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Improvement of System Dynamic Precision by Dynamic Prediction
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作者 HU Chun -hai (Yanshan University, Qinhuangdao 066004,CHN) 《Semiconductor Photonics and Technology》 CAS 2000年第1期34-36,58,共4页
According to the characteristic of the sensor inertia, the dynamic prediction to improve the system dynamic precision is presented in this paper. With the recurrence calculation of time constant of the sensor, the sys... According to the characteristic of the sensor inertia, the dynamic prediction to improve the system dynamic precision is presented in this paper. With the recurrence calculation of time constant of the sensor, the system dynamic precision is greatly improved. The example using this method is given. 展开更多
关键词 INERTIA dynamic prediction Time constant dynamic precision
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Fluke 9640A RF Reference Source combines level precision,dynamic range,frequency capability in a single instrument
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作者 Stream lines workload enables automationof calibration procedures with MET/CAL(Plus Calibration Measurement Software 《国外电子测量技术》 2007年第1期81-81,共1页
关键词 Source RF Fluke 9640A RF Reference Source combines level precision dynamic range frequency capability in a single instrument
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Principle and key technology of generalized high precision simulation of TT&C channel
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作者 Yang Zhou Zhe Zheng Siliang Wu 《Journal of Systems Engineering and Electronics》 SCIE EI CSCD 2013年第2期318-323,共6页
A generalized simulation method of the tracking,telemetry and control(TT&C) channel,which is applicable to wideband and arbitrary radio frequency(RF) signal,is proposed.It can accurately simulate the dynamic tran... A generalized simulation method of the tracking,telemetry and control(TT&C) channel,which is applicable to wideband and arbitrary radio frequency(RF) signal,is proposed.It can accurately simulate the dynamic transmission delay of the arbitrary RF signal in channels,especially regardless of any prior knowledge including signal form,signal parameters,and so on.The proposed method orthogonally demodulates the wideband and arbitrary RF signal to complex baseband by a known local oscillator(LO) signal.Whereafter,it takes measures to obtain the delay reconstruction signal of baseband signals based on the dynamic transmission delay between a ground station and a responder.Meanwhile,it manages to obtain the delay reconstruction signal of LO signals.The simulation output signal(the delayed RF signal) can be achieved through the synthesis of the two delay reconstruction signals mentioned above.The principle and its related key technology are described in detail,and the realizable system architecture is given. 展开更多
关键词 GENERALIZATION channel simulation high precision dynamic delay reconstruction dynamic delay cancellation
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Tracking and manipulating ultrafast photocarrier dynamics in 3D Dirac semimetal Cd3As2 by chemical doping
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作者 PENG SUO WENJIE ZHANG +8 位作者 YUNKUN YANG LONG GENG CHEN WANG KAIWEN SUN XIAN LIN LI-PING LV LEI QIAO FAXIAN XIU GUOHONG MA 《Photonics Research》 2025年第4期1028-1037,共10页
Element doping can break the crystal symmetry and realize the topological phase transition in quantum materials,which enables the precise modulation of energy band structure and microscopic dynamical interaction.Herei... Element doping can break the crystal symmetry and realize the topological phase transition in quantum materials,which enables the precise modulation of energy band structure and microscopic dynamical interaction.Herein,we have studied the ultrafast photocarrier dynamics in Zn-doped 3D topological Dirac semimetal Cd_(3)As_(2)utilizing time-resolved optical pump-terahertz probe spectroscopy.Comparing to the pristine Cd_(3)As_(2),we found that the relaxation time of the lightly doped alloy is slightly shorter,while that of the heavily doped alloy exhibits a significant prolongation.Pump-fluence-and temperature-dependent transient terahertz spectroscopy indicated that in pristine and lightly doped samples within nontrivial semimetal phase,the photocarrier dynamics are dominated by the cooling of Dirac fermions.In heavily doped alloy,however,the observed longer relaxation process can be attributed to interband electron-hole recombination,which is a result of doping-induced transition into a trivial semiconductor phase.Our investigation highlights that Zn-doping is an effective and flexible scheme for engineering the electronic structure and transient carrier relaxation dynamics in Cd_(3)As_(2),and offers a control knob for functional switching between diverse optoelectronic devices within the realm of practical applications. 展开更多
关键词 precise modulation energy band structure microscopic dynamical interactionhereinwe element doping lightly doped alloy break crystal symmetry chemical doping relaxation time topological phase transition ultrafast photocarrier dynamics
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Overlay mark optimization for thick-film resist overlay metrology
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作者 朱亮 李杰 +2 位作者 周从树 顾以理 杨华岳 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2009年第6期142-146,共5页
For thick resist implant layers,such as a high voltage P well and a deep N well,systematic and uncorrectable overlay residues brought about by the tapered resist profiles were found.It was found that the tapered profi... For thick resist implant layers,such as a high voltage P well and a deep N well,systematic and uncorrectable overlay residues brought about by the tapered resist profiles were found.It was found that the tapered profile is closely related to the pattern density.Potential solutions of the manufacturing problem include hardening the film solidness or balancing the exposure density.In this paper,instead of focusing on the process change methodology,we intend to solve the issue of the overlay metrology error from the perspective of the overlay mark design.Based on the comparison of the overlay performances between the proposed overlay mark and the original design,it is shown that the optimized overlay mark target achieves better performance in terms of profiles,dynamic precision,tool induced shift(TIS),and residues.Furthermore,five types of overlay marks with dummy bars are studied,and a recommendation for the overlay marks is given. 展开更多
关键词 overlay metrology error dynamic precision tool induced shift statistical process control depth of focus exposure latitude
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