In order to deal with the limitations during the register transfer level verification, a new functional verification method based on the random testing for the system-level of system-on-chip is proposed.The validity o...In order to deal with the limitations during the register transfer level verification, a new functional verification method based on the random testing for the system-level of system-on-chip is proposed.The validity of this method is proven theoretically.Specifically, testcases are generated according to many approaches of randomization.Moreover, the testbench for the system-level verification according to the proposed method is designed by using advanced modeling language.Therefore, under the circumstances that the testbench generates testcases quickly, the hardware/software co-simulation and co-verification can be implemented and the hardware/software partitioning planning can be evaluated easily.The comparison method is put to use in the evaluation approach of the testing validity.The evaluation result indicates that the efficiency of the partition testing is better than that of the random testing only when one or more subdomains are covered over with the area of errors, although the efficiency of the random testing is generally better than that of the partition testing.The experimental result indicates that this method has a good performance in the functional coverage and the cost of testing and can discover the functional errors as soon as possible.展开更多
Generalized Bent function and generalized Bent function sequences are introduced in this paper.The main performance or these sequences used as SW/SFH(Short Wave/Slow Frequency Hopping) code are studied. And the hardwa...Generalized Bent function and generalized Bent function sequences are introduced in this paper.The main performance or these sequences used as SW/SFH(Short Wave/Slow Frequency Hopping) code are studied. And the hardware circuit and the soflware program flow chart of the SW/SFH PN code generator are also given,which is based on generalized Bent function sequence generator by using a single chip mlcrocomputer.展开更多
研制了一款K波段(23~25 GHz)收发一体化多功能芯片。该芯片集成了单刀双掷开关(SPDT)、接收支路低噪声放大器和发射支路高效率功率放大器。为兼顾低噪声和高效率功率特性,对电路的拓扑结构进行了优化选择和设计。在器件特征工作频点,采...研制了一款K波段(23~25 GHz)收发一体化多功能芯片。该芯片集成了单刀双掷开关(SPDT)、接收支路低噪声放大器和发射支路高效率功率放大器。为兼顾低噪声和高效率功率特性,对电路的拓扑结构进行了优化选择和设计。在器件特征工作频点,采用开关模型、噪声模型和非线性大信号模型进行联合仿真设计。测试结果表明,该收发一体多功能芯片在23~25 GHz范围内,接收支路增益23 d B、噪声系数2.5 d B,工作电流仅为12 m A;发射支路增益为30 d B,1 d B压缩点输出功率为18.7 d Bm,功率附加效率达到30%,动态电流仅为70 m A。芯片尺寸小,仅为3.5 mm×2.5 mm。展开更多
基金supported by the National High Technology Research and Development Program of China (863 Program) (2002AA1Z1490)Specialized Research Fund for the Doctoral Program of Higher Education (20040486049)the University Cooperative Research Fund of Huawei Technology Co., Ltd
文摘In order to deal with the limitations during the register transfer level verification, a new functional verification method based on the random testing for the system-level of system-on-chip is proposed.The validity of this method is proven theoretically.Specifically, testcases are generated according to many approaches of randomization.Moreover, the testbench for the system-level verification according to the proposed method is designed by using advanced modeling language.Therefore, under the circumstances that the testbench generates testcases quickly, the hardware/software co-simulation and co-verification can be implemented and the hardware/software partitioning planning can be evaluated easily.The comparison method is put to use in the evaluation approach of the testing validity.The evaluation result indicates that the efficiency of the partition testing is better than that of the random testing only when one or more subdomains are covered over with the area of errors, although the efficiency of the random testing is generally better than that of the partition testing.The experimental result indicates that this method has a good performance in the functional coverage and the cost of testing and can discover the functional errors as soon as possible.
文摘Generalized Bent function and generalized Bent function sequences are introduced in this paper.The main performance or these sequences used as SW/SFH(Short Wave/Slow Frequency Hopping) code are studied. And the hardware circuit and the soflware program flow chart of the SW/SFH PN code generator are also given,which is based on generalized Bent function sequence generator by using a single chip mlcrocomputer.
文摘研制了一款K波段(23~25 GHz)收发一体化多功能芯片。该芯片集成了单刀双掷开关(SPDT)、接收支路低噪声放大器和发射支路高效率功率放大器。为兼顾低噪声和高效率功率特性,对电路的拓扑结构进行了优化选择和设计。在器件特征工作频点,采用开关模型、噪声模型和非线性大信号模型进行联合仿真设计。测试结果表明,该收发一体多功能芯片在23~25 GHz范围内,接收支路增益23 d B、噪声系数2.5 d B,工作电流仅为12 m A;发射支路增益为30 d B,1 d B压缩点输出功率为18.7 d Bm,功率附加效率达到30%,动态电流仅为70 m A。芯片尺寸小,仅为3.5 mm×2.5 mm。
