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GeS_2-Ga_2S_3-CsCl系统玻璃的微结构研究 被引量:3
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作者 陶海征 赵修建 +1 位作者 杨慧 敬承斌 《无机材料学报》 SCIE EI CAS CSCD 北大核心 2005年第1期47-52,共6页
对准三元系统玻璃GeS2-Ga2S3-CsCl中两个系列样品的室温拉曼谱进行了系统的探测和分析.基于Cs+对混合阴离子基团GaS3/2Cl影响的分析,解释了低CsCl含量时样品的拉曼谱演变;基于Cs+对桥式单元Ga2S4Cl2影响的分析,解释了Ga2S3-2CsCl玻璃... 对准三元系统玻璃GeS2-Ga2S3-CsCl中两个系列样品的室温拉曼谱进行了系统的探测和分析.基于Cs+对混合阴离子基团GaS3/2Cl影响的分析,解释了低CsCl含量时样品的拉曼谱演变;基于Cs+对桥式单元Ga2S4Cl2影响的分析,解释了Ga2S3-2CsCl玻璃和二聚物Ga2Cl6熔体拉曼谱相似和变化的原因,并在此基础上解释了高CsCl含量时GeS2-Ga2S3-CsCl系统玻璃样品的拉曼谱演变.根据拉曼谱的微结构起源,GeS2-Ga2S3-CsCl玻璃的微结构被推测是Cs+以氯原子为最近邻配位的单壳层形式均匀地分布在由GeS4/2,GaS3/2Cl,Ga2S4Cl2等结构单元通过桥硫键联接而形成的玻璃网络中. 展开更多
关键词 ges2-一Ga2s3-cscl系统玻璃 拉曼 微结构
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Microstructural Probing of (1-x) GeS_(2-x)Ga_2S_3 System Glasses By Raman Scattering 被引量:4
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作者 陶海征 《Journal of Wuhan University of Technology(Materials Science)》 SCIE EI CAS 2005年第3期8-10,共3页
Roman scattering measurement of ( 1 - x ) GeS2-x Ga2S3 system glasses was conducted in order to understand the microstructural change caused by the addition of Ga2S3 . According to the change of Raman spectra with t... Roman scattering measurement of ( 1 - x ) GeS2-x Ga2S3 system glasses was conducted in order to understand the microstructural change caused by the addition of Ga2S3 . According to the change of Raman spectra with the addition of Ga2S3, two main structural transformations were deduced : the gradual enhancement of ethane- like structural units S3 Ge- GeS3 ( 250 cm ^- 1) and S3 Ga- GaS3 (270 cm ^- 1 ) and the appearance of charge imbalanced units [ Ga2 S2 ( S1/2 )4 ]^2- and [Ga( S1/2 )4 ]^- . And this change of structural aspect seems to give as a clue to understanding the cause of the increased rare-earth solubility. 展开更多
关键词 1 - x ges2-x Ga2s3 system glasses Raman microstructure
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Second-harmonic Generation in UV-pulsed Laser Poled Amorphous 80GeS_2-15Ga_2 S_3-5CdS Chalcogenide Film
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作者 LIU Gang PENG Minhong 《Journal of Wuhan University of Technology(Materials Science)》 SCIE EI CAS 2013年第6期1064-1067,共4页
With the pulsed laser deposition (PLD) method, amorphous 80GeS2-15Ga2S3-5CdS chalcogenide film was deposited on glassy substrate. Obvious second harmonic generation (SHG) was observed in the ultraviolet (UV)-pol... With the pulsed laser deposition (PLD) method, amorphous 80GeS2-15Ga2S3-5CdS chalcogenide film was deposited on glassy substrate. Obvious second harmonic generation (SHG) was observed in the ultraviolet (UV)-polarized film and the SHG intensity increased with the increase in single pulse energy and irradiation time. Through Raman spectra and transmission spectra, the mechanism of SHG was studied. The experimental results demonstrated that effective electron traps and hole traps were generated in the UV- polarized film. The energy of electrons and holes was using up due to the collision with other particles and crystal fields during their movement and finally they were captured by the traps and fixed, which made the electric charge distribution nonuniform in the film and destroyed the spatial isotropy. In the meantime, the center of positive and negative charges separated and a built-in electric field was formed which generated the optical second-order nonlinearity of the film. 展开更多
关键词 amorphous ges2-ga2s3-Cds chalcogenide film UV-pulsed laser poled second harmonicgeneration maker fringes
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