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基于GaN FETs的高频半桥谐振变换器分析与设计 被引量:2
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作者 管乐诗 卞晴 +4 位作者 刘宾 王懿杰 张相军 徐殿国 王卫 《电源学报》 CSCD 2016年第4期82-89,共8页
随着Si材料半导体器件性能逐步达到瓶颈,宽禁带半导体器件(GaN、SiC)在诸多方面展现出了很好的性能,如低导通阻抗,小输入、输出电容等,这些特性使得GaN和SiC器件能够应用在更高的开关频率条件,从而提高系统的功率密度。针对基于GaN FET... 随着Si材料半导体器件性能逐步达到瓶颈,宽禁带半导体器件(GaN、SiC)在诸多方面展现出了很好的性能,如低导通阻抗,小输入、输出电容等,这些特性使得GaN和SiC器件能够应用在更高的开关频率条件,从而提高系统的功率密度。针对基于GaN FETs构成的高频半桥谐振变换器进行设计,分析了高频条件下寄生电感参数对系统驱动电压及漏源极电压的影响,同时分析了高频条件下系统电压电流测量所需注意的事项及影响因素,为高频条件下GaN FETs的应用提供一定的帮助。 展开更多
关键词 GAN fets 高频 谐振变换器 寄生电感
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Advances in MoS_2-Based Field Effect Transistors(FETs) 被引量:5
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作者 Xin Tong Eric Ashalley +2 位作者 Feng Lin Handong Li Zhiming M.Wang 《Nano-Micro Letters》 SCIE EI CAS 2015年第3期203-218,共16页
This paper reviews the original achievements and advances regarding the field effect transistor(FET) fabricated from one of the most studied transition metal dichalcogenides: two-dimensional Mo S2. Not like graphene, ... This paper reviews the original achievements and advances regarding the field effect transistor(FET) fabricated from one of the most studied transition metal dichalcogenides: two-dimensional Mo S2. Not like graphene, which is highlighted by a gapless Dirac cone band structure, Monolayer Mo S2 is featured with a 1.9 e V gapped direct energy band thus facilitates convenient electronic and/or optoelectronic modulation of its physical properties in FET structure. Indeed,many Mo S2 devices based on FET architecture such as phototransistors, memory devices, and sensors have been studied and extraordinary properties such as excellent mobility, ON/OFF ratio, and sensitivity of these devices have been exhibited. However, further developments in FET device applications depend a lot on if novel physics would be involved in them. In this review, an overview on advances and developments in the Mo S2-based FETs are presented. Engineering of Mo S2-based FETs will be discussed in details for understanding contact physics, formation of gate dielectric, and doping strategies. Also reported are demonstrations of device behaviors such as low-frequency noise and photoresponse in Mo S2-based FETs, which is crucial for developing electronic and optoelectronic devices. 展开更多
关键词 Mo S2fets engineering Low-frequency noise Optical properties Mo S2sensors Mo S2memory devices
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A comprehensive review of recent progress on enhancement-modeβ-Ga_(2)O_(3)FETs:Growth,devices and properties
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作者 Botong Li Xiaodong Zhang +10 位作者 Li Zhang Yongjian Ma Wenbo Tang Tiwei Chen Yu Hu Xin Zhou Chunxu Bian Chunhong Zeng Tao Ju Zhongming Zeng Baoshun Zhang 《Journal of Semiconductors》 EI CAS CSCD 2023年第6期7-23,共17页
Power electronic devices are of great importance in modern society.After decades of development,Si power devices have approached their material limits with only incremental improvements and large conversion losses.As ... Power electronic devices are of great importance in modern society.After decades of development,Si power devices have approached their material limits with only incremental improvements and large conversion losses.As the demand for electronic components with high efficiency dramatically increasing,new materials are needed for power device fabrication.Betaphase gallium oxide,an ultra-wide bandgap semiconductor,has been considered as a promising candidate,and variousβ-Ga_(2)O_(3)power devices with high breakdown voltages have been demonstrated.However,the realization of enhancement-mode(E-mode)β-Ga_(2)O_(3)field-effect transistors(FETs)is still challenging,which is a critical problem for a myriad of power electronic applications.Recently,researchers have made some progress on E-modeβ-Ga_(2)O_(3)FETs via various methods,and several novel structures have been fabricated.This article gives a review of the material growth,devices and properties of these E-modeβ-Ga_(2)O_(3)FETs.The key challenges and future directions in E-modeβ-Ga_(2)O_(3)FETs are also discussed. 展开更多
关键词 enhancement mode fets β-Ga_(2)O_(3)
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Experimental investigation on the instability for NiO/β-Ga_(2)O_(3) heterojunction-gate FETs under negative bias stress 被引量:1
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作者 Zhuolin Jiang Xiangnan Li +5 位作者 Xuanze Zhou Yuxi Wei Jie Wei Guangwei Xu Shibing Long Xiaorong Luo 《Journal of Semiconductors》 EI CAS CSCD 2023年第7期32-36,共5页
A NiO/β-Ga_(2)O_(3) heterojunction-gate field effect transistor(HJ-FET)is fabricated and it_(s)instability mechanisms are exper-imentally investigated under different gate stress voltage(V_(G,s))and stress times(t_(s... A NiO/β-Ga_(2)O_(3) heterojunction-gate field effect transistor(HJ-FET)is fabricated and it_(s)instability mechanisms are exper-imentally investigated under different gate stress voltage(V_(G,s))and stress times(t_(s)).Two different degradation mechanisms of the devices under negative bias stress(NBS)are identified.At low V_(G,s)for a short t_(s),NiO bulk traps trapping/de-trapping elec-trons are responsible for decrease/recovery of the leakage current,respectively.At higher V_(G,s)or long t_(s),the device transfer char-acteristic curves and threshold voltage(V_(TH))are almost permanently negatively shifted.This is because the interface dipoles are almost permanently ionized and neutralize the ionized charges in the space charge region(SCR)across the heterojunction inter-face,resulting in a narrowing SCR.This provides an important theoretical guide to study the reliability of NiO/β-Ga_(2)O_(3) hetero-junction devices in power electronic applications. 展开更多
关键词 NiO/β-Ga_(2)O_(3)heterojunction FET NBS INSTABILITY bulk traps interface dipoles
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Design Consideration in the Development of Multi-Fin FETs for RF Applications
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作者 Peijie Feng Prasanta Ghosh 《World Journal of Nano Science and Engineering》 2012年第2期88-91,共4页
In this paper, we propose multi-fin FET design techniques targeted for RF applications. Overlap and underlap design configuration in a base FinFET are compared first and then multi-fin device (consisting of transistor... In this paper, we propose multi-fin FET design techniques targeted for RF applications. Overlap and underlap design configuration in a base FinFET are compared first and then multi-fin device (consisting of transistor unit up to 50) is studied to develop design limitations and to evaluate their effects on the device performance. We have also investigated the impact of the number of fins (up to 50) in multi-fin structure and resulting RF parameters. Our results show that as the number of fin increases, underlap design compromises RF performance and short channel effects. The results provide technical understanding that is necessary to realize new opportunities for RF and analog mixed-signal design with nanoscale FinFETs. 展开更多
关键词 FINFET Analog RF Source/Drain Extension Region Engineering Simulation Multi-Fin FET
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Ionic effects on the transport characteristics of nanowire-based FETs in a liquid environment
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作者 Daijiro Nozaki Jens Kunstmann +5 位作者 Felix Zorgiebel Sebastian Pregl Larysa Baraban Walter M. Weber Thomas Mikolajick Gianaurelio Cuniberti 《Nano Research》 SCIE EI CAS CSCD 2014年第3期380-389,共10页
For the development of ultra-sensitive electrical bio/chemical sensors based on nanowire field effect transistors (FETs), the influence of the ions in the solution on the electron transport has to be understood. For... For the development of ultra-sensitive electrical bio/chemical sensors based on nanowire field effect transistors (FETs), the influence of the ions in the solution on the electron transport has to be understood. For this purpose we establish a simulation platform for nanowire FETs in the liquid environment by implementing the modified Poisson-Boltzmann model into Landauer transport theory. We investigate the changes of the electric potential and the transport characteristics due to the ions. The reduction of sensitivity of the sensors due to the screening effect from the electrolyte could be successfully reproduced. We also fabricated silicon nanowire Schottky-barrier FETs and our model could capture the observed reduction of the current with increasing ionic concentration. This shows that our simulation platform can be used to interpret ongoing experiments, to design nanowire FETs, and it also gives insight into controversial issues such as whether ions in the buffer solution affect the transport characteristics or not. 展开更多
关键词 nanowire field effecttransistors fets biosensors silicon nanowires Poisson-Boltzmann theory Landauer model
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Modeling of cylindrical surrounding gate MOSFETs including the fringing field effects
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作者 Santosh K.Gupta Srimanta Baishya 《Journal of Semiconductors》 EI CAS CSCD 2013年第7期52-57,共6页
A physically based analytical model for surface potential and threshold voltage including the fringing gate capacitances in cylindrical surround gate(CSG) MOSFETs has been developed.Based on this a subthreshold drai... A physically based analytical model for surface potential and threshold voltage including the fringing gate capacitances in cylindrical surround gate(CSG) MOSFETs has been developed.Based on this a subthreshold drain current model has also been derived.This model first computes the charge induced in the drain/source region due to the fringing capacitances and considers an effective charge distribution in the cylindrically extended source/drain region for the development of a simple and compact model.The fringing gate capacitances taken into account are outer fringe capacitance,inner fringe capacitance,overlap capacitance,and sidewall capacitance.The model has been verified with the data extracted from 3D TCAD simulations of CSG MOSFETs and was found to be working satisfactorily. 展开更多
关键词 physics based modeling source/drain extension (SDE) cylindrical surrounding gate (CSG) MOS- fets fringing field surface potential threshold voltage
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Investigation and statistical modeling of InAs-based double gate tunnel FETs for RF performance enhancement
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作者 S.Poorvasha B.Lakshmi 《Journal of Semiconductors》 EI CAS CSCD 2018年第5期30-40,共11页
In this paper,RF performance analysis of In As-based double gate(DG)tunnel field effect transistors(TFETs)is investigated in both qualitative and quantitative fashion.This investigation is carried out by varying t... In this paper,RF performance analysis of In As-based double gate(DG)tunnel field effect transistors(TFETs)is investigated in both qualitative and quantitative fashion.This investigation is carried out by varying the geometrical and doping parameters of TFETs to extract various RF parameters,unity gain cut-off frequency(f_t),maximum oscillation frequency(f_(max)),intrinsic gain and admittance(Y)parameters.An asymmetric gate oxide is introduced in the gate-drain overlap and compared with that of DG TFETs.Higher ON-current(ION)of about 0.2 mA and less leakage current(IOFF)of 29 f A is achieved for DG TFET with gate-drain overlap.Due to increase in transconductance(g_m),higher ft and intrinsic gain is attained for DG TFET with gate-drain overlap.Higher f_(max) of 985 GHz is obtained for drain doping of 5×10^(17)cm^(-3) because of the reduced gate-drain capacitance(C_(gd))with DG TFET with gate-drain overlap.In terms of Y-parameters,gate oxide thickness variation offers better performance due to the reduced values of Cgd.A second order numerical polynomial model is generated for all the RF responses as a function of geometrical and doping parameters.The simulation results are compared with this numerical model where the predicted values match with the simulated values. 展开更多
关键词 double gate tunnel fets gate-drain overlap unity gain cut-off frequency maximum oscillation frequency Y-parameters modeling
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Contact and injection engineering for low SS reconfigurable FETs and high gain complementary inverters 被引量:2
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作者 Xingxia Sun Chenguang Zhu +11 位作者 Huawei Liu Biyuan Zheng Yong Liu Jiali Yi Lizhen Fang Ying Liu Xingwang Wang Muhammad Zubair Xiaoli Zhu Xiao Wang Dong Li Anlian Pan 《Science Bulletin》 SCIE EI CSCD 2020年第23期2007-2013,M0004,共8页
The newly emerged two-dimensional(2D) semiconducting materials, owning to the atomic thick nature and excellent optical and electrical properties, are considered as potential candidates to solve the bottlenecks of tra... The newly emerged two-dimensional(2D) semiconducting materials, owning to the atomic thick nature and excellent optical and electrical properties, are considered as potential candidates to solve the bottlenecks of traditional semiconductors. However, the realization of high performance 2D semiconductorbased field-effect transistors(FETs) has been a longstanding challenge in 2D electronics, which is mainly ascribing to the presence of significant Schottky barrier(SB) at metal-semiconductor interfaces. Here, an additional contact gate is induced in 2D ambipolar FET to realize near ideal reconfigurable FET(RFET)devices without restrictions of SB. Benefitting from the consistently high doping of contact region, the effective SB height can be maintained at ultra-small value during all operation conditions, resulting in the near ideal subthreshold swing(SS) values(132 mV/decade for MoTe2 RFET and 67 mV/decade for WSe2 RFET) and the relatively high mobility(28.6 cm2/(Vs) for MoTe2 RFET and 89.8 cm2/(V s) for WSe2 RFET). Moreover, the flexible control on the doping polarity of contact region enables the remodeling and switching of the achieved unipolar FETs between p-type mode and n-type mode. Based on such reconfigurable behaviors, high gain complementary MoTe2 inverters are further realized. The findings in this work push forward the development of high-performance 2D semiconductor integrated devices and circuits. 展开更多
关键词 Reconfigurable field-effect transistor(FET) Schottky barrier Subthreshold swing Complementary inverter
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Line-edge roughness induced single event transient variation in SOI Fin FETs 被引量:1
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作者 武唯康 安霞 +4 位作者 蒋晓波 陈叶华 刘静静 张兴 黄如 《Journal of Semiconductors》 EI CAS CSCD 2015年第11期25-29,共5页
The impact of process induced variation on the response of SOI Fin FET to heavy ion irradiation is studied through 3-D TCAD simulation for the first time. When Fin FET biased at OFF state configuration(Vgs D0, Vds DV... The impact of process induced variation on the response of SOI Fin FET to heavy ion irradiation is studied through 3-D TCAD simulation for the first time. When Fin FET biased at OFF state configuration(Vgs D0, Vds DVdd/ is struck by a heavy ion, the drain collects ionizing charges under the electric field and a current pulse(single event transient, SET) is consequently formed. The results reveal that with the presence of line-edge roughness(LER), which is one of the major variation sources in nano-scale Fin FETs, the device-to-device variation in terms of SET is observed. In this study, three types of LER are considered: type A has symmetric fin edges, type B has irrelevant fin edges and type C has parallel fin edges. The results show that type A devices have the largest SET variation while type C devices have the smallest variation. Further, the impact of the two main LER parameters,correlation length and root mean square amplitude, on SET variation is discussed as well. The results indicate that variation may be a concern in radiation effects with the down scaling of feature size. 展开更多
关键词 heavy ion irradiation single event transient VARIATION line-edge roughness SOI Fin FET
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Compact modeling of quantum confinements in nanoscale gate-all-around MOSFETs
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作者 Baokang Peng Yanxin Jiao +7 位作者 Haotian Zhong Zhao Rong Zirui Wang Ying Xiao Waisum Wong Lining Zhang Runsheng Wang Ru Huang 《Fundamental Research》 CAS CSCD 2024年第5期1306-1313,共8页
In this work,a surface-potential based compact model focusing on the quantum confinement effects of ultimately scaled gate-all-around(GAA)MOSFET is presented.Energy quantization with sub-band formation along the radiu... In this work,a surface-potential based compact model focusing on the quantum confinement effects of ultimately scaled gate-all-around(GAA)MOSFET is presented.Energy quantization with sub-band formation along the radius direction of cylindrical GAAs or thickness direction of nanosheet GAAs leads to significant quantization effects.An analytical model of surface potentials is developed by solving the Poisson equation with incorporating sub-band effects.In combination with the existing transport model framework,charge-voltage and current-voltage formulations are developed based on the surface potential.The model formulations are then extensively validated using TCAD numerical simulations as well as Si data of nanosheet GAA MOSFETs.Simulations of typical circuits verify the model robustness and convergence for its applications in GAA technology. 展开更多
关键词 Gate-all-around FET Compact model Quantum mechanical confinement Nanosheet FET Nanowire FET Sub-band energy
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颅内间叶性肿瘤伴FET∷CREB融合2例临床病理学观察
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作者 张娇娇 张新娟 +5 位作者 宫惠琳 刘希 汪园园 杨喆 马瑞宁 梁华 《临床与实验病理学杂志》 北大核心 2025年第12期1641-1645,共5页
目的探讨颅内间叶性肿瘤伴FET∷CREB融合的临床病理学特征、免疫表型、分子生物学特点、鉴别诊断及预后。方法对2例颅内间叶性肿瘤伴FET∷CREB融合的临床资料、病理特点及免疫组化标记、分子检测结果进行分析,并复习相关文献。结果2例患... 目的探讨颅内间叶性肿瘤伴FET∷CREB融合的临床病理学特征、免疫表型、分子生物学特点、鉴别诊断及预后。方法对2例颅内间叶性肿瘤伴FET∷CREB融合的临床资料、病理特点及免疫组化标记、分子检测结果进行分析,并复习相关文献。结果2例患者,例1为8岁男童,肿瘤位于右额叶,影像学表现为界限清楚的囊实性占位,例2为44岁女性,肿瘤位于左侧侧脑室,影像学表现为界限清楚的实性占位。镜下共同特征表现为无包膜,肿瘤细胞疏密不等,主要由形态温和的短梭形、星芒状细胞组成,呈条索状或片状分布于黏液样间质中,间质血管可见血管瘤样改变,肿瘤周围可见淋巴细胞、浆细胞浸润。免疫表型:2例肿瘤均弥漫表达CD99、部分表达desmin、EMA,Ki67增殖指数5%~10%。FISH检测例1出现EWSR1分离信号。下一代测序检测例1为EWSR1∷CREB1基因融合,例2为EWSR1∷CREM基因融合。术后随访6~12个月,2例患者均无复发及转移。结论颅内间叶性肿瘤伴FET∷CREB融合较为罕见,预后尚不明确,诊断应与脑膜瘤、黏液样胶质神经元肿瘤、低度恶性纤维黏液样肉瘤等鉴别。 展开更多
关键词 颅内间叶性肿瘤 FET∷CREB融合 临床病理学特征 鉴别诊断
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多次复发的颅内间叶源性肿瘤伴FET∷CREB融合阳性1例并文献复习
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作者 高敏 王雅杰 +4 位作者 段焕利 曲利娟 赵莉红 熊艳蕾 滕梁红 《临床与实验病理学杂志》 北大核心 2025年第9期1225-1229,共5页
目的探讨颅内间叶源性肿瘤伴FET∷CREB融合阳性的病理鉴别诊断及预后。方法收集1例多次复发的颅内间叶源性肿瘤伴FET∷CREB融合阳性患者的临床资料,采用免疫组化、FISH及NGS进行检测,分析其临床病理特征与预后的关系。结果患者于2008年... 目的探讨颅内间叶源性肿瘤伴FET∷CREB融合阳性的病理鉴别诊断及预后。方法收集1例多次复发的颅内间叶源性肿瘤伴FET∷CREB融合阳性患者的临床资料,采用免疫组化、FISH及NGS进行检测,分析其临床病理特征与预后的关系。结果患者于2008年首次在外院行鞍区手术,术后病理结果为透明细胞型脑膜瘤,后经历肿瘤多次复发及手术伽玛刀治疗。2023年肿瘤再次复发,在我院行肿瘤切除,术后病理诊断为颅内间叶源性肿瘤伴FET∷CREB融合阳性,高通量基因测序检出EWSR1∷ATF1融合。从患者第一次手术开始随访至今已196个月,目前患者仍存活。结论颅内间叶源性肿瘤伴FET∷CREB融合阳性形态学表现多样,鉴别诊断困难时可行分子检测明确诊断;该肿瘤易复发,但整体生存期可较长。 展开更多
关键词 间叶源性肿瘤 颅内 FET∷CREB 分子 预后
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超宽禁带半导体Ga_(2)O_(3)功率器件、紫外光电器件的新进展(续)
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作者 赵正平 《半导体技术》 北大核心 2025年第5期417-434,共18页
在电动汽车等绿色能源应用和发展的带动下,宽禁带半导体材料SiC、GaN电力电子产业成为新一代产业的发展主流,而有可能成为下一代电力电子学发展的超宽禁带半导体材料金刚石、Ga_(2)O_(3)和AlN已成为目前前瞻性的科研热点,其中Ga_(2)O_(3... 在电动汽车等绿色能源应用和发展的带动下,宽禁带半导体材料SiC、GaN电力电子产业成为新一代产业的发展主流,而有可能成为下一代电力电子学发展的超宽禁带半导体材料金刚石、Ga_(2)O_(3)和AlN已成为目前前瞻性的科研热点,其中Ga_(2)O_(3)在这三种半导体材料中具有单晶尺寸发展最快、成本最低和功率二极管性能已接近工程化等特点,预判Ga_(2)O_(3)在电力电子和紫外光电器件两个领域具有提前工程化和后续产业化的发展趋势。介绍了Ga_(2)O_(3)在上述两个领域,如Ga_(2)O_(3)功率二极管、Ga_(2)O_(3)功率FET、Ga_(2)O_(3)紫外光电器件的最新进展。其中包括Ga_(2)O_(3)功率二极管在肖特基势垒二极管(SBD)、异质结二极管和MOS二极管方面的结构设计创新、工艺创新和可靠性;也包括Ga_(2)O_(3)功率FET在MESFET、MOSFET、异质结FET、无极FET和立体晶体管等方向的器件结构设计创新、工艺创新和可靠性;此外,还包括Ga_(2)O_(3)紫外光电器件在光电晶体管、薄膜光电导体、光电二极管、金属-半导体-金属(MSM)光电探测器和异质结构光电探测器等方向的器件结构设计创新、工艺和机理的创新。分析和评价了Ga_(2)O_(3)在电力电子和紫外光电器件两个领域从科研向工程化的发展态势。 展开更多
关键词 超宽禁带半导体 Ga_(2)O_(3) 功率二极管 功率FET 紫外光电器件
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超宽禁带半导体Ga_(2)O_(3)功率器件、紫外光电器件的新进展
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作者 赵正平 《半导体技术》 北大核心 2025年第4期313-332,共20页
在电动汽车等绿色能源应用和发展的带动下,宽禁带半导体材料SiC、GaN电力电子产业成为新一代产业的发展主流,而有可能成为下一代电力电子学发展的超宽禁带半导体材料金刚石、Ga_(2)O_(3)和AlN已成为目前前瞻性的科研热点,其中Ga_(2)O_(3... 在电动汽车等绿色能源应用和发展的带动下,宽禁带半导体材料SiC、GaN电力电子产业成为新一代产业的发展主流,而有可能成为下一代电力电子学发展的超宽禁带半导体材料金刚石、Ga_(2)O_(3)和AlN已成为目前前瞻性的科研热点,其中Ga_(2)O_(3)在这三种半导体材料中具有单晶尺寸发展最快、成本最低和功率二极管性能已接近工程化等特点,预判Ga_(2)O_(3)在电力电子和紫外光电器件两个领域具有提前工程化和后续产业化的发展趋势。介绍了Ga_(2)O_(3)在上述两个领域,如Ga_(2)O_(3)功率二极管、Ga_(2)O_(3)功率FET、Ga_(2)O_(3)紫外光电器件的最新进展。其中包括Ga_(2)O_(3)功率二极管在肖特基势垒二极管(SBD)、异质结二极管和MOS二极管方面的结构设计创新、工艺创新和可靠性;也包括Ga_(2)O_(3)功率FET在MESFET、MOSFET、异质结FET、无极FET和立体晶体管等方向的器件结构设计创新、工艺创新和可靠性;此外,还包括Ga_(2)O_(3)紫外光电器件在光电晶体管、薄膜光电导体、光电二极管、金属-半导体-金属(MSM)光电探测器和异质结构光电探测器等方向的器件结构设计创新、工艺和机理的创新。分析和评价了Ga_(2)O_(3)在电力电子和紫外光电器件两个领域从科研向工程化的发展态势。 展开更多
关键词 超宽禁带半导体 Ga_(2)O_(3) 功率二极管 功率FET 紫外光电器件
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Supercritical CO_(2)-FET’s game changer for the biomedical market
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《China Textile》 2025年第3期56-57,共2页
A much more sustainable,cost effective and very flexible process for manufacturing critical fibres based on ultra high molecular weight polyethylene(UHMWPE)is being launched by the UK’s Fibre Extrusion Technologies(F... A much more sustainable,cost effective and very flexible process for manufacturing critical fibres based on ultra high molecular weight polyethylene(UHMWPE)is being launched by the UK’s Fibre Extrusion Technologies(FET). 展开更多
关键词 cost effective sustainable manufacturing critical fibres flexible process fibre extrusion technologies fet FET biomedical market supercritical co
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Catalytic effect of nano-thick gold electrodes on p-doping of diselenides during annealing process
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作者 Yan Wang Yang Sun Jing Liu 《Nanotechnology and Precision Engineering》 2025年第3期66-73,共8页
Two-dimensional transition metal dichalcogenides(TMDs)show great promise for developing the next generation of electronic and optoelectronic devices.However,most TMDs have n-type or n-dominant bipolar characteristics,... Two-dimensional transition metal dichalcogenides(TMDs)show great promise for developing the next generation of electronic and optoelectronic devices.However,most TMDs have n-type or n-dominant bipolar characteristics,and this severely limits their potential for being designed as multi-functional heterostructures.Recently,thermal annealing has been reported as an easy means of p-doping TMDs,but the mechanism remains ambiguous,thereby preventing reliable outcomes and it becoming a mature doping technology for TMDs.Here,the mechanism of thermal annealing for p-doping a 2D selenide is investigated thoroughly,revealing the key role of the catalytic effect of nano-thick gold electrodes in achieving p-doping.As an example,2D SnSe_(2)with a fairly high electron density of∼10^(18)cm^(−3)is used,and its electrical performance is greatly enhanced after thermal annealing when 30-nm-thick gold electrodes are deposited.The results of performing XPS and Auger electron spectroscopy on samples before and after annealing show that the p-doping effect is due to the oxidation of selenide atoms,during which the gold acts as a critical catalytic element.This method is also shown to be valid for other 2D selenides including WSe_(2)and MoSe_(2),and the present findings offer new avenues for enriching the electrical properties of 2D selenides by means of annealing. 展开更多
关键词 DISELENIDE Annealing Field-effect transistor(FET) P-DOPING Nano-thick gold Catalytic
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Oxygen-assisted recoverable hydrogen sensor based on sensing gate field effect transistor with ppb-level detection ability
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作者 Yi-Xi Wang Bin Liu +1 位作者 Bo-Hao Liu Yong Zhang 《Rare Metals》 2025年第2期1160-1169,共10页
The rise in gas leakage incidents underscores the urgent need for advanced gas-sensing platforms with ultra-low concentration detection capability.Sensing gate field effect transistor(FET)gas sensors,renowned for the ... The rise in gas leakage incidents underscores the urgent need for advanced gas-sensing platforms with ultra-low concentration detection capability.Sensing gate field effect transistor(FET)gas sensors,renowned for the gas-induced signal amplification without directly exposing the channel to the ambient environment,play a pivotal role in detecting trace-level hazardous gases with high sensitivity and good stability.In this work,carbon nanotubes are employed as the conducting channel,and yttrium oxide(Y_(2)O_(3))is utilized as the gate dielectric layer.Noble metal Pd is incorporated as a sensing gate for hydrogen(H_(2))detection,leveraging its catalytic properties and unique adsorption capability.The fabricated carbon-based FET gas sensor demonstrates a remarkable detection limit of 20×10^(–9) for H_(2) under an air environment,enabling early warning in case of gas leakage.Moreover,the as-prepared sensor exhibited good selectivity,repeatability,and anti-humidity properties.Further experiments elucidate the interaction between H_(2) and sensing electrode under an air/nitrogen environment,providing insights into the underlying oxygen-assisted recoverable sensing mechanism.It is our aspiration for this research to establish a robust experimental foundation for achieving high performance and highly integrated fabrication of trace gas sensors. 展开更多
关键词 Carbon-based FET Sensing gate Hydrogen sensor Ppb-level Sensing mechanism
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Study of Environmental and Geochemical Effects on The Distribution and Transformations of Iron Oxides in Some Soils
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作者 Rafaa Haider Azizi Al-Mahanna Luma Abdalalah Sagban Alabadi 《Journal of Environmental & Earth Sciences》 2025年第2期129-137,共9页
This study was conducted to determine the content,distribution and transformation of iron oxides in the soils of the Middle Euphrates regions in Iraq.The study included four sites:Tuwairij area in Karbala Governorate,... This study was conducted to determine the content,distribution and transformation of iron oxides in the soils of the Middle Euphrates regions in Iraq.The study included four sites:Tuwairij area in Karbala Governorate,College of Agriculture at the University of Kufa in Najaf Governorate,College of Agriculture at the University of Qadisiyah in Diwaniyah Governorate,and the Nile District in Babylon Governorate.The results showed that the soils of Najaf and Qadisiyah were superior in terms of their content of total free iron oxides(Fet)compared to the soils of Karbala and Babylon.The relative distribution of free iron oxides was generally close among the studied sites,with a homogeneous pattern in the distribution of these oxides within the soil horizons.As for silicate iron oxides(Fes),a homogeneous pattern was observed in the soil of Babylon with its content increasing with depth,while these patterns varied in the soils of Karbala,Najaf and Qadisiyah.Regarding the ratios of crystalline iron oxides(Fed/Fet),the study showed that the Babylon and Qadisiyah soils recorded the highest values,while these values were lower in the Najaf and Karbala soils.On the other hand,amorphous iron oxides(FeO)showed similar values in the Najaf and Qadisiyah soils.In general,these results clearly showed the effect of environmental and geochemical factors of the study areas on the distribution and transformations of iron oxides in the soil of the Middle Euphrates regions. 展开更多
关键词 Fed/Fet FEO CRYSTALLINE Iron Compounds Active Iron Ratio
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双核素FDG和FET正电子发射断层扫描诊断胶质瘤的临床价值
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作者 任宇涛 孟强 +2 位作者 刘永 李焕发 张华 《立体定向和功能性神经外科杂志》 2025年第5期257-262,共6页
目的分析双核素2-[^(18)F]-氟-2-脱氧-D-葡萄糖(^(18)F-FDG)和O-(2-[^(18)F]-氟乙基)-L-酪氨酸(^(18)F-FET)正电子发射断层扫描在胶质瘤中的临床价值。方法本研究纳入2023年7月至2024年9月病理诊断胶质瘤的患者。术前进行^(18)F-FDG和^(... 目的分析双核素2-[^(18)F]-氟-2-脱氧-D-葡萄糖(^(18)F-FDG)和O-(2-[^(18)F]-氟乙基)-L-酪氨酸(^(18)F-FET)正电子发射断层扫描在胶质瘤中的临床价值。方法本研究纳入2023年7月至2024年9月病理诊断胶质瘤的患者。术前进行^(18)F-FDG和^(18)F-FET正电子发射断层扫描。双核素标准化摄取值(standardized uptake value,SUV)参数包括平均值(SUVmean)、最大值(SUVmax)和最小值(SUVmin)。根据摄取值,摄取模式分为两种类型:阳性摄取,SUVmean大于正常脑组织;阴性摄取,SUVmean不高于正常脑组织。通过Pearson相关性分析FET和FDG的SUV与肿瘤增殖标志物Ki-67及P53蛋白表达之间的相关性。结果18例病理诊断为胶质瘤患者术前进行双核素FDG和FET检查。所有胶质瘤均表现出FET阳性摄取。双核素摄取模式:FET阳性摄取/FDG阳性摄取(12例,66.7%),FET阳性摄取/FDG阴性摄取(6例,33.3%)。3例(16.7%)双核素诊断与病理结果完全一致,15例(83.3%)不完全一致。双核素SUV与Ki-67和P53蛋白表达无相关性(P>0.05)。结论双核素正电子发射断层扫描在胶质瘤辅助诊断中具有重要临床应用价值。FDG和FET双阳性摄取是最常见的摄取模式。相较于单一FDG检查,双核素FDG和FET的摄取模式为胶质瘤诊断提供了更多的线索。 展开更多
关键词 双核素 正电子发射断层扫描 FDG FET 标准化摄取值 胶质瘤
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