 +2 位作者 张有润 王易 李肇基 《Chinese Physics B》 SCIE EI CAS CSCD 2011年第1期584-588,共5页
An improved 4H-SiC metal-semiconductor field-effect transistors (MESFETs) with step p-buffer layer is proposed, and the static and dynamic electrical performances are analysed in this paper. A step p-buffer layer ha... An improved 4H-SiC metal-semiconductor field-effect transistors (MESFETs) with step p-buffer layer is proposed, and the static and dynamic electrical performances are analysed in this paper. A step p-buffer layer has been applied not only to increase the channel current, but also to improve the transconductance. This is due to the fact that the variation in p-buffer layer depth leads to the decrease in parasitic series resistance resulting from the change in the active channel thickness and modulation in the electric field distribution inside the channel. Detailed numerical simulations demonstrate that the saturation drain current and the maximum theoretical output power density of the proposed structure are about 30% and 37% larger than those of the conventional structure. The cut-off frequency and the maximum oscillation frequency of the proposed MESFETs are 14.5 and 62 GHz, respectively, which are higher than that of the conventional structure. Therefore, the 4H-SiC MESFETs with step p-buffer layer have superior direct-current and radio-frequency performances compared to the similar devices based on the conventional structure. 展开更多
关键词 4H-SIC metal-semiconductor field-effect transistors step buffer laver
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Drain-induced barrier lowering effect for short channel dual material gate 4H silicon carbide metal-semiconductor field-effect transistor
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作者 张现军 杨银堂 +3 位作者 段宝兴 柴常春 宋坤 陈斌 《Chinese Physics B》 SCIE EI CAS CSCD 2012年第9期455-459,共5页
Sub-threshold characteristics of the dual material gate 4H-SiC MESFET (DMGFET) are investigated and the analytical models to describe the drain-induced barrier lowering (DIBL) effect are derived by solving one- an... Sub-threshold characteristics of the dual material gate 4H-SiC MESFET (DMGFET) are investigated and the analytical models to describe the drain-induced barrier lowering (DIBL) effect are derived by solving one- and two- dimensional Poisson's equations. Using these models, we calculate the bottom potential of the channel and the threshold voltage shift, which characterize the drain-induced barrier lowering (DIBL) effect. The calculated results reveal that the dual material gate (DMG) structure alleviates the deterioration of the threshold voltage and thus suppresses the DIBL effect due to the introduced step function, which originates from the work function difference of the two gate materials when compared with the conventional single material gate metal-semiconductor field-effect transistor (SMGFET). 展开更多
关键词 silicon carbide metal-semiconductor contact dual material gate
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The Model for Linear Magnetoresistance of Two-Dimensional Metal-Semiconductor Composites with Interfacial Shells
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作者 徐洁 王国栋 +2 位作者 李山东 李强 高小洋 《Chinese Physics Letters》 SCIE CAS CSCD 2015年第9期123-127,共5页
A metal-semiconductor composite with the interracial shells is investigated theoretically for the large linear mag- netoresistance effect of high doping Ag2+δ Se and Ag2+δ te materials. The magnetoresistance (MR... A metal-semiconductor composite with the interracial shells is investigated theoretically for the large linear mag- netoresistance effect of high doping Ag2+δ Se and Ag2+δ te materials. The magnetoresistance (MR) of composites is a function of the magnetic field, temperature, the conductivities of two phases without magnetic field, and the thickness and conductivity of the interracial shells. The MR increases with the increase of the magnetic field and with the decrease of temperature, and no saturation is found even under the high magnetic field. Moreover, it is interestingly found that the interracial shell is an important factor for the MR of the composites. The MR increases with the thickness and the conductivity of the interfacial shells. Lastly, the theoretical results on the MR are compared with the experimental data. It is found that the value of the MR of the composite with the interfacial shell is larger than that without the interfacial shell. 展开更多
关键词 The Model for Linear Magnetoresistance of Two-Dimensional metal-semiconductor Composites with Interfacial Shells Ag MR
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MODELING OF METAL-SEMICONDUCTOR-METAL PHOTODETECTOR
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作者 陈维友 刘式墉 《Journal of Electronics(China)》 1994年第4期377-382,共6页
A complete model of Metal-Semiconductor-Metal Photodetector(MSM-PD) is presented. It can be used in any circuit simulators. Simulated DC characteristics for a GaAs MSM-PD are in good agreement with reported results.
关键词 metal-semiconductor-metal PHOTODETECTOR MODELING COMPUTER-AIDED ANALYSIS
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Metal-Semiconductor Interfaces Investigated by Positron Annihilation Spectroscopy
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作者 Abdulnasser S. Saleh 《World Journal of Condensed Matter Physics》 CAS 2016年第2期68-74,共7页
Variable-energy positron annihilation spectroscopy has been applied to study interfaces in Al/Si, Au/Si and Au/GaAs structures. Computational fittings of ROYPROF program were used to analyze Doppler broadening results... Variable-energy positron annihilation spectroscopy has been applied to study interfaces in Al/Si, Au/Si and Au/GaAs structures. Computational fittings of ROYPROF program were used to analyze Doppler broadening results in order to determine kinds of regions that positrons were likely to sample. The interfaces were found acting as a capturing thin layer with negligible positrons stopped in them and their characteristics came only from positrons diffusing to these interfaces, the positron work function of these materials were taken into consideration. In all fittings, the interfaces are found to have 1 nm thickness and act as an absorbing sink for all thermal positrons diffusing towards them, and this indicates either the existence of open volume defects or a weakness of known theoretical models for positron affinities. The result is supported by measurements obtained by applying external electric fields on Al/Si sample. Theoretical fittings have clearly demonstrated the sensitivity of interfaces in these attempts and their importance in data analyzing and in developing of fitting cods. 展开更多
关键词 Positron Annihilation INTERFACE metal-semiconductor DEFECTS
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Fabrication of Ag@Cu2O core-shell metal-semiconductor nanoparticles and high efficiency photocatalysis under visible- near-infrared light irradiation
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作者 Lele Wang Ailing Yang +1 位作者 Xichang Bao Renqiang Yang 《纳米科技》 2015年第5期43-50,共8页
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基于Pt纳米颗粒修饰的La_(0.8)Sr_(0.2)FeO_(3)增强型NO传感器
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作者 王杰 王晓丽 +3 位作者 周明军 程振乾 邹杰 简家文 《传感器与微系统》 北大核心 2026年第3期57-61,共5页
基于铂(Pt)对氮氧化物(NO_(x))的显著催化能力,设计并制备了一种新型的一氧化氮(NO)敏感材料,并对其气敏特性进行了测试。通过浸渍法制备了基于Pt纳米颗粒(PtNPs)修饰的La_(0.8)Sr_(0.2)FeO_(3)(LSF)金属氧化物半导体NO传感器。研究结... 基于铂(Pt)对氮氧化物(NO_(x))的显著催化能力,设计并制备了一种新型的一氧化氮(NO)敏感材料,并对其气敏特性进行了测试。通过浸渍法制备了基于Pt纳米颗粒(PtNPs)修饰的La_(0.8)Sr_(0.2)FeO_(3)(LSF)金属氧化物半导体NO传感器。研究结果显示:在最佳工作温度(200℃)下,基于1%vol PtNPs修饰的样品表现出优异的气敏特性,具有160.5×10^(-6)的灵敏度,相较于未经PtNPs修饰的样品,提高了近一倍。在长期稳定性测试中,传感器的响应波动不超过5%。同时,该传感器具有良好的选择性和一致性。这些结果表明:PtNPs的催化作用是提高气敏特性的主要原因。 展开更多
关键词 铂纳米颗粒 修饰 金属氧化物半导体 传感器 催化
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高速视觉芯片研究进展
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作者 王哲 杨旭 +8 位作者 吕卓阳 丁伯文 于双铭 窦润江 石匆 刘剑 吴南健 冯鹏 刘力源 《物理学报》 北大核心 2026年第4期21-42,共22页
在边缘计算场景中,视觉感知系统的响应速度、体积及功耗已成为核心挑战.传统感算分离的视觉系统因数据传输导致的高延迟、高功耗以及隐私泄露等问题亟待解决.在此背景下,模仿人类视觉系统的视觉芯片成为有效解决方案之一,视觉芯片将图... 在边缘计算场景中,视觉感知系统的响应速度、体积及功耗已成为核心挑战.传统感算分离的视觉系统因数据传输导致的高延迟、高功耗以及隐私泄露等问题亟待解决.在此背景下,模仿人类视觉系统的视觉芯片成为有效解决方案之一,视觉芯片将图像采集与信息处理集成在一起,实现了感算一体的协同处理机制,能在边缘端高效完成视觉感知与计算任务.本文围绕高速视觉芯片的技术路径,系统梳理了其关键环节的研究进展,分别从高速传感器件、读出电路与智能处理3个层面展开论述.分析了互补金属氧化物半导体图像传感器、动态视觉传感器与单光子图像传感器在实现高速光电转换中的物理机制、结构创新与性能瓶颈;探讨了高速模数转换、地址事件编码及时间相关单光子计数等读出电路架构及其效率优化策略;并介绍了基于脉冲信号的高速图像复原与脉冲神经网络处理等前沿智能处理算法.最后对高速视觉芯片未来发展趋势进行了展望. 展开更多
关键词 高速视觉芯片 互补金属氧化物半导体图像传感器 脉冲型图像传感器 高速脉冲处理
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Epitaxial growth of metal-semiconductor van der Waals heterostructures NbS2/MoS2 with enhanced performance of transistors and photodetectors 被引量:4
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作者 Peng Zhang Ce Bian +9 位作者 Jiafu Ye Ningyan Chen Xingguo Wang Huaning Jiang Yi Wei Yiwei Zhang Yi Du Lihong Bao Weida Hu Yongji Gong 《Science China Materials》 SCIE EI CSCD 2020年第8期1548-1559,共12页
Two-dimensional(2D)heterostructures based on layered transition metal dichalcogenides(TMDs)have attracted increasing attention for the applications of the nextgeneration high-performance integrated electronics and opt... Two-dimensional(2D)heterostructures based on layered transition metal dichalcogenides(TMDs)have attracted increasing attention for the applications of the nextgeneration high-performance integrated electronics and optoelectronics.Although various TMD heterostructures have been successfully fabricated,epitaxial growth of such atomically thin metal-semiconductor heterostructures with a clean and sharp interface is still challenging.In addition,photodetectors based on such heterostructures have seldom been studied.Here,we report the synthesis of high-quality vertical NbS2/MoS2metallic-semiconductor heterostructures.By using NbS2as the contact electrodes,the field-effect mobility and current on-off ratio of MoS2can be improved at least 6-fold and two orders of magnitude compared with the conventional Ti/Au contact,respectively.By using NbS2as contact,the photodetector performance of MoS2is much improved with higher responsivity and less response time.Such facile synthesis of atomically thin metal-semiconductor heterostructures by a simple chemical vapor deposition strategy and its effectiveness as ultrathin 2D metal contact open the door for the future application of electronics and optoelectronics. 展开更多
关键词 metal-semiconductor heterostructures contact engineering field-effect transistor PHOTODETECTOR
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环境条件对功率器件热阻测试的影响研究
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作者 胡建力 王磊 +2 位作者 张斌 林氦 郭清 《电子产品可靠性与环境试验》 2026年第1期94-99,共6页
结-壳热阻是衡量功率器件从芯片表面到封装表面热扩散能力的重要参数,也是器件最关键的热性能指标之一。以金属-氧化物-半导体场效应晶体管和绝缘栅双极型晶体管分立器件为研究对象,探讨两种环境条件对结-壳热阻测试的影响:一是在不同... 结-壳热阻是衡量功率器件从芯片表面到封装表面热扩散能力的重要参数,也是器件最关键的热性能指标之一。以金属-氧化物-半导体场效应晶体管和绝缘栅双极型晶体管分立器件为研究对象,探讨两种环境条件对结-壳热阻测试的影响:一是在不同环境下采用相同分离层,二是在相同环境下采用不同分离层。测试结果表明,在不同温度环境下可获得相近的K系数;在此基础上,选用相同的分离层可测得接近的结-壳热阻值。而准确获得结-壳热阻,需确保分离层与器件、散热层之间紧密接触,且分离层具有较高的导热系数。本研究结果为功率分立器件的结-壳热阻测试提供了参考。 展开更多
关键词 金属-氧化物-半导体场效应晶体管 绝缘栅双极型晶体管 环境条件 分离层 热阻 K系数
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基于CIS的瞬态信息分幅成像技术
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作者 马友麟 陈颀萱 +4 位作者 唐梓栋 焦国柱 吕超 向利娟 蔡厚智 《深圳大学学报(理工版)》 北大核心 2026年第2期196-202,共7页
微通道板行波选通分幅相机常用于惯性约束聚变,存在体积庞大和非单视线成像等问题,可以采用互补金属氧化物半导体(complementary metal oxide semiconductor,CMOS)图像传感器(CMOS image sensor,CIS)替代微通道板变像管的方式来解决这... 微通道板行波选通分幅相机常用于惯性约束聚变,存在体积庞大和非单视线成像等问题,可以采用互补金属氧化物半导体(complementary metal oxide semiconductor,CMOS)图像传感器(CMOS image sensor,CIS)替代微通道板变像管的方式来解决这些问题.基于0.18µm标准CMOS工艺,提出一种8×8像素阵列的CMOS图像传感器设计方案.通过设计超短快门像素电路和快门信号控制电路,实现单次4分幅成像,并采用基于单端放大器的相关双采样电路消除噪声.仿真结果表明,该电路功能正常,4幅图像像素信号均匀性优于99%,每幅图像时间分辨率为100 ps,画幅时间间隔为300 ps. 展开更多
关键词 光电检测技术 惯性约束聚变 超快诊断 分幅成像 CMOS图像传感器 时间分辨率
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稀土Er掺杂SnO_(2)材料对甲醛的气敏响应
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作者 杨升爵 张玉红 +2 位作者 庄成 李生辉 王律青 《吉林建筑大学学报》 2026年第1期76-81,共6页
利用水热法合成了SnO_(2)和Er/SnO_(2)纳米材料,进行XRD、SEM和EDS材料表征分析,3 mol%Er^(3+)/SnO_(2)材料的纳米颗粒相比于纯的SnO_(2),颗粒更小,进而具有更大的比表面积。将其用于针对甲醛气体的测试,探寻稀土元素在金属氧化物半导... 利用水热法合成了SnO_(2)和Er/SnO_(2)纳米材料,进行XRD、SEM和EDS材料表征分析,3 mol%Er^(3+)/SnO_(2)材料的纳米颗粒相比于纯的SnO_(2),颗粒更小,进而具有更大的比表面积。将其用于针对甲醛气体的测试,探寻稀土元素在金属氧化物半导体中用于甲醛检测的气敏特性。在甲醛检测方面发现,50 ppm浓度下,Er^(3+)/SnO_(2)材料比纯SnO_(2)材料对于甲醛具有更好的响应和突出的选择性。此外,在200℃环境下,Er^(3+)/SnO_(2)对5~50 ppm范围内不同浓度的甲醛表现出线性关系。本文详细讨论了Er^(3+)/SnO_(2)纳米粒子对甲醛响应的增强机理,研究结果为提升金属半导体氧化物气体传感器对于检测甲醛气体性能提供了新的思路。 展开更多
关键词 水热法 甲醛 稀土元素 金属氧化物半导体
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功率电子器件结构发展概述
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作者 张家驹 闫闯 +4 位作者 刘俐 刘国友 周洋 刘胜 陈志文 《电子与封装》 2026年第2期71-86,共16页
在功率电子的高压与低压应用中,硅基绝缘栅双极型晶体管(IGBT)和金属-氧化物半导体场效应晶体管(MOSFET)正分别占据主流。由于Si材料自身的局限性,新型功率器件不断涌现,其中以碳化硅(SiC)、氮化镓(GaN)为代表的第三代宽禁带半导体器件... 在功率电子的高压与低压应用中,硅基绝缘栅双极型晶体管(IGBT)和金属-氧化物半导体场效应晶体管(MOSFET)正分别占据主流。由于Si材料自身的局限性,新型功率器件不断涌现,其中以碳化硅(SiC)、氮化镓(GaN)为代表的第三代宽禁带半导体器件,以及金刚石、氧化镓(Ga2O3)等超宽禁带半导体器件最为典型。回顾MOSFET、IGBT以及GaN高电子迁移率晶体管(HEMT) 3类功率电子器件的结构发展历程,综述这3类器件向宽禁带化演进过程中的结构发展,分析各结构的设计特点及在击穿电压、热管理、开关特性等方面的性能提升机制,并讨论各个方案的利弊;最后分别论述其发展过程中遇到的问题,并对未来发展方向作出展望。 展开更多
关键词 宽禁带半导体器件 功率电子器件 金属-氧化物半导体场效应晶体管(MOSFET) 绝缘栅双极型晶体管(IGBT) 高电子迁移率晶体管(HEMT)
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Ultrathin nanoporous metal-semiconductor heterojunction photoanodes for visible light hydrogen evolution
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作者 Weiqing Zhang Yunfeng Zhao +7 位作者 Kai He Jun Luo Guoliang Li Ruirui Liu Siyu Liu Zhen Cao Pengtao Jing Yi Ding 《Nano Research》 SCIE EI CAS CSCD 2018年第4期2046-2057,共12页
Plasmonic metal-semiconductor nano-heterojuncfions (NHJs), with their superior photocatalytic performance, provide opportunities for the efficient utilization of solar energy. However, scientific significance and te... Plasmonic metal-semiconductor nano-heterojuncfions (NHJs), with their superior photocatalytic performance, provide opportunities for the efficient utilization of solar energy. However, scientific significance and technical challenges remain in the development of suitable metal-semiconductor NHJ photoelectrodes for new generation flexible optoelectronic devices, which often require complex processing. Herein, we report integrated three-dimensional (3D) NHJ photoelectrodes by conformally coating cadmium sulfide (CdS) nanolayers onto ultrathin nano- porous gold (NPG) films via a facile electrodeposition method. Localized surface plasmon resonance (LSPR) of NPG enhances the electron-hole pair generation and separation. Moreover, the direct contact interface and high conductive framework structure of the NHJs boosts the photogenerated carrier separation and transport. Hence, the NHJs exhibit evidently enhanced photocurrent density and hydrogen evolution rate relative to CdS deposited on either gold (Au) foil or fluorine-doped tin oxide (FTO) at 0 V vs. SCE (saturated calomel electrode) under visible-light irradiation. Moreover, they demonstrate a surprisingly stable photoelectrochemical hydrogen evolution (PEC-HE) activity over 104 s of continuous irradiation. 展开更多
关键词 nanoporous gold cadmium sulfide metal-semiconductor heterojunction localized surface plasmon resonance visible light hydrogen evolution DEALLOYING
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Co_(3)O_(4)@SnO_(2)异质结材料的设计构筑及其氢气气敏性能研究
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作者 林孟豪 陈唯一 +3 位作者 王添乐 丁杨 路金达 刘洋 《中国陶瓷》 北大核心 2026年第1期24-32,共9页
电力变压器油中溶解气体气敏检测面临传统气敏材料对低浓度H_(2)的检测灵敏度不足和传感器响应动态范围有限等问题,难以满足变压器早期故障监测的精度要求并会严重影响故障等级的准确判断。基于此,本文采用“分步水热-煅烧法”成功合成... 电力变压器油中溶解气体气敏检测面临传统气敏材料对低浓度H_(2)的检测灵敏度不足和传感器响应动态范围有限等问题,难以满足变压器早期故障监测的精度要求并会严重影响故障等级的准确判断。基于此,本文采用“分步水热-煅烧法”成功合成了Co_(3)O_(4)@SnO_(2)异质结复合材料,通过精确调控半导体氧化物显微结构及其表界面特性,系统研究了微结构对H_(2)气敏性能的增强机制。通过XRD、SEM、XPS等表征结果显示,ZIF-67衍生的Co_(3)O_(4)纳米颗粒均匀地负载于SnO_(2)表面,形成了紧密的p-n异质结界面并显著提升了异质结表面的氧空位浓度。气敏测试表明,在150℃的最佳工作温度下,优化后的Co_(3)O_(4)@SnO_(2)传感器对20 ppm H_(2)表现出较高的响应值(46.7),响应时间为17.2 s,恢复时间为21.6 s,且具备优异的线性和长期稳定性。气敏性能提升归因于异质结内建电场促进了氧吸附/解离动力学及氧空位对H_(2)分子的高效活化作用,为设计和开发高性能金属半导体氧化物基气敏传感器提供了“结构–性能”协同优化策略。 展开更多
关键词 氧空位调控 二氧化锡 四氧化三钴 金属氧化物半导体
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Engineering Colloidal Metal-Semiconductor Nanorods Hybrid Nanostructures for Photocatalysis
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作者 Jiayi Chen Derek Hao +7 位作者 Wei Chen Yazi Liu Zongyou Yin Hsien-Yi Hsu Bing-Jie Ni Aixiang Wang Simon W.Lewis Guohua Jia 《Chinese Journal of Chemistry》 SCIE CAS CSCD 2023年第22期3050-3062,共13页
Emerging engineering strategies of colloidal metal-semiconductor nanorod hybrid nanostructures spanning from type,size,dimension,and location of both metal nanoparticles and semiconductors,co-catalyst,band gap structu... Emerging engineering strategies of colloidal metal-semiconductor nanorod hybrid nanostructures spanning from type,size,dimension,and location of both metal nanoparticles and semiconductors,co-catalyst,band gap structure,surface ligand to hole scavenger are elaborated symmetrically to rationalize the design of this type of intriguing materials for efficient photocatalytic applications. 展开更多
关键词 Hybrid nanostructure metal-semiconductor nanorod Engineering strategy PHOTOCATALYSIS Hydrogen production
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sp^(2) to sp^(3) hybridization transformation in 2D metal-semiconductor contact interface suppresses tunneling barrier and Fermi level pinning simultaneously
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作者 Wenchao Shan Anqi Shi +4 位作者 Zhuorong Zhong Xiuyun Zhang Bing Wang Yongtao Li Xianghong Niu 《Nano Research》 SCIE EI CSCD 2024年第11期10227-10234,共8页
Van der Waals (vdWs) stacking of two-dimensional (2D) materials can effectively weaken the Fermi level pinning (FLP) effect in metal/semiconductor contacts due to dangling-bond-free surfaces. However, the inherent vdW... Van der Waals (vdWs) stacking of two-dimensional (2D) materials can effectively weaken the Fermi level pinning (FLP) effect in metal/semiconductor contacts due to dangling-bond-free surfaces. However, the inherent vdWs gap always induces a considerable tunneling barrier, significantly limiting carrier injection. Herein, by inducing a sp^(2) to sp^(3) hybridization transformation in 2D carbon-based metal via surface defect engineering, the large orbital overlap can form an efficient carrier channel, overcoming the tunneling barrier. Specifically, by selecting the 2D carbon-based X_(3)C_(2) (X = Cd, Hg, and Zn) metal and the 2D MSi_(2)N_(4) (M = Cr, Hf, Mo, Ti, V, and Zr) semiconductor, we constructed 36 metal/semiconductor contacts. For vdWs contacts, although Ohmic contacts can be formed at the interface, the highest tunneling probability (P TB) is only 3.11%. As expected, the P TB can be significantly improved, as high as 48.73%, when MSi_(2)N_(4), accompanied by surface nitrogen vacancies, forms an interface covalent bond with X_(3)C_(2). Simultaneously, weak FLP and Ohmic contact remain at the covalent-bond-based surface, attributing to the protection of the MSi_(2)N_(4) band-edge electronic states by the outlying Si-N sublayer. Our work provides a promising path for advancing the progress of 2D electronic and photoelectronic devices. 展开更多
关键词 two-dimensional(2D)material metal-semiconductor contacts tunneling-barrier Schottky barrier density functional theory
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一种基于宽带谐波整形的低相位噪声压控振荡器
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作者 程国枭 冯燕 +2 位作者 周美鑫 李志浩 康炜 《微波学报》 北大核心 2026年第1期79-85,共7页
文中设计了一种宽带低相位噪声压控振荡器(VCO)。该VCO采用了基于周期性时变电感的Class-D结构,并将共模谐振扩展技术应用于谐振腔,实现了宽带谐波整形,优化了整个带宽内的相位噪声性能。此外,将传统的N沟道金属氧化物半导体对替换为P... 文中设计了一种宽带低相位噪声压控振荡器(VCO)。该VCO采用了基于周期性时变电感的Class-D结构,并将共模谐振扩展技术应用于谐振腔,实现了宽带谐波整形,优化了整个带宽内的相位噪声性能。此外,将传统的N沟道金属氧化物半导体对替换为P沟道金属氧化物半导体交叉耦合对,降低了沟道电流的热噪声与闪烁噪声。该芯片采用SMIC 55-nm CMOS工艺制造,包括焊盘在内的芯片面积为0.47 mm^(2)。测试结果表明,该VCO芯片在3.5 GHz~5.1 GHz(38.4%)的宽频率范围内能连续工作,输出功率为7.5 d Bm~7.1 d Bm,其在3.5 GHz处测试的相位噪声为-125.8 d Bc/Hz@1 MHz。当电源电压为1.8 V时,该VCO核心消耗电流为21.3 m A~23.0 m A,缓冲级消耗电流为14.4 m A~15.3 m A,对应含调谐范围的优值(Fo MT)为192.4 d Bc/Hz~189.6 d Bc/Hz。 展开更多
关键词 压控振荡器 谐波整形 低相位噪声 宽带 互补金属氧化物半导体
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应用于工业园区恶臭气体监测与溯源的微型传感器研究进展
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作者 常鋆青 邓赞红 +2 位作者 潘宁 刘思源 孟钢 《大气与环境光学学报》 2026年第1期3-24,共22页
恶臭气体污染物是一类重要的大气污染物,其主要来源于工业园区的无组织排放。这些恶臭气体不仅刺鼻难闻而且还会直接危害人体健康。为有效控制工业园区的恶臭气体排放、科学评估其管控与治理效果,对恶臭气体排放通量及其分布进行精准监... 恶臭气体污染物是一类重要的大气污染物,其主要来源于工业园区的无组织排放。这些恶臭气体不仅刺鼻难闻而且还会直接危害人体健康。为有效控制工业园区的恶臭气体排放、科学评估其管控与治理效果,对恶臭气体排放通量及其分布进行精准监测和溯源至关重要。目前已经开发了多种新型气体传感器用于检测和分析各种恶臭气体成分。本文旨在详细审查关键类型的气体传感器,特别是光离子化(PID)、电化学(ECS)及金属氧化物半导体(MOS)这3种微型传感器,详细介绍了这3大类传感器的工作原理、结构特点、敏感材料、重要特性以及实际应用案例,并展望了各自在我国工业园区恶臭气体排放通量监测与溯源方面的应用前景。 展开更多
关键词 恶臭气体 光离子化传感器 电化学传感器 金属氧化物半导体传感器 监测溯源 多传感器融合
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