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X-ray Powder Diffraction Pattern of Bi_4(SiO_4)_3
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作者 Hongchao LIU Changlin KUO (Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050, China) 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 1997年第2期145-148,共4页
In cooperation with figure-of-merits the Rietveld analysis can appraise both angular and intensity data of powder diffraction. In this work, X-ray diffraction pattern of Bi4(SiO4)3 was redetermined with intensity figu... In cooperation with figure-of-merits the Rietveld analysis can appraise both angular and intensity data of powder diffraction. In this work, X-ray diffraction pattern of Bi4(SiO4)3 was redetermined with intensity figure-of-merits, which qualify agreement between observed and calculated relative intensities. F30 is 158.90 (0.0059, 32), intensity figure of merit Rint is 8.7, I20(17), 8.0. The values of figure-of-merits show that the data of JCPDS cards are distorted. Both the experimental and calculated peak positions and heights are listed in detail. 展开更多
关键词 SiO4 X-ray powder diffraction pattern of Bi4 BI
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IDENTIFICATION AND SIMULATION OF X-RAY POWDER DIFFRACTION PATTERN
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作者 Shao Fan LIN Xiang Jun LU Wei Fan ZHENG 《Chinese Chemical Letters》 SCIE CAS CSCD 1991年第11期873-876,共4页
A new method for pattern identification and simulation of X-ray powder diffraction data is described, which can give definite phase composition of the unknown rapidly and correctly. The method is implemented in Micros... A new method for pattern identification and simulation of X-ray powder diffraction data is described, which can give definite phase composition of the unknown rapidly and correctly. The method is implemented in Microsoft Fortran 77 for the IBM PC/XT/AT personal computer or their compatibles. 展开更多
关键词 IDENTIFICATION AND SIMULATION OF X-RAY powder diffraction pattern
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