A clock bias data processing method based on interval correlation coefficient wavelet threshold denoising is suggested for minor mistakes in clock bias data in order to increase the efficacy of satellite clock bias pr...A clock bias data processing method based on interval correlation coefficient wavelet threshold denoising is suggested for minor mistakes in clock bias data in order to increase the efficacy of satellite clock bias prediction.Wavelet analysis was first used to break down the satellite clock frequency data into several levels,producing high and low frequency coefficients for each layer.The correlation coefficients of the high and low frequency coefficients in each of the three sub-intervals created by splitting these coefficients were then determined.The major noise region—the sub-interval with the lowest correlation coefficient—was chosen for thresholding treatment and noise threshold computation.The clock frequency data was then processed using wavelet reconstruction and reconverted to clock data.Lastly,three different kinds of satellite clock data—RTS,whu-o,and IGS-F—were used to confirm the produced data.Our method enhanced the stability of the Quadratic Polynomial(QP)model’s predictions for the C16 satellite by about 40%,according to the results.The accuracy and stability of the Auto Regression Integrated Moving Average(ARIMA)model improved up to 41.8%and 14.2%,respectively,whilst the Wavelet Neural Network(WNN)model improved by roughly 27.8%and 63.6%,respectively.Although our method has little effect on forecasting IGS-F series satellites,the experimental findings show that it can improve the accuracy and stability of QP,ARIMA,and WNN model forecasts for RTS and whu-o satellite clock bias.展开更多
Modern warfare demands weapons capable of penetrating substantial structures,which presents sig-nificant challenges to the reliability of the electronic devices that are crucial to the weapon's perfor-mance.Due to...Modern warfare demands weapons capable of penetrating substantial structures,which presents sig-nificant challenges to the reliability of the electronic devices that are crucial to the weapon's perfor-mance.Due to miniaturization of electronic components,it is challenging to directly measure or numerically predict the mechanical response of small-sized critical interconnections in board-level packaging structures to ensure the mechanical reliability of electronic devices in projectiles under harsh working conditions.To address this issue,an indirect measurement method using the Bayesian regularization-based load identification was proposed in this study based on finite element(FE)pre-dictions to estimate the load applied on critical interconnections of board-level packaging structures during the process of projectile penetration.For predicting the high-strain-rate penetration process,an FE model was established with elasto-plastic constitutive models of the representative packaging ma-terials(that is,solder material and epoxy molding compound)in which material constitutive parameters were calibrated against the experimental results by using the split-Hopkinson pressure bar.As the impact-induced dynamic bending of the printed circuit board resulted in an alternating tensile-compressive loading on the solder joints during penetration,the corner solder joints in the edge re-gions experience the highest S11 and strain,making them more prone to failure.Based on FE predictions at different structural scales,an improved Bayesian method based on augmented Tikhonov regulariza-tion was theoretically proposed to address the issues of ill-posed matrix inversion and noise sensitivity in the load identification at the critical solder joints.By incorporating a wavelet thresholding technique,the method resolves the problem of poor load identification accuracy at high noise levels.The proposed method achieves satisfactorily small relative errors and high correlation coefficients in identifying the mechanical response of local interconnections in board-level packaging structures,while significantly balancing the smoothness of response curves with the accuracy of peak identification.At medium and low noise levels,the relative error is less than 6%,while it is less than 10%at high noise levels.The proposed method provides an effective indirect approach for the boundary conditions of localized solder joints during the projectile penetration process,and its philosophy can be readily extended to other scenarios of multiscale analysis for highly nonlinear materials and structures under extreme loading conditions.展开更多
Surfaces of stored grain bulk are often reconstructed from organized point sets with noise by 3-D laser scanner in an online measuring system.As a result,denoising is an essential procedure in processing point cloud d...Surfaces of stored grain bulk are often reconstructed from organized point sets with noise by 3-D laser scanner in an online measuring system.As a result,denoising is an essential procedure in processing point cloud data for more accurate surface reconstruction and grain volume calculation.A classified denoising method was presented in this research for noise removal from point cloud data of the grain bulk surface.Based on the distribution characteristics of cloud point data,the noisy points were divided into three types:The first and second types of the noisy points were either sparse points or small point cloud data deviating and suspending from the main point cloud data,which could be deleted directly by a grid method;the third type of the noisy points was mixed with the main body of point cloud data,which were most difficult to distinguish.The point cloud data with those noisy points were projected into a horizontal plane.An image denoising method,discrete wavelet threshold(DWT)method,was applied to delete the third type of the noisy points.Three kinds of denoising methods including average filtering method,median filtering method and DWT method were applied respectively and compared for denoising the point cloud data.Experimental results show that the proposed method remains the most of the details and obtains the lowest average value of RMSE(Root Mean Square Error,0.219)as well as the lowest relative error of grain volume(0.086%)compared with the other two methods.Furthermore,the proposed denoising method could not only achieve the aim of removing noisy points,but also improve self-adaptive ability according to the characteristics of point cloud data of grain bulk surface.The results from this research also indicate that the proposed method is effective for denoising noisy points and provides more accurate data for calculating grain volume.展开更多
基金2023 Liaoning Institute of Science and Technology Doctoral Program Launch fund(No.2307B29).
文摘A clock bias data processing method based on interval correlation coefficient wavelet threshold denoising is suggested for minor mistakes in clock bias data in order to increase the efficacy of satellite clock bias prediction.Wavelet analysis was first used to break down the satellite clock frequency data into several levels,producing high and low frequency coefficients for each layer.The correlation coefficients of the high and low frequency coefficients in each of the three sub-intervals created by splitting these coefficients were then determined.The major noise region—the sub-interval with the lowest correlation coefficient—was chosen for thresholding treatment and noise threshold computation.The clock frequency data was then processed using wavelet reconstruction and reconverted to clock data.Lastly,three different kinds of satellite clock data—RTS,whu-o,and IGS-F—were used to confirm the produced data.Our method enhanced the stability of the Quadratic Polynomial(QP)model’s predictions for the C16 satellite by about 40%,according to the results.The accuracy and stability of the Auto Regression Integrated Moving Average(ARIMA)model improved up to 41.8%and 14.2%,respectively,whilst the Wavelet Neural Network(WNN)model improved by roughly 27.8%and 63.6%,respectively.Although our method has little effect on forecasting IGS-F series satellites,the experimental findings show that it can improve the accuracy and stability of QP,ARIMA,and WNN model forecasts for RTS and whu-o satellite clock bias.
基金supported by the National Natural Science Foundation of China(Grant Nos.52475166,52175148)the Regional Collaboration Project of Shanxi Province(Grant No.202204041101044).
文摘Modern warfare demands weapons capable of penetrating substantial structures,which presents sig-nificant challenges to the reliability of the electronic devices that are crucial to the weapon's perfor-mance.Due to miniaturization of electronic components,it is challenging to directly measure or numerically predict the mechanical response of small-sized critical interconnections in board-level packaging structures to ensure the mechanical reliability of electronic devices in projectiles under harsh working conditions.To address this issue,an indirect measurement method using the Bayesian regularization-based load identification was proposed in this study based on finite element(FE)pre-dictions to estimate the load applied on critical interconnections of board-level packaging structures during the process of projectile penetration.For predicting the high-strain-rate penetration process,an FE model was established with elasto-plastic constitutive models of the representative packaging ma-terials(that is,solder material and epoxy molding compound)in which material constitutive parameters were calibrated against the experimental results by using the split-Hopkinson pressure bar.As the impact-induced dynamic bending of the printed circuit board resulted in an alternating tensile-compressive loading on the solder joints during penetration,the corner solder joints in the edge re-gions experience the highest S11 and strain,making them more prone to failure.Based on FE predictions at different structural scales,an improved Bayesian method based on augmented Tikhonov regulariza-tion was theoretically proposed to address the issues of ill-posed matrix inversion and noise sensitivity in the load identification at the critical solder joints.By incorporating a wavelet thresholding technique,the method resolves the problem of poor load identification accuracy at high noise levels.The proposed method achieves satisfactorily small relative errors and high correlation coefficients in identifying the mechanical response of local interconnections in board-level packaging structures,while significantly balancing the smoothness of response curves with the accuracy of peak identification.At medium and low noise levels,the relative error is less than 6%,while it is less than 10%at high noise levels.The proposed method provides an effective indirect approach for the boundary conditions of localized solder joints during the projectile penetration process,and its philosophy can be readily extended to other scenarios of multiscale analysis for highly nonlinear materials and structures under extreme loading conditions.
基金National Natural Science Foundation of China(No.50975121)Jilin Province Science and Technology Development Plan Item(No.20130522150JH)2013 Jilin Province Science Foundation for Post Doctorate Research(No.RB201361).
文摘Surfaces of stored grain bulk are often reconstructed from organized point sets with noise by 3-D laser scanner in an online measuring system.As a result,denoising is an essential procedure in processing point cloud data for more accurate surface reconstruction and grain volume calculation.A classified denoising method was presented in this research for noise removal from point cloud data of the grain bulk surface.Based on the distribution characteristics of cloud point data,the noisy points were divided into three types:The first and second types of the noisy points were either sparse points or small point cloud data deviating and suspending from the main point cloud data,which could be deleted directly by a grid method;the third type of the noisy points was mixed with the main body of point cloud data,which were most difficult to distinguish.The point cloud data with those noisy points were projected into a horizontal plane.An image denoising method,discrete wavelet threshold(DWT)method,was applied to delete the third type of the noisy points.Three kinds of denoising methods including average filtering method,median filtering method and DWT method were applied respectively and compared for denoising the point cloud data.Experimental results show that the proposed method remains the most of the details and obtains the lowest average value of RMSE(Root Mean Square Error,0.219)as well as the lowest relative error of grain volume(0.086%)compared with the other two methods.Furthermore,the proposed denoising method could not only achieve the aim of removing noisy points,but also improve self-adaptive ability according to the characteristics of point cloud data of grain bulk surface.The results from this research also indicate that the proposed method is effective for denoising noisy points and provides more accurate data for calculating grain volume.
