针对纸张图像在复杂纹理背景下识别难度大、特征稳定性差的问题,提出一种基于ORB(Oriented FAST and Rotated BRIEF)算法的数字化纸张信息识别方法。该方法利用高效的关键点提取与描述技术,提升了纸张表面批次标识、水印结构、印刷编码...针对纸张图像在复杂纹理背景下识别难度大、特征稳定性差的问题,提出一种基于ORB(Oriented FAST and Rotated BRIEF)算法的数字化纸张信息识别方法。该方法利用高效的关键点提取与描述技术,提升了纸张表面批次标识、水印结构、印刷编码等视觉信息的识别精度与实时性。在典型纸张图像样本上进行实验,结果显示,该方法具有识别速度快、抗干扰能力强、匹配准确率高等优势。研究结果对推动纸品追溯管理和智能检测系统建设具有重要的工程价值与实际意义。展开更多
Aims and scope Journal of Systems Engineering and Electronics,keeping abreast with the development trend of science and technology worldwide,reports the latest developments and achievements in both theoretical and pra...Aims and scope Journal of Systems Engineering and Electronics,keeping abreast with the development trend of science and technology worldwide,reports the latest developments and achievements in both theoretical and practical aspects of systems engineering,electronics and related research areas.The journal welcomes high quality original papers from a wide range of countries.The scope of the journal includes systems engineering,military systems,electronic technology,defense electronic technology,control theory and practice,software algorithm and simulation,reliability,computer development and application,and other topics in all related fields.展开更多
文摘针对纸张图像在复杂纹理背景下识别难度大、特征稳定性差的问题,提出一种基于ORB(Oriented FAST and Rotated BRIEF)算法的数字化纸张信息识别方法。该方法利用高效的关键点提取与描述技术,提升了纸张表面批次标识、水印结构、印刷编码等视觉信息的识别精度与实时性。在典型纸张图像样本上进行实验,结果显示,该方法具有识别速度快、抗干扰能力强、匹配准确率高等优势。研究结果对推动纸品追溯管理和智能检测系统建设具有重要的工程价值与实际意义。
文摘Aims and scope Journal of Systems Engineering and Electronics,keeping abreast with the development trend of science and technology worldwide,reports the latest developments and achievements in both theoretical and practical aspects of systems engineering,electronics and related research areas.The journal welcomes high quality original papers from a wide range of countries.The scope of the journal includes systems engineering,military systems,electronic technology,defense electronic technology,control theory and practice,software algorithm and simulation,reliability,computer development and application,and other topics in all related fields.
