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Lateral-Coupled Junctionless IZO-Based Electric-Double-Layer Thin-Film Transistors Gated by Solid-State Phosphorosilicate Glass Electrolyte
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作者 周菊枚 高晓红 张洪亮 《Chinese Physics Letters》 SCIE CAS CSCD 2015年第3期149-152,共4页
We describe the lateral-coupled junctionless indium-zinc-oxide (IZO) thin-film transistors (TFTs) in which there are no junctions between channel and source/drain electrodes and with solid-state phosphorosilieate ... We describe the lateral-coupled junctionless indium-zinc-oxide (IZO) thin-film transistors (TFTs) in which there are no junctions between channel and source/drain electrodes and with solid-state phosphorosilieate glass electrolyte (PSG) gating. Due to the three-dimensional high proton conduction and lateral coupled electric-double- layer (EDL) capacitance (〉 1 #Flora2) of the PSG, the low voltage (2.0 V) junctionless IZO TFTs and the dual eoplanar gate devices are obtained. An AND logic function is demonstrated on the basis of the junctionless EDL-TFTs. Such devices are promising for applications in pH sensors, humidity sensors, biosensors, and neuron network simulation. 展开更多
关键词 PSG lateral-coupled Junctionless IZO-Based Electric-Double-Layer Thin-Film Transistors Gated by Solid-State Phosphorosilicate Glass Electrolyte EDL
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