期刊文献+
共找到22篇文章
< 1 2 >
每页显示 20 50 100
Test Case Generation from UML-Diagrams Using Genetic Algorithm 被引量:2
1
作者 Rajesh Kumar Sahoo Morched Derbali +3 位作者 Houssem Jerbi Doan Van Thang P.Pavan Kumar Sipra Sahoo 《Computers, Materials & Continua》 SCIE EI 2021年第5期2321-2336,共16页
Software testing has been attracting a lot of attention for effective software development.In model driven approach,Unified Modelling Language(UML)is a conceptual modelling approach for obligations and other features ... Software testing has been attracting a lot of attention for effective software development.In model driven approach,Unified Modelling Language(UML)is a conceptual modelling approach for obligations and other features of the system in a model-driven methodology.Specialized tools interpret these models into other software artifacts such as code,test data and documentation.The generation of test cases permits the appropriate test data to be determined that have the aptitude to ascertain the requirements.This paper focuses on optimizing the test data obtained from UML activity and state chart diagrams by using Basic Genetic Algorithm(BGA).For generating the test cases,both diagrams were converted into their corresponding intermediate graphical forms namely,Activity Diagram Graph(ADG)and State Chart Diagram Graph(SCDG).Then both graphs will be combined to form a single graph called,Activity State Chart Diagram Graph(ASCDG).Both graphs were then joined to create a single graph known as the Activity State Chart Diagram Graph(ASCDG).Next,the ASCDG will be optimized using BGA to generate the test data.A case study involving a withdrawal from the automated teller machine(ATM)of a bank was employed to demonstrate the approach.The approach successfully identified defects in various ATM functions such as messaging and operation. 展开更多
关键词 Genetic algorithm generation of test data and optimization state-chart diagram activity diagram model-driven approach
在线阅读 下载PDF
Forecasting and Evaluating the Efficiency of Test Generation Algorithms by Genetic Algorithm 被引量:1
2
作者 Shiyi Xu and Wei Cen School of Computers Shanghai University, Shanghai, China 200072 《湖南大学学报(自然科学版)》 EI CAS CSCD 2000年第S2期86-94,共9页
To generate a test set for a given circuit (including both combinational and sequential circuits), choice of an algorithm within a number of existing test generation algorithms to apply is bound to vary from circuit t... To generate a test set for a given circuit (including both combinational and sequential circuits), choice of an algorithm within a number of existing test generation algorithms to apply is bound to vary from circuit to circuit. In this paper, the genetic algorithms are used to construct the models of existing test generation algorithms in making such choice more easily. Therefore, we may forecast the testability parameters of a circuit before using the real test generation algorithm. The results also can be used to evaluate the efficiency of the existing test generation algorithms. Experimental results are given to convince the readers of the truth and the usefulness of this approach. 展开更多
关键词 testABILITY GENETic algorithm Forecasting EVALUATING test generation.
在线阅读 下载PDF
Target-Fault-Oriented Test Generation of Sequential CircuitsUsing Genetic Algorithm
3
作者 Li Shen Institute of Computing Technology, Chinese Academy of Sciences, Beijing, China, 100080 《湖南大学学报(自然科学版)》 EI CAS CSCD 2000年第S2期95-103,共9页
This paper deals with the target-fault-oriented test generation of sequential circuits using genetic algorithms. We adopted the concept of multiple phases and proposed four sub-procedures which consist of activation, ... This paper deals with the target-fault-oriented test generation of sequential circuits using genetic algorithms. We adopted the concept of multiple phases and proposed four sub-procedures which consist of activation, propagation and justification phases. The paper focuses on the design of genetic operators and construction of fitness functions which are based on the structure information of circuits. Using ISCAS89 benchmarks, the experiment results of GA were given. 展开更多
关键词 target-fault-oriented test generation GENETic algorithm test generati(
在线阅读 下载PDF
MC/DC Test Data Generation Algorithm Based on Whale Genetic Algorithm 被引量:1
4
作者 LIU Huiying LIU Ziyang YAN Minghui 《Instrumentation》 2022年第2期1-12,共12页
The automatic generation of test data is a key step in realizing automated testing.Most automated testing tools for unit testing only provide test case execution drivers and cannot generate test data that meets covera... The automatic generation of test data is a key step in realizing automated testing.Most automated testing tools for unit testing only provide test case execution drivers and cannot generate test data that meets coverage requirements.This paper presents an improved Whale Genetic Algorithm for generating test data re-quired for unit testing MC/DC coverage.The proposed algorithm introduces an elite retention strategy to avoid the genetic algorithm from falling into iterative degradation.At the same time,the mutation threshold of the whale algorithm is introduced to balance the global exploration and local search capabilities of the genetic al-gorithm.The threshold is dynamically adjusted according to the diversity and evolution stage of current popu-lation,which positively guides the evolution of the population.Finally,an improved crossover strategy is pro-posed to accelerate the convergence of the algorithm.The improved whale genetic algorithm is compared with genetic algorithm,whale algorithm and particle swarm algorithm on two benchmark programs.The results show that the proposed algorithm is faster for test data generation than comparison methods and can provide better coverage with fewer evaluations,and has great advantages in generating test data. 展开更多
关键词 test Data generation MC/DC Whale Genetic algorithm Mutation Threshold
原文传递
Minimal-Length Interoperability Test Sequences Generation via Genetic Algorithm
5
作者 钟宁 匡镜明 何遵文 《Journal of Beijing Institute of Technology》 EI CAS 2008年第3期341-345,共5页
A novel interoperability test sequences optimization scheme is proposed in which the genetic algorithm (GA) is used to obtain the minimal-length interoperability test sequences. During our work, the basic interopera... A novel interoperability test sequences optimization scheme is proposed in which the genetic algorithm (GA) is used to obtain the minimal-length interoperability test sequences. During our work, the basic interoperability test sequences are generated based on the minimal-complete-coverage criterion, which removes the redundancy from conformance test sequences. Then interoperability sequences minimization problem can be considered as an instance of the set covering problem, and the GA is applied to remove redundancy in interoperability transitions. The results show that compared to conventional algorithm, the proposed algorithm is more practical to avoid the state space explosion problem, for it can reduce the length of the test sequences and maintain the same transition coverage. 展开更多
关键词 interoperability testing genetic algorithm test sequences generation
在线阅读 下载PDF
Generating of Test Data by Harmony Search Against Genetic Algorithms
6
作者 Ahmed S.Ghiduk Abdullah Alharbi 《Intelligent Automation & Soft Computing》 SCIE 2023年第4期647-665,共19页
Many search-based algorithms have been successfully applied in sev-eral software engineering activities.Genetic algorithms(GAs)are the most used in the scientific domains by scholars to solve software testing problems.... Many search-based algorithms have been successfully applied in sev-eral software engineering activities.Genetic algorithms(GAs)are the most used in the scientific domains by scholars to solve software testing problems.They imi-tate the theory of natural selection and evolution.The harmony search algorithm(HSA)is one of the most recent search algorithms in the last years.It imitates the behavior of a musician tofind the best harmony.Scholars have estimated the simi-larities and the differences between genetic algorithms and the harmony search algorithm in diverse research domains.The test data generation process represents a critical task in software validation.Unfortunately,there is no work comparing the performance of genetic algorithms and the harmony search algorithm in the test data generation process.This paper studies the similarities and the differences between genetic algorithms and the harmony search algorithm based on the ability and speed offinding the required test data.The current research performs an empirical comparison of the HSA and the GAs,and then the significance of the results is estimated using the t-Test.The study investigates the efficiency of the harmony search algorithm and the genetic algorithms according to(1)the time performance,(2)the significance of the generated test data,and(3)the adequacy of the generated test data to satisfy a given testing criterion.The results showed that the harmony search algorithm is significantly faster than the genetic algo-rithms because the t-Test showed that the p-value of the time values is 0.026<α(αis the significance level=0.05 at 95%confidence level).In contrast,there is no significant difference between the two algorithms in generating the adequate test data because the t-Test showed that the p-value of thefitness values is 0.25>α. 展开更多
关键词 Harmony search algorithm genetic algorithms test data generation
在线阅读 下载PDF
Study on MCM Interconnect Test Generation Based on Ant Algorithm with Mutation Operator
7
作者 陈雷 《上海交通大学学报》 EI CAS CSCD 北大核心 2007年第S2期150-153,共4页
A novel multi-chip module(MCM) interconnect test generation scheme based on ant algorithm(AA) with mutation operator was presented.By combing the characteristics of MCM interconnect test generation,the pheromone updat... A novel multi-chip module(MCM) interconnect test generation scheme based on ant algorithm(AA) with mutation operator was presented.By combing the characteristics of MCM interconnect test generation,the pheromone updating rule and state transition rule of AA is designed.Using mutation operator,this scheme overcomes ordinary AA’s defects of slow convergence speed,easy to get stagnate,and low ability of full search.The international standard MCM benchmark circuit provided by the MCNC group was used to verify the approach.The results of simulation experiments,which compare to the results of standard ant algorithm,genetic algorithm(GA) and other deterministic interconnecting algorithms,show that the proposed scheme can achieve high fault coverage,compact test set and short CPU time,that it is a newer optimized method deserving research. 展开更多
关键词 MULTI-CHIP module(MCM) INTERCONNECT test ANT algorithm(AA) test generation MUTATION
在线阅读 下载PDF
Multi-objective Firefly Algorithm for Test Data Generation with Surrogate Model
8
作者 Wenning Zhang Qinglei Zhou +1 位作者 Chongyang Jiao Ting Xu 《国际计算机前沿大会会议论文集》 2021年第1期283-299,共17页
To solve the emerging complex optimization problems, multi objectiveoptimization algorithms are needed. By introducing the surrogate model forapproximate fitness calculation, the multi objective firefly algorithm with... To solve the emerging complex optimization problems, multi objectiveoptimization algorithms are needed. By introducing the surrogate model forapproximate fitness calculation, the multi objective firefly algorithm with surrogatemodel (MOFA-SM) is proposed in this paper. Firstly, the population wasinitialized according to the chaotic mapping. Secondly, the external archive wasconstructed based on the preference sorting, with the lightweight clustering pruningstrategy. In the process of evolution, the elite solutions selected from archivewere used to guide the movement to search optimal solutions. Simulation resultsshow that the proposed algorithm can achieve better performance in terms ofconvergence iteration and stability. 展开更多
关键词 Firefly algorithm Multi objective optimization Surrogate model test data generation
原文传递
A Genetic Approach to Analyze Algorithm Performance Based on the Worst-Case Instances 被引量:3
9
作者 So-Yeong Jeon Yong-Hyuk Kim 《Journal of Software Engineering and Applications》 2010年第8期767-775,共9页
Search-based software engineering has mainly dealt with automated test data generation by metaheuristic search techniques. Similarly, we try to generate the test data (i.e., problem instances) which show the worst cas... Search-based software engineering has mainly dealt with automated test data generation by metaheuristic search techniques. Similarly, we try to generate the test data (i.e., problem instances) which show the worst case of algorithms by such a technique. In this paper, in terms of non-functional testing, we re-define the worst case of some algorithms, respectively. By using genetic algorithms (GAs), we illustrate the strategies corresponding to each type of instances. We here adopt three problems for examples;the sorting problem, the 0/1 knapsack problem (0/1KP), and the travelling salesperson problem (TSP). In some algorithms solving these problems, we could find the worst-case instances successfully;the successfulness of the result is based on a statistical approach and comparison to the results by using the random testing. Our tried examples introduce informative guidelines to the use of genetic algorithms in generating the worst-case instance, which is defined in the aspect of algorithm performance. 展开更多
关键词 Search-Based Software Engineering AUTOMATED test Data generation Worst-Case Instance algorithm
在线阅读 下载PDF
A Parallel Genetic Algorithm Based on Spark for Pairwise Test Suite Generation 被引量:12
10
作者 Rong-Zhi Qi Zhi-Jian Wang Shui-Yan Li 《Journal of Computer Science & Technology》 SCIE EI CSCD 2016年第2期417-427,共11页
Pairwise testing is an effective test generation technique that requires all pairs of parameter values to be by at least one test case. It has been proven that generating minimum test suite is an NP-complete problem c... Pairwise testing is an effective test generation technique that requires all pairs of parameter values to be by at least one test case. It has been proven that generating minimum test suite is an NP-complete problem covered Genetic algorithms have been used for pairwise test suite generation by researchers. However, it is always a time-consuming process, which leads to significant limitations and obstacles for practical use of genetic algorithms towards large-scale test problems. Parallelism will be an effective way to not only enhance the computation performance but also improve the quality of the solutions. In this paper, we use Spark, a fast and general parallel computing platform, to parallelize the genetic algorithm to tackle the problem. We propose a two-phase parallelization algorithm including fitness evaluation parallelization and genetic operation parallelization. Experimental results show that our algorithm outperforms the sequential genetic algorithm and competes with other approaches in both test suite size and computational performance. As a result, our algorithm is a promising improvement of the genetic algorithm for pairwise test suite generation. 展开更多
关键词 pairwise testing parallel genetic algorithm SPARK test generation
原文传递
Forecasting the Efficiency of Test Generation Algorithms for Combinational Circuits 被引量:2
11
作者 徐拾义 TukwasibweJustafFrank 《Journal of Computer Science & Technology》 SCIE EI CSCD 2000年第4期326-337,共12页
In this era of VLSI circuits, testability is truly a very crucial issue.To generate a test set for a given circuit, choice of an algorithm from a number ofexisting test generation algorithms to apply is bound to vary ... In this era of VLSI circuits, testability is truly a very crucial issue.To generate a test set for a given circuit, choice of an algorithm from a number ofexisting test generation algorithms to apply is bound to vary from circuit to circuit.In this paper, the Genetic Algorithm is used in order to construct an accurate modelfor some existing test generation algorithms that are being used everywhere in theworld. Some objective quantitative measures are used as an effective tool in makingsuch choice. Such measures are so important to the analysis of algorithms that theybecome one of the subjects of this work. 展开更多
关键词 testABILITY genetic algorithm forecasting test generation
原文传递
A Complete Critical Path Algorithm for Test Generation of Combinational Circuits
12
作者 周权 魏道政 《Journal of Computer Science & Technology》 SCIE EI CSCD 1991年第1期74-82,共9页
It is known that critical path test generation method is not a complete algorithm for combinational circuits with reconvergent-fanout.In order to make it a complete algorithm,we put forward a reconvergent-fanout- orie... It is known that critical path test generation method is not a complete algorithm for combinational circuits with reconvergent-fanout.In order to make it a complete algorithm,we put forward a reconvergent-fanout- oriented technique,the principal critical path algorithm,propagating the critical value back to primary inputs along a single path,the principal critical path,and allowing multiple path sensitization if needed.Relationship among test patterns is also discussed to accelerate test generation. 展开更多
关键词 PATH A Complete Critical Path algorithm for test generation of Combinational Circuits test
原文传递
A novel strategy for automatic test data generation using soft computing technique 被引量:1
13
作者 Priyanka CHAWLA Inderveer CHANA Ajay RANA 《Frontiers of Computer Science》 SCIE EI CSCD 2015年第3期346-363,共18页
Software testing is one of the most crucial and analytical aspect to assure that developed software meets pre- scribed quality standards. Software development process in- vests at least 50% of the total cost in softwa... Software testing is one of the most crucial and analytical aspect to assure that developed software meets pre- scribed quality standards. Software development process in- vests at least 50% of the total cost in software testing process. Optimum and efficacious test data design of software is an important and challenging activity due to the nonlinear struc- ture of software. Moreover, test case type and scope deter- mines the quality of test data. To address this issue, software testing tools should employ intelligence based soft comput- ing techniques like particle swarm optimization (PSO) and genetic algorithm (GA) to generate smart and efficient test data automatically. This paper presents a hybrid PSO and GA based heuristic for automatic generation of test suites. In this paper, we described the design and implementation of the proposed strategy and evaluated our model by performing ex- periments with ten container classes from the Java standard library. We analyzed our algorithm statistically with test ad- equacy criterion as branch coverage. The performance ade- quacy criterion is taken as percentage coverage per unit time and percentage of faults detected by the generated test data. We have compared our work with the heuristic based upon GA, PSO, existing hybrid strategies based on GA and PSO and memetic algorithm. The results showed that the test case generation is efficient in our work. 展开更多
关键词 software testing particle swarm optimization genetic algorithm soft computing test data generation
原文传递
通用数字IC的测试生成研究
14
作者 王迎旭 武显荣 《铁道学报》 EI CAS CSCD 北大核心 1993年第3期39-47,共9页
本文首先建立通用数字IC的故障模型,引入故障等效和支配的概念,将IC最小完备测试集的算法复杂性从0(2~n)降低至0(n)。本文给出组合逻辑IC的布尔差分运算和时序逻辑IC的FSM形式描述.最终建立了组合逻辑IC和时序逻辑IC的测试生成算法。 ... 本文首先建立通用数字IC的故障模型,引入故障等效和支配的概念,将IC最小完备测试集的算法复杂性从0(2~n)降低至0(n)。本文给出组合逻辑IC的布尔差分运算和时序逻辑IC的FSM形式描述.最终建立了组合逻辑IC和时序逻辑IC的测试生成算法。 本文是PC-ICT通用数字IC测试系统及其软件包研究课题的理论进展之一。本研究成果已在铁路系统批量生产,并在铁路微电子设备故障检测和可靠性保障中获得了实际应用。 展开更多
关键词 数字ic 故障模型 测试生成
在线阅读 下载PDF
基于归一化模板匹配算法的动作电位检测IC 被引量:2
15
作者 庞勋 姚镭 《现代电子技术》 北大核心 2024年第2期1-6,共6页
针对多通道神经元动作电位(AP)信号采集硬件系统中,前端采集IC因电极阻抗、应用环境、系统功耗以及系统面积等因素而导致原始信号信噪比较低的问题,设计一种基于归一化模板匹配算法的AP信号检测IC。该检测IC基于模板匹配算法,并引入信... 针对多通道神经元动作电位(AP)信号采集硬件系统中,前端采集IC因电极阻抗、应用环境、系统功耗以及系统面积等因素而导致原始信号信噪比较低的问题,设计一种基于归一化模板匹配算法的AP信号检测IC。该检测IC基于模板匹配算法,并引入信号归一化以去除冗余信息。为确保芯片的实时性并降低功耗,芯片整体采用三级流水线结构,各个模块间插入门控时钟,同时可通过SPI总线配置更新其工作状态。在SMIC 180 nm数字工艺下,裸片面积为0.98 mm^(2),配置模板信息时功耗为701μW,完全工作时功耗为8.07 mW,且采用QFN48封装形式。测试结果表明,所设计的AP信号检测IC具有较好的抗噪性能,可用于信噪比较低的环境来降低信号传输带宽,即使在-10 dB信噪比环境下,评价模型综合性能的F1-Score仍可达到94.65%。 展开更多
关键词 动作电位检测 ic设计 模板匹配算法 信号归一化 抗噪性能 检测芯片测试
在线阅读 下载PDF
组合数字集成电路测试生成技术研究 被引量:4
16
作者 张必超 于鹏 《中国测试技术》 2007年第3期105-107,共3页
介绍了数字集成电路测试的基本概念,包括测试的分类,以及可控性、可观性、可测性、故障、失效和缺陷等概念;概述了测试的基本过程及测试生成概念和原理;着重阐述了组合数字集成电路的各种测试生成算法,包括异或法、步尔差分法、路径敏... 介绍了数字集成电路测试的基本概念,包括测试的分类,以及可控性、可观性、可测性、故障、失效和缺陷等概念;概述了测试的基本过程及测试生成概念和原理;着重阐述了组合数字集成电路的各种测试生成算法,包括异或法、步尔差分法、路径敏化法、D算法、PODEM算法和FAN算法等,这些算法是测试图形生成的基本方法,在具体应用中可灵活选用。 展开更多
关键词 组合数字集成电路 可测性 失效 测试生成 算法
在线阅读 下载PDF
Predicting stability of integrated circuit test equipment using upper side boundary values of normal distribution 被引量:1
17
作者 Zhan Wenfa Hu Xinyi +3 位作者 Zheng Jiangyun Yu Chuxian Cai Xueyuan Zhang Lihua 《The Journal of China Universities of Posts and Telecommunications》 EI CSCD 2024年第2期85-93,共9页
In response to the growing complexity and performance of integrated circuit(IC),there is an urgent need to enhance the testing and stability of IC test equipment.A method was proposed to predict equipment stability us... In response to the growing complexity and performance of integrated circuit(IC),there is an urgent need to enhance the testing and stability of IC test equipment.A method was proposed to predict equipment stability using the upper side boundary value of normal distribution.Initially,the K-means clustering algorithm classifies and analyzes sample data.The accuracy of this boundary value is compared under two common confidence levels to select the optimal threshold.A range is then defined to categorize unqualified test data.Through experimental verification,the method achieves the purpose of measuring the stability of qualitative IC equipment through a deterministic threshold value and judging the stability of the equipment by comparing the number of unqualified data with the threshold value,which realizes the goal of long-term operation monitoring and stability analysis of IC test equipment. 展开更多
关键词 K-means clustering algorithm the upper side boundary of normal distribution THRESHOLD integrated circuit(ic)test equipment stability analysis
原文传递
Generation method of minimal-complete-coverage interoperability test sequence based on digraph
18
作者 LIN Huahui ZHAO Baohua QU Yugui 《Frontiers of Electrical and Electronic Engineering in China》 CSCD 2007年第1期29-33,共5页
Even if two implementations of a protocol pass the conformance testing,it cannot guarantee that they can interoperate properly;so direct testing of interoperation is considered indispensable.During the interoperabilit... Even if two implementations of a protocol pass the conformance testing,it cannot guarantee that they can interoperate properly;so direct testing of interoperation is considered indispensable.During the interoperability testing,a minimal number of test sequences are expected to check as many as possible implementation errors.By using minimal-complete-coverage criterion,the test sequence generation based on digraph can produce more effective test sequences. 展开更多
关键词 interoperability test interoperability equiva-lence minimal-complete-coverage criterion algorithm of test sequence generation DIGRAPH
原文传递
列控车载设备安全功能测试序列优化方法研究 被引量:3
19
作者 窦磊 李耀 +2 位作者 郭进 童音 兰浩 《中国安全科学学报》 CAS CSCD 北大核心 2019年第5期73-78,共6页
列控系统测试序列优化问题可以转换成旅行商问题(TSP),在求解TSP时,用改良圈(IC)算法难以得出最优解,而模拟退火(SA)算法计算迭代次数多,为解决这一问题,提出一种基于SA优化IC算法的测试序列优化方法。首先,以车载设备模式转换功能为例... 列控系统测试序列优化问题可以转换成旅行商问题(TSP),在求解TSP时,用改良圈(IC)算法难以得出最优解,而模拟退火(SA)算法计算迭代次数多,为解决这一问题,提出一种基于SA优化IC算法的测试序列优化方法。首先,以车载设备模式转换功能为例,介绍基于TSP的测试序列生成方法;然后,说明SA优化IC算法的步骤和流程;最后,引入实例,并将其转换成TSP,采用SA算法优化IC算法求解TSP,并得到测试序列。结果表明:该算法较IC算法的结果更优,迭代次数较SA算法迭代次数降低了27. 54%,该方法可有效优化测试序列。 展开更多
关键词 列控系统 车载设备 旅行商问题(TSP) 测试序列 改良圈(ic)算法 模拟退火(SA)算法
原文传递
基于发动机稳态工况的整车WLTC循环油耗研究 被引量:9
20
作者 李吉安 姚建明 吴旭陵 《内燃机工程》 EI CAS CSCD 北大核心 2016年第6期235-240,共6页
根据欧6c/d WLTP(世界统一轻型车测试循环)定义,由车辆参数确定循环换挡策略,转鼓试验得到发动机工况点,聚类计算14个工况点及权重,模拟循环油耗。以Matlab为编程工具,建立了14点稳态工况代替WLTC循环模拟油耗的一套完整方法,包括WLTC... 根据欧6c/d WLTP(世界统一轻型车测试循环)定义,由车辆参数确定循环换挡策略,转鼓试验得到发动机工况点,聚类计算14个工况点及权重,模拟循环油耗。以Matlab为编程工具,建立了14点稳态工况代替WLTC循环模拟油耗的一套完整方法,包括WLTC换挡策略、整车转鼓试验和k-means聚类计算方法。14点模拟油耗结果百公里油耗8.90L,与转鼓试验百公里油耗9.19L相差3.16%,表明以发动机的稳态工况代替整车循环进行WLTC油耗分析是可行的,这将简化面向WLTC和欧6c/d指标的发动机燃烧开发和优化改进的标定策略,提高开发工作的效率。 展开更多
关键词 内燃机 欧6c/d 世界统一轻型车测试循环 换挡策略 转鼓试验 K-MEANS算法 发动机稳态工况 油耗
在线阅读 下载PDF
上一页 1 2 下一页 到第
使用帮助 返回顶部