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A novel monolithic ultraviolet image sensor based on a standard CMOS process 被引量:1
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作者 李贵柯 冯鹏 吴南健 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2011年第10期133-138,共6页
We present a monolithic ultraviolet(UV) image sensor based on a standard CMOS process.A compact UV sensitive device structure is designed as a pixel for the image sensor.This UV image sensor consists of a CMOS pixel... We present a monolithic ultraviolet(UV) image sensor based on a standard CMOS process.A compact UV sensitive device structure is designed as a pixel for the image sensor.This UV image sensor consists of a CMOS pixel array,high-voltage switches,a readout circuit and a digital control circuit.A 16×16 image sensor prototype chip is implemented in a 0.18μm standard CMOS logic process.The pixel and image sensor were measured. Experimental results demonstrate that the image sensor has a high sensitivity of 0.072 V/(mJ/cm^2) and can capture a UV image.It is suitable for large-scale monolithic bio-medical and space applications. 展开更多
关键词 UV image sensor standard cmos process floating gate
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A Low-Power,Single-Poly,Non-Volatile Memory for Passive RFID Tags 被引量:1
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作者 赵涤燹 闫娜 +3 位作者 徐雯 杨立吾 王俊宇 闵昊 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2008年第1期99-104,共6页
Single-poly,576bit non-volatile memory is designed and implemented in an SMIC 0.18μm standard CMOS process for the purpose of reducing the cost and power of passive RFID tag chips. The memory bit cell is designed wit... Single-poly,576bit non-volatile memory is designed and implemented in an SMIC 0.18μm standard CMOS process for the purpose of reducing the cost and power of passive RFID tag chips. The memory bit cell is designed with conventional single-poly pMOS transistors, based on the bi-directional Fowler-Nordheim tunneling effect, and the typical program/erase time is 10ms for every 16bits. A new ,single-ended sense amplifier is proposed to reduce the power dissipation in the current sensing scheme. The average current consumption of the whole memory chip is 0.8μA for the power supply voltage of 1.2V at a reading rate of 640kHz. 展开更多
关键词 RFID single-poly non-volatile memory standard cmos process sense amplifier low power
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A high efficiency charge pump circuit for low power applications 被引量:4
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作者 冯鹏 李昀龙 吴南健 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2010年第1期88-92,共5页
A high efficiency charge pump circuit is designed and realized. The charge transfer switch is biased by the additional capacitor and transistor to eliminate the influence of the threshold voltage. Moreover, the bulk o... A high efficiency charge pump circuit is designed and realized. The charge transfer switch is biased by the additional capacitor and transistor to eliminate the influence of the threshold voltage. Moreover, the bulk of the switch transistor is dynamically biased so that the threshold voltage gets lower when it is turned on during charge transfer and gets higher when it is turned off. As a result, the efficiency of the charge pump circuit can be improved. A test chip has been implemented in a 0.18μm 3.3 V standard CMOS process. The measured output voltage of the eight-pumpingstage charge pump is 9.8 V with each pumping capacitor of 0.5 pF at an output current of 0.18 μA, when the clock frequency is 780 kHz and the supply voltage is 2 V. The charge pump and the clock driver consume a total current of 2.9 μA from the power supply. This circuit is suitable for low power applications. 展开更多
关键词 high efficiency low power charge pump circuit high-voltage generator standard cmos process
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