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Using modified Mach-Zehnder interferometer to get better nonlinear correction term of an isotropic nonlinear material
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作者 Ashish Pal Sourangshu Mukhopadhyay 《Chinese Optics Letters》 SCIE EI CAS CSCD 2009年第7期624-626,共3页
Nonlinear materials have been well established as photo refractive switching material. Important applica- tions of isotropic nonlinear materials are seen in self-focusing, defocusing phenomena, switching systems, etc.... Nonlinear materials have been well established as photo refractive switching material. Important applica- tions of isotropic nonlinear materials are seen in self-focusing, defocusing phenomena, switching systems, etc. The nonlinear correction term is basically responsible for the optical switches. Mach-Zehnder inter- ferometer (MZI) is a well-known arrangement for determining the above correction term, but there are some major problems for finding out the term by MZI. We propose a new method of finding the nonlinear correction term as well as the second order nonlinear susceptibility of the materials by using a modified MZI system. This method may be used to find out the above parameters for any unknown nonlinear material. 展开更多
关键词 Using modified Mach-Zehnder interferometer to get better nonlinear correction term of an isotropic nonlinear material EOM MZI
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