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A Novel Method for Determining the Void Fraction in Gas-Liquid Multi-Phase Systems Using a Dynamic Conductivity Probe
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作者 Xiaochu Luo Xiaobing Qi +3 位作者 Zhao Luo Zhonghao Li Ruiquan Liao Xingkai Zhang 《Fluid Dynamics & Materials Processing》 EI 2024年第6期1233-1249,共17页
Conventional conductivity methods for measuring the void fraction in gas-liquid multiphase systems are typically affected by accuracy problems due to the presence of fluid flow and salinity.This study presents a novel... Conventional conductivity methods for measuring the void fraction in gas-liquid multiphase systems are typically affected by accuracy problems due to the presence of fluid flow and salinity.This study presents a novel approach for determining the void fraction based on a reciprocating dynamic conductivity probe used to measure the liquid film thickness under forced annular-flow conditions.The measurement system comprises a cyclone,a conductivity probe,a probe reciprocating device,and a data acquisition and processing system.This method ensures that the flow pattern is adjusted to a forced annular flow,thereby minimizing the influence of complex and variable gas-liquid flow patterns on the measurement results;Moreover,it determines the liquid film thickness solely according to circuit connectivity rather than specific conductivity values,thereby mitigating the impact of salinity.The reliability of the measurement system is demonstrated through laboratory experiments.The experimental results indicate that,in a range of gas phase superficial velocities 5–20 m/s and liquid phase superficial velocities 0.079–0.48 m/s,the maximum measurement deviation for the void fraction is 4.23%. 展开更多
关键词 Forced annular flow dynamic conductivity probe void fraction gas-liquid flow liquid film thickness
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Probing Ultrafast Dissociation Dynamics of Chloroiodomethane in the B Band by Time-Resolved Mass Spectrometry 被引量:1
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作者 刘玉柱 龙金友 +2 位作者 徐林华 张翔云 张冰 《Chinese Physics Letters》 SCIE CAS CSCD 2017年第3期21-24,共4页
Ultrafast dissociation dynamics of chloroiodomethane (CH2ICl) in the B band is studied by femtosecond time- resolved time-of-flight (TOF) mass spectrometry. Time-resolved TOF mass signal of parent ion (CH2ICl+)... Ultrafast dissociation dynamics of chloroiodomethane (CH2ICl) in the B band is studied by femtosecond time- resolved time-of-flight (TOF) mass spectrometry. Time-resolved TOF mass signal of parent ion (CH2ICl+) and main daughter ion (CH2Cl+) are obtained. The curve for the transient signal of CH2ICl+ is simple and can be well fitted by an exponential decay convoluted with a Gaussian function. The decay constant determined to be less than 35 fs reflects the lifetime of the B band. Significant substituent effects on photodissociation dynamics of CH2IC1 compared with CH3I are discussed. The dissociation time from the parent ion CH2IC1+ to the daughter ion CH2Cl+ is determined in the experiment. The optimized geometry of the ionic state of CH2ICl and the ionization energy are calculated for further analysis of the measurements. In addition, compared with the parent ion, a new decay component with time constant of -596 fs is observed for CH2Cl+, and reasonable mechanisms are proposed for the explanation. 展开更多
关键词 Probing Ultrafast Dissociation dynamics of Chloroiodomethane in the B Band by Time-Resolved Mass Spectrometry ICI
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Probing of Ultrafast Plasmon Dynamics on Gold Bowtie Nanostructure Using Photoemission Electron Microscopy
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作者 秦将 季博宇 +1 位作者 郝作强 林景全 《Chinese Physics Letters》 SCIE CAS CSCD 2015年第6期61-65,共5页
We report the direct imaging of plasmon on the tips pulses and probing of ultrafast plasmon dynamics by of nano-prisms in a bowtie structure excited by 7 fs laser combining the pump-probe technology with three-photon ... We report the direct imaging of plasmon on the tips pulses and probing of ultrafast plasmon dynamics by of nano-prisms in a bowtie structure excited by 7 fs laser combining the pump-probe technology with three-photon photoemission electron microscopy. Different photoemission patterns induced by the plasmon effect are observed when the bowties are excited by s- and p-polarized femtosecond laser pulses. A series of images of the evolution of local surface plasmon modes on different tips of the bowtie are obtained by the time-resolved three-photon photoemission electron microscopy, and the result discloses that plasmon excitation is dominated by the interfer- ence of the pump and probe pulses within the first 13 fs of the delay time, and thereafter the individual plasmon starts to oscillate on its own characteristic resonant frequencies. 展开更多
关键词 Probing of Ultrafast Plasmon dynamics on Gold Bowtie Nanostructure Using Photoemission Electron Microscopy LSP
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Gravitational Wave Background from Extreme-Mass-Ratio Inspirals
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作者 Haoyu Zhao Yuanhao Zhang +1 位作者 Xilong Fan Wenbiao Han 《Chinese Physics Letters》 2025年第5期239-247,共9页
The gravitational wave background(GWB) produced by extreme-mass-ratio inspirals(EMRIs) serves as a powerful tool for probing the astrophysical and dynamical processes in galactic centers. EMRI systems are a primary ta... The gravitational wave background(GWB) produced by extreme-mass-ratio inspirals(EMRIs) serves as a powerful tool for probing the astrophysical and dynamical processes in galactic centers. EMRI systems are a primary target for the space-based detector laser interferometer space antenna due to their long-lived signals and high signal-to-noise ratios. This study explores the statistical properties of the GWB from EMRI, focusing on the calculation methods for the GWB, the astrophysical distribution of EMRI sources, and the influence of key parameters, including the spin of supermassive black holes(SMBHs) and the masses of compact objects(COs). By analyzing these factors, we determine the distribution range of the characteristic strain of the GWB from EMRIs. We find that the final eccentricity distributions appear to have negligible effect on the intensity of the GWB due to rapid circularization before they become detectable and the spin of the SMBH enhances the gravitational wave characteristic strain by approximately 1% compared to cases without spin effects. The masses of COs can also significantly affect the characteristic strain of the GWB from EMRIs, with black hole as CO producing a gravitational wave signal intensity that is approximately one order of magnitude higher compared to cases where neutron star or white dwarf are the COs. 展开更多
关键词 probing astrophysical dynamical processes galactic centers astrophysical distribution extreme mass ratio inspirals laser interferometer space antenna gravitational wave background calculation methods characteristic strain Laser Interferometer Space Antenna
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Proposals of SPT-CPT and DPL-CPT correlations for sandy soils in Brazil 被引量:1
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作者 Mirella Dalvi dos Santos Kátia Vanessa Bicalho 《Journal of Rock Mechanics and Geotechnical Engineering》 SCIE CSCD 2017年第6期1152-1158,共7页
Field tests in geotechnical engineering are fundamental for identification of the underground conditions.The standard penetration test(SPT) is the most commonly used geotechnical approach. There has been an increase b... Field tests in geotechnical engineering are fundamental for identification of the underground conditions.The standard penetration test(SPT) is the most commonly used geotechnical approach. There has been an increase both in the use and application of the in situ tests: cone penetration test(CPT) and dynamic probing(DP). Several empirical SPT-CPT and dynamic probing light(DPL)-CPT correlations for sandy soils have been discussed in the literature. New SPT-CPT and DPL-CPT correlations for the sandy soils of the city of Vitoria, in the southeast of Brazil, are suggested in this paper. Statistical analyses to evaluate the quality of the data used are performed, and the suggested correlations are validated with several previous published datasets. The paper also provides some insights into SPT-CPT correlations and soil characteristics(i.e. the mean particle size and the fines fraction of the soil). 展开更多
关键词 Standard penetration test(SPT) Cone penetration test(CPT) dynamic probing light(DPL) CORRELATIONS SANDS Statistical evaluations
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NUMERICAL IMPLEMENTATION FOR A 2-D THERMAL INHOMOGENEITY THROUGH THE DYNAMICAL PROBE METHOD
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作者 Lei Yi Kyoungsun Kim Gen Nakamura 《Journal of Computational Mathematics》 SCIE CSCD 2010年第1期87-104,共18页
In this paper, we present the theory and numerical implementation for a 2-D thermal inhomogeneity through the dynamical probe method. The main idea of the dynamical probe method is to construct an indicator function a... In this paper, we present the theory and numerical implementation for a 2-D thermal inhomogeneity through the dynamical probe method. The main idea of the dynamical probe method is to construct an indicator function associated with some probe such that when the probe touch the boundary of the inclusion the indicator function will blow up. From this property, we can get the shape of the inclusion. We will give the numerical reconstruction algorithm to identify the inclusion from the simulated Neumann-to-Dirichlet map. 展开更多
关键词 Heat equation dynamical probe method Neumann-to-Dirichlet map.
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Non-contact and nanometer-scale measurement of PN junction depth buried in Si wafers using terahertz emission spectroscopy
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作者 Fumikazu Murakami Shinji Ueyama +8 位作者 Kenji Suzuki Ingi Kim Inkeun Baek Sangwoo Bae Dougyong Sung Myungjun Lee Sungyoon Ryu Yusin Yang Masayoshi Tonouchi 《Light: Science & Applications》 2025年第8期2279-2288,共10页
Buried channel array transistors enable fast and high-density integrated devices.The depth of the PN junction and carrier dynamics at the depletion layer in silicon wafers have a crucial influence on their performance... Buried channel array transistors enable fast and high-density integrated devices.The depth of the PN junction and carrier dynamics at the depletion layer in silicon wafers have a crucial influence on their performance and reliability.Therefore,rapid and non-contact/non-destructive inspection tools are necessary to accelerate the semiconductor industry.Despite the great efforts in this field,realizing a technique to probe the junction depth and carrier dynamics at the PN junction inside wafers remains challenging.Herein,we propose a new approach to access PN junctions embedded in wafers using terahertz(THz)emission spectroscopy.THz emission measurements and simulations demonstrate that the amplitude and polarity of THz emissions reflect the junction depth and carrier dynamics at the PN junctions.It allows us to evaluate the junction depth non-destructively with nanometer-scale accuracy,surpassing the limits of traditional techniques.Laser-induced THz emission spectroscopy is a promising method for the sensitive and non-contact/non-destructive evaluation of Si wafers and will benefit the modern semiconductor industry. 展开更多
关键词 terahertz emission spectroscopy integrated devicesthe buried channel array transistors depletion layer pn junction silicon wafers depth measurement probe junction depth carrier dynamics
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