At the end of last year, the editors from Power and Electrical Engineers interviewed Zhou Xiaoxin on "Fundamental Research on Enhancing Operation Reliability for Large-Scale Interconnected Power Grids", a pr...At the end of last year, the editors from Power and Electrical Engineers interviewed Zhou Xiaoxin on "Fundamental Research on Enhancing Operation Reliability for Large-Scale Interconnected Power Grids", a project of "973 Program". Mr. Zhou, the chief engineer of China Electric Power Research Institute(CEPRI) and an academician of Chinese Academy of Sciences, is the chief scientist in charge of this research project.展开更多
Dipole coupled nanomagnets controlled by the static Zeeman field can form various magnetic logic interconnects.However, the corner wire interconnect is often unreliable and error-prone at room temperature. In this stu...Dipole coupled nanomagnets controlled by the static Zeeman field can form various magnetic logic interconnects.However, the corner wire interconnect is often unreliable and error-prone at room temperature. In this study, we address this problem by making it into a reliable type with trapezoid-shaped nanomagnets, the shape anisotropy of which helps to offer the robustness. The building method of the proposed corner wire interconnect is discussed,and both its static and dynamic magnetization properties are investigated. Static micromagnetic simulation demonstrates that it can work correctly and reliably. Dynamic response results are reached by imposing an ac microwave field on the proposed corner wire. It is found that strong ferromagnetic resonance absorption appears at a low frequency. With the help of a very small ac field with the peak resonance frequency, the required static Zeeman field to switch the corner wire is significantly decreased by ~21 m T. This novel interconnect would pave the way for the realization of reliable and low power nanomagnetic logic circuits.展开更多
Nanomagnet logic（NML） devices have been proposed as one of the best candidates for the next generation of integrated circuits thanks to its substantial advantages of nonvolatility, radiation hardening and potentiall...Nanomagnet logic（NML） devices have been proposed as one of the best candidates for the next generation of integrated circuits thanks to its substantial advantages of nonvolatility, radiation hardening and potentially low power. In this article, errors of nanomagnetic interconnect wire subjected to magnet edge imperfections have been evaluated for the purpose of reliable logic propagation. The missing corner defects of nanomagnet in the wire are modeled with a triangle, and the interconnect fabricated with various magnetic materials is thoroughly investigated by micromagnetic simulations under different corner defect amplitudes and device spacings. The results show that as the defect amplitude increases, the success rate of logic propagation in the interconnect decreases. More results show that from the interconnect wire fabricated with materials, iron demonstrates the best defect tolerance ability among three representative and frequently used NML materials, also logic transmission errors can be mitigated by adjusting spacing between nanomagnets. These findings can provide key technical guides for designing reliable interconnects.展开更多
文摘At the end of last year, the editors from Power and Electrical Engineers interviewed Zhou Xiaoxin on "Fundamental Research on Enhancing Operation Reliability for Large-Scale Interconnected Power Grids", a project of "973 Program". Mr. Zhou, the chief engineer of China Electric Power Research Institute(CEPRI) and an academician of Chinese Academy of Sciences, is the chief scientist in charge of this research project.
基金Supported by the National Natural Science Foundation of China under Grant No 61302022
文摘Dipole coupled nanomagnets controlled by the static Zeeman field can form various magnetic logic interconnects.However, the corner wire interconnect is often unreliable and error-prone at room temperature. In this study, we address this problem by making it into a reliable type with trapezoid-shaped nanomagnets, the shape anisotropy of which helps to offer the robustness. The building method of the proposed corner wire interconnect is discussed,and both its static and dynamic magnetization properties are investigated. Static micromagnetic simulation demonstrates that it can work correctly and reliably. Dynamic response results are reached by imposing an ac microwave field on the proposed corner wire. It is found that strong ferromagnetic resonance absorption appears at a low frequency. With the help of a very small ac field with the peak resonance frequency, the required static Zeeman field to switch the corner wire is significantly decreased by ~21 m T. This novel interconnect would pave the way for the realization of reliable and low power nanomagnetic logic circuits.
基金supported by the National Natural Science Foundation of China(No.61302022)the Scientific Research Foundation for Postdoctor of Air Force Engineering University(Nos.2015BSKYQD03,2016KYMZ06)
文摘Nanomagnet logic（NML） devices have been proposed as one of the best candidates for the next generation of integrated circuits thanks to its substantial advantages of nonvolatility, radiation hardening and potentially low power. In this article, errors of nanomagnetic interconnect wire subjected to magnet edge imperfections have been evaluated for the purpose of reliable logic propagation. The missing corner defects of nanomagnet in the wire are modeled with a triangle, and the interconnect fabricated with various magnetic materials is thoroughly investigated by micromagnetic simulations under different corner defect amplitudes and device spacings. The results show that as the defect amplitude increases, the success rate of logic propagation in the interconnect decreases. More results show that from the interconnect wire fabricated with materials, iron demonstrates the best defect tolerance ability among three representative and frequently used NML materials, also logic transmission errors can be mitigated by adjusting spacing between nanomagnets. These findings can provide key technical guides for designing reliable interconnects.
