In order to obtain bioelectrical impedance electrodes with high stability, the chemical etching process was used to fabricate the copper electrode with a series of surface microstructures. By changing the etching proc...In order to obtain bioelectrical impedance electrodes with high stability, the chemical etching process was used to fabricate the copper electrode with a series of surface microstructures. By changing the etching processing parameters, some comparison experiments were performed to reveal the influence of etching time, etching temperature, etching liquid concentration, and sample sizes on the etching rate and surface microstructures of copper electrode. The result shows that the etching rate is decreased with increasing etching time, and is increased with increasing etching temperature. Moreover, it is found that the sample size has little influence on the etching rate. After choosing the reasonable etching liquid composition （formulation 3）, the copper electrode with many surface microstructures can be obtained by chemical etching process at room temperature for 20 rain. In addition, using the alternating current impedance test of electrode-electrode for 24 h, the copper electrode with a series of surface microstructures fabricated by the etching process presents a more stable impedance value compared with the electrocardiograph （ECG） electrode, resulting from the reliable surface contact of copper electrode-electrode.展开更多
A multi-scale numerical method coupled with the reactor,sheath and trench model is constructed to simulate dry etching of SiO_2 in inductively coupled C_4F_8 plasmas.Firstly,ion and neutral particle densities in the r...A multi-scale numerical method coupled with the reactor,sheath and trench model is constructed to simulate dry etching of SiO_2 in inductively coupled C_4F_8 plasmas.Firstly,ion and neutral particle densities in the reactor are decided using the CFD-ACE＋ commercial software.Then,the ion energy and angular distributions（IEDs and IADs） are obtained in the sheath model with the sheath boundary conditions provided with CFD-ACE＋.Finally,the trench profile evolution is simulated in the trench model.What we principally focus on is the effects of the discharge parameters on the etching results.It is found that the discharge parameters,including discharge pressure,radio-frequency（rf） power,gas mixture ratios,bias voltage and frequency,have synergistic effects on IEDs and IADs on the etched material surface,thus further affecting the trench profiles evolution.展开更多
Two-dimensional(2D)nitride MXenes are predicted to exhibit exceptional metallic properties and high polarity;however,their synthesis remains challenging.Research has relied on traditional molten salt etching,highlight...Two-dimensional(2D)nitride MXenes are predicted to exhibit exceptional metallic properties and high polarity;however,their synthesis remains challenging.Research has relied on traditional molten salt etching,highlighting the need for a scalable,high-purity approach.Here,we present the first solution-based synthesis of Ti_(4)N_(3)T_(x)MXene via a novel saturated salt solution(S^(3))etching technique employing alkali metal salts.By optimizing the sintering process for high-purity Ti_(4)AlN_(3)MAX and refining the S^(3)etching route,we significantly reduced the etch pit density to 1.2×10^(6)cm^(-2)and lowered the etch pit formation rate to 4%,yielding high-quality,phasepure Ti_(4)N_(3)T_(x)MXene.Our study highlights the critical role of alkali metal ions in selective A-layer removal and demonstrates the impressive electrical conductivity and electromagnetic interference shielding performance of 2D nitride MXene,setting a new benchmark for this underexplored material.These findings pave the way for advancing 2D nitride MXenes and their diverse applications.展开更多
Compared to the conventional phase change materials,the new phase change material Ta-Sb2Te3 has the advantages of excellent data retention and good material stability.In this letter,the etching characteristics of Ta-S...Compared to the conventional phase change materials,the new phase change material Ta-Sb2Te3 has the advantages of excellent data retention and good material stability.In this letter,the etching characteristics of Ta-Sb2Te3 were studied by using CF4/Ar.The results showed that when CF4/Ar=25/25,the etching power was 600 W and the etching pressure was 2.5 Pa,the etching speed was up to 61 nm/min.The etching pattern of Ta-Sb2Te3 film had a smooth side wall and good perpendicularity(close to 90°),smooth surface of the etching(RMS was 0.51nm),and the etching uniformity was fine.Furthermore,the mechanism of this etching process was analyzed by X-ray photoelectron spectroscopy(XPS).The main damage mechanism of ICP etching in CF4/Ar was studied by X-ray diffraction(XRD).展开更多
Ge2Sb2Te5 gap filling is one of the key processes for phase-change random access memory manufacture. Physical vapor deposition is the mainstream method of Ge2Sb2Te5 film deposition due to its advantages of film qualit...Ge2Sb2Te5 gap filling is one of the key processes for phase-change random access memory manufacture. Physical vapor deposition is the mainstream method of Ge2Sb2Te5 film deposition due to its advantages of film quality, purity, and accurate composition control. However,the conventional physical vapor deposition process cannot meet the gap- filling requirement with the critical device dimension scaling down to 90 nm or below. In this study, we find that the deposit-etch-deposit process shows better gap-filling capability and scalability than the single-step deposition process, especially at the nano-scale critical dimension. The gap-filling mechanism of the deposit-etch-deposit process was briefly discussed. We also find that re-deposition of phase-change material from via the sidewall to via the bottom by argon ion bombardment during the etch step was a key ingredient for the final good gap filling. We achieve void-free gap filling of phase-change material on the 45-nm via the two-cycle deposit-etch-deposit process. We gain a rather comprehensive insight into the mechanism of deposit-etch-deposit process and propose a potential gap-filling solution for over 45-nm technology nodes for phase-change random access memory.展开更多
Quartz crystals are the most widely used material in resonant sensors,owing to their excellent piezoelectric and mechanical properties.With the development of portable and wearable devices,higher processing efficiency...Quartz crystals are the most widely used material in resonant sensors,owing to their excellent piezoelectric and mechanical properties.With the development of portable and wearable devices,higher processing efficiency and geometrical precision are required.Wet etching has been proven to be the most efficient etching method for large-scale production of quartz devices,and many wet etching approaches have been developed over the years.However,until now,there has been no systematic review of quartz crystal etching in liquid phase environments.Therefore,this article provides a comprehensive review of the development of wet etching processes and the achievements of the latest research in thisfield,covering conventional wet etching,additive etching,laser-induced backside wet etching,electrochemical etching,and electrochemical discharge machining.For each technique,a brief overview of its characteristics is provided,associated problems are described,and possible solutions are discussed.This review should provide an essential reference and guidance for the future development of processing strategies for the manufacture of quartz crystal devices.展开更多
Microchannel reactors are commonly used in micro-chemical technology. The performance of microreactors is greatly affected by the velocity field in the microchannel. The flow field is disturbed by the cylindrical etch...Microchannel reactors are commonly used in micro-chemical technology. The performance of microreactors is greatly affected by the velocity field in the microchannel. The flow field is disturbed by the cylindrical etch holes caused by air dust on the microchannel surface during its processing procedure. In this approach, a two-dimensional computational fluid dynamics （CFD） model is put forward to study the effect of etch holes on flow field. The influenced area of single or two concave etch holes is studied for the case of laminar flow. The hole diameter, the Reynolds number and the distance between the center of holes are found to have influences on the flow field. Numerical results indicate that the effects of etch hole on the flow field should be evaluated and the way of choosing the economic class of cleanroom for microreactor manufacture is presented.展开更多
The comparison of domestic and foreign studies has been utilized to extensively employ junction termination extension(JTE)structures for power devices.However,achieving a gradual doping concentration change in the lat...The comparison of domestic and foreign studies has been utilized to extensively employ junction termination extension(JTE)structures for power devices.However,achieving a gradual doping concentration change in the lateral direction is difficult for SiC devices since the diffusion constants of the implanted aluminum ions in SiC are much less than silicon.Many previously reported studies adopted many new structures to solve this problem.Additionally,the JTE structure is strongly sensitive to the ion implantation dose.Thus,GA-JTE,double-zone etched JTE structures,and SM-JTE with modulation spacing were reported to overcome the above shortcomings of the JTE structure and effectively increase the breakdown voltage.They provided a theoretical basis for fabricating terminal structures of 4H-SiC PiN diodes.This paper summarized the effects of different terminal structures on the electrical properties of SiC devices at home and abroad.Presently,the continuous development and breakthrough of terminal technology have significantly improved the breakdown voltage and terminal efficiency of 4H-SiC PiN power diodes.展开更多
基金Project (2011A090200123) supported by Industry-Universities-Research Cooperation Project of Guangdong Province and Ministry of Education of ChinaProject (111gpy06) supported by Fundamental Research Funds for the Central Universities,ChinaProject (101055807) supported by the Innovative Experiment Plan Project for College Students of Sun Yat-sen University,China
文摘In order to obtain bioelectrical impedance electrodes with high stability, the chemical etching process was used to fabricate the copper electrode with a series of surface microstructures. By changing the etching processing parameters, some comparison experiments were performed to reveal the influence of etching time, etching temperature, etching liquid concentration, and sample sizes on the etching rate and surface microstructures of copper electrode. The result shows that the etching rate is decreased with increasing etching time, and is increased with increasing etching temperature. Moreover, it is found that the sample size has little influence on the etching rate. After choosing the reasonable etching liquid composition （formulation 3）, the copper electrode with many surface microstructures can be obtained by chemical etching process at room temperature for 20 rain. In addition, using the alternating current impedance test of electrode-electrode for 24 h, the copper electrode with a series of surface microstructures fabricated by the etching process presents a more stable impedance value compared with the electrocardiograph （ECG） electrode, resulting from the reliable surface contact of copper electrode-electrode.
基金supported by National Natural Science Foundation of China(No.11375040)the Important National Science&Technology Specific Project of China(No.2011ZX02403-002)
文摘A multi-scale numerical method coupled with the reactor,sheath and trench model is constructed to simulate dry etching of SiO_2 in inductively coupled C_4F_8 plasmas.Firstly,ion and neutral particle densities in the reactor are decided using the CFD-ACE＋ commercial software.Then,the ion energy and angular distributions（IEDs and IADs） are obtained in the sheath model with the sheath boundary conditions provided with CFD-ACE＋.Finally,the trench profile evolution is simulated in the trench model.What we principally focus on is the effects of the discharge parameters on the etching results.It is found that the discharge parameters,including discharge pressure,radio-frequency（rf） power,gas mixture ratios,bias voltage and frequency,have synergistic effects on IEDs and IADs on the etched material surface,thus further affecting the trench profiles evolution.
基金supported by the Nano&Material Technology Development Program through the National Research Foundation of Korea(NRF)funded by Ministry of Science and ICT(Grant No.RS-2024-00408180)by Institute for Basic Science(No.IBS-R019-G1).
文摘Two-dimensional(2D)nitride MXenes are predicted to exhibit exceptional metallic properties and high polarity;however,their synthesis remains challenging.Research has relied on traditional molten salt etching,highlighting the need for a scalable,high-purity approach.Here,we present the first solution-based synthesis of Ti_(4)N_(3)T_(x)MXene via a novel saturated salt solution(S^(3))etching technique employing alkali metal salts.By optimizing the sintering process for high-purity Ti_(4)AlN_(3)MAX and refining the S^(3)etching route,we significantly reduced the etch pit density to 1.2×10^(6)cm^(-2)and lowered the etch pit formation rate to 4%,yielding high-quality,phasepure Ti_(4)N_(3)T_(x)MXene.Our study highlights the critical role of alkali metal ions in selective A-layer removal and demonstrates the impressive electrical conductivity and electromagnetic interference shielding performance of 2D nitride MXene,setting a new benchmark for this underexplored material.These findings pave the way for advancing 2D nitride MXenes and their diverse applications.
基金This work was financially supported by the Natural Science Foundation of China(61874129)the National Key Research and Development Program of China(2017YFB0405601).
文摘Compared to the conventional phase change materials,the new phase change material Ta-Sb2Te3 has the advantages of excellent data retention and good material stability.In this letter,the etching characteristics of Ta-Sb2Te3 were studied by using CF4/Ar.The results showed that when CF4/Ar=25/25,the etching power was 600 W and the etching pressure was 2.5 Pa,the etching speed was up to 61 nm/min.The etching pattern of Ta-Sb2Te3 film had a smooth side wall and good perpendicularity(close to 90°),smooth surface of the etching(RMS was 0.51nm),and the etching uniformity was fine.Furthermore,the mechanism of this etching process was analyzed by X-ray photoelectron spectroscopy(XPS).The main damage mechanism of ICP etching in CF4/Ar was studied by X-ray diffraction(XRD).
基金Project supported by the National Basic Research Program of China (Grant Nos.2010CB934300,2011CBA00607,and 2011CB932800)the National Integrate Circuit Research Program of China (Grant No. 2009ZX02023-003)+1 种基金the National Natural Science Foundation of China (Grant Nos. 60906004,60906003,61006087,and 61076121)the Science and Technology Council of Shanghai,China (Grant No. 1052nm07000)
文摘Ge2Sb2Te5 gap filling is one of the key processes for phase-change random access memory manufacture. Physical vapor deposition is the mainstream method of Ge2Sb2Te5 film deposition due to its advantages of film quality, purity, and accurate composition control. However,the conventional physical vapor deposition process cannot meet the gap- filling requirement with the critical device dimension scaling down to 90 nm or below. In this study, we find that the deposit-etch-deposit process shows better gap-filling capability and scalability than the single-step deposition process, especially at the nano-scale critical dimension. The gap-filling mechanism of the deposit-etch-deposit process was briefly discussed. We also find that re-deposition of phase-change material from via the sidewall to via the bottom by argon ion bombardment during the etch step was a key ingredient for the final good gap filling. We achieve void-free gap filling of phase-change material on the 45-nm via the two-cycle deposit-etch-deposit process. We gain a rather comprehensive insight into the mechanism of deposit-etch-deposit process and propose a potential gap-filling solution for over 45-nm technology nodes for phase-change random access memory.
基金supported by the Natural Science Foundation of China (Grant No.12234005)the major research and development program of Jiangsu Province (Grant Nos.BE2021007-2 and BK20222007)。
文摘Quartz crystals are the most widely used material in resonant sensors,owing to their excellent piezoelectric and mechanical properties.With the development of portable and wearable devices,higher processing efficiency and geometrical precision are required.Wet etching has been proven to be the most efficient etching method for large-scale production of quartz devices,and many wet etching approaches have been developed over the years.However,until now,there has been no systematic review of quartz crystal etching in liquid phase environments.Therefore,this article provides a comprehensive review of the development of wet etching processes and the achievements of the latest research in thisfield,covering conventional wet etching,additive etching,laser-induced backside wet etching,electrochemical etching,and electrochemical discharge machining.For each technique,a brief overview of its characteristics is provided,associated problems are described,and possible solutions are discussed.This review should provide an essential reference and guidance for the future development of processing strategies for the manufacture of quartz crystal devices.
基金Supported by the National Natural Science Foundation of China （20676093）.
文摘Microchannel reactors are commonly used in micro-chemical technology. The performance of microreactors is greatly affected by the velocity field in the microchannel. The flow field is disturbed by the cylindrical etch holes caused by air dust on the microchannel surface during its processing procedure. In this approach, a two-dimensional computational fluid dynamics （CFD） model is put forward to study the effect of etch holes on flow field. The influenced area of single or two concave etch holes is studied for the case of laminar flow. The hole diameter, the Reynolds number and the distance between the center of holes are found to have influences on the flow field. Numerical results indicate that the effects of etch hole on the flow field should be evaluated and the way of choosing the economic class of cleanroom for microreactor manufacture is presented.
基金financially supported by the Scientific and Technology Project of State Grid Corporation of China,Research on Dry Etching Forming Technology of Silicon Carbide Device,Project No.5500-202158437A-0-0-00.
文摘The comparison of domestic and foreign studies has been utilized to extensively employ junction termination extension(JTE)structures for power devices.However,achieving a gradual doping concentration change in the lateral direction is difficult for SiC devices since the diffusion constants of the implanted aluminum ions in SiC are much less than silicon.Many previously reported studies adopted many new structures to solve this problem.Additionally,the JTE structure is strongly sensitive to the ion implantation dose.Thus,GA-JTE,double-zone etched JTE structures,and SM-JTE with modulation spacing were reported to overcome the above shortcomings of the JTE structure and effectively increase the breakdown voltage.They provided a theoretical basis for fabricating terminal structures of 4H-SiC PiN diodes.This paper summarized the effects of different terminal structures on the electrical properties of SiC devices at home and abroad.Presently,the continuous development and breakthrough of terminal technology have significantly improved the breakdown voltage and terminal efficiency of 4H-SiC PiN power diodes.
