In this paper we study a group testing model ФX, Y,, XY. In other words, we consider a n-item set containing exactly two defective ones. The purpose of this paper is to find out the two defective items with a worst-c...In this paper we study a group testing model ФX, Y,, XY. In other words, we consider a n-item set containing exactly two defective ones. The purpose of this paper is to find out the two defective items with a worst-case minimum number of tests, each of which will indicates whether the subset being tested contains all good （normal） items or not and in the latter case, it is not sure that the tested subset is of one defective （bad） item or two. Based on the M-sharp algorithm obtained in the previous paper and some combinatorial skills, we derive an almost optimal algorithm for the so called n-problem.展开更多
基金This research is supported by Natural Science Foundation of Beiing （1052007）.
文摘In this paper we study a group testing model ФX, Y,, XY. In other words, we consider a n-item set containing exactly two defective ones. The purpose of this paper is to find out the two defective items with a worst-case minimum number of tests, each of which will indicates whether the subset being tested contains all good （normal） items or not and in the latter case, it is not sure that the tested subset is of one defective （bad） item or two. Based on the M-sharp algorithm obtained in the previous paper and some combinatorial skills, we derive an almost optimal algorithm for the so called n-problem.
