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Using light to image millimeter wave based on stacked meta-MEMS chip 被引量:1
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作者 Han Wang Zhigang Wang +6 位作者 Cheng Gong Xinyu Li Tiansheng Cui Huiqi Jiang Minghui Deng Bo Yan Weiwei Liu 《Light: Science & Applications》 2025年第2期521-530,共10页
A stacked metamaterial MEMS(meta-MEMS)chip is proposed,which can perfectly absorb electromagnetic waves,convert them into mechanical energy,drive movement of the optical micro-reflectors array,and detect millimeter wa... A stacked metamaterial MEMS(meta-MEMS)chip is proposed,which can perfectly absorb electromagnetic waves,convert them into mechanical energy,drive movement of the optical micro-reflectors array,and detect millimeter waves.It is equivalent to using visible light to image a millimeter wave.The meta-MEMS adopts the design of upper and lower chip separation and then stacking to achieve the"dielectric-resonant-air-ground"structure,reduce the thickness of the metamaterial and MEMS structures,and improve the performance of millimeter wave imaging.For verification,we designed and prepared a 94 GHz meta-MEMS focal plane array chip,in which the sum of the thickness of the metamaterial and MEMS structures is only 1/2500 wavelength,the pixel size is less than 1/3 wavelength,but the absorption rate is as high as 99.8%.Moreover,a light readout module was constructed to test the millimeter wave imaging performance.The results show that the response speed can reach 144 Hz and the lens-less imaging resolution is 1.5mm. 展开更多
关键词 detect millimeter wavesit metamaterial mems structuresand millimeter wave imaging image millimeter wavethe upper lower chip separation visible light absorb electromagnetic wavesconvert stacked metamaterial MEMS chip
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TXV Technology:The cornerstone of 3D system-in-packaging 被引量:6
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作者 ZHAO HeRan CHEN MingXiang +3 位作者 PENG Yang WANG Qing KANG Min CAO LiHua 《Science China(Technological Sciences)》 SCIE EI CAS CSCD 2022年第9期2031-2050,共20页
System-in-packaging(Si P) can realize the integration and miniaturization of electronic devices and it is significant to continue Moore’s law.Through-X-via(TXV) technology is the cornerstone of 3 D-SiP,which enables ... System-in-packaging(Si P) can realize the integration and miniaturization of electronic devices and it is significant to continue Moore’s law.Through-X-via(TXV) technology is the cornerstone of 3 D-SiP,which enables the vertical stacking and electrical interconnection of electronic devices.TXV originated from through-hole(TH) in PCB substrates and evolved in different substrate materials,such as silicon,glass,ceramic,and polymer.This work provides a comprehensive review of four distinguishing TXV technologies(through silicon via(TSV),through glass via(TGV),through ceramic via(TCV),and through mold via(TMV)),including the fabrication mechanisms,processes,and applications.Every TXV technology has unique characteristics and owns particular processes and functions.The process methods,key technologies,application fields,and advantages and disadvantages of each TXV technology were discussed.The cutting-edge through-hole process and development direction were reviewed. 展开更多
关键词 through silicon via(TSV) through ceramic via(TCV) through glass via(TGV) through mold via(TMV) 3D packaging chip stacking interposer
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