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Test Mismatch in Switched-Current Circuits Using Wavelet Analysis
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作者 郭杰荣 何怡刚 +2 位作者 刘美容 唐圣学 李宏民 《Tsinghua Science and Technology》 SCIE EI CAS 2007年第S1期229-234,共6页
Errors of mismatch and currents calibration caused by channel geometrical variety in switchedcurrent are investigated in this paper. The relation and computing of mismatch and sensitivity are discussed also, and then ... Errors of mismatch and currents calibration caused by channel geometrical variety in switchedcurrent are investigated in this paper. The relation and computing of mismatch and sensitivity are discussed also, and then a measure method of switched current mismatch using wavelet decomposition is proposed. A selected group of same transconductance is choosing as a cohort firstly, and the sensitivities of cohort in relation to the variation of transconductance are computed. Compared with the nominal deviation and tolerance borderline, the optimization and testing can be performed. As an example, a sixth order chebyshev low-pass filter is simulated and tested. The results have justified the reliability and feasibility of the method. 展开更多
关键词 switched-current MISMATCH sensitivity cohort parameter WAVELET DECOMPOSITION
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