The microstructural evolution and inteffacial reaction of the Au/Sn/Au/Sn/Au/Sn/Au couples were investigated during annealing at 453, 523, and 543 K for up to 240 h. The Au/Sn combination formed a rapid diffusion syst...The microstructural evolution and inteffacial reaction of the Au/Sn/Au/Sn/Au/Sn/Au couples were investigated during annealing at 453, 523, and 543 K for up to 240 h. The Au/Sn combination formed a rapid diffusion system. Even in rolled Au-Sn solder, three phases, such as AuSn, AuSn2, and AuSn4, were formed. After initial annealing at 453 K, the diffusion layers of AuSn, AuSn2, and AuSn4, which were formed after rolling, expanded gradually and then fully transformed into phase （containing Sn from 10% to 18.5%, mole fraction） and 6 （AuSn） phase. As a whole, the microstmcture of the couple was stable during annealing at 453 K. The solid-state interracial reaction was much faster at 523 K than at 453 K. After annealing at 523 K for 6 h, the AuSn, AuSn2, and AuSn4 were fully transformed into the phase and phase （AuSn）. In spite of the prolonged annealing time for up to 240 h, no significant change of the interfacial microstructure occurred, and the microstructure of the couple was stable during annealing at 523 K. When annealing at 543 K, however, the interfacial of Au/Sn was transformed into solid-liquid state, and the whole couple formed a eutecfic structure rapidly, causing the solder to be brittle. The study results clearly demonstrate that the service temperature of the Au-Sn solder should be lower than 543 K.展开更多
The growth of Au-Sn intermetallic compounds(IMCs) is a major concern to the reliability of solder joints in microelectronic,optoelectronic and micro-electronic-mechanical system(MEMS) which has a layer of Au metalliza...The growth of Au-Sn intermetallic compounds(IMCs) is a major concern to the reliability of solder joints in microelectronic,optoelectronic and micro-electronic-mechanical system(MEMS) which has a layer of Au metallization on the surface of components or leads.This paper presented the growth behavior of Au-Sn IMCs at interfaces of Au metallization and Sn-based solder joints with the addition of Cu alloying element during aging process,and growth coefficients of the Au-Sn IMCs were calculated.Results on the interfacial reaction between Sn-xCu solders and Au metallization during aging process show that three layers of Au-Sn IMCs including AuSn,AuSn2 and AuSn4 formed at the interface region.The thickness of each Au-Sn IMC layer vs square root of aging time follows linear relationship.Calculation of the IMC growth coefficients shows that the diffusion coefficients decrease with the addition Cu elements,which indicates that Cu addition suppresses the growth of Au-Sn IMCs layer.展开更多
文摘The microstructural evolution and inteffacial reaction of the Au/Sn/Au/Sn/Au/Sn/Au couples were investigated during annealing at 453, 523, and 543 K for up to 240 h. The Au/Sn combination formed a rapid diffusion system. Even in rolled Au-Sn solder, three phases, such as AuSn, AuSn2, and AuSn4, were formed. After initial annealing at 453 K, the diffusion layers of AuSn, AuSn2, and AuSn4, which were formed after rolling, expanded gradually and then fully transformed into phase （containing Sn from 10% to 18.5%, mole fraction） and 6 （AuSn） phase. As a whole, the microstmcture of the couple was stable during annealing at 453 K. The solid-state interracial reaction was much faster at 523 K than at 453 K. After annealing at 523 K for 6 h, the AuSn, AuSn2, and AuSn4 were fully transformed into the phase and phase （AuSn）. In spite of the prolonged annealing time for up to 240 h, no significant change of the interfacial microstructure occurred, and the microstructure of the couple was stable during annealing at 523 K. When annealing at 543 K, however, the interfacial of Au/Sn was transformed into solid-liquid state, and the whole couple formed a eutecfic structure rapidly, causing the solder to be brittle. The study results clearly demonstrate that the service temperature of the Au-Sn solder should be lower than 543 K.
基金This work was financially supported by the National Natural Science Foundation of China ( No 50675047/ E052105)Joint Project between Samsung Electronics Co Ltd( Korea) and Harbin Institute of Technology( HIT)
文摘The growth of Au-Sn intermetallic compounds(IMCs) is a major concern to the reliability of solder joints in microelectronic,optoelectronic and micro-electronic-mechanical system(MEMS) which has a layer of Au metallization on the surface of components or leads.This paper presented the growth behavior of Au-Sn IMCs at interfaces of Au metallization and Sn-based solder joints with the addition of Cu alloying element during aging process,and growth coefficients of the Au-Sn IMCs were calculated.Results on the interfacial reaction between Sn-xCu solders and Au metallization during aging process show that three layers of Au-Sn IMCs including AuSn,AuSn2 and AuSn4 formed at the interface region.The thickness of each Au-Sn IMC layer vs square root of aging time follows linear relationship.Calculation of the IMC growth coefficients shows that the diffusion coefficients decrease with the addition Cu elements,which indicates that Cu addition suppresses the growth of Au-Sn IMCs layer.
