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Polypropylene Insulation Failure Model Modification Based on Space Charge and Trap Parameters
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作者 Beibei Sun Yanze Han +4 位作者 Tianzhen Liu Xuejing Li Yanhui Wei Yuanwei Zhu Guochang Li 《High Voltage》 2025年第5期1154-1161,共8页
The performance of polypropylene film determines the reliability of capacitors.This paper studies the change of insulation characteristics of the insulation dielectric polypropylene of high-voltage capacitors during t... The performance of polypropylene film determines the reliability of capacitors.This paper studies the change of insulation characteristics of the insulation dielectric polypropylene of high-voltage capacitors during the long-term operation process.Moreover,the correction of the insulation failure model of polypropylene media is implemented.Some conclusions are drawn from a series of experiments.The breakdown strength of the insulation dielectrics decreases as the withstand time rises,with amaximum decrease of 37.91%compared to the polypropylene sample without withstand voltage.As the electric field increases from−20 to−100 kV/mm,the total amount of space charge,the trap energy level and the trap density inside the polypropylene increase by 524.15%,18.99%and 773.36%,respectively.In the capacitor simulation model,the electric field in the capacitor increases by 19.62%after presetting space charge relative to the nonspace charge.The experimental data are substituted into the inverse power model,and the trap parameters are used to modify the model.The results show that the ageing state of the polypropylene has a negative exponential relationship with the trap parameters.This paper provides an important reference for the study of the failure mechanism of polypropylene in high-voltage capacitors and the assessment of polypropylene ageing state. 展开更多
关键词 insulation dielectrics change insulation characteristics space charge insulation dielectric polypropylene breakdown strength polypropylene media correction insulation failure model polypropylene
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Surface flashover in 50 years:II.Material modification,structureoptimisation,and characteristics enhancement 被引量:1
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作者 Zhen Li Ji Liu +2 位作者 Yoshimichi Ohki George Chen Shengtao Li 《High Voltage》 2025年第2期243-278,共36页
Surface flashover is a gas-solid interface insulation failure that significantly jeopardises the secure operation of advanced electronic,electrical,and spacecraft applications.Despite the widespread application of num... Surface flashover is a gas-solid interface insulation failure that significantly jeopardises the secure operation of advanced electronic,electrical,and spacecraft applications.Despite the widespread application of numerous material modification and structure optimisation technologies aimed at enhancing surface flashover performance,the influence mechanisms of the present technologies have yet to be systematically discussed and summarised.This review aims to introduce various material modification technologies while demonstrating their influence mechanisms on flashover performances by establishing relationships among‘microscopic structure-mesoscopic charge transport-macroscopic insulation failure’.Moreover,it elucidates the effects of chemical structure on surface trap parameters and surface charge transport concerning flashover performance.The review categorises and presents structure optimisation technologies that govern electric field distribution.All identified technologies highlight that achieving a uniform tangential electric field and reducing the normal electric field can effectively enhance flashover performance.Finally,this review proposes recommendations encompassing mathematical,chemical,evaluation,and manufacturing technologies.This systematic summary of current technologies,their influence mechanisms,and associated advantages and disadvantages in improving surface insulation performance is anticipated to be a pivotal component in flashover and future dielectric theory. 展开更多
关键词 material modification structure optimization surface flashover structure optimisation technologies chemical structure charge transport insulation failure
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