期刊文献+
共找到3篇文章
< 1 >
每页显示 20 50 100
DETERMINATION OF TOTAL EL2 AND NET ACCEPTOR CONCENTRATION IN UNDOPED SI GaAs BY MULTI-WAVELENGTH INFRARED ABSORPTION METHOD
1
作者 杨瑞霞 李光平 《Journal of Electronics(China)》 1995年第1期58-65,共8页
Total EL2 concentration distribution and net acceptor concentration distribution in uncloped semi-insulating(SI) LEC GaAs have been measured by multi-wavelength infrared absorption method. The experimental results ind... Total EL2 concentration distribution and net acceptor concentration distribution in uncloped semi-insulating(SI) LEC GaAs have been measured by multi-wavelength infrared absorption method. The experimental results indicate that total EL2 concentration radial distribution is W-shaped and net acceptor concentration radial distribution is sample-dependent, it can present a n shape, a A shape, or a W shape corresponding to different samples. 展开更多
关键词 el2 ACCEPTOR GAAS infrared absorption Distribution
在线阅读 下载PDF
Spatial Distribution of EL2 Defect in Semi-insulating GaAs
2
作者 汝琼娜 李光平 何秀坤 《Rare Metals》 SCIE EI CAS CSCD 1994年第4期296-298,共3页
It has advantages of accuracy, rapidity and non-destruction that EL2 distribution in semi-insulating LECGaAs crystal has been measured by near infrared absorption method with a high spatial resolution. Now EL2defect e... It has advantages of accuracy, rapidity and non-destruction that EL2 distribution in semi-insulating LECGaAs crystal has been measured by near infrared absorption method with a high spatial resolution. Now EL2defect existed in all wafer is directly observed by 1 .0972 μm and 2 μm absorption curves obtained from a suc-cessive and automatical horizontal scan across the different bands parallelly ranged with tbe diameter of asemi-insulating GaAs wafer. Not only EL2 distribution across the wafer corresponding with that of dislocationdensities has been indicated but also the fine structure found. 展开更多
关键词 el2defect si-gaas infrared absorption
在线阅读 下载PDF
Correlation between the Concentrations of  Ionized EL2 and Carbon Acceptor in Undoped Semi-insulating LEC GaAs
3
作者 杨瑞霞 李光平 《Rare Metals》 SCIE EI CAS CSCD 1994年第2期113-117,共5页
Undoped semi-insulating (SI) LEC GaAs samples were investigated. The concentrations of ionized EL2and carbon acceptor were measured by multiple wavelength infrared absorption and local vibrational modeinfrared absorpt... Undoped semi-insulating (SI) LEC GaAs samples were investigated. The concentrations of ionized EL2and carbon acceptor were measured by multiple wavelength infrared absorption and local vibrational modeinfrared absorption methods. The results indicate that for the same sample the ionized EL2 concentration([EL2 ̄+]) is higher than the carbon acceptor concentration ([C]). The value of [EL2 ̄+]-[C] is of the order ofmagnitude of 10 ̄(15) cm ̄(-3), which means that acceptors other than carbon exist with a concentration of10 ̄(15) cm ̄(-3) in the samples. This is in conflict with the conventional 3-level compensation model. The radialdistribution of [EL2 ̄+] was investigated. The radial distribution of carbon acceptor does not present any regu-larity. 展开更多
关键词 infrared absorption el2 Carbon acceptor si-gaas
在线阅读 下载PDF
上一页 1 下一页 到第
使用帮助 返回顶部