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Doubly periodic patterns of modulated hydrodynamic waves:exact solutions of the Davey-Stewartson system 被引量:1
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作者 J.-H. Li S.-Y. Lou K.-W. Chow 《Acta Mechanica Sinica》 SCIE EI CAS CSCD 2011年第5期620-626,共7页
Exact doubly periodic standing wave patterns of the Davey-Stewartson (DS) equations are derived in terms of rational expressions of elliptic functions.In fluid mechanics,DS equations govern the evolution of weakly n... Exact doubly periodic standing wave patterns of the Davey-Stewartson (DS) equations are derived in terms of rational expressions of elliptic functions.In fluid mechanics,DS equations govern the evolution of weakly nonlinear,free surface wave packets when long wavelength modulations in two mutually perpendicular,horizontal directions are incorporated.Elliptic functions with two different moduli (periods) are necessary in the two directions.The relation between the moduli and the wave numbers constitutes the dispersion relation of such waves.In the long wave limit,localized pulses are recovered. 展开更多
关键词 free surface waves · Periodic patterns · DaveyStewartson equations
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Thinking on Establishing Free Trade Area of Central Asia
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作者 Lunzhi He Ping Cai 《Chinese Business Review》 2003年第4期27-32,共6页
With the economic integration all over the world, it is necessary to establish the free trade area of central Asia, including Xinjiang. This paper analyses the demands on establishing free trade area in central Asia. ... With the economic integration all over the world, it is necessary to establish the free trade area of central Asia, including Xinjiang. This paper analyses the demands on establishing free trade area in central Asia. According to the present statues of Xinjiang and five countries of central Asia, the developmental patterns are suggested. Furthermore, some policies and suggestions are proposed about the existing problems. 展开更多
关键词 western development free trade area of central Asia developmental pattern suggestions
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Planarization properties of an alkaline slurry without an inhibitor on copper patterned wafer CMP 被引量:17
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作者 王辰伟 刘玉岭 +3 位作者 田建颖 牛新环 郑伟艳 岳红维 《Journal of Semiconductors》 EI CAS CSCD 2012年第11期134-138,共5页
The chemical mechanical polishing/planarization(CMP) performance of an inhibitor-free alkaline copper slurry is investigated.The results of the Cu dissolution rate(DR) and the polish rate(PR) show that the alkal... The chemical mechanical polishing/planarization(CMP) performance of an inhibitor-free alkaline copper slurry is investigated.The results of the Cu dissolution rate(DR) and the polish rate(PR) show that the alkaline slurry without inhibitors has a relatively high copper removal rate and considerable dissolution rate.Although the slurry with inhibitors has a somewhat low DR,the copper removal rate was significantly reduced due to the addition of inhibitors(Benzotriazole,BTA).The results obtained from pattern wafers show that the alkaline slurry without inhibitors has a better planarization efficacy;it can planarize the uneven patterned surface during the excess copper removal.These results indicate that the proposed inhibitor-free copper slurry has a considerable planarization capability for CMP of Cu pattern wafers,it can be applied in the first step of Cu CMP for copper bulk removal. 展开更多
关键词 planarization alkaline copper slurry inhibitor free copper pattern wafer
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