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基于2.5D封装设计对SI性能影响的研究
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作者 张江涛 余斌 +2 位作者 庞健 孙拓北 欧阳可青 《中国集成电路》 2021年第6期78-84,共7页
随着AI、5G、超大规模存储的云服务,高性能显卡以及高端服务器的应用,传统2D封装技术已经不能满足相关设计与性能需求,在市场需求驱动下2.5D封装技术解决方案在满足产品对高带宽、低功耗、高集成度的需求方面的优势得到凸显与认可,尤其... 随着AI、5G、超大规模存储的云服务,高性能显卡以及高端服务器的应用,传统2D封装技术已经不能满足相关设计与性能需求,在市场需求驱动下2.5D封装技术解决方案在满足产品对高带宽、低功耗、高集成度的需求方面的优势得到凸显与认可,尤其在高端HBM显卡方面的应用。由于2.5D封装技术的工艺复杂,数据量以及仿真建模难度比较大,导致芯片的封装设计与加工成本相比于传统2D芯片会高很多,因此目前绝大部分的2.5D封装技术都只能在高端芯片领域使用[2]。伴随着越来越多的芯片设计公司加入到2.5D封装设计的浪潮中,工艺迭代加速使得工艺成熟度越来越高,成本也在逐步降低,相信随着工艺技术的进一步成熟与完善,2.5D设计技术将会迎来快速增长。本文主要针对2.5D封装工艺对封装系统SI性能进行仿真和评估,制定相关设计规范,为封装设计提供参考与指导。 展开更多
关键词 插损 串扰 HBM interposer tsv 2.5DIC
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Design,analysis and test of high-frequency interconnections in 2.5D package with silicon interposer 被引量:4
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作者 任晓黎 庞诚 +5 位作者 秦征 平野 姜峰 薛恺 刘海燕 于大全 《Journal of Semiconductors》 EI CAS CSCD 2016年第4期113-119,共7页
An interposer test vehicle with TSVs(through-silicon vias) and two redistribute layers(RDLs) on the top side for 2.5D integration was fabricated and high-frequency interconnections were designed in the form of cop... An interposer test vehicle with TSVs(through-silicon vias) and two redistribute layers(RDLs) on the top side for 2.5D integration was fabricated and high-frequency interconnections were designed in the form of coplanar waveguide(CPW) and micro strip line(MSL) structures. The signal transmission structures were modeled and simulated in a 3D EM tool to estimate the S-parameters. The measurements were carried out using the vector network analyzer(VNA). The simulated results of the transmission lines on the surface of the interposer without TSVs showed good agreement with the simulated results, while the transmission structures with TSVs showed significant offset between simulation and test results. The parameters of the transmission structures were changed,and the results were also presented and discussed in this paper. 展开更多
关键词 interposer tsv(through-silicon vias) RDL high-frequency simulation test S-parameter
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