In X-ray absorption fine structure(XAFS) experiments,Soller slits are widely used as filter devices in order to improve the signal to noise ratio.Performing high accuracy manual focusing operations is a time-consuming...In X-ray absorption fine structure(XAFS) experiments,Soller slits are widely used as filter devices in order to improve the signal to noise ratio.Performing high accuracy manual focusing operations is a time-consuming process;therefore,this work introduces an automatic focusing method for Soller slits in multi-element fluorescence detectors.This method establishes a relation model between the fluorescence intensity distribution and the coordinates of the fluorescence excitation point.According to this relation model,the actual coordinates of the fluorescence excitation point can be deduced from the detected fluorescence intensity distribution and used in focusing operations.This method has proven to be feasible in an XAFS experiment at the BL14W1 beamline of the Shanghai Synchrotron Radiation Facility.展开更多
Based on the multi-slit method, a new method is introduced to measure the nonlinear force caused emittance growth in a RF photoinjector. It is possible to reconstruct the phase space of a beam under some conditions by...Based on the multi-slit method, a new method is introduced to measure the nonlinear force caused emittance growth in a RF photoinjector. It is possible to reconstruct the phase space of a beam under some conditions by the multi-slit method. Based on the reconstructed phase space, besides the emittance, the emittance growth from the distortion of the phase space can also be measured. The emittance growth results from the effects of nonlinear force acting on electron, which is very important for the high quality beam in a RF photoinjector.展开更多
基金supported by National Nature Science Foundation of China(No.11175244)
文摘In X-ray absorption fine structure(XAFS) experiments,Soller slits are widely used as filter devices in order to improve the signal to noise ratio.Performing high accuracy manual focusing operations is a time-consuming process;therefore,this work introduces an automatic focusing method for Soller slits in multi-element fluorescence detectors.This method establishes a relation model between the fluorescence intensity distribution and the coordinates of the fluorescence excitation point.According to this relation model,the actual coordinates of the fluorescence excitation point can be deduced from the detected fluorescence intensity distribution and used in focusing operations.This method has proven to be feasible in an XAFS experiment at the BL14W1 beamline of the Shanghai Synchrotron Radiation Facility.
基金Project supported by the National Natural Science Foundation of China （Grant No 10347009）.
文摘Based on the multi-slit method, a new method is introduced to measure the nonlinear force caused emittance growth in a RF photoinjector. It is possible to reconstruct the phase space of a beam under some conditions by the multi-slit method. Based on the reconstructed phase space, besides the emittance, the emittance growth from the distortion of the phase space can also be measured. The emittance growth results from the effects of nonlinear force acting on electron, which is very important for the high quality beam in a RF photoinjector.
