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A water probe for direct pH measurement of individual particles via micro-Raman spectroscopy
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作者 Xiaoyu Cui Mingjin Tang Tong Zhu 《Journal of Environmental Sciences》 2025年第3期200-208,共9页
The acidity of atmospheric aerosols influences fundamental physicochemical processes that affect climate and human health.We recently developed a novel and facilewater-probebased method for directly measuring of the p... The acidity of atmospheric aerosols influences fundamental physicochemical processes that affect climate and human health.We recently developed a novel and facilewater-probebased method for directly measuring of the pH for micrometer-size droplets,providing a promising technique to better understand aerosol acidity in the atmosphere.The complex chemical composition of fine particles in the ambient air,however,poses certain challenges to using a water-probe for pH measurement,including interference from interactions between compositions and the influence of similar compositions on water structure.To explore the universality of our method,it was employed to measure the pH of ammonium,nitrate,carbonate,sulfate,and chloride particles.The pH of particles covering a broad range(0–14)were accurately determined,thereby demonstrating that our method can be generally applied,even to alkaline particles.Furthermore,a standard spectral library was developed by integrating the standard spectra of common hydrated ions extracted through the waterprobe.The library can be employed to identify particle composition and overcome the spectral overlap problem resulting from similar effects.Using the spectral library,all ions were identified and their concentrations were determined,in turn allowing successful pH measurement of multicomponent(ammonium-sulfate-nitrate-chloride)particles.Insights into the synergistic effect of Cl^(–),NO_(3)^(–),and NH_(4)^(+)depletion obtained with our approach revealed the interplay between pH and volatile partitioning.Given the ubiquity of component partitioning and pH variation in particles,the water probemay provide a new perspective on the underlying mechanisms of aerosol aging and aerosol–cloud interaction. 展开更多
关键词 Particle pH Water probe Standard spectral library micro-raman spectroscopy Direct measurement
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中煤级煤Micro-Raman结构对甲烷吸附的响应 被引量:1
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作者 陈小珍 李美芬 曾凡桂 《煤炭学报》 EI CAS CSCD 北大核心 2022年第7期2678-2686,共9页
煤与甲烷、二氧化碳等流体作用后的体积膨胀及其机制一直是煤层气地质学和煤与瓦斯突出防治研究中的重要课题之一。以往的研究主要集中在宏观吸附膨胀及变形,并从力学的角度解释其膨胀机制。实际上,煤作为由大分子构成的分子体系,与甲... 煤与甲烷、二氧化碳等流体作用后的体积膨胀及其机制一直是煤层气地质学和煤与瓦斯突出防治研究中的重要课题之一。以往的研究主要集中在宏观吸附膨胀及变形,并从力学的角度解释其膨胀机制。实际上,煤作为由大分子构成的分子体系,与甲烷、二氧化碳的相互作用是一种分子现象,其膨胀变形的本质应该是分子体系发生了变化,因此揭示煤大分子结构对煤体吸附膨胀的响应特征是认识其机制的基础。应用显微-拉曼光谱法对吸附甲烷前后的8个中煤级煤样(镜质组最大反射率R_(o)=1.08%~1.80%)进行了结构表征,并运用Origin 8.5软件对煤样吸附甲烷前后的拉曼光谱曲线进行了分峰拟合,在此基础上计算了煤样吸附前后的拉曼光谱结构参数。结果表明:原煤和吸附煤的G峰与D峰的峰位差d(G-D)随着煤级的增加有增大趋势,G峰半峰宽(FWHM-G)呈减小趋势,表明在反射率1.08%~1.80%阶段,煤结构有序度和微晶尺寸随煤级增加而逐渐增加;大芳香环(≥6)的相对含量(A_(D)/A_(G))出现先增加后减小的趋势,这是以较大芳香环的生成为主转为向石墨结构生成为主的结果;随着煤级增加,原煤的大芳香环结构中“杂质”(A_(S)/A_(D))及氢化芳环上的C—C的含量(A_(S)/A_(total))均有减小的趋势,反映出煤结构中sp^(2)-sp^(3)杂化烷基碳或氢化芳环逐渐减少,有序度逐渐增加;当R_(o)>1.3%时,吸附煤相对原煤的d(G-D)及A_(D)/A_(G)减少,小芳香环相对含量(A_(GR+VR+VL)/A_(D)),A_(S)/A_(D),A_(S)/A_(total)和FWHM-G增加,表明甲烷吸附变形引起环数较大的芳香环和微晶结构破裂形成较小的芳香环。这一结果对于认识煤大分子结构与甲烷的相互作用机制提供了理论依据。 展开更多
关键词 micro-raman 吸附变形 结构演化 中煤级煤 西山煤田
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Measurement of residual stress in a multi-layer semiconductor heterostructure by micro-Raman spectroscopy 被引量:15
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作者 Wei Qiu Cui-Li Cheng +7 位作者 Ren-Rong Liang Chun-Wang Zhao Zhen-Kun Lei Yu-Cheng Zhao Lu-Lu Ma Jun Xu Hua-Jun Fang Yi-Lan Kang 《Acta Mechanica Sinica》 SCIE EI CAS CSCD 2016年第5期805-812,共8页
Si-based multilayer structures are widely used in current microelectronics. During their preparation, some inhomogeneous residual stress is induced, resulting in competition between interface mismatching and surface e... Si-based multilayer structures are widely used in current microelectronics. During their preparation, some inhomogeneous residual stress is induced, resulting in competition between interface mismatching and surface energy and even leading to structure failure. This work presents a methodological study on the measurement of residual stress in a multi-layer semiconductor heterostructure. Scanning electron microscopy(SEM), micro-Raman spectroscopy(MRS), and transmission electron microscopy(TEM) were applied to measure the geometric parameters of the multilayer structure. The relationship between the Raman spectrum and the stress/strain on the [100] and [110] crystal orientations was determined to enable surface and crosssection residual stress analyses, respectively. Based on the Raman mapping results, the distribution of residual stress along the depth of the multi-layer heterostructure was successfully obtained. 展开更多
关键词 Residual stress Multi-layer semiconductor heterostructure micro-raman spectroscopy(MRS) Strained silicon Germanium silicon
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Using X-ray computed tomography and micro-Raman spectrometry to measure individual particle surface area, volume, and morphology towards investigating atmospheric heterogeneous reactions 被引量:1
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作者 Mingjin Wang Nan Zheng +6 位作者 Tong Zhu Jing Shang Ting Yu Xiaojuan Song Defeng Zhao Yong Guan Yangchao Tian 《Journal of Environmental Sciences》 SCIE EI CAS CSCD 2018年第7期23-32,共10页
Heterogeneous reactions on the aerosol particle surface in the atmosphere play important roles in air pollution, climate change, and global biogeochemical cycles. However, the reported uptake coefficients of heterogen... Heterogeneous reactions on the aerosol particle surface in the atmosphere play important roles in air pollution, climate change, and global biogeochemical cycles. However, the reported uptake coefficients of heterogeneous reactions usually have large variations and may not be relevant to real atmospheric conditions. One of the major reasons for this is the use of bulk samples in laboratory experiments, while particles in the atmosphere are suspended individually. A number of technologies have been developed recently to study heterogeneous reactions on the surfaces of individual particles. Precise measurements on the reactive surface area, volume, and morphology of individual particles are necessary for calculating the uptake coefficient, quantifying reactants and products, and understanding the reaction mechanism better. In this study, for the first time we used synchrotron radiation X-ray computed tomography(XCT) and micro-Raman spectrometry to measure individual CaCO_3 particle morphology, with sizes ranging from 3.5–6.5 μm. Particle surface area and volume were calculated using a reconstruction method based on software threedimensional(3-D) rendering. The XCT was first validated with high-resolution fieldemission scanning electron microscopy(FE-SEM) to acquire accurate CaCO_3 particle surface area and volume estimates. Our results showed an average difference of only 6.1% in surface area and 3.2% in volume measured either by micro-Raman spectrometry or X-ray tomography. X-ray tomography and FE-SEM can provide more morphological details of individual Ca CO3 particles than micro-Raman spectrometry. This study demonstrated that X-ray computed tomography and micro-Raman spectrometry can precisely measure the surface area, volume, and morphology of an individual particle. 展开更多
关键词 Heterogeneous reactions Individual CaCO3 particle micro-raman spectrometry Synchrotron radiation X-ray computed tomography MORPHOLOGY Surface area VOLUME
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Comparison between Double Crystals X-ray Diffraction and Micro-Raman Measurement on Composition Determination of High Ge Content Si_(1-x)Ge_(x) Layer Epitaxied on Si Substrate 被引量:1
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作者 Lei ZHAO Yuhua ZUO Buwen CHENG Jinzhong YU Qiming WANG 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2006年第5期651-654,共4页
It is important to acquire the composition of Si1-xGex layer, especially that with high Ge content, epitaxied on Si substrate. Two nondestructive examination methods, double crystals X-ray diffraction (DCXRD) and mi... It is important to acquire the composition of Si1-xGex layer, especially that with high Ge content, epitaxied on Si substrate. Two nondestructive examination methods, double crystals X-ray diffraction (DCXRD) and micro-Raman measurement, were introduced comparatively to determine x value in Si1-xGex layer, which show that while the two methods are consistent with each other when x is low, the results obtained from double crystals X-ray diffraction are not credible due to the large strain relaxation occurring in Si1-xGex layers when Ge content is higher than about 20%. Micro-Raman measurement is more appropriate for determining high Ge content than DCXRD. 展开更多
关键词 Si1-xGex Ge content Composition determination Double crystals X-ray diffraction (DCXRD) micro-raman measurement
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Development of in-situ Micro-Raman spectroscopy system for autoclave experimental apparatus 被引量:1
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作者 Lin Chen Heping Li +3 位作者 Shengbin Li Liping Xu Sen Lin Hongbin Zhou 《Acta Geochimica》 EI CAS CSCD 2020年第4期445-450,共6页
We developed a set of in-situ Micro-Raman spectroscopy system for autoclave experimental apparatus because of the scientific significance of in-situ Micro-Raman spectroscopy system under the high-pressure hydrothermal... We developed a set of in-situ Micro-Raman spectroscopy system for autoclave experimental apparatus because of the scientific significance of in-situ Micro-Raman spectroscopy system under the high-pressure hydrothermal condition.We used this system to measure the Raman spectrum of water-fluid and quartz crystal at the temperature ranging from 125 to 420℃.The signal-tonoise ratio of the Raman signal is good. 展开更多
关键词 micro-raman Hydrothermal system IN-SITU AUTOCLAVE
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Low-energy(40 keV)proton irradiation of YBa_(2)Cu_(3)O_(7-x)thin films:Micro-Raman characterization and electrical transport properties
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作者 San-Sheng Wang Fang Li +8 位作者 Han Wu Yu Zhang Suleman Muhammad Peng Zhao Xiao-Yun Le Zhi-Song Xiao Li-Xiang Jiang Xue-Dong Ou Xiao-Ping Ouyang 《Chinese Physics B》 SCIE EI CAS CSCD 2019年第2期406-413,共8页
To investigate the damage profiles of high-fluence low-energy proton irradiation on superconducting materials and related devices,Raman characterization and electrical transport measurement of 40-keV-proton irradiated... To investigate the damage profiles of high-fluence low-energy proton irradiation on superconducting materials and related devices,Raman characterization and electrical transport measurement of 40-keV-proton irradiated YBa_(2)Cu_(3)O_(7-x)(YBCO)thin films are carried out.From micro-Raman spectroscopy and x-ray diffraction studies,the main component of proton-radiation-induced defects is found to be the partial transition of superconducting orthorhombic phase to the semiconducting tetragonal phase and non-superconducting secondary phase.The results indicate that the defects induced in the conducting CuO_(2) planes,such as increased oxygen vacancies and interstitials,can result in an increase in the resistivity but a decrease in the transition temperature TCwith the increase in the fluence of proton irradiation,which is confirmed in the electrical transport measurements.Especially,zero-resistance temperature TC_(0) is not observed at a fluence of 10^(15)p/cm^(2).Furthermore,the variation of activation energy U_(0) can be explained by the plastic-flux creep theory,which indicates that the plastic deformation and entanglement of vortices in a weakly pinned vortex liquid are caused by disorders of point-like defects.Point-like disorders are demonstrated to be the main contribution to the low-energy proton radiation damage in YBCO thin films.These disorders are likely to cause flux creep by thermally assisted flux flow,which may increase noise and reduce the precision of superconducting devices. 展开更多
关键词 SUPERCONDUCTORS PROTON radiation micro-raman spectra electrical transport
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A polarized micro-Raman study of a 0.65PbMg_(1/3)Nb_(2/3)O_3-0.35PbTiO_3 single crystal
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作者 Zhang Li-Yan Zhu Ke Liu Yu-Long 《Chinese Physics B》 SCIE EI CAS CSCD 2012年第1期482-487,共6页
Polarized micro-Raman spectra of a 0.65PbMgl/3Nb2/303 0.35PbTiO3 (0.65PMN-0.35PT) single crystal poled in the [001] direction are obtained in a wide frequency range (50 2000 cm^-1) at different temperatures. The b... Polarized micro-Raman spectra of a 0.65PbMgl/3Nb2/303 0.35PbTiO3 (0.65PMN-0.35PT) single crystal poled in the [001] direction are obtained in a wide frequency range (50 2000 cm^-1) at different temperatures. The best fit to the Raman spectrum at 77 K is achieved using 17 Lorenzians to convolute into it, and this is proved to be a reasonable fit. According to the group theory and selection rules of overtone and combinational modes, apart from the seven Raman modes that are from first-order Raman scattering, the remaining ones are attributed to being from second-order Raman scattering. A comparison between the experimental results and theoretical predictions shows that they are in satisfactory agreement with each other. Our results indicate that at 77 K the sample belongs to the rhombohedral symmetry with the C^53v(R3m) space group (Z = 1). In our study, on heating, the 0.65PMN 0.35PT single crystal undergoes a rhombohedral → tetragonal → cubic phase transition sequence. The two phase transitions occur at 340 and 440 K, which correspond to the disappearance of the soft mode near 106 cm-1 recorded in VV polarization and the vanishing of the band around 780 cm^-1 in VH polarization, respectively. 展开更多
关键词 0.65PMN-0.35PT polarized micro-raman second-order Raman scattering phase tran-sition
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Study of Thermal Conductivity of Porous Silicon Using the Micro-Raman Method
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作者 Amaria Ould-Abbas Mama Bouchaour Nasr-Eddine Chabane Sari 《Open Journal of Physical Chemistry》 2012年第1期1-6,共6页
In this work, we are interesting in the measurement of thermal conductivity (on the surface and in-depth) of Porous silicon by the micro-Raman spectroscopy. This direct method (micro-Raman spectroscopy) enabled us to ... In this work, we are interesting in the measurement of thermal conductivity (on the surface and in-depth) of Porous silicon by the micro-Raman spectroscopy. This direct method (micro-Raman spectroscopy) enabled us to develop a systematic means of investigation of the morphology and the thermal conductivity of Porous silicon oxidized or no. The thermal conductivity is studied according to the parameters of anodization and fraction of silicon oxidized. Thermal transport in the porous silicon layers is limited by its porous nature and the blocking of transport in the silicon skeleton what supports its use in the thermal sensors. 展开更多
关键词 Mono-Crystal SILICON POROUS SILICON Thermal CONDUCTIVITY micro-raman Spectroscopy
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Micro-Raman and SEM Analysis of Minerals from the Darhib Mine, Egypt
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作者 Giuliana Gatto Rotondo Larysa Darchuk +1 位作者 Marcel Swaenen René Van Grieken 《Journal of Analytical Sciences, Methods and Instrumentation》 2012年第1期42-47,共6页
The Darhib mine is one of the several talc deposits in the Hamata area of southeastern Egypt. Several specimens of minerals coming from this mine were subjected to complementary investigation by micro-Raman spectromet... The Darhib mine is one of the several talc deposits in the Hamata area of southeastern Egypt. Several specimens of minerals coming from this mine were subjected to complementary investigation by micro-Raman spectrometry and scanning electron microscopy. The difficulty in their identification is the appearance of most of them: they are all very small and only visible under the mineral binocular microscope(×10 - ×40). They appear as small crystals in fissures and holes and a visual determination on colour and crystal gives only a guess of what kind of mineral it could be. Therefore, only after analyzing them by micro-Raman and scanning electron microscopy it was possible to identify their structure and they can be divided in three main groups: one is quite generic and several minerals of different species were identified, such as quartz, talc, mottramite and chrysocolla, very common in the talc mine (these ones are Si-based minerals);the other one is constituted by four samples which are Zn and/or Cu rich, which means minerals of the rosasite or aurichalcite groups;the last group is constituted by two samples containing mainly Pb.. 展开更多
关键词 MINERALS micro-raman SEM TALC Mines
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不同煤级煤纳米力学性能的Micro-Raman结构响应 被引量:4
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作者 韩雅婷 孙蓓蕾 《煤矿安全》 CAS 北大核心 2022年第11期7-14,共8页
煤的力学性质具有非均质性及多尺度效应,从纳米尺度认识煤力学性质及与其组成结构之间的关系,是理解煤储层的压裂改造机制及裂纹扩展机理的关键。利用原子力显微镜和显微拉曼对不同煤级煤的镜质组进行测试,获得煤样的力学和结构参数。... 煤的力学性质具有非均质性及多尺度效应,从纳米尺度认识煤力学性质及与其组成结构之间的关系,是理解煤储层的压裂改造机制及裂纹扩展机理的关键。利用原子力显微镜和显微拉曼对不同煤级煤的镜质组进行测试,获得煤样的力学和结构参数。结果表明:镜质组的弹性模量E在0.66~7.58 GPa之间,且弹性模量随镜质组最大反射率Ro的增加而增加;同时随着Ro的增大,拉曼结构参数呈现有规律的变化;将弹性模量E与拉曼结构参数建立关系,发现(G-D)峰位差、多环芳烃的相对含量与致弹性模量均呈现明显的正相关关系,FWHM-G与E呈现负相关关系,反映了结构有序度的增加会导致弹性模量增大,表明随着成熟度的增加,促使大分子结构排列紧密且分子间作用力增大,导致弹性模量也随之增大。 展开更多
关键词 煤储层压裂 煤结构 原子力显微镜 显微拉曼 纳米力学性能
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Micro-Raman Spectroscopy for Stress Evaluation of 3C-SiC Epitaxially Grown on Si Substrate by Hot Wall CVD
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作者 ZHUWen-liang ZHUJi-liang PEZZOTTIGiuseppe 《材料热处理学报》 EI CAS CSCD 北大核心 2004年第05B期803-806,共4页
A series of cubic SiC single crystals were heteroepitaxially grown by the hot-wall chemical vapor deposition (CVD) using a HMDS-C3H8-H2 system on 2 inch silicon substrates with the orientations of (100), (111), (110) ... A series of cubic SiC single crystals were heteroepitaxially grown by the hot-wall chemical vapor deposition (CVD) using a HMDS-C3H8-H2 system on 2 inch silicon substrates with the orientations of (100), (111), (110) and (211), respectively. Even though an initial carbonization was carried out to reduce the large lattice mismatch, residual stress could not be completely relieved, partly also due to the difference of their thermal expansion coefficients. Raman scattering studies for the specimens were performed to estimate the internal stress in the SiC epilayer and the substrate. Raman spectra were mapped out on the sample surface as well as on the cross section using an automated x-y stage with a spatial resolution capable of 100 nm. For all the samples, two Raman peaks corresponding to the transverse optical (TO) and longitudinal optical (LO) phonon modes were observed, even though the intensity varied with the polarization configurations. In the SiC epilayers, tensile stresses decrease away from the interface, while compressive stresses exist in the substrate, with the magnitudes dependent on the growth orientation. The lattice strains were discussed in terms of the elastic deformation theory for the comparison. 展开更多
关键词 显微喇曼光谱学 应力测定 3C-SIC 热壁CVD 外延生长
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浑源窑黑釉剔花与黑釉瓷物化组成与制备工艺
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作者 王甜 宋思樾 +6 位作者 王秀玲 侯亮亮 王芬 王莹 李强 罗宏杰 朱建锋 《硅酸盐学报》 北大核心 2025年第1期125-135,共11页
通过对比研究浑源窑黑釉剔花瓷与黑釉瓷的胎釉微观形貌、晶体种类及分布、釉玻璃相结构及釉中铁元素价态,解析胎釉的原料特点与釉的呈色机理,揭示剔花瓷与黑釉瓷的制备工艺的异同。结果表明:二者胎釉采用相似原料与烧成工艺,但剔花瓷釉... 通过对比研究浑源窑黑釉剔花瓷与黑釉瓷的胎釉微观形貌、晶体种类及分布、釉玻璃相结构及釉中铁元素价态,解析胎釉的原料特点与釉的呈色机理,揭示剔花瓷与黑釉瓷的制备工艺的异同。结果表明:二者胎釉采用相似原料与烧成工艺,但剔花瓷釉中更高的CaO,在胎釉结构处分布的钙长石结晶层,有效增加了花纹与胎体的结合性;黑釉剔花瓷胎相对釉具有更高浓度TiO_(2)和更低浓度Mn O_(2)与Fe_(2)O_(3),使得剔花装饰形成强烈的黑白对比,具有浮雕之感。釉面分布的枝状ε-Fe_(2)O_(3)晶体,有效提高了釉面光泽度,进一步增强了装饰效果。此外,釉面还发现少量黑色镁铁尖晶石。 展开更多
关键词 浑源窑 黑釉剔花瓷 原料特征 制备工艺 显微共聚焦Raman光谱
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面向超薄硅晶圆精密磨削工艺的内部残余应力分析
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作者 熊正权 窦筠雯 +4 位作者 陈颖 高能 黄银 朱旻昊 冯雪 《表面技术》 北大核心 2025年第2期161-172,共12页
目的硅基集成电路的超薄化(通常厚度≤50μm)是高性能集成器件实现柔性化的关键,同时也满足了器件先进封装的需求。背面精密磨削是低成本、大规模制造超薄硅基集成电路的重要技术路径。然而,随着厚度的降低,本征硬脆的硅基器件的机械强... 目的硅基集成电路的超薄化(通常厚度≤50μm)是高性能集成器件实现柔性化的关键,同时也满足了器件先进封装的需求。背面精密磨削是低成本、大规模制造超薄硅基集成电路的重要技术路径。然而,随着厚度的降低,本征硬脆的硅基器件的机械强度急剧下降,磨削的难度也极大增加。此外,当器件的厚度接近甚至低于有源层厚度(约为15μm)时,磨削过程中产生的缺陷和内部残余应力将严重影响超薄器件的性能和良品率。因此,控制磨削过程的缺陷和内部残余应力是突破超薄柔性硅基集成电路制备技术的关键,非常有必要深入分析超薄硅晶圆精密磨削产生的内部残余应力,建立起工艺参数与内部残余应力之间的定量关系。方法针对精密磨削工艺,基于磨轮与硅晶圆的几何运动学关系,将磨轮进给率对磨削过程的影响转变为对等效磨削深度的影响,建立了硅晶圆在单颗磨粒单次和多颗磨粒多次磨削下的有限元局部模型,探讨了工艺参数(磨轮转速、磨轮进给率、磨粒尺寸)、磨粒数量和磨削次数对磨削后的表面质量和内部残余应力的影响,开展了12英寸硅晶圆的自旋转精密磨削实验验证仿真。结果硅晶圆精密磨削后的内部残余应力主要集中于距离硅片表面约50nm处,并沿深度方向快速减小。降低磨轮进给率和减小磨粒尺寸可以有效降低内部残余应力,提高表面质量。使硅片磨削后的表面及内部区域近似处于等双轴压缩应力状态,当磨轮进给率为0.5、0.35和0.2μm/s时,通过激光共聚焦显微拉曼光谱仪测得残余应力分别为(-185±33)、(-216±25)和(283±41)MPa,多颗磨粒多次磨削有限元仿真获得的残余应力分别为(-127±32)、(-171±43)和(-221±55)MPa,二者吻合较好。结论将磨轮进给率转变为等效磨削深度后,建立的多颗磨粒多次精密磨削有限元模型可以有效预测硅晶圆自旋转精密磨削的内部残余应力,为硅基集成电路薄化工艺的开发和优化提供了指导。 展开更多
关键词 硅晶圆 超薄 精密磨削 内部残余应力 有限元仿真 显微拉曼实验
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拉曼光谱技术在环境微纳塑料检测中的应用与挑战 被引量:1
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作者 叶轲夫 谢敏捷 +2 位作者 陈兴祺 朱治宇 高士祥 《化学进展》 北大核心 2025年第1期2-15,共14页
本文综述了拉曼光谱技术用于检测环境中微纳塑料的优势及研究进展。随着微塑料污染问题的加剧,尤其是其在水生和陆生环境中广泛存在,拉曼光谱作为一种非破坏性、高分辨率的分析技术,因其独特的光谱特征及相较于红外光谱不易受到水的干扰... 本文综述了拉曼光谱技术用于检测环境中微纳塑料的优势及研究进展。随着微塑料污染问题的加剧,尤其是其在水生和陆生环境中广泛存在,拉曼光谱作为一种非破坏性、高分辨率的分析技术,因其独特的光谱特征及相较于红外光谱不易受到水的干扰,在微纳塑料的识别和定量分析中得到广泛应用。拉曼光谱技术在微纳塑料检测中的优势主要体现在其高空间分辨率、宽光谱覆盖范围和高灵敏度;而其在检测过程中面临的挑战包括荧光干扰和信噪比低等问题。多种方法被用于优化拉曼信号,包括样品前处理、表面增强拉曼光谱(SERS)和非线性拉曼光谱技术等。此外,本文强调了构建全面的拉曼光谱数据库的重要性,以提高检测的准确性和效率。未来的研究方向包括开发更高效的预处理技术、动态监测微纳塑料行为以及智能化检测系统的应用。 展开更多
关键词 拉曼光谱 微纳塑料 定性识别 定量检测 信号增强优化 机器学习
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拉曼光谱成像在牙本质粘接界面研究中的应用
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作者 毕超 刘双双 +3 位作者 洪晓黎 许佳佳 李英娘 杨晨 《实验室研究与探索》 北大核心 2025年第1期39-43,共5页
采用共焦显微拉曼光谱成像技术,以黏接剂-牙本质粘接界面为研究对象,探究非均相体系的化学组成与空间分布。对牙本质与黏接剂分别进行拉曼光谱采集,识别两者的特征峰。对粘接界面某一区域进行拉曼光谱扫描,采用单变量拉曼成像分析法,揭... 采用共焦显微拉曼光谱成像技术,以黏接剂-牙本质粘接界面为研究对象,探究非均相体系的化学组成与空间分布。对牙本质与黏接剂分别进行拉曼光谱采集,识别两者的特征峰。对粘接界面某一区域进行拉曼光谱扫描,采用单变量拉曼成像分析法,揭示粘接界面中牙本质矿物质、牙本质胶原成分和黏接剂特征官能团的空间关系与分布;采用多变量拉曼成像分析法,由基于随机森林特征选择的加权模糊C均值聚类算法对高维光谱数据集进行聚类分析,区分粘接界面中牙本质、部分脱矿牙本质、裸露胶原基质、混合层与黏接剂并进行可视化展示。共焦显微拉曼光谱成像技术能够无损、高分辨率地揭示黏接剂-牙本质粘接界面的化学结构和微观形貌,为评估和优化牙本质粘接修复效果提供一种手段。 展开更多
关键词 牙本质 黏接剂 共焦显微拉曼光谱 拉曼成像
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面向鱼油掺假的ElasticNet定量反演算法和拉曼光谱检测研究 被引量:1
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作者 路玉君 徐刚 刘华东 《光散射学报》 北大核心 2025年第1期60-68,共9页
鱼油是目前大众消费追求的保健品之一,国内鱼油消费市场的体量也与日俱增,鱼油的掺假行为也日益突出。为实现鱼油掺假行为的量化分析,本文提出了一种基于近红外显微拉曼光谱技术结合ElasticNet定量反演算法实现不同动物油脂掺假鱼油的... 鱼油是目前大众消费追求的保健品之一,国内鱼油消费市场的体量也与日俱增,鱼油的掺假行为也日益突出。为实现鱼油掺假行为的量化分析,本文提出了一种基于近红外显微拉曼光谱技术结合ElasticNet定量反演算法实现不同动物油脂掺假鱼油的研究工作。详细开展了不同动物油拉曼光谱特征峰的分析,分别建立牛油、猪油、羊油及鸡油掺假鱼油的拉曼光谱数据库,并建立了与之对应的ElasticNet定量反演模型,结果表明4个定量模型对测试集预测的R^(2)分别为0.9848、0.9876、0.9886及0.9880,RMSE分别为0.0389、0.0352、0.0339及0.0347。因此,面向鱼油掺假问题,本文提出的ElasticNet定量反演算法和拉曼光谱相结合的技术方法对鱼油质量检测领域具有重要的借鉴价值和研究意义,该方法可指导未来鱼油检测的现场原位快检应用。 展开更多
关键词 弹性网络回归 显微拉曼光谱 鱼油 定量分析 掺假分析
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显微拉曼在微塑料检测中的参数优化与适用性研究
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作者 王佳敏 邹文奇 +2 位作者 汤庆峰 刘艳 高峡 《中国无机分析化学》 北大核心 2025年第7期1011-1026,共16页
微塑料污染因其广泛的环境分布与潜在生态风险,已成为全球环境领域的研究热点,然而传统测试方法(如傅里叶变换红外光谱)受限于空间分辨率和灵敏度,难以满足复杂微塑料的高效检测需求。为此,通过系统优化显微拉曼光谱法的关键参数,并综... 微塑料污染因其广泛的环境分布与潜在生态风险,已成为全球环境领域的研究热点,然而传统测试方法(如傅里叶变换红外光谱)受限于空间分辨率和灵敏度,难以满足复杂微塑料的高效检测需求。为此,通过系统优化显微拉曼光谱法的关键参数,并综合评价其对不同属性微塑料的适用性,通过实验对比物镜放大倍数、激光波长、激光强度、积分时间、累计次数及基底等参数,分别建立了单点与自动检测模式下的最优条件组合:1)单点测试时,推荐的测试条件为物镜放大倍数20X、激光波长532 nm、激光强度10 mW、积分时间5 s、累计次数3次。2)自动检测时,推荐的测试条件物镜放大倍数20X、激光波长532 nm、积分时间2 s、累计次数1次、以金膜为基底。进一步验证表明,显微拉曼可检测最小尺寸为2.4μm的微塑料,并适用于多种成分、颜色及形态的微塑料精准识别。显微拉曼光谱技术亦可以实现对水体中微塑料成分、形状、大小和颜色等多种特性的分析。研究成果为复杂环境介质中微塑料的高灵敏度检测提供了参数优化方案与技术支撑,推动了微塑料污染监测与风险评估方法的发展。 展开更多
关键词 显微拉曼光谱法 微塑料检测 参数优化 适用性评价
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The 2-axis stress component decoupling of {100} c-Si by using oblique backscattering micro-Raman spectroscopy 被引量:3
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作者 DongHui Fu XiaoYong He +4 位作者 LuLu Ma HuaDan Xing Tian Meng Ying Chang Wei Qiu 《Science China(Physics,Mechanics & Astronomy)》 SCIE EI CAS CSCD 2020年第9期51-57,共7页
With the application of strain engineering in microelectronics,complex stress states are introduced into advanced semiconductor devices.However,there is still a lack of effective metrology for the decoupling analysis ... With the application of strain engineering in microelectronics,complex stress states are introduced into advanced semiconductor devices.However,there is still a lack of effective metrology for the decoupling analysis of the complex stress states in semiconductor materials.This paper presents an investigation on the 2-axis stress component decoupling of{100}monocrystalline silicon(c-Si)by using oblique backscattering micro-Raman spectroscopy.A spectral-mechanical model was established,and two practicable methods for actual stress decoupling analyses were proposed.The verification experiments demonstrated the correctness and applicability of the methods proposed in this paper. 展开更多
关键词 {100}c-Si stress component decoupling oblique backscattering micro-raman spectroscopy
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Investigation on the laser ablation of SiC ceramics using micro-Raman mapping technique 被引量:3
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作者 Chaoli FU Yong YANG +4 位作者 Zhengren HUANG Guiling LIU Hui ZHANG Fang JIANG Yuquan WEI 《Journal of Advanced Ceramics》 CSCD 2016年第3期253-261,共9页
Research on the laser ablation behavior of SiC ceramics has great significance for the improvement of their anti-laser ability as high-performance mirrors in space and lasers, or the laser surface micro-machining tech... Research on the laser ablation behavior of SiC ceramics has great significance for the improvement of their anti-laser ability as high-performance mirrors in space and lasers, or the laser surface micro-machining technology as electronic components in micro-electron mechanical systems (MEMS). In this work, the laser ablation of SiC ceramics has been performed by using laser pulses of 12 ns duration at 1064 nm. The laser induced damage threshold (LIDT) below 0.1 J/cm(2) was obtained by 1-on-1 mode and its damage morphology appeared in the form of 'burning crater' with a clear boundary. Micro-Raman mapping technique was first introduced in our study on the laser ablation mechanisms of SiC surface by identifying physical and chemical changes between uninjured and laser-ablated areas. It has been concluded that during the ablation process, SiC surface mainly underwent decomposition to the elemental Si and C, accompanied by some transformation of crystal orientation. The oxidation of SiC also took place but only in small amount on the edges of target region, while there was no hint of SiO2 in the center with higher energy density, maybe because of deficiency of O-2 atmosphere in the ablated area, elimination of SiO2 by carbon at 1505 degrees C, or evaporating at 2230 degrees C. 展开更多
关键词 silicon carbide (SiC) laser ablation micro-raman mapping technique DECOMPOSITION OXIDATION
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