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Film thickness effect on 2D lead-free hybrid double perovskite properties: Band gap, photocurrent and stability 被引量:1
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作者 Mohamed Saber Lassoued Faizan Ahmad Yanzhen Zheng 《Chinese Chemical Letters》 2025年第4期449-454,共6页
Lead-free hybrid double perovskites(LFHDPs) have received a lot of attention due to their environmental friendliness and promising attributes. However, studying the effect of film thickness on LFHDPs optoelectronic pr... Lead-free hybrid double perovskites(LFHDPs) have received a lot of attention due to their environmental friendliness and promising attributes. However, studying the effect of film thickness on LFHDPs optoelectronic properties has not yet been investigated. Herein, we synthesized two new Ruddlesden–Popper LFHDPs, namely(C_(5)H_(12)N)_(4)AgBiI_(8)(CAB-1) and(C_(6)H_(14)N)_(4)Ag Bi I8(CAB-2) using cyclopentylamine and cyclohexylamine as monoamine ligands. Indeed, these two Ag(Ⅰ)-Bi(Ⅲ) LFHDPs form smooth and uniform films ranging in thickness from 250 nm to 1 μm, with preferred orientations. Notably, the studies on the optical properties showed that the direct band gap value decreased from 2.17 e V to 1.91 e V for CAB-1 and from 2.05 e V to 1.86 e V for CAB-2 with increasing thickness. Accordingly, photo-current response using a xenon lamp revealed a significant difference of over 1000 n A between light and dark conditions for1 μm-thickness films, suggesting potential for light harvesting. Other than that, thicker films of CAB-1and CAB-2 exhibit high stability for 90 days in a relatively humid environment(RH of 55%), paving the way for promising optoelectronic applications. 展开更多
关键词 LEAD-FREE Double perovskites film thickness Photocurrent response High stability
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Numerical Simulation of the Pitting Corrosion Behavior of Stainless Steel Bellows Influenced by Varying Liquid Film Thicknesses
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作者 Lu-Jun Ren Guo-Min Li +2 位作者 Zhen-Xiao Zhu Hai-Yan Xiong Bing Li 《电化学(中英文)》 北大核心 2025年第7期37-51,共15页
To advance the understanding of the corrosion behavior of stainless steel bellows in marine atmospheric environments and enhance the precision of service life predictions,this study employs finite element simulations ... To advance the understanding of the corrosion behavior of stainless steel bellows in marine atmospheric environments and enhance the precision of service life predictions,this study employs finite element simulations to investigate the pitting corrosion rates and pit morphologies of bellows peaks and troughs under varying electrolyte film thicknesses.The model incorporates localized electrochemical reactions,oxygen concentration,and homogeneous solution reactions.For improved computational accuracy,the fitted polarization curve data were directly applied as nonlinear boundary conditions on the electrode surface via interpolation functions.Simulation results reveal that the peak regions exhibit faster corrosion rates than the trough regions.With increasing electrolyte film thickness(from 10μm to 500μm),corrosion rates at both peaks and troughs decrease progressively,and after 120 hours of simulation,the maximum corrosion rate at the peaks declines from 0.720 mm/a to 0.130 mm/a,and at the troughs from 0.520 mm/a to 0.120 mm/a,with the disparity in corrosion rates diminishing over time.Furthermore,as corrosion progresses,pits propagate deeper into the substrate,exhibiting both vertical penetration and lateral expansion along the passive film interface,ultimately breaching the substrate.This research offers valuable insights into designing corrosion mitigation strategies for stainless steel bellows in marine environments. 展开更多
关键词 Finite element method Pitting corrosion Stainless steel bellows Electrolyte film thickness
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Prediction for asphalt pavement water film thickness based on artificial neural network 被引量:6
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作者 Ma Yaolu Geng Yanfen +1 位作者 Chen Xianhua Lu Yankun 《Journal of Southeast University(English Edition)》 EI CAS 2017年第4期490-495,共6页
In order to study the variation o f the asphalt pavement water film thickness influenced by multi-factors,anew method for predicting water film thickness was developed by the combination o f the artificial neural netw... In order to study the variation o f the asphalt pavement water film thickness influenced by multi-factors,anew method for predicting water film thickness was developed by the combination o f the artificial neural network(ANN)a d two-dimensional shallow water equations based on hydrodynamic theory.Multi-factors included the rainfall intensity,pavement width,cross slope,longitudinal slope a d pavement roughness coefficient.The two-dimensional hydrodynamic method was validated by a natural rainfall event.Based on the design scheme o f Shen-Sha expressway engineering project,the limited training data obtained by the two-dimensional hydrodynamic simulation model was used to predict water film thickness.Furthermore,the distribution of the water film thickness influenced by multi-factors on the pavement was analyzed.The accuracy o f the ANN model was verified by the18sets o f data with a precision o f0.991.The simulation results indicate that the water film thickness increases from the median strip to the edge o f the pavement.The water film thickness variation is obviously influenced by rainfall intensity.Under the condition that the pavement width is20m and t e rainfall intensity is3m m/h,t e water film thickness is below10mm in the fast lane and20mm in t e lateral lane.Athough there is fluctuation due to the amount oftraining data,compared with the calculation on the basis o f the existing criterion and theory,t e ANN model exhibits a better performance for depicting the macroscopic distribution of the asphalt pavement water film. 展开更多
关键词 pavement engineering water film thickness artificial neural network hydrodynamic method prediction analysis
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Determination of the solvation film thickness of dispersed particles with the method of Einstein viscosity equation 被引量:9
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作者 Changsheng Peng Shaoxian Son Shouci Lu 《Journal of University of Science and Technology Beijing》 CSCD 2005年第4期370-375,共6页
The dispersion of a solid particle in a liquid may lead to the formation of solvation film on the particle surface, which can strongly increase the repulsive force between particles and thus strongly affect the stabil... The dispersion of a solid particle in a liquid may lead to the formation of solvation film on the particle surface, which can strongly increase the repulsive force between particles and thus strongly affect the stability of dispersions. The solvation film thickness, which varies with the variation of the property of suspension particles and solutions, is one of the most important parameters of the solvation film, and is also one of the most difficult parameters that can be measured accurately. In this paper, a method, based on the Einstein viscosity equation of dispersions, for determining the solvation film thickness of particles is developed. This method was tested on two kinds of silica spherical powders (namely M1 and M2) dispersed in ethyl alcohol, in water, and in a water-ethyl alcohol mixture (1:1 by volume) through measuring the relative viscosity of dispersions of the particles as a function of the volume fraction of the dry particles in the dispersion, and of the specific surface area and the density of the particles. The calculated solvation film thicknesses on M1 are 7.48, 18.65 and 23.74 nm in alcohol, water and the water-ethyl alcohol mixture, 12.41, 12.71 and 13.13 nm on M2 in alcohol, water and the water-ethyl alcohol mixture, respectively. 展开更多
关键词 solvation film VISCOSITY film thickness Einstein viscosity equation
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Influences of Film Thickness on the Electrical Properties of TaN_x Thin Films Deposited by Reactive DC Magnetron Sputtering 被引量:4
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作者 Hongchuan Jiang Chaojie Wang Wanli Zhang Xu Si Yanrong Li 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2010年第7期597-600,共4页
TaNx thin films were deposited on commercial polished Al2O3 ceramic substrates by reactive dc magnetron sputtering. The influences of the film thickness on the electrical properties of the samples were examined in det... TaNx thin films were deposited on commercial polished Al2O3 ceramic substrates by reactive dc magnetron sputtering. The influences of the film thickness on the electrical properties of the samples were examined in detail. It is found that the film thickness does not influence the phase structures of the TaNx thin films. The sheet resistances of the samples shift from 173 Ω/sq. to 7.5 Ω/sq. with the film thickness shifting from 30 nm to 280 nm. With the increase of the film thickness from 30 nm to 280 nm, the temperature coefficient of resistance (TCR) of the samples shifts from negative value to positive value. When the film thickness is about 100 nm, TaNx thin films exhibits a near-zero TCR value (approximately -15×10^-6/℃). This fact implies that TaNx thin films with a null TCR can be obtained by adjusting the film thickness. The variation in the electrical properties of the TaNx thin films with the film thickness can be qualitatively explained by the parallel connection of surface layer with high resistivity and negative TCR and TaNx layer with low resistivity and positive TCR. 展开更多
关键词 TaNx thin films film thickness Temperature coefficient of resistance (TCR) Sheet resistance
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Effect of Mg-Film Thickness on the Formation of Semiconductor Mg_2Si Films Prepared by Resistive Thermal Evaporation Method 被引量:3
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作者 余宏 谢泉 CHEN Qian 《Journal of Wuhan University of Technology(Materials Science)》 SCIE EI CAS 2014年第3期612-616,共5页
Mg films of various thicknesses were deposited on Si(111) substrates at room temperature by resistive thermal evaporation method, and then the Mg/Si samples were annealed at 40 ℃ for 4 h. The effects of Mg film thi... Mg films of various thicknesses were deposited on Si(111) substrates at room temperature by resistive thermal evaporation method, and then the Mg/Si samples were annealed at 40 ℃ for 4 h. The effects of Mg film thickness on the formation and structure of Mg2Si films were investigated. The results showed that the crystallization quality of Mg2Si films was strongly influenced by the thickness of Mg film. The XRD peak intensity of Mg2Si (220) gradually increased initially and then decreased with increasing Mg film thickness. The XRD peak intensity of Mg2Si (220) reached its maximum when the Mg film of 380 um was used. The thickness of the Mg2Si film annealed at 400℃ for 4 h was approximately 3 times of the Mg film. 展开更多
关键词 Mg film thickness Mg2Si films Mg2Si films thickness thermal evaporation ANNEALING
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Simultaneous measurement of velocity profile and liquid film thickness in horizontal gas–liquid slug flow by using ultrasonic Doppler method 被引量:3
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作者 Lusheng Zhai Bo Xu +1 位作者 Haiyan Xia Ningde Jin 《Chinese Journal of Chemical Engineering》 SCIE EI CAS CSCD 2023年第6期323-340,共18页
Horizontal gas-liquid two-phase flows widely exist in chemical engineering,oil/gas production and other important industrial processes.Slug flow pattern is the main form of horizontal gas-liquid flows and characterize... Horizontal gas-liquid two-phase flows widely exist in chemical engineering,oil/gas production and other important industrial processes.Slug flow pattern is the main form of horizontal gas-liquid flows and characterized by intermittent motion of film region and slug region.This work aims to develop the ultrasonic Doppler method to realize the simultaneous measurement of the velocity profile and liquid film thickness of slug flow.A single-frequency single-channel transducer is adopted in the design of the field-programmable gate array based ultrasonic Doppler system.A multiple echo repetition technology is used to improve the temporal-spatial resolution for the velocity profile.An experiment of horizontal gas-liquid two-phase flow is implemented in an acrylic pipe with an inner diameter of 20 mm.Considering the aerated characteristics of the liquid slug,slug flow is divided into low-aerated slug flow,high-aerated slug flow and pseudo slug flow.The temporal-spatial velocity distributions of the three kinds of slug flows are reconstructed by using the ultrasonic velocity profile measurement.The evolution characteristics of the average velocity profile in slug flows are investigated.A novel method is proposed to derive the liquid film thickness based on the instantaneous velocity profile.The liquid film thickness can be effectively measured by detecting the position and the size of the bubbles nearly below the elongated gas bubble.Compared with the time of flight method,the film thickness measured by the Doppler system shows a higher accuracy as a bubble layer occurs in the film region.The effect of the gas distribution on the film thickness is uncovered in three kinds of slug flows. 展开更多
关键词 Gas–liquid flow Complex fluids Measurement Ultrasonic Doppler Velocity profile Liquid film thickness
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Modeling of liquid film thickness around Taylor bubbles rising in vertical stagnant and co-current slug flowing liquids 被引量:1
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作者 Weikai Ren Runsong Dai Ningde Jin 《Chinese Journal of Chemical Engineering》 SCIE EI CAS CSCD 2023年第6期179-194,共16页
The hydrodynamic study of the liquid film around Taylor bubbles in slug flow has great significance for understanding parallel flow and interaction between Taylor bubbles.The prediction models for liquid film thicknes... The hydrodynamic study of the liquid film around Taylor bubbles in slug flow has great significance for understanding parallel flow and interaction between Taylor bubbles.The prediction models for liquid film thickness mainly focus on stagnant flow,and some of them remain inaccurate performance.However,in the industrial process,the slug flow essentially is co-current flow.Therefore,in this paper,the liquid film thickness is studied by theoretical analysis and experimental methods under two conditions of stagnant and co-current flow.Firstly,under the condition of stagnant flow,the present work is based on Batchelor's theory,and modifies Batchelor's liquid film thickness model,which effectively improves its prediction accuracy.Under the condition of co-current flow,the prediction model of average liquid film thickness in slug flow is established by force and motion analysis.Taylor bubble length is introduced into the model as an important parameter.Dynamic experiments were carried out in the pipe with an inner diameter of 20 mm.The liquid film thickness,Taylor bubble velocity and length were measured by distributed ultrasonic sensor and intrusive cross-correlation conductivity sensor.Comparing the predicted value of the model with the measured results,the relative error is controlled within 10%. 展开更多
关键词 Slug flow Taylor bubble Liquid film thickness Ultrasonic sensor Physical model
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Influences of fiber length and water film thickness on fresh properties of basalt fiber-reinforced mortar 被引量:1
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作者 Leo Gu LI Yi OUYANG +2 位作者 Pui-Lam NG Kai-long ZENG Albert Kwok Hung KWAN 《Journal of Zhejiang University-Science A(Applied Physics & Engineering)》 SCIE EI CAS CSCD 2021年第5期344-356,共13页
In plain mortar,the water film thickness(WFT)has been found to play a key role in the fresh properties.However,in fiber-reinforced mortar,the role of WFT has not been investigated yet.In this research,basalt fibers of... In plain mortar,the water film thickness(WFT)has been found to play a key role in the fresh properties.However,in fiber-reinforced mortar,the role of WFT has not been investigated yet.In this research,basalt fibers of different lengths were added to the mortar,and the dynamic and static flowability,cohesiveness,adhesiveness,and packing density were tested to study the effects of fiber length on the packing density and WFT,and the combined effects of fiber length and WFT on the fresh properties.The results showed that in fiber-reinforced mortar,the WFT also plays a key role,whereas the fiber length exerts its influences through the indirect effects on the packing density and WFT and the direct effect on fiber-mortar interaction.Basically,an increase in fiber length decreases the packing density and WFT,decreases the dynamic and static flowability needed for placing,increases the cohesiveness needed for avoiding segregation,and,quite unexpectedly,decreases the adhesiveness needed for rendering and spraying applications.Regression analysis yielded good correlation of the fresh properties to fiber length and WFT,and best-fit formulas for the mix design for basalt fiber-reinforced mortar were obtained. 展开更多
关键词 Basalt fiber Fiber-reinforced mortar Fresh properties Water film thickness(WFT)
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EFFECT OF MOLECULAR WEIGHT AND FILM THICKNESS ON THE CRYSTALLIZATION AND MICROPHASE SEPARATION IN POLYSTYRENE-BLOCK-POLY(L-LACTIC ACID) THIN FILMS AT THE EARLY STAGE
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作者 于新红 《Chinese Journal of Polymer Science》 SCIE CAS CSCD 2011年第3期325-335,共11页
We investigated the effects of molecular weight and film thickness on the crystallization and microphase separation in semicrystalline block copolymer polystyrene-block-poly(L-lactic acid) (PS-b-PLLA) thin films, ... We investigated the effects of molecular weight and film thickness on the crystallization and microphase separation in semicrystalline block copolymer polystyrene-block-poly(L-lactic acid) (PS-b-PLLA) thin films, at the early stage of film evolution (when Tg 〈 T 〈 TODT) by in situ hot stage atomic force microscopy. For PS-b-PLLA 1 copolymer which had lower molecular weight and higher PLLA fraction, diffusion-controlled break-out crystallization started easily. For PS-b-PLLA 2 with higher molecular weight, crystallization in nanometer scales occurs in local area. After melting of the two copolymer films, islands were observed at the film surface: PS-b-PLLA 1 film was in a disordered phase mixed state while PS-b-PLLA 2 film formed phase-separated lamellar structure paralleling to the substrate. Crystallization-melting and van der Waals forces drove the island formation in PS-b-PLLA 1 film. Film thickness affected the crystallization rate. Crystals grew very slowly in much thinner film of PS-b-PLLA 1 and remained almost unchanged at long time annealing. The incompatibility between PS and PLLA blocks drove the film fluctuation which subsequently evolved into spinodal-like morphology. 展开更多
关键词 CRYSTALLIZATION Microphase separation Molecular weight film thickness Early stage.
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Correlating Photovoltaic Performance of Dye-Sensitized Solar Cell to the Film Thickness of Titania via Numerical Drift-Diffusion Simulations
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作者 Yu-dan Wang Zhe Sun +3 位作者 Ya-jun Ren Yan Zhang Mao Liang Song Xue 《Chinese Journal of Chemical Physics》 SCIE CAS CSCD 2016年第6期735-741,I0002,共8页
The thickness of TiO2 film is vital to realize the optimization on photovoltaic performance of dye sensitized solar cells (DSSCs). Herein, the process of charge separation in DSSCs was simulated by using a drift-dif... The thickness of TiO2 film is vital to realize the optimization on photovoltaic performance of dye sensitized solar cells (DSSCs). Herein, the process of charge separation in DSSCs was simulated by using a drift-diffusion model. This model allows multiple-trapping diffu- sion of photo-generated electrons, as well as the back reaction with the electron acceptors in electrolyte, to be mimicked in both steady and non-steady states. Numerical results on current-voltage characteristics allow power conversion efficiency to be maximized by varying the thickness of TiO2 film. Charge collection efficiency is shown to decrease with film thick- ness, whereas the flux of electron injection benefits from the film thickening. The output of photocurrent is actually impacted by the two factors. Furthermore, recombination rate constant is found to affect the optimized film thickness remarkably. Thicker TiO2 film is suitable to the DSSCs in which back reaction is suppressed sufficiently. On the contrary, the DSSCs with the redox couple showing fast electron interception require thinner film to alleviate the charge loss via recombination. At open circuit, electron density is found to decrease with film thickness, which engenders not only the reduction of photovoltage but also the increase of electron lifetime. 展开更多
关键词 Dye-sensitized solar cells TITANIA film thickness SIMULATION
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Erratum to “Accurate determination of film thickness by low-angle x-ray reflection”
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作者 Ming Xu Tao Yang +5 位作者 Wenxue Yu Ning Yang Cuixiu Liu Zhenhong Mai Wuyan Lai Kun Tao 《Chinese Physics B》 SCIE EI CAS CSCD 2022年第9期658-658,共1页
Equation(6)in Chin.Phys.090833(2000)is corrected.All subsequent derivations were given based on the correct Eq.(6),so the conclusions in the paper are not ffected by the rrata.
关键词 erratum film thickness X-RAY
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Method of measuring one-dimensional photonic crystal period-structure-film thickness based on Bloch surface wave enhanced Goos–H?nchen shift
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作者 郎垚璞 刘庆纲 +2 位作者 王奇 周兴林 贾光一 《Chinese Physics B》 SCIE EI CAS CSCD 2023年第1期545-552,共8页
This paper puts forward a novel method of measuring the thin period-structure-film thickness based on the Bloch surface wave(BSW) enhanced Goos–Hanchen(GH) shift in one-dimensional photonic crystal(1DPC). The BSW phe... This paper puts forward a novel method of measuring the thin period-structure-film thickness based on the Bloch surface wave(BSW) enhanced Goos–Hanchen(GH) shift in one-dimensional photonic crystal(1DPC). The BSW phenomenon appearing in 1DPC enhances the GH shift generated in the attenuated total internal reflection structure. The GH shift is closely related to the thickness of the film which is composed of layer-structure of 1DPC. The GH shifts under multiple different incident light conditions will be obtained by varying the wavelength and angle of the measured light, and the thickness distribution of the entire structure of 1DPC is calculated by the particle swarm optimization(PSO) algorithm.The relationship between the structure of a 1DPC film composed of TiO_(2) and SiO_(2) layers and the GH shift, is investigated.Under the specific photonic crystal structure and incident conditions, a giant GH shift, 5.1 × 10^(3) times the wavelength of incidence, can be obtained theoretically. Simulation and calculation results show that the thickness of termination layer and periodic structure bilayer of 1DPC film with 0.1-nm resolution can be obtained by measuring the GH shifts. The exact structure of a 1DPC film is innovatively measured by the BSW-enhanced GH shift. 展开更多
关键词 thin film thickness Bloch surface wave(BSW) Goos–H?nchen shift photonic crystal
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A Novel Model for the Prediction of Liquid Film Thickness Distribution in Pipe Gas-Liquid Flows
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作者 Yubo Wang Yanan Yu +1 位作者 Qiming Wang Anxun Liu 《Fluid Dynamics & Materials Processing》 EI 2024年第9期1993-2006,共14页
A model is proposed for liquid film profile prediction in gas-liquid two-phase flow,which is able to provide the film thickness along the circumferential direction and the pressure gradient in the flow direction.A two... A model is proposed for liquid film profile prediction in gas-liquid two-phase flow,which is able to provide the film thickness along the circumferential direction and the pressure gradient in the flow direction.A two-fluid model is used to calculate both gas and liquid phases’flow characteristics.The secondary flow occurring in the gas phase is taken into account and a sailing boat mechanism is introduced.Moreover,energy conservation is applied for obtaining the liquid film thickness distribution along the circumference.Liquid film thickness distribution is calculated accordingly for different cases;its values are compared with other models and available experimental data.As a result,the newly proposed model is tested and good performances are demonstrated.The liquid film thickness distribution in small pipes and inclined pipes is also studied,and regime transition is revealed by liquid film profile evolution.The observed inflection point demonstrates that the liquid film thickness decreases steeply along the circumference,when the circle angle ranges between 30°and 50°for gas-liquid stratified flow with small superficial velocities. 展开更多
关键词 film thickness secondary flow void fraction pressure gradient regime transition
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Effect of Film Thickness on Properties of a-Si∶H Films
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作者 QIANXiang-zhong CHENGJian-bo 《Semiconductor Photonics and Technology》 CAS 2003年第1期37-40,共4页
The a-Si∶H films with different thickness smaller than 1 μm were deposited by plasma enhanced chemical vapor deposition (PECVD) under the optimum deposition conditions. The effect of different thickness on film prop... The a-Si∶H films with different thickness smaller than 1 μm were deposited by plasma enhanced chemical vapor deposition (PECVD) under the optimum deposition conditions. The effect of different thickness on film properties is analyzed.The results show that,with the increase of the film thickness,the dark conductivity, photoconductivity and threshold voltage increase, the optical gap and peak ratio of TA to TO in the Raman spectra decrease, the refractive index keeps almost constant, and the optical absorption coefficient and current ratio of on/off state first maximize and then reduce. 展开更多
关键词 amorphous Si : H film film thickness optical properties ELECTRICALPROPERTIES
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Study on multi-wavelength thin film thickness determination method
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作者 SHI Ce XIE Mao-Bin +3 位作者 ZHENG Wei-Bo JI Ruo-Nan WANG Shao-Wei LU Wei 《红外与毫米波学报》 CSCD 北大核心 2024年第6期813-819,共7页
This work introduces a novel method for measuring thin film thickness,employing a multi-wavelength method that significantly reduces the need for broad-spectrum data.Unlike traditional techniques that require sev⁃eral... This work introduces a novel method for measuring thin film thickness,employing a multi-wavelength method that significantly reduces the need for broad-spectrum data.Unlike traditional techniques that require sev⁃eral hundred spectral data points,the multi-wavelength method achieves precise thickness measurements with data from only 10 wavelengths.This innovation not only simplifies the process of spectral measurement analysis but also enables accurate real-time thickness measurement on industrial coating production lines.The method effectively reconstructs and fits the visible spectrum(400-800 nm)using a minimal amount of data,while maintaining measurement error within 7.1%.This advancement lays the foundation for more practical and efficient thin film thickness determination techniques in various industrial applications. 展开更多
关键词 film thickness determination transmittance and reflectance spectra FITTING spectral reconstruction
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Effects of Film Thickness and Ar/O2 Ratio on Resistive Switching Characteristics of HfOx-Based Resistive-Switching Random Access Memories
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作者 郭婷婷 谭婷婷 刘正堂 《Chinese Physics Letters》 SCIE CAS CSCD 2015年第1期125-128,共4页
Cu/HfOx/n^+Si devices are fabricated to investigate the influence of technological parameters including film thickness and Ar/02 ratio on the resistive switching (RS) characteristics of HfOx films, in terms of swit... Cu/HfOx/n^+Si devices are fabricated to investigate the influence of technological parameters including film thickness and Ar/02 ratio on the resistive switching (RS) characteristics of HfOx films, in terms of switch ratio, endurance properties, retention time and multilevel storage. It is revealed that the RS characteristics show strong dependence on technological parameters mainly by altering the defects (oxygen vacancies) in the film. The sample with thickness of 2Onto and Ar/O2 ratio of 12:3 exhibits the best RS behavior with the potential of multilevel storage. The conduction mechanism of all the films is interpreted based on the filamentary model. 展开更多
关键词 Effects of film thickness and Ar/O2 Ratio on Resistive Switching Characteristics of HfOx-Based Resistive-Switching Random Access Memories
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The Effect of Carrier Doping and Thickness on the Electronic Structures of La_(3)Ni_(2)O_(7)Thin Films
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作者 Haoliang Shi Zihao Huo +4 位作者 Guanlin Li Hao Ma Tian Cui Daoxin Yao Defang Duan 《Chinese Physics Letters》 2025年第8期201-229,共29页
The discovery of high-temperature superconductivity in bilayer nickelate La_(3)Ni_(2)O_(7)under high-pressure conditions has spurred extensive efforts to stabilize superconductivity at ambient pressure.Recently,the re... The discovery of high-temperature superconductivity in bilayer nickelate La_(3)Ni_(2)O_(7)under high-pressure conditions has spurred extensive efforts to stabilize superconductivity at ambient pressure.Recently,the realization of superconductivity in compressively strained La_(3)Ni_(2)O_(7)thin films grown on the SrLaAlO_(4)substrates,with a T_(c)exceeding 40 K,represents a significant step toward this goal.Here,we investigate the influence of film thickness and carrier doping on the electronic structure of La_(3)Ni_(2)O_(7)thin films,ranging from 0.5 to 3 unit cells,using first-principles calculations.For a 2 unit-cell film with an optimal doping concentration of 0.3 hole per formula unit(0.15 hole/Ni),the Ni-d_(z^(2))interlayer bonding state crosses the Fermi level,resulting in the formation ofγpockets at the Fermi surface.These findings align with angle-resolved photoemission spectroscopy experimental data.Our results provide theoretical validation for the recent experimental discovery of ambient-pressure superconductivity in La_(3)Ni_(2)O_(7)thin films and underscore the significant impact of film thickness and carrier doping on electronic property modulation. 展开更多
关键词 bilayer nickelate film thickness electronic structure l electronic structure la ni o thin films carrier doping stabilize superconductivity SUPERCONDUCTIVITY
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Liquid film thickness model formed by atomized droplets during sustainable cryogenic air MQL grinding
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作者 Mingzheng LIU Changhe LI +6 位作者 Qinglong AN Yanbin ZHANG Min YANG Xin CUI Teng GAO Yusuf Suleiman DAMBATTA Runze LI 《Frontiers of Mechanical Engineering》 2025年第1期45-68,共24页
Surface thermal damage in a difficult-to-process metal precision grinding workpiece has emerged as a technical bottleneck restricting machining quality.As an alternative to traditional pouring cooling,a green clean mi... Surface thermal damage in a difficult-to-process metal precision grinding workpiece has emerged as a technical bottleneck restricting machining quality.As an alternative to traditional pouring cooling,a green clean minimum-quantity lubrication technology still has defects,such as insufficient heat dissipation.The use of cryogenic air instead of normal temperature air,that is,the supply of low-temperature energized lubricant,can effectively improve oil film heat transfer and lubrication performance in a grinding area.Under the premise of ensuring the effective flow of lubricating oil in a grinding zone,the thickness of a liquid film in the wedge zone of a grinding wheel or workpiece is the key factor for determining its performance.However,the dynamic mechanism of droplet formation and distribution of liquid film thickness are still unclear.Hence,the mechanism by which nozzle orientation influences the effective region of a liquid film was analyzed,and the range of nozzle inclination that helps to atomize droplets and enables them to enter the grinding zone was revealed.Then,the dynamic mechanism of atomized droplet film formation was analyzed,and the influence of normal and tangential momentum sources generated by gas impingement perturbation flow and droplet impingement steady flow on the driving effect of liquid film flow was revealed.The thickness distribution model of a liquid film in the impact zone of gas–liquid two-phase flow under different cryogenic air temperatures was established.The model results under different working conditions were obtained by numerical analysis,and validation experiments were carried out.Results show that the measured values agree with the theoretical values.At 0.4 MPa air pressure,the thickness of the liquid film in the impact zone of the atomized droplets increases with decreasing cryogenic air temperature.At−10 and−50°C,the thickness of the liquid film is 0.92 and 1.26 mm,respectively.Further,on the basis of the surface topography model of cubic boron nitride grinding wheel,the pose relationship of any three adjacent abrasive particles was analyzed,and the theoretical model of abrasive clearance volume was established.The dynamic variation of abrasive clearance volume distribution domain is[70.46,78.72]mm3,and the total volume distribution domain is[140.84,155.67]mm3.The research will provide a theoretical basis for the application of cryogenic air minimum quantity lubrication technology to hard metal grinding. 展开更多
关键词 sustainable grinding cryogenic cooling minimum quantity lubrication CAMQL liquid film thickness formation mechanism
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Prediction and verification of thin liquid film thickness on salt-deposited copper surface in an atmospheric hygrothermal environment
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作者 Rongdie Zhu Binxia Ma +2 位作者 Hongbin Zhang Zhihao Qu Jinyang Zhu 《Corrosion Communications》 2025年第2期76-84,共9页
This study used laser spectroscopy testing technology and independently constructed a testing apparatus to achieve stable measurements of the adsorbed liquid film thickness on copper surfaces.The apparatus measurement... This study used laser spectroscopy testing technology and independently constructed a testing apparatus to achieve stable measurements of the adsorbed liquid film thickness on copper surfaces.The apparatus measurement accuracy reached 91.7%.Using this apparatus,the thickness of the adsorbed liquid film on copper surfaces was measured and analyzed under different temperatures,relative humidity(RH),and salt(NaCl)deposition density conditions.According to the results,increased temperature,RH,and NaCl deposition increased the liquid film thickness.Furthermore,the liquid film thickness increased exponentially with increasing RH under the same temperature and Na Cl deposition conditions.Surface fitting of the obtained liquid film thickness data yielded a fitting calculation formula for the adsorbed liquid film thickness on copper surfaces under typical atmospheric temperature conditions(25–45℃).In addition,artificial neural networks(ANNs)and support vector machine models were constructed based on machine learning methods for predicting liquid film thickness.Comparative results indicated that the ANN prediction model exhibited higher accuracy,with a model determination coefficient (R^(2)) reaching 0.99.Validation by comparing measured and predicted values under typical conditions for liquid film thickness showed that the machine learning-based prediction error was approximately 9.7%.This approach rapidly predicted adsorbed liquid film thickness on copper surfaces subjected to atmospheric humid and hot NaCl deposition. 展开更多
关键词 COPPER Atmospheric corrosion Hygrothermal environment Thin liquid film thickness Machine learning
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