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Halide perovskite volatile unipolar nanomemristor
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作者 Abolfazl Mahmoodpoor Prokhor A.Alekseev +4 位作者 Ksenia A.Gasnikova Kuzmenko Natalia Artem Larin Sergey Makarov Aleksandra Furasova 《Opto-Electronic Advances》 2025年第11期31-42,共12页
Halide perovskites is a recently emerged platform for the creation of efficient memristors.In turn,single-crystal inorganic perovskite would be new low-cost and flexible memory devices because of their excellent resis... Halide perovskites is a recently emerged platform for the creation of efficient memristors.In turn,single-crystal inorganic perovskite would be new low-cost and flexible memory devices because of their excellent resistive switching(RS)properties,without risk of chemical and mechanical stress-generated degradation,compared with the operational instability of general thin-film perovskite memristors.Moreover,miniaturization of perovskite memristors would be useful for creating high-density memory devices.Here we demonstrate the smallest CsPbBr3 perovskite nanomemristor with volatile unipolar RS characteristics which depends on the size of a single-crystal as a resistive layer due to its overall structural stability and low sensitivity to atmosphere conditions that helps to keep the stable RS switching over 1500 times with the lowest consumption power of 70 nW.To better understand the RS mechanism,we provide a comprehensive simulation of the evolution of mixed ionic-electronic charge carriers under current-voltage(I-V)tests using a one-dimensional drift-diffusion model.Because of the nonreactive nature of the contacts,the main mechanism of resistive state switching is potential barrier modulation of the Schottky contacts through the accumulation of migrating ions at the interfaces.Our findings pave the way for ultracompact memristors as well as shed light on RS mechanism in non-filamentary perovskitebased memory devices. 展开更多
关键词 perovskite nanocrystals nanomemristor volatile memory resistive switching ions migration
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Primary Exploration of Reliability Evaluation of Computer Live Forensics Model on Physical Memory Analysis 被引量:1
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作者 Lian-Hai Wang Qiu-Liang Xu 《Journal of Harbin Institute of Technology(New Series)》 EI CAS 2014年第4期121-128,共8页
The integrity and fidelity of digital evidence are very important in live forensics. Previous studies have focused the uncertainty of live forensics based on different memory snapshots. However,this kind of method is ... The integrity and fidelity of digital evidence are very important in live forensics. Previous studies have focused the uncertainty of live forensics based on different memory snapshots. However,this kind of method is not effective in practice. In fact,memory images are usually acquired by using forensics tools instead of using snapshots. Therefore,the integrity and fidelity of live evidence should be evaluated during the acquisition process. In this paper,we study the problem in a novel viewpoint. Firstly,several definitions about memory acquisition measure error are introduced to describe the trusty. Then,we analyze the experimental error and propose some suggestions on how to reduce it. A novel method is also developed to calculate the system error in detail. The results of a case study on Windows 7 and VMware virtual machine show that the experimental error has good accuracy and precision,which demonstrate the efficacy of the proposed reducing methods. The system error is also evaluated,that is,it accounts for the whole error from 30% to 50%. 展开更多
关键词 digital investigation live forensics volatile memory acquisition trusted probability
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