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An Approach to Concurrent TTCN Test Generation
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作者 毕军 吴建平 《Journal of Computer Science & Technology》 SCIE EI CSCD 1999年第6期614-618,共5页
The basis of distributed system conformance testing is to test theconformance of each entity with its standard. This paper addresses the approach toentity conformance testing based on concurrent TTCN. First a prelimin... The basis of distributed system conformance testing is to test theconformance of each entity with its standard. This paper addresses the approach toentity conformance testing based on concurrent TTCN. First a preliminary framework for entity conformance testing is introduced and a specification model CEBEis presented. Then a test generation method, which could directly derive concurrentTTCN test suite from CEBE, is proposed. 展开更多
关键词 conformance testing distributed system cebe concurrent TTCN
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