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Impact and Residual Flexural Properties of 3D Integrated Woven Spacer Composites
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作者 Mahim Masfikun Hannan Deng’an Cai Xinwei Wang 《Journal of Polymer Materials》 2025年第3期873-891,共19页
This study investigates the low-velocity impact and post-impact flexural properties of 3D integrated woven spacer composites,focusing on their orthotropic behavior when tested along two principal directions,i.e.,warp(... This study investigates the low-velocity impact and post-impact flexural properties of 3D integrated woven spacer composites,focusing on their orthotropic behavior when tested along two principal directions,i.e.,warp(X-type)and weft(Y-type)directions.The same composite material was tested in these orientations to evaluate the differences in impact resistance and residual bending strength.Specimens were fabricated via vacuum-assisted molding and tested at 2,3,5,and 7 J impact energies using an Instron Ceast 9350 drop-weight impact testing machine,in accordance with ASTM D7136.Post-impact flexural tests were performed using a four-point bending method in accordance with ASTM D7264.The absorbed energy increased from 1.97 to 6.98 J,and the panel damage area ranged from 121 to 361 mm^(2) as impact energy roses.Specimens tested in the weft direction(Y-type)showed greater residual strength(up to 15.83 N)and displacement(up to 0.538 mm)than those tested in the warp direction(X-type).Ultrasonic C-scan imaging revealed localized matrix cracking and fiber failure damage patterns.Results emphasize the directional differences in impact resistance and residual bending properties,highlighting the importance of material orientation in structural applications.This study provides a foundation for utilizing 3D woven spacer composites in lightweight,damage-tolerant structural components. 展开更多
关键词 3d integrated woven spacer composites low-velocity impact post-impact flexural properties impact resistance
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Flexible Monolithic 3D-Integrated Self-Powered Tactile Sensing Array Based on Holey MXene Paste
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作者 Mengjie Wang Chen Chen +9 位作者 Yuhang Zhang Yanan Ma Li Xu Dan‑Dan Wu Bowen Gao Aoyun Song Li Wen Yongfa Cheng Siliang Wang Yang Yue 《Nano-Micro Letters》 2026年第2期772-785,共14页
Flexible electronics face critical challenges in achieving monolithic three-dimensional(3D)integration,including material compatibility,structural stability,and scalable fabrication methods.Inspired by the tactile sen... Flexible electronics face critical challenges in achieving monolithic three-dimensional(3D)integration,including material compatibility,structural stability,and scalable fabrication methods.Inspired by the tactile sensing mechanism of the human skin,we have developed a flexible monolithic 3D-integrated tactile sensing system based on a holey MXene paste,where each vertical one-body unit simultaneously functions as a microsupercapacitor and pressure sensor.The in-plane mesopores of MXene significantly improve ion accessibility,mitigate the self-stacking of nanosheets,and allow the holey MXene to multifunctionally act as a sensing material,an active electrode,and a conductive interconnect,thus drastically reducing the interface mismatch and enhancing the mechanical robustness.Furthermore,we fabricate a large-scale device using a blade-coating and stamping method,which demonstrates excellent mechanical flexibility,low-power consumption,rapid response,and stable long-term operation.As a proof-of-concept application,we integrate our sensing array into a smart access control system,leveraging deep learning to accurately identify users based on their unique pressing behaviors.This study provides a promising approach for designing highly integrated,intelligent,and flexible electronic systems for advanced human-computer interactions and personalized electronics. 展开更多
关键词 Holey MXene Microsupercapacitor Tactile sensor Monolithic 3d integration Deep learning algorithm
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Development of a viable 3D integrated circuit technology
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作者 陈文新 高秉强 《Science in China(Series F)》 2001年第4期241-248,共8页
Three-dimensional integrated circuit technology with transistors stacked on top of one an-other in multi-layer silicon film has always been a vision in the future technology direction. While the idea is simple, the te... Three-dimensional integrated circuit technology with transistors stacked on top of one an-other in multi-layer silicon film has always been a vision in the future technology direction. While the idea is simple, the technique to obtain high performance multi-layer transistors is extraordinarily diffi-cult. Not until recently does such technology become feasible. In this paper, the background and vari-ous techniques to form three-dimensional circuits will be reviewed. Recent development of a simple and promising technology to achieve three-dimensional integration using Metal-Induced-Lateral-Crystalliza-tion will be described. Preliminary results of 3D inverters will also be provided to demonstrate the viabil-ity for 3D integration. 展开更多
关键词 3d integrated circuit technology TRANSISTOR silicon film.
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Collaborative Design in PDM / 3D CAD Integrated Environment 被引量:3
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作者 CHEN Zhuoning ZHANG Fen YAN Xiaoguang BIN Hongzan 《Wuhan University Journal of Natural Sciences》 EI CAS 2006年第3期642-648,共7页
Some key issues in supporting collaborative design in product data management(PDM ) system and 3D computer aided design(CAD) system integrated environment are analyzed. The general architecture of the integrated e... Some key issues in supporting collaborative design in product data management(PDM ) system and 3D computer aided design(CAD) system integrated environment are analyzed. The general architecture of the integrated environment is divided into five tiers and employs the transparently integrated mode, with the mode, function calling and information exchanging among independent PDM and CAD processes are carried out via message translation /parse approach. Product layout feature(PLF ) model definition is presented, PLF model is used to represent design intention at the preliminary design phase. The collaborative design methodology employing the PLF model in PDM/3D CAD integrated environment is analyzed. The design methodology can speed up the design process, reduce the investment and improve the product quality. 展开更多
关键词 PDM/3d CAD integrated product layout feature collaborative design transparently integrated mode
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Synergistic Coupling of Sulfide Electrolyte and Integrated 3D FeS_(2)Electrode Toward Long-Cycling All-Solid-State Lithium Batteries 被引量:1
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作者 Wenyi Liu Yongzhi Zhao +4 位作者 Chengjun Yi Weifei Hu Jiale Xia Yuanyuan Li Jinping Liu 《Energy & Environmental Materials》 SCIE EI CAS CSCD 2024年第5期68-76,共9页
FeS_(2)cathode is promising for all-solid-state lithium batteries due to its ultra-high capacity,low cost,and environmental friendliness.However,the poor performances,induced by limited electrode-electrolyte interface... FeS_(2)cathode is promising for all-solid-state lithium batteries due to its ultra-high capacity,low cost,and environmental friendliness.However,the poor performances,induced by limited electrode-electrolyte interface,severe volume expansion,and polysulfide shuttle,hinder the application of FeS_(2)in all-solid-state lithium batteries.Herein,an integrated 3D FeS_(2)electrode with full infiltration of Li6PS5Cl sulfide electrolytes is designed to address these challenges.Such a 3D integrated design not only achieves intimate and maximized interfacial contact between electrode and sulfide electrolytes,but also effectively buffers the inner volume change of FeS_(2)and completely eliminates the polysulfide shuttle through direct solid-solid conversion of Li2S/S.Besides,the vertical 3D arrays guarantee direct electron transport channels and horizontally shortened ion diffusion paths,endowing the integrated electrode with a remarkably reduced interfacial impedance and enhanced reaction kinetics.Benefiting from these synergies,the integrated all-solid-state lithium battery exhibits the largest reversible capacity(667 mAh g^(-1)),best rate performance,and highest capacity retention of 82%over 500 cycles at 0.1 C compared to both a liquid battery and non-integrated all-solid-state lithium battery.The cycling performance is among the best reported for FeS_(2)-based all-solid-state lithium batteries.This work presents an innovative synergistic strategy for designing long-cycling high-energy all-solid-state lithium batteries,which can be readily applied to other battery systems,such as lithium-sulfur batteries. 展开更多
关键词 3d electrolyte infiltration all-solid-state batteries FeS_(2)nanosheets arrays integrated 3d electrodes sulfide electrolytes
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3D printing of osteocytic Dll4 integrated with PCL for cell fate determination towards osteoblasts in vitro 被引量:1
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作者 Pengtao Wang Xiaofang Wang +5 位作者 Bo Wang Xian Li Zhengsong Xie Jie Chen Tasuku Honjo Xiaolin Tu 《Bio-Design and Manufacturing》 SCIE EI CAS CSCD 2022年第3期497-511,共15页
Since 3D printed hard materials could match the shape of bone,cell survival and fate determination towards osteoblasts in such materials have become a popular research target.In this study,a scaffold of hardmaterial f... Since 3D printed hard materials could match the shape of bone,cell survival and fate determination towards osteoblasts in such materials have become a popular research target.In this study,a scaffold of hardmaterial for 3D fabrication was designed to regulate developmental signal(Notch)transduction guiding osteoblast differentiation.We established a polycaprolactone(PCL)and cell-integrated 3D printing system(PCI3D)to reciprocally print the beams of PCL and cell-laden hydrogel for a module.This PCI3D module holds good cell viability of over 87%,whereas cells show about sixfold proliferation in a 7-day culture.The osteocytic MLO-Y4 was engineered to overexpress Notch ligand Dll4,making up 25%after mixing with 75%stromal cells in the PCI3D module.Osteocytic Dll4,unlike other delta-like family members such as Dll1 or Dll3,promotes osteoblast differentiation and themineralization of primary mouse and a cell line of bone marrow stromal cells when cultured in a PCI3D module for up to 28 days.Mechanistically,osteocytic Dll4 could not promote osteogenic differentiation of the primary bone marrow stromal cells(BMSCs)after conditional deletion of the Notch transcription factor RBPjκby Cre recombinase.These data indicate that osteocytic Dll4 activates RBPjκ-dependent canonical Notch signaling in BMSCs for their oriented differentiation towards osteoblasts.Additionally,osteocytic Dll4 holds a great potential for angiogenesis in human umbilical vein endothelial cells within modules.Our study reveals that osteocytic Dll4 could be the osteogenic niche determining cell fate towards osteoblasts.This will open a new avenue to overcome the current limitation of poor cell viability and low bioactivity of traditional orthopedic implants. 展开更多
关键词 integrated 3d printing PCL scaffold Cell-laden hydrogel Osteocytic Dll4 Bone marrow stromal cell Osteoblast differentiation Cell viability in hard material RBPjκ Notch signaling
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Integrated 3D Fan-out Package of RF Microsystem and Antenna for 5G Communications 被引量:1
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作者 XIA Chenhui WANG Gang +1 位作者 WANG Bo MING Xuefei 《ZTE Communications》 2020年第3期33-41,共9页
A 3D fan-out packaging method for the integration of 5G communication RF microsystem and antenna is studied.First of all,through the double-sided wiring technology on the glass wafer,the fabrication of 5G antenna arra... A 3D fan-out packaging method for the integration of 5G communication RF microsystem and antenna is studied.First of all,through the double-sided wiring technology on the glass wafer,the fabrication of 5G antenna array is realized.Then the low power devices such as through silicon via(TSV)transfer chips,filters and antenna tuners are flip-welded on the glass wafer,and the glass wafer is reformed into a wafer permanently bonded with glass and resin by the injection molding process with resin material.Finally,the thinning resin surface leaks out of the TSV transfer chip,the rewiring is carried out on the resin surface,and then the power amplifier,low-noise amplifier,power management and other devices are flip-welded on the resin wafer surface.A ball grid array(BGA)is implanted to form the final package.The loss of the RF transmission line is measured by using the RF millimeter wave probe table.The results show that the RF transmission loss from the chip end to the antenna end in the fan-out package is very small,and it is only 0.26 dB/mm when working in 60 GHz.A slot coupling antenna is designed on the glass wafer.The antenna can operate at 60 GHz and the maximum gain can reach 6 dB within the working bandwidth.This demonstration successfully provides a feasible solution for the 3D fan-out integration of RF microsystem and antenna in 5G communications. 展开更多
关键词 AIP fan‐out package RF microsystem 3d integration 5G communications
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Sourcing the merits of 3D integrated air cathodes for highperformance Zn-air batteries by bubble pump consumption chronoamperometry
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作者 Mengxuan Li Linfeng Yu +4 位作者 Hai Liu Chuanyi Zhang Jiazhan Li Liang Luo Xiaoming Sun 《Nano Research》 SCIE EI CSCD 2024年第8期6951-6959,共9页
Zn-air batteries(ZABs)as a potential energy conversion system suffer from low power density(typically≤200 mW·cm^(−2)).Recently,three-dimensional(3D)integrated air cathodes have demonstrated promising performance... Zn-air batteries(ZABs)as a potential energy conversion system suffer from low power density(typically≤200 mW·cm^(−2)).Recently,three-dimensional(3D)integrated air cathodes have demonstrated promising performance over traditional twodimensional(2D)plane ones,which is ascribed to enriched active sites and enhanced diffusion,but without experimental evidence.Herein,we applied a bubble pump consumption chronoamperometry(BPCC)method to quantitatively identify the gas diffusion coefficient(D)and effective catalytic sites density(ρEC)of the integrated air cathodes for ZABs.Furthermore,the D andρEC values can instruct consequent optimization on the growth of Co embedded N-doped carbon nanotubes(CoNCNTs)on carbon fiber paper(CFP)and aerophilicity tuning,giving 4 times D and 1.3 timesρEC over the conventional 2D Pt/C-CFP counterparts.As a result,using the CoNCNTs with half-wave potential of merely 0.78 V vs.RHE(Pt/C:0.89 V vs.RHE),the superaerophilic CoNCNTs-CFP cathode-based ZABs exhibited a superior peak power density of 245 mW·cm^(−2) over traditional 2D Pt/C-CFP counterparts,breaking the threshold of 200 mW·cm^(−2).This work reveals the intrinsic feature of the 3D integrated air cathodes by yielding exact D andρEC values,and demonstrates the feasibility of BPCC method for the optimization of integrated electrodes,bypassing trial-and-error strategy. 展开更多
关键词 Zn-air batteries three-dimensional(3d)integrated air cathodes superaerophilic gas diffusion coefficient effective catalytic sites density
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Beyond the Silicon Plateau:A Convergence of Novel Materials for Transistor Evolution
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作者 Jung Hun Lee Jae Young Kim +3 位作者 Hyeon-Ji Lee Sung-Jin Choi Yoon Jung Lee Ho Won Jang 《Nano-Micro Letters》 2026年第2期786-844,共59页
As silicon-based transistors face fundamental scaling limits,the search for breakthrough alternatives has led to innovations in 3D architectures,heterogeneous integration,and sub-3 nm semiconductor body thicknesses.Ho... As silicon-based transistors face fundamental scaling limits,the search for breakthrough alternatives has led to innovations in 3D architectures,heterogeneous integration,and sub-3 nm semiconductor body thicknesses.However,the true effectiveness of these advancements lies in the seamless integration of alternative semiconductors tailored for next-generation transistors.In this review,we highlight key advances that enhance both scalability and switching performance by leveraging emerging semiconductor materials.Among the most promising candidates are 2D van der Waals semiconductors,Mott insulators,and amorphous oxide semiconductors,which offer not only unique electrical properties but also low-power operation and high carrier mobility.Additionally,we explore the synergistic interactions between these novel semiconductors and advanced gate dielectrics,including high-K materials,ferroelectrics,and atomically thin hexagonal boron nitride layers.Beyond introducing these novel material configurations,we address critical challenges such as leakage current and long-term device reliability,which become increasingly crucial as transistors scale down to atomic dimensions.Through concrete examples showcasing the potential of these materials in transistors,we provide key insights into overcoming fundamental obstacles—such as device reliability,scaling down limitations,and extended applications in artificial intelligence—ultimately paving the way for the development of future transistor technologies. 展开更多
关键词 Modern transistors Transistor scaling Alternative semiconductors 3d integration Device reliability
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Fabrication of polyetheretherketone(PEEK)-based 3D electronics with fine resolution by a hydrophobic treatment assisted hybrid additive manufacturing method 被引量:5
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作者 Liexin Wu Li Meng +4 位作者 Yueyue Wang Ming Lv Taoyuan Ouyang Yilin Wang Xiaoyan Zeng 《International Journal of Extreme Manufacturing》 SCIE EI CAS CSCD 2023年第3期519-532,共14页
Additive manufacturing(AM)is a free-form technology that shows great potential in the integrated creation of three-dimensional(3D)electronics.However,the fabrication of 3D conformal circuits that fulfill the requireme... Additive manufacturing(AM)is a free-form technology that shows great potential in the integrated creation of three-dimensional(3D)electronics.However,the fabrication of 3D conformal circuits that fulfill the requirements of high service temperature,high conductivity and high resolution remains a challenge.In this paper,a hybrid AM method combining the fused deposition modeling(FDM)and hydrophobic treatment assisted laser activation metallization(LAM)was proposed for manufacturing the polyetheretherketone(PEEK)-based 3D electronics,by which the conformal copper patterns were deposited on the 3D-printed PEEK parts,and the adhesion between them reached the 5B high level.Moreover,the 3D components could support the thermal cycling test from-55℃ to 125℃ for more than 100 cycles.Particularly,the application of a hydrophobic coating on the FDM-printed PEEK before LAM can promote an ideal catalytic selectivity on its surface,not affected by the inevitable printing borders and pores in the FDM-printed parts,then making the resolution of the electroless plated copper lines improved significantly.In consequence,Cu lines with width and spacing of only60μm and 100μm were obtained on both as-printed and after-polished PEEK substrates.Finally,the potential of this technique to fabricate 3D conformal electronics was demonstrated. 展开更多
关键词 PEEK fused deposition modeling hydrophobic treatment laser activation metallization integrated manufacturing of 3d electronics RESOLUTION
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An optimal stacking order for mid-bond testing cost reduction of 3D IC 被引量:2
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作者 Ni Tianming Liang Huaguo +4 位作者 Nie Mu Bian Jingchang Huang Zhengfeng Xu Xiumin Fang Xiangsheng 《Journal of Southeast University(English Edition)》 EI CAS 2018年第2期166-172,共7页
In order to solve the problem that the testing cost of the three-dimensional integrated circuit(3D IC)is too high,an optimal stacking order scheme is proposed to reduce the mid-bond test cost.A new testing model is bu... In order to solve the problem that the testing cost of the three-dimensional integrated circuit(3D IC)is too high,an optimal stacking order scheme is proposed to reduce the mid-bond test cost.A new testing model is built with the general consideration of both the test time for automatic test equipment(ATE)and manufacturing failure factors.An algorithm for testing cost and testing order optimization is proposed,and the minimum testing cost and optimized stacking order can be carried out by taking testing bandwidth and testing power as constraints.To prove the influence of the optimal stacking order on testing costs,two baselines stacked in sequential either in pyramid type or in inverted pyramid type are compared.Based on the benchmarks from ITC 02,experimental results show that for a 5-layer 3D IC,under different constraints,the optimal stacking order can reduce the test costs on average by 13%and 62%,respectively,compared to the pyramid type and inverted pyramid type.Furthermore,with the increase of the stack size,the test costs of the optimized stack order can be decreased. 展开更多
关键词 three-dimensional integrated circuit(3d IC) mid-bond test cost stacking order sequential stacking failed bonding
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Construction Model of First-class Undergraduate Courses in Local Universities from the Perspective of New Liberal Arts:Based on the Reform Practice of the"Finance"Course at Yangtze University
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作者 Lu TAN Xiaofang ZOU Hong YANG 《Meteorological and Environmental Research》 2025年第4期11-15,共5页
Against the dual background of deepening the construction of new liberal arts and implementing the"Double Ten Thousand Plan"for first-class undergraduate courses,local universities urgently need to explore d... Against the dual background of deepening the construction of new liberal arts and implementing the"Double Ten Thousand Plan"for first-class undergraduate courses,local universities urgently need to explore distinctive curriculum construction paths.Based on the requirements of the new liberal arts connotation,this paper constructs a three-dimensional integrated framework of"value guidance,ability driven,and knowledge foundation",and takes the construction of the"Finance"course at Yangtze University as a typical case for research.When systematically analyzing the"Finance"course in the school,a three-dimensional integrated curriculum reform practice is implemented by reshaping the three-level curriculum objectives of"state-society-individual",developing teaching content that integrates"modularization-localization-cutting-edge",using the"O-PRAISE"situational teaching method,and constructing a diversified collaborative evaluation system.A first-class curriculum construction model for local universities has been summarized,which involves five collaborative approaches:"localization"of target positioning,"integration"of content construction,"contextualization"of method implementation,"value-added"evaluation orientation,and"synergy"of resource guarantee.The aim is to provide theoretical paradigms and practical solutions for similar universities to learn from,effectively solving practical difficulties such as the disconnect between value shaping and knowledge transmission,and the mismatch between talent cultivation and local needs in curriculum construction. 展开更多
关键词 New liberal arts First-class courses Local universities 3d integration Five-bit synergy
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Integrated 3D-printed multilayer FSS with high interlayer reliability for multi-band radomes
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作者 Chunyu DONG Xing LIU +8 位作者 Houchao ZHANG Wenzheng SUN Tianwen WANG Juchen LI Zhenghao LI Rui WANG Hongke LI Xiaoyang ZHU Hongbo LAN 《Science China(Technological Sciences)》 2025年第10期296-309,共14页
Multilayer frequency selective surfaces(FSSs)have become core components of multi-band communication systems because they possess high selectivity,stability,and out-of-band suppression capabilities.However,interlayer ... Multilayer frequency selective surfaces(FSSs)have become core components of multi-band communication systems because they possess high selectivity,stability,and out-of-band suppression capabilities.However,interlayer reliability problems have negatively affected the manufacture of multilayer FSSs for many years,and these negative impacts are primarily reflected in restrictions in the interlayer bonding strength and the interlayer alignment accuracy.To address these problems,a macroscopic-microscopic cross-scale,multi-material integrated additive manufacturing process was designed during this study.This process,which utilizes electric field-driven(EFD)jet printing and in-situ curing,produced multilayer FSS structures with high-resolution patterning(with a line width of<20μm)and a low alignment error(equal to 0.73%of the periodic dimension).A highly stable micro-interdiffused polyimide(PI)material,which was used for interlayer bonding,was developed by performing trifluoromethyl and fluorenyl side-chain modifications.This material exhibited both extreme environmental adaptability(the PI-based electrodes fabricated using this material exhibited a resistance change rate of less than 5%at 360°C)and a strong interlayer interfacial bonding strength(>3.37 MPa).Using this process and material,a dual-band FSS with passband center frequencies at 14.5 and 60 GHz was designed and fabricated.In addition,the flexibility of the PI material enabled the resultant FSSs to conform to deployable curved surfaces;thus,this material offers a simplified 2D-to-3D fabrication solution for deployable radomes.The proposed binder-free integrated forming process combines environmental sustainability with costeffectiveness;therefore,it serves as a novel strategy for rapid manufacture and performance optimizations of high-frequency communication devices. 展开更多
关键词 integrated 3d printing direct ink writing electric field-driven printing frequency selective surface
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Ultrahigh-power electrochemical double-layer capacitors based on structurally integrated 3D carbon tube arrays 被引量:1
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作者 Fangming Han Guowen Meng +5 位作者 Dou Lin Gan Chen Shiping Zhang Ou Qian Xiaoguang Zhu Bingqing Wei 《Nano Research》 SCIE EI CSCD 2023年第11期12849-12854,共6页
The rational design of electrodes is the key to achieving ultrahigh-power performance in electrochemical energy storage devices.Recently,we have constructed well-organized and integrated three-dimensional(3D)carbon tu... The rational design of electrodes is the key to achieving ultrahigh-power performance in electrochemical energy storage devices.Recently,we have constructed well-organized and integrated three-dimensional(3D)carbon tube(CT)grids(3D-CTGs)using a 3D porous anodic aluminum oxide template-assisted method as electrodes of electrical double-layer capacitors(EDLCs),showing excellent frequency response performance.The unique design warrants fast ion migration channels,excellent electronic conductivity,and good structural stability.This study achieved one of the highest carbon-based ultrahigh-power EDLCs with the 3D-CTG electrodes,resulting in ultrahigh power of 437 and 1708 W·cm−3 with aqueous and organic electrolytes,respectively.Capacitors constructed with these electrodes would have important application prospects in the ultrahigh-power output.The rational design and fabrication of the 3D-CTGs electrodes have demonstrated their capability to build capacitors with ultrahighpower performance and open up new possibilities for applications requiring high-power output. 展开更多
关键词 ultrahigh-power double-layer capacitor structurally integrated three-dimensional(3d)carbon tube smooth ion migration channels
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AIR-GAP-BASED RF COAXIAL TSV AND ITS CHARACTERISTIC ANALYSIS 被引量:1
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作者 Yu Le Sun Jiabin +3 位作者 Zhang Chunhong Wang Zhaoxin Zhang Chao Yang Haigang 《Journal of Electronics(China)》 2013年第6期587-598,共12页
Many 3D IC applications such as MEMS and RF systems require Through-Silicon Via (TSV) with operations for high-speed vertical communication. In this paper, we introduce a novel air-gap coaxial TSV that is suiTab, fo... Many 3D IC applications such as MEMS and RF systems require Through-Silicon Via (TSV) with operations for high-speed vertical communication. In this paper, we introduce a novel air-gap coaxial TSV that is suiTab, for such RF applications. Firstly, the detailed fabrication process is described to explain how to acquire such a structure. Then, an Resistor Inductance Conductance Capacitance (RLGC) model is developed to profile the transverse electromagnetic field effect of the proposed air-gap TSV. The model is further verified by a 3D field solver program through the S-parameter comparison. With reference to the numerically simulated results, this analytical model delivers a maximum deviation of less than 6%0, on the conditions of varying diameters, outer to inner radius ratios, and SU-8 central angles, etc. Taking advantages of scalability of the model, a number of air-gap-based TSV designs are simulated, providing 1.6-4.0 times higher bandwidth than the con- ventional coaxial TSVs and leading to an efficient high frequency vertical RF interconnection solution for 3D ICs. 展开更多
关键词 Through-Silicon Via (TSV) Three dimensional integrated Circuits 3d IC) Air-gap COAXIAL Radio Frequency-Interconnect (RF-I)
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Electrical characterization of integrated passive devices using thin film technology for 3D integration
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作者 Xin SUN Yun-hui ZHU +5 位作者 Zhen-hua LIU Qing-hu CUI Sheng-lin MA Jing CHEN Min MIAO Yu-feng JIN 《Journal of Zhejiang University-Science C(Computers and Electronics)》 SCIE EI 2013年第4期235-243,共9页
With the development of 3D integration technology, microsystems with vertical interconnects are attracting attention from researchers and industry applications. Basic elements of integrated passive devices (IPDs), i... With the development of 3D integration technology, microsystems with vertical interconnects are attracting attention from researchers and industry applications. Basic elements of integrated passive devices (IPDs), including inductors, capacitors, and resistors, could dramatically save the tbotprint of the system, optimize the form factor, and improve the performance of radio frequency (RF) systems. In this paper, IPDs using thin film built-up technology are introduced, and the design and characterization of coplanar waveguides (CPWs), inductors, and capacitors are presented. 展开更多
关键词 integrated passive device (IPD) Benzocyclobutcne (BCB) Thin flim 3d Integration
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Resistive switching memory for high density storage and computing
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作者 Xiao-Xin Xu Qing Luo +3 位作者 Tian-Cheng Gong Hang-Bing Lv Qi Liu Ming Liu 《Chinese Physics B》 SCIE EI CAS CSCD 2021年第5期26-51,共26页
The resistive random access memory(RRAM)has stimulated a variety of promising applications including programmable analog circuit,massive data storage,neuromorphic computing,etc.These new emerging applications have hug... The resistive random access memory(RRAM)has stimulated a variety of promising applications including programmable analog circuit,massive data storage,neuromorphic computing,etc.These new emerging applications have huge demands on high integration density and low power consumption.The cross-point configuration or passive array,which offers the smallest footprint of cell size and feasible capability of multi-layer stacking,has received broad attention from the research community.In such array,correct operation of reading and writing on a cell relies on effective elimination of the sneaking current coming from the neighboring cells.This target requires nonlinear I-V characteristics of the memory cell,which can be realized by either adding separate selector or developing implicit build-in nonlinear cells.The performance of a passive array largely depends on the cell nonlinearity,reliability,on/off ratio,line resistance,thermal coupling,etc.This article provides a comprehensive review on the progress achieved concerning 3D RRAM integration.First,the authors start with a brief overview of the associative problems in passive array and the category of 3D architectures.Next,the state of the arts on the development of various selector devices and self-selective cells are presented.Key parameters that influence the device nonlinearity and current density are outlined according to the corresponding working principles.Then,the reliability issues in 3D array are summarized in terms of uniformity,endurance,retention,and disturbance.Subsequently,scaling issue and thermal crosstalk in 3D memory array are thoroughly discussed,and applications of 3D RRAM beyond storage,such as neuromorphic computing and CMOL circuit are discussed later.Summary and outlooks are given in the final. 展开更多
关键词 resistive switching memory(RRAM) three-dimensional(3d)integration RELIABILITY COMPUTING
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A review on monolithic 3D integration:From bulk semiconductors to low-dimensional materials
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作者 Ziying Hu Hongtao Li +7 位作者 Mingdi Zhang Zeming Jin Jixiang Li Wenku Fu Yunyun Dai Yuan Huang Xia Liu Yeliang Wang 《Nano Research》 2025年第3期581-604,共24页
Monolithic three-dimensional(M3D)integration represents a transformative approach in semiconductor technology,enabling the vertical integration of diverse functionalities within a single chip.This review explores the ... Monolithic three-dimensional(M3D)integration represents a transformative approach in semiconductor technology,enabling the vertical integration of diverse functionalities within a single chip.This review explores the evolution of M3D integration from traditional bulk semiconductors to low-dimensional materials like two-dimensioanl(2D)transition metal dichalcogenides(TMDCs)and carbon nanotubes(CNTs).Key applications include logic circuits,static random access memory(SRAM),resistive random access memory(RRAM),sensors,optoelectronics,and artificial intelligence(AI)processing.M3D integration enhances device performance by reducing footprint,improving power efficiency,and alleviating the von Neumann bottleneck.The integration of 2D materials in M3D structures demonstrates significant advancements in terms of scalability,energy efficiency,and functional diversity.Challenges in manufacturing and scaling are discussed,along with prospects for future research directions.Overall,the M3D integration with low-dimensional materials presents a promising pathway for the development of next-generation electronic devices and systems. 展开更多
关键词 monolithic three-dimensional(M3d)integration two-dimensional(2D)material logic circuit static random access memory(SRAM) resistive random access memory(RRAM) sensor OPTOELECTRONICS artificial intelligence
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Effective fault detection in M3D ICs:a cluster-based BIST for enhanced inter-layer via fault coverage
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作者 Hadi JAHANIRAD Ahmad MENBARI +1 位作者 Hemin RAHIMI Daniel ZIENER 《Frontiers of Information Technology & Electronic Engineering》 2025年第10期2041-2063,共23页
Monolithic three-dimensional integrated circuits(M3D ICs)have emerged as an innovative solution to overcome the limitations of traditional 2D scaling,offering improved performance,reduced power consumption,and enhance... Monolithic three-dimensional integrated circuits(M3D ICs)have emerged as an innovative solution to overcome the limitations of traditional 2D scaling,offering improved performance,reduced power consumption,and enhanced functionality.Inter-layer vias(ILVs),crucial components of M3D ICs,provide vertical connectivity between layers but are susceptible to manufacturing and operational defects,such as stuck-at faults(SAFs),shorts,and opens,which can compromise system reliability.These challenges necessitate advanced built-in self-test(BIST)methodologies to ensure robust fault detection and localization while minimizing the testing overhead.In this paper,we introduce a novel BIST architecture tailored to efficiently detect ILV defects,particularly in irregularly positioned ILVs,and approximately localize them within clusters,using a walking pattern approach.In the proposed BIST framework,ILVs are grouped according to the probability of fault occurrence,enabling efficient detection of all SAFs and bridging faults(BFs)and most multiple faults within each cluster.This strategy empowers designers to fine-tune fault coverage,localization precision,and test duration to meet specific design requirements.The new BIST method addresses a critical shortcoming of existing solutions by significantly reducing the number of test configurations and overall test time using multiple ILV clusters.The method also enhances efficiency in terms of area and hardware utilization,particularly for larger circuit benchmarks.For instance,in the LU32PEENG benchmark,where ILVs are divided into 64 clusters,the power,area,and hardware overheads are minimized to 0.82%,1.03%,and 1.14%,respectively. 展开更多
关键词 Monolithic three-dimensional integrated circuits(M3d ICs) Inter-layer vias(ILVs) Built-in self-test(BIST) Fault detection and localization
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Impedance matching for the reduction of signal reflection in high speed multilevel three-dimensional integrated chips 被引量:3
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作者 刘晓贤 朱樟明 +2 位作者 杨银堂 王凤娟 丁瑞雪 《Journal of Semiconductors》 EI CAS CSCD 2014年第1期121-128,共8页
In high speed three-dimensional integrated circuits (3D ICs), through silicon via (TSV) insertion causes impedance discontinuities along the interconnect-TSV channel that results in signal reflection. As demonstra... In high speed three-dimensional integrated circuits (3D ICs), through silicon via (TSV) insertion causes impedance discontinuities along the interconnect-TSV channel that results in signal reflection. As demonstrated for a two-plane interconnect structure connected by a TSV, we incorporate an appropriate capacitance at the junction to mitigate the signal reflection with gigascale frequencies. Based on 65 nm technology and S-parameter analysis, the decrease of signal reflection can be 189% at the tuned frequency of 5 GHz. Extending this method to the five-plane interconnect structure further, the reduction of signal reflection can achieve 400%. So we could broaden this method to any multilevel 3D interconnect structures. This method can also be applied to a circuit with tunable operating frequencies by digitally connecting the corresponding matching capacitance into the circuit through switches. There are remarkable improvements of the quality of the transmitting signals. 展开更多
关键词 3d integration TSV signal reflection impedance matching S-PARAMETER
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