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Characteristics of blocking voltage for power 4H-SiC BJTs with mesa edge termination
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作者 张倩 张玉明 张义门 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2010年第7期41-45,共5页
According to the avalanche ionization theory,a computer-based analysis is performed to analyze the structural parameters of single-and multiple-zone junction termination extension(JTE) structures for 4H-SiC bipolar ... According to the avalanche ionization theory,a computer-based analysis is performed to analyze the structural parameters of single-and multiple-zone junction termination extension(JTE) structures for 4H-SiC bipolar junction transistors(BJTs) with mesa structure.The calculation results show that a single-zone JTE can yield high breakdown voltages if the activated JTE dose and the implantation width are controlled precisely and a multiple-zone JTE method can decrease the peak surface field while still maintaining a high blocking capability.The influences of the positive and negative surface or interface states on the blocking capability are also shown.These conclusions have a realistic meaning in optimizing the design of a mesa power device. 展开更多
关键词 4H-SIC BJTs blocking voltage junction termination extension mesa device
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