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Programming Logic Modeling and Cross-Program Defect Detection Method for Object-Oriented Code
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作者 Yan Liu Wenyuan Fang +2 位作者 Qiang Wei Yuan Zhao Liang Wang 《Computers, Materials & Continua》 SCIE EI 2020年第7期273-295,共23页
Code defects can lead to software vulnerability and even produce vulnerability risks.Existing research shows that the code detection technology with text analysis can judge whether object-oriented code files are defec... Code defects can lead to software vulnerability and even produce vulnerability risks.Existing research shows that the code detection technology with text analysis can judge whether object-oriented code files are defective to some extent.However,these detection techniques are mainly based on text features and have weak detection capabilities across programs.Compared with the uncertainty of the code and text caused by the developer’s personalization,the programming language has a stricter logical specification,which reflects the rules and requirements of the language itself and the developer’s potential way of thinking.This article replaces text analysis with programming logic modeling,breaks through the limitation of code text analysis solely relying on the probability of sentence/word occurrence in the code,and proposes an object-oriented language programming logic construction method based on method constraint relationships,selecting features through hypothesis testing ideas,and construct support vector machine classifier to detect class files with defects and reduce the impact of personalized programming on detection methods.In the experiment,some representative Android applications were selected to test and compare the proposed methods.In terms of the accuracy of code defect detection,through cross validation,the proposed method and the existing leading methods all reach an average of more than 90%.In the aspect of cross program detection,the method proposed in this paper is superior to the other two leading methods in accuracy,recall and F1 value. 展开更多
关键词 Method constraint relationship programming logic code defect hypothesis test
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Elimination of Zig-zag Defects in Surface-stabilized Ferroelectric Liquid Crystal Cells
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作者 WANGBin GANChun-Hui 《Semiconductor Photonics and Technology》 CAS 1999年第2期125-128,F003-F004,共6页
The elimination of zig-zag defects in polyimide-coated surface-stabilized ferroelectric liquid crystal(SSFLC) cells is carried out by applying a low-frequency electric field. It has been achieved when the thickness of... The elimination of zig-zag defects in polyimide-coated surface-stabilized ferroelectric liquid crystal(SSFLC) cells is carried out by applying a low-frequency electric field. It has been achieved when the thickness of SSFLC cell is 3 μm. The optical spectral transmittance measurement confirmed that there is no change of layer structure, and the memory capability was not improved. The different effects of low-frequency electric field applied on the different thickness FLC cells have been observed, and experimental results were presented. 展开更多
关键词 Liquid Crystal Display SSFLC Zig-zag defects CLC number:TN304.9 Document code:A
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