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I-Line光刻胶材料的研究进展 被引量:11
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作者 郑金红 《影像科学与光化学》 CAS CSCD 北大核心 2012年第2期81-90,共10页
酚醛树脂-重氮萘醌正型光刻胶由于其优异的光刻性能,在g-line(436nm)、i-line(365nm)光刻中被广泛使用.g-line光刻胶胶、i-line光刻胶,两者虽然都是用线型酚醛树脂做成膜树脂,重氮萘醌型酯化物作感光剂,但当曝光波长从g-line发展到i-lin... 酚醛树脂-重氮萘醌正型光刻胶由于其优异的光刻性能,在g-line(436nm)、i-line(365nm)光刻中被广泛使用.g-line光刻胶胶、i-line光刻胶,两者虽然都是用线型酚醛树脂做成膜树脂,重氮萘醌型酯化物作感光剂,但当曝光波长从g-line发展到i-line时,为适应对应的曝光波长以及对高分辨率的追求,酚醛树脂及感光剂的微观结构均有变化.在i-line光刻胶中,酚醛树脂的邻-邻′相连程度高,感光剂酯化度高,重氮萘醌基团间的间距远.溶解促进剂是i-line光刻胶的一个重要组分,本文对其也进行了介绍. 展开更多
关键词 i-line 光刻胶 酚醛树脂 感光剂 溶解促进剂
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Improvement of Environment Stability of an i-Line Chemically Amplified Photoresist
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作者 Haibo Li Qian Yang +3 位作者 Jia Sun Jie Li Meng Guo Bing Li 《Journal of Microelectronic Manufacturing》 2021年第2期1-7,共7页
An i-Line chemically amplified(ICA)thick film positive resist is reported in this paper.The impact of process conditions on photoresist performance was investigated.Pre-apply bake temperature and post exposure bake te... An i-Line chemically amplified(ICA)thick film positive resist is reported in this paper.The impact of process conditions on photoresist performance was investigated.Pre-apply bake temperature and post exposure bake temperature affect acid diffusion and deblocking reactions,thus playing an integral role in defining the resist profile.Both pre-apply bake delay and post exposure delay(PED)affect critical dimension(CD)variation,but PED is more sensitive to contact with airborne contaminants.Different polymers and different photo-acid generators(PAG)are also illustrated in this work.By optimizing the structure and concentration of key components,an ICA resist with good environment stability and excellent lithographic performance was demonstrated. 展开更多
关键词 Chemical amplification thick film i-line environment stability Poly(p-hydroxyl styrene) PAB PEB
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Observed Enhancement in LIBS Signals from Nano vs. Bulk ZnO Targets: Comparative Study of Plasma Parameters 被引量:1
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作者 Ashraf M. El Sherbini Abdel-Nasser M. Aboulfotouh +3 位作者 Farid F. Rashid Sami H. Allam Ashraf El Dakrouri Tharwtt M. El Sherbini 《World Journal of Nano Science and Engineering》 2012年第4期181-188,共8页
In this article, we will report an experimental evidence of enhanced LIBS emission upon replacing a Bulk-Based ZnO target by the corresponding Nano-Based target. The plasma was initiated via interaction of a Nd:YAG la... In this article, we will report an experimental evidence of enhanced LIBS emission upon replacing a Bulk-Based ZnO target by the corresponding Nano-Based target. The plasma was initiated via interaction of a Nd:YAG laser at the fundamental wavelength with both targets in open air under the same experimental conditions. The measurements show an enhanced emission from the Zn I-lines at the wavelengths of 328.26, 330.29, 334.55, 468.06, 472.2, 481.01, 636.38 nm. The measurements were repeated at different delay times in the range from 1 to 5 μs at constant irradiation level and fixed gate time of 1 μs. The average enhancement over the different Zn I-lines was found increases exponentially up to 8-fold with delay time. The electron density to each plasma was measured utilizing the Hα-line appeared in the emitted spectra from each plasma and was found to give similar values. The electron temperatures were measured via Boltzmann plot method utilizing the relative intensities of the Zn I-lines and were found to give very close values. Moreover, the relative population density of the ground state of the zinc atoms (relative concentration) was measured spectroscopically utilizing the Boltzmann plot method and was found to increase in a very similar trend to that of enhancement. The results of the spectroscopic analysis conclude that these signal enhancements can be attributed to the higher concentration of neutral atoms in the Nano-Based material plasma with respect to the corresponding Bulk-based ZnO material. 展开更多
关键词 LIBS ENHANCEMENT ZnO Nonmaterial Hα-Line Zn i-lines Spectroscopy
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