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Methods for behavior descriptions of structure-complex Petri nets
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作者 QingtianZENG ZhehuiWU 《控制理论与应用(英文版)》 EI 2004年第1期93-98,共6页
Petri net language is a powerful tool for describing dynamic behaviors of physical systems. However, it is not easy to obtain the language expression for a given Petri net especially a structure-complex net. In this p... Petri net language is a powerful tool for describing dynamic behaviors of physical systems. However, it is not easy to obtain the language expression for a given Petri net especially a structure-complex net. In this paper, we first analyze the behaviors of S-nets, which are structure-simple. With the decomposition method based on a given index function on the place set, a given structure-complex Petri net can be decomposed into a set of structure-simple S-nets. With the language relationships between the original system and the decomposed subnets, an algorithm to obtain the language expression of a given structure-complex net system is presented, which benefits the analysis of physical systems based on the Petri net language. 展开更多
关键词 Petri net S-net DECOMPOSITION Index of places Petri net language behavior description Synchronous intersection of languages
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IC Testing by Phase Classification Based on Behavioral Description of RTL 被引量:1
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作者 Huawei Li Yinghua Min Zhongcheng Li 《湖南大学学报(自然科学版)》 EI CAS CSCD 2000年第S2期104-106,共3页
The growing complexity of integrated circuits (ICs) is driving the trend of IC testing towards testing based on behavioral descriptions of register-transfer level (RTL). A behavioral description contains an algorithmi... The growing complexity of integrated circuits (ICs) is driving the trend of IC testing towards testing based on behavioral descriptions of register-transfer level (RTL). A behavioral description contains an algorithmic specification of functionality of design. It may contain little or even no information about the design’s cycle-by-cycle behavior or structural implementation. However, it usually has an interior variable to lead the process of its functional phases. This interior variable is named phase variable. The functional behavior of a digital circuit changes according to different values of a phase variable. By analyzing some ITC99 benchmark circuits, this paper presents a way to generate tests for a circuit by tracing the value change of a phase variable in the circuit. 展开更多
关键词 behavioral description register-transfer level functional phase test generation
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Clustering of behavioral phases in FSMs and its applications to VLSI test 被引量:2
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作者 李华伟 闵应骅 李忠诚 《Science in China(Series F)》 2002年第6期462-478,共17页
This paper presents a new level of description between behavioral and state descriptions of a finite-state machine (FSM). The description is termed behavioral phase clustering description. New concepts of behavioral p... This paper presents a new level of description between behavioral and state descriptions of a finite-state machine (FSM). The description is termed behavioral phase clustering description. New concepts of behavioral phase and clustering of behavioral phases in an FSM are introduced. The new description simplifies functional analysis, verification and test of FSM designs. If an FSM is described at low level, some states can be clustered into behavioral phases directly. If it is described at behavioral level, behavioral phases can be extracted from the behavioral description, and clustering of behavioral phases can be performed through easy functional analysis. As one application of behavioral phase clustering descriptions, a new technique employed in a test generation system, ATCLUB, at Register Transfer (RT)-level based on a behavioral phase transition fault model is introduced in this paper. In ATCLUB, test generation process is accelerated through clustering of behavioral phases. Experimental results show that ATCLUB generates test sequence efficiently, with a sharp decrease in vector count at the penalty of a slightly decrease in fault coverage comparing to other ATPC tools. 展开更多
关键词 finite-state machines clustering of states behavioral descriptions test generation.
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