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Efficiency Analysis of the Autofocusing Algorithm Based on Orthogonal Transforms
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作者 Przemyslaw Sliwinski Krzysztof Berezowski +1 位作者 Piotr Patronik Pawel Wachel 《Journal of Computer and Communications》 2013年第6期41-45,共5页
Efficiency of the autofocusing algorithm implementations based on various orthogonal transforms is examined. The algorithm uses the variance of an image acquired by a sensor as a focus function. To compute the estimat... Efficiency of the autofocusing algorithm implementations based on various orthogonal transforms is examined. The algorithm uses the variance of an image acquired by a sensor as a focus function. To compute the estimate of the variance we exploit the equivalence between that estimate and the image orthogonal expansion. Energy consumption of three implementations exploiting either of the following fast orthogonal transforms: the discrete cosine, the Walsh-Hadamard, and the Haar wavelet one, is evaluated and compared. Furthermore, it is conjectured that the computation precision can considerably be reduced if the image is heavily corrupted by the noise, and a simple problem of optimal word bit-length selection with respect to the signal variance is analyzed. 展开更多
关键词 AUTO-FOCUSING image variance Discrete Orthogonal Transforms Word-Length Selection Architectural Performance Evaluation
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BEACON-automated aberration correction for scanning transmission electron microscopy using Bayesian optimization
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作者 Alexander J.Pattison Stephanie M.Ribet +6 位作者 Marcus M.Noack Georgios Varnavides Kunwoo Park Earl J.Kirkland Jungwon Park Colin Ophus Peter Ercius 《npj Computational Materials》 2025年第1期2964-2973,共10页
Aberration correction is an important aspect of modern high-resolution scanning transmission electron microscopy.Most methods of aligning aberration correctors require specialized sample regions and are unsuitable for... Aberration correction is an important aspect of modern high-resolution scanning transmission electron microscopy.Most methods of aligning aberration correctors require specialized sample regions and are unsuitable for fine-tuning aberrations without interrupting on-going experiments.Here,we present an automated method of correcting first-and second-order aberrations called BEACON,which uses Bayesian optimization of the normalized image variance to efficiently determine the optimal corrector settings.We demonstrate its use on gold nanoparticles and a hafnium dioxide thin film showing its versatility in nano-and atomic-scale experiments.BEACON can correct all firstand second-order aberrations simultaneously to achieve an initial alignment and first-and secondorder aberrations independently for fine alignment.Ptychographic reconstructions are used to demonstrate an improvement in probe shape and a reduction in the target aberration. 展开更多
关键词 scanning transmission electron microscopy first order aberrations BEACON aligning aberration correctors bayesian optimization aberration correction automated aberration correction normalized image variance
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